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Microscope image measurement

Microscope image measurement, Total:221 items.

In the international standard classification, Microscope image measurement involves: Optical equipment, Finances. Banking. Monetary systems. Insurance, Document imaging applications, Analytical chemistry, Photography, Farming and forestry, Electronic display devices, Electrical wires and cables, Fluid power systems, Ceramics, Audio, video and audiovisual engineering, Physics. Chemistry, Optics and optical measurements, Textile auxiliary materials, Air quality, Textile fibres, Non-destructive testing, Surface treatment and coating, Optoelectronics. Laser equipment, Linear and angular measurements, Electrical equipment for working in special conditions, Microbiology, Mechanical testing, Testing of metals, Test conditions and procedures in general, Materials for aerospace construction, Metrology and measurement in general, Nuclear energy engineering, Coals, Wood technology processes.

British Standards Institution (BSI), Microscope image measurement

BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS ISO 19056-1:2015 Microscopes. Definition and measurement of illumination properties. Image brightness and uniformity in bright field microscopy
BS ISO 6196-5:1987 Micrographics. Vocabulary. Quality of images, legibility, inspection
BS ISO 7565:1993 Micrographics. Readers for transparent microforms. Measurement of characteristics
BS ISO 11698-1:2000 Micrographics. Methods of measuring image quality produced by aperture card scanners - Characteristics of the test images
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS IEC 63145-21-20:2022 Eyewear display - Specific measurement methods for VR image quality. Screen door effect
BS ISO 11698-2:2000 Micrographics. Methods of measuring image quality produced by aperture card scanners - Quality criteria and control
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 446:2004 Micrographics. ISO character and ISO test chart No 1. Description and use
BS ISO 14648-2:2001 Micrographics. Quality control of COM recorders that generate images using a single internal display system - Method of use
BS ISO 14648-1:2001 Micrographics. Quality control of COM recorders that generate images using a single internal display system - Characteristics of the software test target
PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
BS ISO 19056-3:2022 Microscopes. Definition and measurement of illumination properties - Incident light fluorescence microscopy with incoherent light sources
BS ISO 19056-2:2019 Microscopes. Definition and measurement of illumination properties - Illumination properties related to the colour in bright field microscopy
BS ISO 6200:1999 Micrographics. First generation silver-gelatin microforms of source documents. Density specifications and method of measurement
BS PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
BS IEC 62906-5-3:2021 Laser display devices. Measuring methods of image quality for laser projection display
BS EN 61988-2-4:2011 Plasma display panels. Measuring methods. Visual quality. Image artifacts
BS ISO 29301:2017 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
BS IEC 62906-5-7:2022 Laser displays - Measuring methods of image quality affected by speckle for scanning laser displays
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS EN 61988-2-3:2009 Plasma display panels - Measuring methods - Image quality - Defects and degradation
BS EN 62341-6-3:2012 Organic light emitting diode (OLED) displays. Measuring methods of image quality
18/30339980 DC BS ISO 19056-2. Microscopes. Definition and measurement of illumination properties. Part 2. Illumination properties related to the colour in bright field microscopy
21/30395346 DC BS ISO 19056-3. Microscopes. Definition and measurement of illumination properties. Part 3. Incident light fluorescence microscopy with incoherent light sources
BS ISO 14648-2:2002 Micrographics - Quality control of COM recorders that generate images using a single internal display system - Method of use
BS ISO 14648-1:2002 Micrographics - Quality control of COM recorders that generate images using a single internal display system - Characteristics of the software test target
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
BS ISO 8126:2019 Tracked Changes. Micrographics. Duplicating film, silver, diazo and vesicular. Specifications and measurement for visual density
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis

International Organization for Standardization (ISO), Microscope image measurement

ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
ISO 19056-1:2015 Microscopes - Definition and measurement of illumination properties - Part 1: Image brightness and uniformity in bright field microscopy
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO/TS 20793:2019 Photography — Lenticular print for changing images — Measurements of image quality
ISO 20263:2017 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO/CD 20263:2023 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO/TS 22292:2021 Nanotechnologies — 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
ISO 19056-3:2022 Microscopes — Definition and measurement of illumination properties — Part 3: Incident light fluorescence microscopy with incoherent light sources
ISO 4912:1981 Textiles; Cotton fibres; Evaluation of maturity; Microscopic method
ISO 19232-5:2004 Non-destructive testing - Image quality of radiographs - Part 5: Image quality indicators (duplex wire type) - Determination of image unsharpness value
ISO 19232-5:2018 Non-destructive testing - Image quality of radiographs - Part 5: Determination of the image unsharpness and basic spatial resolution value using duplex wire-type image quality indicators
ISO 29301:2017 Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
ISO 19056-2:2019 Microscopes — Definition and measurement of illumination properties — Part 2: Illumination properties related to the colour in bright field microscopy
ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO 1463:2021 Metallic and oxide coatings — Measurement of coating thickness — Microscopical method
ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 4967:1998 Steel - Determination of content of nonmetallic inclusions - Micrographic method using standard diagrams
ISO/CD 22262-2:2011 Air quality — Bulk materials — Part 2: Quantitative determination of asbestos by gravimetric and microscopical methods
ISO/DIS 23124:2023 Surface Chemical Analysis — Measurement of lateral and axial resolutions of Raman microscope
ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems

Professional Standard - Machinery, Microscope image measurement

JB/T 9339-1999 Measuring microscope
JB/T 9349-1999 Measuring knives for the toolmaker's microscope

Japanese Industrial Standards Committee (JISC), Microscope image measurement

JIS B 7153:1995 Measuring microscopes
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS B 7152:1991 Biological microscope objectives and eyepieces -- Methods of measurement of performance
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS M 8816:1992 Solid mineral fuels -- Methods of microscopical measurement for the macerals and reflectance

Professional Standard - Finance, Microscope image measurement

JRT 0267-2023

Korean Agency for Technology and Standards (KATS), Microscope image measurement

KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS X ISO 6196-5-2007(2012) Mircrographics－Vocabulary－Part 5：Quality of images, legibility, inspection
KS I ISO 4407:2012 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS E 4005-2007(2012) Portable polarizing microscope for sampling and determining incombustible matter in coal and rock-dust mixtures
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS E 4005-1981 Portable polarizing microscope for sampling and determining incombustible matter in coal and rock-dust mixtures
KS D 0204-2007 Steel-Determination of content of nonmetallic inclusions-Micrographic method using standard diagrams
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 8519-2009(2015) Metallic and oxide coating－Measurement of coating thickness－Microscopical method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 0204-1982 Steel-Determination of content of nonmetallic inclusions-Micrographic method using standard diagrams
KS C 7114-2008(2018) Plasma display panels(PDP)－Measuring method of moving picture resolution
KS C 7116-2008(2018) Organic light emitting diode(OLED) displays－Measuring method of image sticking
KS X ISO 11698-1-2002(2012) Micrographics－Methods of measuring image quality produced by aperture card scanners－Part 1：Characteristics of the test images
KS X ISO 11698-1:2002 Micrographics-Methods of measuring image quality produced by aperture card scanners-Part 1:Characteristics of the test images
KS X ISO 11698-1:2013 Micrographics－Methods of measuring image quality produced by aperture card scanners－Part 1：Characteristics of the test images
KS C IEC 61988-2-3:2007 Plasma display panels－Part 2－3：Measuring methods－Quality

National Metrological Verification Regulations of the People's Republic of China, Microscope image measurement

JJG 571-2004 Reading Microscope and Measuring Microscope
JJG 571-1988 Verification Regulation of Measuring Microscope

National Metrological Technical Specifications of the People's Republic of China, Microscope image measurement

JJF 1819-2020 Calibration Specification for Medical Micro-image Analyzers

Association Francaise de Normalisation, Microscope image measurement

NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
NF EN ISO 4499-1:2020 Métaux-durs - Détermination métallographique de la microstructure - Partie 1 : prises de vue photomicrographiques et description
NF G06-008*NF EN ISO 20705:2020 Textiles - Quantitative microscopical analysis - General principles of testing
NF EN ISO 20705:2020 Textiles - Analyse quantitative par microscopie - Principes généraux des essais
NF A91-110:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method.
NF A91-110*NF EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
NF A04-106:1984 Iron and steel. Methods of determination of content of non metallic inclusions in wrought steel. Part II : micrographic method using standards diagrams.
NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF C96-541-6-3*NF EN 62341-6-3:2012 Organic light emitting diode (OLED) displays - Part 6-3 : measuring methods of image quality
NF C93-548-2-3*NF EN 61988-2-3:2010 Plasma display panels - Part 2-3 : measuring methods - Image quality : defects and degradation
NF C93-548-2-4*NF EN 61988-2-4:2012 Plasma display panels - Part 2-4 : measuring methods - Visual quality : image artifacts
NF EN 61988-2-4:2012 Panneaux d'affichage à plasma - Partie 2-4 : méthodes de mesure - Qualité visuelle : artéfacts d'image

