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Polarization potential window

Polarization potential window, Total:189 items.

In the international standard classification, Polarization potential window involves: Analytical chemistry, Equipment for petroleum and natural gas industries, Corrosion of metals, Surface treatment and coating, Non-ferrous metals, Electricity. Magnetism. Electrical and magnetic measurements, Geology. Meteorology. Hydrology, Electrical accessories, Iron and steel products, Integrated circuits. Microelectronics, Medical equipment, Metrology and measurement in general, Interface and interconnection equipment, Nuclear energy engineering, Semiconductor devices.


American Society for Testing and Materials (ASTM), Polarization potential window

  • ASTM G5-94 Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-94(1999) Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-94(1999)e1 Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-94(2004) Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-94(2011)e1 Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-14(2021) Standard Reference Test Method for Making Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-14e1 Standard Reference Test Method for Making Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-14 Standard Reference Test Method for Making Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-13e2 Standard Reference Test Method for Making Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-13 Standard Reference Test Method for Making Potentiodynamic Anodic Polarization Measurements
  • ASTM G5-13e1 Standard Reference Test Method for Making Potentiodynamic Anodic Polarization Measurements
  • ASTM G59-97(2003) Standard Test Method for Conducting Potentiodynamic Polarization Resistance Measurements
  • ASTM G59-97(2020) Standard Test Method for Conducting Potentiodynamic Polarization Resistance Measurements
  • ASTM G59-23 Standard Test Method for Conducting Potentiodynamic Polarization Resistance Measurements
  • ASTM F2129-17b Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM F2129-19 Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM F2129-17a Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM F2129-15 Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM F2129-19a Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM F2129-17 Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM G61-86(2024) Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements for Localized Corrosion Susceptibility of Iron-, Nickel-, or Cobalt-Based Alloys
  • ASTM F2129-03 Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM F2129-01 Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM F2129-04 Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM F2129-08 Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM F2129-06 Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices
  • ASTM G61-86(2009) Standard Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements for Localized Corrosion Susceptibility of Iron-, Nickel-, or Cobalt-Based Alloys
  • ASTM C1477-19 Standard Test Method for Isotopic Abundance Analysis of Uranium Hexafluoride and Uranyl Nitrate Solutions by Multi-Collector, Inductively Coupled Plasma-Mass Spectrometry
  • ASTM C1477-08 Standard Test Method for Isotopic Abundance Analysis of Uranium Hexafluoride and Uranyl Nitrate Solutions by Multi-Collector, Inductively Coupled Plasma-Mass Spectrometry

Professional Standard - Petroleum, Polarization potential window

  • SY/T 6973-2013 Petroleum core induced polarization potential measurement instrument
  • SY 6973-2013 Petroleum Rock Induced Polarization Potential Measuring Instrument

未注明发布机构, Polarization potential window

  • ASTM RR-G01-1026 2013 G0005-Reference Test Method for Making Potentiodynamic Anodic Polarization Measurements
  • ASTM RR-F04-1011 2008 F2129-Test Method for Conducting Cyclic Potentiodynamic Polarization Measurements to Determine the Corrosion Susceptibility of Small Implant Devices

Korean Agency for Technology and Standards (KATS), Polarization potential window

  • KS D ISO 17475-2017(2022) Corrosion of metals and alloys-Electrochemical test methods-Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • KS D ISO 2376-2013 Anodizing of aluminium and its alloys-Determination of electric breakdown potential
  • KS D ISO 2376:2012 Anodizing of aluminium and its alloys-Determination of electric breakdown potential
  • KS D ISO 2376:2013 Anodizing of aluminium and its alloys-Determination of electric breakdown potential
  • KS D 0269-2020 Potentiostatic polarization test method for determination of critical pitting temperature for stainless steels
  • KS D ISO 17475:2008 Corrosion of metals and alloys-Electrochemical test methods-Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • KS D ISO 17475:2017 Corrosion of metals and alloys-Electrochemical test methods-Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • KS D 0269-2009 Potentiostatic polarization test method for determination of critical pitting temperature for stainless steels
  • KS D 0280-2005 Standard test method for conducting cyclic potentiodynamic polarization measurements for localized corrosion susceptibility of iron-, nickel-, or cobalt-based alloys
  • KS C 5020-3-1998 A data format in interface between logic circuit and high level for design automation
  • KS B ISO 10156:2018 Gas cylinders — Gases and gas mixtrures — Determination of fire potential and oxidizing ability for the selection of cylinder valve outlets
  • KS D 0280-2020 Standard test method for conducting cyclic potentiodynamic polarization measurements for localized corrosion susceptibility of iron-, nickel-, or cobalt-based alloys

