DS/EN 60749-29-2011

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

 

 

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标准号
DS/EN 60749-29-2011
发布日期
2011年10月28日
实施日期
2011年10月28日
废止日期
无
国际标准分类号
31.080.01
发布单位
DK-DS
被代替标准
DS/EN 60749-29-2004
适用范围
This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits.This test is classified as destructive.The purpose of this test is to establish a method for determining integrated circuit (IC) latchup characteristics and to define latch-up failure criteria. Latch-up characteristics are used determining product reliability and minimizing ""no trouble found"" (NTF) and ""electrical overstress"" (EOS) failures due to latch-up.This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established.The classification of latch-up as a function of temperature is defined in 3.1 and the f

DS/EN 60749-29-2011系列标准

DS/EN 60749-1-2003 DS/EN 60749-10-2003 DS/EN 60749-10/Corr.1-2004 DS/EN 60749-11-2003 DS/EN 60749-11/Corr.1-2003 DS/EN 60749-11/Corr.2-2004 DS/EN 60749-12-2003 DS/EN 60749-12/Corr.1-2004 DS/EN 60749-13-2003 DS/EN 60749-13/Corr.1-2004 DS/EN 60749-14-2004 DS/EN 60749-15-2011 DS/EN 60749-15/AC-2011 DS/EN 60749-16-2003 DS/EN 60749-17-2003 DS/EN 60749-18-2003 DS/EN 60749-19-2003 DS/EN 60749-19/A1-2010 DS/EN 60749-2-2003 DS/EN 60749-2/Corr.1-2004 DS/EN 60749-20-1-2009 DS/EN 60749-20-2010 DS/EN 60749-21-2011 DS/EN 60749-22+Corr.1-2004 DS/EN 60749-23-2004 DS/EN 60749-23/A1-2011 DS/EN 60749-24-2004 DS/EN 60749-25-2004 DS/EN 60749-26-2006 DS/EN 60749-27-2006 DS/EN 60749-27/A1-2013 DS/EN 60749-3-2003 DS/EN 60749-3/Corr.1-2004 DS/EN 60749-30-2005 DS/EN 60749-30/A1-2011 DS/EN 60749-31+Corr.1-2004 DS/EN 60749-32+Corr.1-2004 DS/EN 60749-32/A1-2010 DS/EN 60749-33-2004 DS/EN 60749-34-2011 DS/EN 60749-35-2007 DS/EN 60749-36-2003 DS/EN 60749-37-2008 DS/EN 60749-38-2008 DS/EN 60749-39-2006 DS/EN 60749-4-2003 DS/EN 60749-4/Corr.1-2004 DS/EN 60749-40-2011 DS/EN 60749-5-2003 DS/EN 60749-6-2003 DS/EN 60749-6/Corr.1-2004 DS/EN 60749-7-2011 DS/EN 60749-8+Corr.2-2004 DS/EN 60749-9-2003 DS/EN 60749-9/Corr.1-2004


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