未注明发布机构, Microscope image measurement

BS ISO 6196-5:1987(2000) Micrographics — Vocabulary — Part 5 : Quality of images, legibility, inspection
BS 3406-4:1993(1999) Methods for determination of particle size distribution — Part 4 : Guide to microscope and image analysis methods
BS ISO 10550:1994(1999) Micrographics — Planetary camera systems — Testtargetforchecking performance

Standard Association of Australia （SAA）, Microscope image measurement

IEC 63145-20-20:2019 Eyewear display — Part 20-20: Fundamental measurement methods — Image quality

IN-BIS, Microscope image measurement

IS 4329-1967

American Society for Testing and Materials (ASTM), Microscope image measurement

ASTM E3060-16 Standard Guide for Subvisible Particle Measurement in Biopharmaceutical Manufacturing Using Dynamic (Flow) Imaging Microscopy
ASTM F728-81(1997)e1 Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
ASTM F72-95(2001) Standard Specification for Gold Wire for Semiconductor Lead Bonding
ASTM C1678-10 Standard Practice for Fractographic Analysis of Fracture Mirror Sizes in Ceramics and Glasses
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E1813-96e1 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E1813-96(2002) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E1813-96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E3060-23 Standard Guide for Subvisible Particle Measurement in Biopharmaceutical Manufacturing Using Dynamic (Flow) Imaging Microscopy
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM D5235-13 Standard Test Method for Microscopical Measurement of Dry Film Thickness of Coatings on Wood Products
ASTM D5235-14 Standard Test Method for Microscopic Measurement of Dry Film Thickness of Coatings on Wood Products
ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM D5235-18 Standard Test Method for Microscopic Measurement of Dry Film Thickness of Coatings on Wood Products

Professional Standard - Agriculture, Microscope image measurement

NY/T 2338-2013 Quick determination of flax fiber fineness.Microscopic image method
NY/T 2222-2012 Test for the average diameter and component of animal fiber.Microscopic image analyser

TH-TISI, Microscope image measurement

TIS 1083-1992 Standard for measurement of coating thickness by microscopical method

International Electrotechnical Commission (IEC), Microscope image measurement

IEC 63145-21-20:2022 Eyewear display - Part 21-20: Specific measurement methods for VR image quality - Screen door effect
IEC 62906-5-3:2021 Laser display devices - Part 5-3: Measuring methods of image quality for laser projection display
IEC 62341-6-3:2017 Organic light emitting diode (OLED) displays - Part 6-3: Measuring methods of image quality
IEC 61988-2-3:2009 Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation
IEC 62341-6-3:2012 Organic light emitting diode (OLED) displays - Part 6-3: Measuring methods of image quality

(U.S.) Ford Automotive Standards, Microscope image measurement

FORD FLTM EU-BA 053-1-2000 MICROSCOPICAL METHOD OF MEASURING DECARBURIZATION ON SPRING STEELS

工业和信息化部, Microscope image measurement

SJ/T 11727-2018 Portable display device image quality measurement method

Professional Standard - Petrochemical Industry, Microscope image measurement

SH/T 0336-1994 Determination method of grease impurity content (microscopic method)

Group Standards of the People's Republic of China, Microscope image measurement

T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
T/GDASE 0008-2020 Determination of Young's modulus of graphene film
T/CSP 8-2021 Particle technology—Microbubble size analysis —Submerged dynamic image analysis method

CZ-CSN, Microscope image measurement

CSN 65 6337-1974 Determination of mechanical impurities content using a microscope
CSN ISO 1463:1993 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Microscope image measurement

GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
GB/T 6462-2005 Metallic and oxide coatings-Measurement of coating thinckness-Microscopical method
GB/T 42659-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/T 32282-2015 Measurement of Dislocation Density in Gallium Nitride Single Crystal by Cathodoluminescence Microscopy
GB/T 6462-1986 Metallic and oxide coatings--Measurement of coating thickness--Microscopical method

农业农村部, Microscope image measurement

NY/T 2870-2015 Microscopic imaging method for rapid detection of linear density of jute and kenaf fibers

