BS ISO 11505:2012

Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

被代替

BS ISO 11505:2012 发布历史

1   Scope This International Standard describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined. NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte elements, and include results of interlaboratory tests for validation of the methods.

BS ISO 11505:2012由英国标准学会 GB-BSI 发布于 2013-01-31，并于 2013-01-31 实施。

BS ISO 11505:2012在国际标准分类中归属于: 71.040.40 化学分析。

BS ISO 11505:2012的历代版本如下：

• 2013年 BS ISO 11505:2013 表面化学分析. 采用辉光放电光学发射光谱法量化组成深度描述的通用规程
• 2013年 BS ISO 11505:2012

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标准号

BS ISO 11505:2012

发布

2013年

发布单位

英国标准学会

替代标准

BS ISO 11505:2013

当前最新

BS ISO 11505:2013

 

 

适用范围

1   Scope This International Standard describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined. NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte elements, and include results of interlaboratory tests for validation of the methods.

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