KR-KS, Polarization potential window

  • KS D ISO 17475-2017 Corrosion of metals and alloys-Electrochemical test methods-Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • KS D ISO 2376-2012 Anodizing of aluminium and its alloys-Determination of electric breakdown potential
  • KS D ISO 17475-2023 Corrosion of metals and alloys — Electrochemical test methods — Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • KS D 2614-2023 Accelerated evaluation method for anti-corrosion performance of painted steel suspension part by cyclic wet(potentiostatic and galvanostatic polarizations)-dry conditions
  • KS B ISO 10156-2018 Gas cylinders — Gases and gas mixtrures — Determination of fire potential and oxidizing ability for the selection of cylinder valve outlets

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Polarization potential window

  • GB/T 24196-2009 Corrosion of metals and alloys.Electrochemical test methods.Cuidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • GB/T 8754-2006 Anodizing of aluminium and its alloys. Insulation check.by measurement of breakdown potential
  • GB 8754-1988 Aluminum and aluminum alloy anodic oxidation application breakdown potential measurement method to test insulation

GSO, Polarization potential window

  • OS GSO ISO 2376:2015 Anodizing of aluminium and its alloys -- Determination of electric breakdown potential
  • BH GSO ISO 2376:2016 Anodizing of aluminium and its alloys -- Determination of electric breakdown potential
  • OS GSO ISO 17475:2013 Corrosion of metals and alloys -- Electrochemical test methods -- Guidelines for conducting potentiostatic and potentiodynamic polarization measurements

HU-MSZT, Polarization potential window

Professional Standard - Post and Telecommunication, Polarization potential window

  • YDN 004-1996 Technical Specifications for Electronic System of Postal Business Window (Trial Implementation)

British Standards Institution (BSI), Polarization potential window

  • BS EN ISO 2376:2010 Anodizing of aluminium and its alloys. Determination of electric breakdown potential
  • BS ISO 3079:2022 Two-electrode method using acetic acid to measure pitting potential of aluminium and aluminium alloys in chloride solutions
  • BS EN ISO 17475:2006 Corrosion of metals and alloys. Electrochemical test methods. Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • BS EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • 21/30408318 DC BS ISO 3079. A two-electrode method using acetic acid to measure pitting potential of aluminium and aluminium alloys in chloride solutions

Danish Standards Foundation, Polarization potential window

  • DS/EN ISO 2376:2010 Anodizing of aluminium and its alloys - Determination of electric breakdown potential
  • DS/EN ISO 17475:2009 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements

Association Francaise de Normalisation, Polarization potential window

  • NF A05-403*NF EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements.
  • NF EN ISO 10156:2017 Gas cylinders - Gases and gas mixtures - Determination of flammability and oxidation potential for the choice of valve outlet connections

European Committee for Standardization (CEN), Polarization potential window

  • EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements

German Institute for Standardization, Polarization potential window

  • DIN EN ISO 17475:2008-07 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005+Cor. 1:2006); German version EN ISO 17475:2008
  • DIN EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005+Cor. 1:2006); English version of DIN EN ISO 17475:2008-07
  • DIN 45910-127:1994-01 Harmonized system of quality assessment for electronic components; detail specification: Polar aluminium electrolytic capacitors with non solid electrolyte, DC 40 to 100 V (suitable to V a.c. load without using a polarizing potential), general-purpose ...

