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single crystal diffractometer sample

single crystal diffractometer sample, Total:23 items.

In the international standard classification, single crystal diffractometer sample involves: Non-destructive testing, Testing of metals, Products of the chemical industry, Production of metals, Education, Analytical chemistry, Inorganic chemicals, Ceramics, Semiconducting materials.

National Metrological Verification Regulations of the People's Republic of China, single crystal diffractometer sample

• JJG 629-2014 Polycrystalline X-Ray Diffractometers
• JJG 629-1989 Verification Regulation for Polycrystalline X-Ray Diffractometer
• JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer

British Standards Institution (BSI), single crystal diffractometer sample

• BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
• BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
• BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
• 20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, single crystal diffractometer sample

• GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
• GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer

Japanese Industrial Standards Committee (JISC), single crystal diffractometer sample

• JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry

Professional Standard - Education, single crystal diffractometer sample

• JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
• JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

German Institute for Standardization, single crystal diffractometer sample

• DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
• DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
• DIN 50433-1:1976 Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction

European Committee for Standardization (CEN), single crystal diffractometer sample

• EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

Association Francaise de Normalisation, single crystal diffractometer sample

• NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.

Danish Standards Foundation, single crystal diffractometer sample

• DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

Lithuanian Standards Office , single crystal diffractometer sample

• LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

AENOR, single crystal diffractometer sample

• UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

国家市场监督管理总局、中国国家标准化管理委员会, single crystal diffractometer sample

• GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation

National Metrological Technical Specifications of the People's Republic of China, single crystal diffractometer sample

• JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

International Organization for Standardization (ISO), single crystal diffractometer sample

• ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

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