VN-TCVN, Microscope image measurement

TCVN 6035-1995 Textiles.Cotton fibres.Evaluation of maturity.Microscopic method

PT-IPQ, Microscope image measurement

NP 3160-1986
NP 3563-1988 Textiles Cotton fibres. Evaluation of maturity. Microscópio method

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Microscope image measurement

IPC TM-650 2.2.14.1-1995 Solder Powder Particle Size Distribution - Measuring Microscope Method

KR-KS, Microscope image measurement

KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS C 7116-2008(2023) Organic light emitting diode(OLED) displays－Measuring method of image sticking

European Committee for Standardization (CEN), Microscope image measurement

EN ISO 19232-5:2013 Non-destructive testing - Image quality of radiographs - Part 5: Determination of the image unsharpness value using duplex wire-type image quality indicators [Superseded: CEN EN 462-5]
EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)

CEN - European Committee for Standardization, Microscope image measurement

EN ISO 19232-5:2018 Non-destructive testing - Image quality of radiographs - Part 5: Determination of the image unsharpness and basic spatial resolution value using duplex wire-type image quality indicators

Danish Standards Foundation, Microscope image measurement

DS/ISO/TS 22292:2021 Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
DS/IEC 62906-5-3:2021 Laser display devices – Part 5-3: Measuring methods of image quality for laser projection displays
DS/EN ISO 1463:1994 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/EN 61988-2-4:2011 Plasma display panels - Part 2-4: Measuring methods - Visual quality: Image artifacts

FI-SFS, Microscope image measurement

SFS 3458-1989

Association of German Mechanical Engineers, Microscope image measurement

VDI/VDE 2655 Blatt 1.1-2008 Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
VDI/VDE 2655 Blatt 1.2-2010 Optical measurement of microtopography - Calibration of confocal microscopes and depth setting standards for roughness measurement
VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method

SE-SIS, Microscope image measurement

SIS SS-ISO 1463:1983 Meta I lic and oxide coatings - Measure- ment of coating thickness - Microscopi- cal method
SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS 11 11 16-1987 Steel - Method for assessment of the content of non-metallic inclusions - Microscopic methods - Jernkontorets inclusion chart II for the assessment of non-metallic inclusions

RO-ASRO, Microscope image measurement

STAS 10552-1976 DETERMINATION OF THE DELTA-FERRITE CONTENT IN THE DEPOSITED METAL BY WELDING OF AUSTENITICAL STEELS Microscopic method
STAS 9070-1981 WOOL Determination of fibre diameter and of content of medullated fibres by tlie projection microscope

ZA-SANS, Microscope image measurement

SANS 144:1982 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method

German Institute for Standardization, Microscope image measurement

DIN 58959-4:1997 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN EN 61988-2-4:2012-04 Plasma display panels - Part 2-4: Measuring methods - Visual quality: Image artifacts (IEC 61988-2-4:2011); German version EN 61988-2-4:2011

PL-PKN, Microscope image measurement

PN C05551-1987 Water and waste water Determination of the phytoplankton ?uantity by using the inverted microscope

RU-GOST R, Microscope image measurement

GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
GOST 8.003-2010 State system for ensuring the uniformity of measurements. Tool-making microscopes. Verification procedure
GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
GOST R ISO 4967-2015 Steel. Determination of content of nonmetallic inclusions. Micrographic method using standard diagrams

ES-UNE, Microscope image measurement

UNE-EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)
UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
UNE-EN 61988-2-4:2011 Plasma display panels - Part 2-4: Measuring methods - Visual quality: Image artifacts (Endorsed by AENOR in January of 2012.)

国家市场监督管理总局、中国国家标准化管理委员会, Microscope image measurement

GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)

PH-BPS, Microscope image measurement

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

Professional Standard - Nuclear Industry, Microscope image measurement

EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

Professional Standard - Commodity Inspection, Microscope image measurement

SN/T 3231-2012 Determination of asbestos in talcum.Polarized light microscope and X-ray diffraction method

AENOR, Microscope image measurement

UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
UNE-EN ISO 1463:2005 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003)

Lithuanian Standards Office , Microscope image measurement

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
LST EN ISO 1463:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003)
LST EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)

AT-ON, Microscope image measurement

OENORM EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)

CH-SNV, Microscope image measurement

SN EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)

European Committee for Electrotechnical Standardization（CENELEC）, Microscope image measurement

EN 61988-2-4:2011 Plasma display panels - Part 2-4: Measuring methods - Visual quality: Image artifacts