SCC, Polarization potential window

  • BS ISO 17475:2005 Corrosion of metals and alloys. Electrochemical test methods. Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • DANSK DS/EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
  • NS-EN ISO 2376:2010 Anodizing of aluminium and its alloys — Determination of electric breakdown potential (ISO 2376:2010)
  • NS-EN 12373-17:2001 Aluminium and aluminium alloys — Anodizing — Part 17: Determination of electric breakdown potential
  • DANSK DS/EN 12373-17:2001 Aluminium and aluminium alloys - Anodizing - Part 17: Determination of electric breakdown potential
  • DIN EN ISO 17475 E:2007 Draft Document - Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005); German version prEN ISO 17475:2007
  • 09/30195872 DC BS EN ISO 2376. Anodizing of aluminium and its alloys. Determination of electric breakdown potential
  • BS 6161-15:1987 Methods of test for anodic oxidation coatings on aluminium and its alloys-Determination of electrical breakdown potential
  • NS-EN ISO 17475:2008 Corrosion of metals and alloys — Electrochemical test methods — Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
  • AENOR UNE-EN ISO 17475:2009 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
  • AASHTO T 373M/T 373-2017(2021) Standard Method of Test for Comparative Qualitative Corrosion Characterization of Steel Bars Used for Concrete Reinforcement (Linear Polarization Resistance and Potentiodynamic Polarization Tests)
  • DIN EN ISO 2376 E:2017 Draft Document - Anodizing of aluminium and its alloys - Determination of electric breakdown potential (ISO/DIS 2376:2017); German and English version prEN ISO 2376:2017
  • DANSK DS/ISO 3079:2022 Two-electrode method using acetic acid to measure pitting potential of aluminium and aluminium alloys in chloride solutions
  • AS 2039.7.1:1978 Methods for testing anodic oxidation coatings on aluminium and aluminium alloys, Part 7.1: Insulation tests - Measurement of breakdown potential of anodic oxidation coatings
  • 05/30142356 DC IEC 62456. Intercomparison of electrode potentials measured in differnt solvent media-use of the half-wave potential of the ferricinium/ferrocerne redoxcouple

