IEC 61788-3-2000
超导体 第3部分:临界电流测量 银-外膜铋-2212和铋-2223氧化物超导体的临界直流电流

Superconductivity - Part 3: Critical current measurement; DC critical current of Ag-sheathed Bi-2212 and Bi-2223 oxide superconductors

IEC 61788-3-2000 发布历史

This part of IEC 61788 covers a test method for the determination of the d.c. critical current of short and straight Ag- or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono-or multicores of oxides. This method is intended for use with superconductors that have critical currents less than 500 A and n-values larger than 5. The test is carried out with and without applying external magnetic fields. In the test of the tape specimen in magnetic fields, the magnetic fields are parallel or perpendicular to the tape surface. The test specimen is immersed either in a liquid helium bath or a liquid nitrogen bath during testing. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this standard. Substantial parts of the test method covered in this standard are in common with, or similar to, those for Nb3Sn composite superconductors (IEC 61788-2). Special features newly found for oxide superconductors may be classified into two groups. The first group is specific to oxide composite superconductors, including mechanical fragility originating from the presence of weak links, cryogen gas bubble formation, aging degradation, magnetic flux flow and creep, large anisotropy, hysteresis in critical current with magnetic field sweep, etc. The second group is due to the short length of the specimen used in the standard. A critical current measurement on such a specimen may easily pick up different voltage signals due to thermal electromotive force, inductive voltage, thermal noise, current redistribution, specimen motion relative to the holder, etc. Current transfer voltages may be present due to the short distance from a current contact to a voltage tap. Short specimen length may reduce mechanical tolerance against the Lorentz force, for example, by promoting the formation of cryogen gas bubbles within the composite.

IEC 61788-3-2000由国际电工委员会 IX-IEC 发布于 2000-12。

IEC 61788-3-2000 在中国标准分类中归属于: L47 其他。

IEC 61788-3-2000的历代版本如下：

• 2000年12月 IEC 61788-3-2000 超导体 第3部分:临界电流测量 银-外膜铋-2212和铋-2223氧化物超导体的临界直流电流
• 2006年04月 IEC 61788-3-2006 超导性.第3部分:临界电流测量.银和/或银合金铠装的铋-2212和铋-2223氧化物超导体的临界直流电流

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标准号

IEC 61788-3-2000

发布日期

2000年12月

实施日期

废止日期

无

中国标准分类号

L47

发布单位

IX-IEC

代替标准

IEC 61788-3-2006

适用范围

This part of IEC 61788 covers a test method for the determination of the d.c. critical current of short and straight Ag- or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono-or multicores of oxides. This method is intended for use with superconductors that have critical currents less than 500 A and n-values larger than 5. The test is carried out with and without applying external magnetic fields. In the test of the tape specimen in magnetic fields, the magnetic fields are parallel or perpendicular to the tape surface. The test specimen is immersed either in a liquid helium bath or a liquid nitrogen bath during testing. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this standard. Substantial parts of the test method covered in this standard are in common with, or similar to, those for Nb3Sn composite superconductors (IEC 61788-2). Special features newly found for oxide superconductors may be classified into two groups. The first group is specific to oxide composite superconductors, including mechanical fragility originating from the presence of weak links, cryogen gas bubble formation, aging degradation, magnetic flux flow and creep, large anisotropy, hysteresis in critical current with magnetic field sweep, etc. The second group is due to the short length of the specimen used in the standard. A critical current measurement on such a specimen may easily pick up different voltage signals due to thermal electromotive force, inductive voltage, thermal noise, current redistribution, specimen motion relative to the holder, etc. Current transfer voltages may be present due to the short distance from a current contact to a voltage tap. Short specimen length may reduce mechanical tolerance against the Lorentz force, for example, by promoting the formation of cryogen gas bubbles within the composite.

IEC 61788-3-2000系列标准

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