Defense Logistics Agency, Polarization potential window

  • DLA A-A-55148 VALID NOTICE 3-2011 Connectors, Electircal, IEEE 488 Compatible, Rectangular, Miniature, Polarized Shell, 24 Position, Back to Back Interface Bus, Cable Terminating, Insulation Displacement, Screw Locking
  • DLA SMD-5962-86025 REV F-2011 MICROCIRCUITS, MEMORY, DIGITAL, BIPOLAR, 16-WORD BY 4-BIT, 2-PORT, RAM, MONOLITHIC SILICON
  • DLA A-A-55148 VALID NOTICE 2-2006 CONNECTORS, ELECTIRCAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, 24 POSITION, BACK TO BACK INTERFACE BUS, CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING
  • DLA A-A-55148 VALID NOTICE 1-2001 CONNECTORS, ELECTIRCAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, 24 POSITION, BACK TO BACK INTERFACE BUS, CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING
  • DLA A-A-55148-1993 CONNECTORS, ELECTIRCAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, 24 POSITION, BACK TO BACK INTERFACE BUS, CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING
  • DLA A-A-55155 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSTION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING, LOOSE PIECE CONSTRUCTION
  • DLA A-A-55141 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, LOW PROFILE, 24 POSITION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, PANEL MOUNT
  • DLA A-A-55141 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, LOW PROFILE, 24 POSITION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, PANEL MOUNT
  • DLA A-A-55141-1994 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, LOW PROFILE, 24 POSITION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, PANEL MOUNT
  • DLA A-A-55147 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, PLUG, LOW PROFILE, 24 POSTION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING
  • DLA A-A-55147 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, PLUG, LOW PROFILE, 24 POSTION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING
  • DLA A-A-55147-1994 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, PLUG, LOW PROFILE, 24 POSTION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING
  • DLA A-A-55142 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, PLUG, LOW PROFILE, 24 POSITION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING
  • DLA A-A-55142 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, PLUG, LOW PROFILE, 24 POSITION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING
  • DLA A-A-55142-1993 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, PLUG, LOW PROFILE, 24 POSITION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING
  • DLA SMD-5962-01507-2001 MICROCIRCUIT, DIGITAL, BIPOLAR, HIGH-SPEED LOOK-AHEAD CARRY GENERATOR, MONOLITHIC SILICON
  • DLA SMD-5962-88698 REV D-2006 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, SYNCHRONOUS 4-BIT UP/DOWN COUNTER, MONOLITHIC SILICON
  • DLA A-A-55140 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING, PREASSEMBLED CONSTRUCTION
  • DLA A-A-55140 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING, PREASSEMBLED CONSTRUCTION
  • DLA A-A-55140-1993 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING, PREASSEMBLED CONSTRUCTION
  • DLA SMD-5962-77056-1977 MICROCIRCUITS, DIGITAL, CMOS, HEX, OPEN DRAIN, N-CHANNEL BUFFERS
  • DLA A-A-55142 VALID NOTICE 3-2011 Connectors, Electrical, IEEE 488 Compatible, Rectangular, Miniature, Polarized Shell, Plug, Low Profile, 24 Position, Flat Cable Terminating, Insulation Displacement, Screw Locking
  • DLA SMD-5962-88627 REV B-1993 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, 8-BIT BINARY COUNTER, MONOLITHIC SILICON
  • DLA A-A-55094 VALID NOTICE 3-2011 Connectors, Electrical, IEEE 488 Compatible, Rectangular, Miniature, Polarized Shell, Plug, 24 Position, Discrete Wire Cable Terminating, Bail Locking
  • DLA A-A-55138 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, 24 POSITION, CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW OR BAIL LOCKING, THICK FLANGE
  • DLA A-A-55138 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, 24 POSITION, CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW OR BAIL LOCKING, THICK FLANGE
  • DLA A-A-55138-1993 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, 24 POSITION, CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW OR BAIL LOCKING, THICK FLANGE
  • DLA A-A-55139 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, 24 POSITION, CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW OR BAIL LOCKING, THIN FLANGE
  • DLA A-A-55139 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, 24 POSITION, CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW OR BAIL LOCKING, THIN FLANGE
  • DLA A-A-55139-1993 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, 24 POSITION, CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW OR BAIL LOCKING, THIN FLANGE
  • DLA SMD-5962-88578 REV B-2001 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, 8-BIT IDENTITY COMPARATOR, MONOLITHIC SILICON
  • DLA A-A-55155 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSTION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING, LOOSE PIECE CONSTRUCTION
  • DLA A-A-55155-1994 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSTION, FLAT CABLE TERMINATING, INSULATION DISPLACEMENT, SCREW LOCKING, LOOSE PIECE CONSTRUCTION
  • DLA SMD-5962-86706 REV C-2010 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR, 1K x 8-bit, REGISTERED PROM WITH PROGRAMMABLE INITIALIZE, MONOLITHIC SILICON
  • DLA A-A-55513 VALID NOTICE 3-2011 Connectors, Electrical, IEEE 488 Compatible, Rectangular, Miniature, Polarized Shell, Plug, 24 Position, EMI Shielded, Cable Terminating, Screw Locking
  • DLA SMD-5962-93150 REV A-1994 MICROCIRCUIT, DIGITAL, CMOS, 96-BIT FLOATING POINT DUAL PORT PROCESSOR, MONOLITHIC SILICON
  • DLA SMD-5962-94508 REV B-2009 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 9-BIT BUS INTERFACE FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA MIL-DTL-24308/27 E-2009 CONNECTORS, ELECTRIC, RECTANGULAR, MINIATURE, POLARIZED SHELL, RACK AND PANEL, INSULATION DISPLACEMENT, SOCKET CONTACTS, NONENVIRONMENTAL
  • DLA SMD-5962-93170 REV A-1996 MICROCIRCUIT, DIGITAL, CMOS, 8-16 BIT PARALLEL INTERFACE/TIMER MONOLITHIC SILICON
  • DLA A-A-55094 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, PLUG, 24 POSITION, DISCRETE WIRE CABLE TERMINATING, BAIL LOCKING
  • DLA A-A-55094-1994 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, PLUG, 24 POSITION, DISCRETE WIRE CABLE TERMINATING, BAIL LOCKING
  • DLA SMD-5962-94508 REV A-2000 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 9-BIT BUS INTERFACE FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-94528 REV B-2003 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL 16-BIT D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-96812 REV B-2010 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 10-BIT ADDRESSABLE SCAN PORTS, MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVER, MONOLITHIC SILICON
  • DLA SMD-5962-90720 REV B-2009 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY, TTL, 9-BIT BUS INTERFACE D-TYPE LATCHES WITH THREE STATE OUTPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-95646 REV B-2008 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 20-BIT BUS-INTERFACE D-TYPE LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA A-A-55146 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, RIGHT ANGLE, PRINTED CIRCUIT BOARD TERMINATING, BAIL LOCKING
  • DLA A-A-55146 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, RIGHT ANGLE, PRINTED CIRCUIT BOARD TERMINATING, BAIL LOCKING
  • DLA A-A-55146-1994 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, RIGHT ANGLE, PRINTED CIRCUIT BOARD TERMINATING, BAIL LOCKING
  • DLA MIL-DTL-24308/28 E-2009 CONNECTORS, ELECTRIC, RECTANGULAR, MINIATURE, POLARIZED SHELL, RACK AND PANEL, INSULATION DISPLACEMENT, PIN CONTACTS, NONENVIRONMENTAL, CLASS G
  • DLA MIL-DTL-24308/28 E (1)-2013 CONNECTORS, ELECTRIC, RECTANGULAR, MINIATURE, POLARIZED SHELL, RACK AND PANEL, INSULATION DISPLACEMENT, PIN CONTACTS, NONENVIRONMENTAL, CLASS G
  • DLA SMD-5962-96769 REV B-2009 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 10-BIT BUS-INTERFACE D-TYPE LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-90695 REV A-2010 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY, TTL, 8-BIT BUS INTERFACE FLIP-FLOPS WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-90780 REV C-2012 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, 10-BIT BUS INTERFACE FLIP-FLOPS WITH NON-INVERTING AND INVERTING INPUTS, MONOLITHIC SILICON
  • DLA A-A-55531 VALID NOTICE 1-2002 CONNECTORS, TELECOMMUNICATION, POLARIZED SHELL, RECEPTACLE, FEMALE RACK AND PANEL, SOLDER CONTACT, SIDE ENTRY COVER, SCREWLOCK
  • DLA A-A-55531-1996 CONNECTORS, TELECOMMUNICATION, POLARIZED SHELL, RECEPTACLE, FEMALE RACK AND PANEL, SOLDER CONTACT, SIDE ENTRY COVER, SCREWLOCK
  • DLA SMD-5962-90710 REV A-2010 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, 10-BIT BUS INTERFACE D-TYPE LATCHES WITH THREE STATE OUTPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-87640 REV B-2002 MICROCIRCUIT, LINEAR, BIMOS II LATCHED DRIVERS, MONOLITHIC SILICON
  • DLA SMD-5962-89444 REV A-2004 MICROCIRCUIT, DIGITAL, BIPOLAR, LOW POWER SCHOTTKY, TTL, 8-BIT SHIFT REGISTER WITH INPUT LATCHES, MONOLITHIC SILICON
  • DLA A-A-55144 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL,IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, VERTICAL MOUNT, PRINTED CIRCUIT BOARD TERMINATING, SCREW LOCKING
  • DLA A-A-55144 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL,IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, VERTICAL MOUNT, PRINTED CIRCUIT BOARD TERMINATING, SCREW LOCKING
  • DLA A-A-55144-1993 CONNECTORS, ELECTRICAL,IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, VERTICAL MOUNT, PRINTED CIRCUIT BOARD TERMINATING, SCREW LOCKING
  • DLA A-A-55145 VALID NOTICE 2-2006 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, RIGHT ANGLE, PRINTED CIRCUIT BOARD TERMINATING, SCREW LOCKING
  • DLA A-A-55145 VALID NOTICE 1-2001 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, RIGHT ANGLE, PRINTED CIRCUIT BOARD TERMINATING, SCREW LOCKING
  • DLA A-A-55145-1993 CONNECTORS, ELECTRICAL, IEEE 488 COMPATIBLE, RECTANGULAR, MINIATURE, POLARIZED SHELL, RECEPTACLE, SHIELDED, 24 POSITION, RIGHT ANGLE, PRINTED CIRCUIT BOARD TERMINATING, SCREW LOCKING
  • DLA A-A-55139 VALID NOTICE 3-2011 Connectors, Electrical, IEEE 488 Compatible, Rectangular, Miniature, Polarized Shell, Receptacle, 24 Position, Cable Terminating, Insulation Displacement, Screw or Bail Locking, Thin Flange
  • DLA SMD-5962-93175 REV B-1999 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-94527 REV E-2004 MICROCIRCUIT, LINEAR, CMOS, QUAD, SERIAL INTERFACE, 8-BIT D/A CONVERTER, MONOLITHIC SILICON
  • DLA SMD-5962-96812 REV A-2003 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 10-BIT ADDRESSABLE SCAN PORTS, MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVER, MONOLITHIC SILICON
  • DLA SMD-5962-90514 REV A-2006 MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-90616 REV A-2004 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW- POWER SCHOTTKY, TTL, 10-BIT BUS INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-90625 REV A-2006 MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUFFER AND LINE DRIVER WITH THREESTATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-93227 REV D-2000 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL BUFFER/DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-96808 REV B-2003 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT TRI-PORT UNIVERSAL BUS EXCHANGER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

Professional Standard - Ocean, Polarization potential window

  • HY/T 192-2015 Test method of potentiodynamic polarization resistance of metallic materials in seawater

AENOR, Polarization potential window

  • UNE 84103:2000 Cosmetic products. Mouthwashes. Determination of pH. Potentiometric method.
  • UNE-EN ISO 17475:2009 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
  • UNE-EN ISO 2376:2011 Anodizing of aluminium and its alloys - Determination of electric breakdown potential (ISO 2376:2010)
  • UNE 112015:1994 BIOLOGICAL CORROSION. EXPERIMENTAL METHOD FOR PIT POTENTIAL DETERMINATION IN STATINLESS STEEL, USING SULFATE REDUCING BACTERIA CULTURES BY MEANS OF THE POTENTIODYNAMIC ANODIC POLARIZATION TECHNIQUE.

Lithuanian Standards Office , Polarization potential window

  • LST EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
  • LST EN ISO 2376:2010 Anodizing of aluminium and its alloys - Determination of electric breakdown potential (ISO 2376:2010)

Professional Standard - Chemical Industry, Polarization potential window

  • HG/T 4543-2013 Water treatment chemicals.Determination of corrosion inhibition performance.Potentiodynamic polarization method

(U.S.) Telecommunications Industries Association , Polarization potential window

  • TIA-1113-2008 Medium-Speed (up to 14 Mbps) Power Line Communications (PLC) Modems using Windowed OFDM

International Organization for Standardization (ISO), Polarization potential window

  • ISO 3079:2022 Two-electrode method using acetic acid to measure pitting potential of aluminium and aluminium alloys in chloride solutions

AASHTO - American Association of State Highway and Transportation Officials, Polarization potential window

  • T 373M/T 373-2017 Standard Method of Test for Comparative Qualitative Corrosion Characterization of Steel Bars Used for Concrete Reinforcement (Linear Polarization Resistance and Potentiodynamic Polarization Tests)

The American Road & Transportation Builders Association, Polarization potential window

  • AASHTO T 373M/T 373-2017 Standard Method of Test for Comparative Qualitative Corrosion Characterization of Steel Bars Used for Concrete Reinforcement (Linear Polarization Resistance and Potentiodynamic Polarization Tests)

PL-PKN, Polarization potential window

  • PN C04603-04-1986 Water and waste water Tests for cyanides Determination of frec combined and total cyanides by potentiometric method with ion selective electrode

IN-BIS, Polarization potential window

  • IS 8554-1977 Method for checking the insulation properties of anodized coatings by measuring breakdown potential

Professional Standard - Commodity Inspection, Polarization potential window

  • SN/T 0254-2011 Potentiometric titration method for the determination of acid-soluble chloride in light-burned magnesium imported and exported

Professional Standard - Medicine, Polarization potential window

  • YY/T 0695-2008 Standard test method for conducting cyclic potentiodynamic polarization measurements to determine the corrosion susceptibility of small lmplant devices

Professional Standard - Aviation, Polarization potential window

  • HB/Z 5104.2-1999 Analytical method of sulfuric acid anodic oxidation solution of aluminum alloy - Determination of aluminum content by potentiometric titration
  • HB/Z 339.2-1999 Analytical method of aluminum alloy chromic acid anodizing solution for determination of chloride ion content by potentiometric titration
  • HB/Z 5104.3-1999 Analysis method for aluminum alloy sulphide acid anodizing solution Determination of chloride Ion content through potentiometric titration
  • HB/Z 339.1-1999 Analytical method of chromic acid anodic oxidation solution of aluminum alloy Determination of free chromium trioxide and total chromium trioxide content by potentiometric titration
  • HB/Z 5104.1-1999 Analytical method of aluminum alloy sulfuric acid anodic oxidation solution Potentiometric titration determination of free sulfuric acid and combined sulfuric acid

RU-GOST R, Polarization potential window

  • GOST R 8.702-2010 State system for ensuring the uniformity of measuremenets. Measuring electrodes for oxidation-reduction potential determination (ORP). Verification procedure

工业和信息化部, Polarization potential window

  • YS/T 1472.1-2021 Methods for chemical analysis of lithium-rich manganese-based cathode materials Part 1: Determination of manganese content by potentiometric titration
  • YS/T 1472.2-2021 Methods for chemical analysis of lithium-rich manganese-based cathode materials Part 2: Determination of cobalt content by potentiometric titration

SAE - SAE International, Polarization potential window

  • SAE AS85028/3-2004 CONNECTOR@ ELECTRIC@ RECTANGULAR@ INDIVIDUAL CONTACT SEALING@ POLARIZED CENTER JACKSCREW@ INTERFACIAL SEAL@ SIZE 16@ CRIMP CONTACTS
  • SAE AS85028/3A-2016 CONNECTOR@ ELECTRIC@ RECTANGULAR@ INDIVIDUAL CONTACT SEALING@ POLARIZED CENTER JACKSCREW@ INTERFACIAL SEAL@ SIZE 16@ CRIMP CONTACTS

Society of Automotive Engineers (SAE), Polarization potential window

  • SAE AS85028/3-2011 Connector Electric Rectangular Independent Contact Sealing Polarized Center Screw Interface Sealing Size 16 Crimp Contacts

CZ-CSN, Polarization potential window

  • CSN ETS 300 288-1994 Business TeleCommunications (BTC). 64 kbit/s digital unstructured leased line with octet integrity (D64U). Network interface presentation
  • CSN ETS 300 290-1994 Business TeleCommunications (BTC). 64 kbit/s digital unstructured leased linewith octet integrity (D64U). Terminal equipment interface




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