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Diffraction peak crystal form

Diffraction peak crystal form, Total:168 items.

In the international standard classification, Diffraction peak crystal form involves: Inorganic chemicals, Pipeline components and pipelines, Education, Testing of metals, Non-destructive testing, Plastics, Products of the chemical industry, Production of metals, Analytical chemistry, Vocabularies, Semiconducting materials, Fuels, Water quality, Ceramics, Paint ingredients, Linear and angular measurements, Non-ferrous metals, Electronic display devices, Air quality, Semiconductor devices, Optical equipment.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Diffraction peak crystal form

GB/T 30904-2014 Inorganic chemicals for industrial use.Crystal form analysis.X-ray diffraction method
GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
GB/T 36165-2018 Determination of average grain size of metal.Electron backscatter diffraction (EBSD)method
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
GB/T 23413-2009 Determination of crystallite size and micro-strain of nano-materials.X-ray diffraction line broadening method
GB/T 30793-2014 Measuring ratio of anatase to rutile in titanium dioxide pigments by X-ray diffraction

Fujian Provincial Standard of the People's Republic of China, Diffraction peak crystal form

DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)

National Metrological Verification Regulations of the People's Republic of China, Diffraction peak crystal form

JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG 629-1989 Verification Regulation for Polycrystalline X-Ray Diffractometer
JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
JJG(电子) 15003-1988 3280 type radio frequency crystal marker signal generator trial verification regulations

Professional Standard - Education, Diffraction peak crystal form

JY/T 0587-2020 General Principles of Polycrystal X-ray Diffraction Methods
JY/T 009-1996 General Principles of Rotating Target Polycrystal X-ray Derivation Method
JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

Professional Standard - Non-ferrous Metal, Diffraction peak crystal form

YS/T 785-2012 Determination of relative crystallinity of zeolite sodium A by X-ray diffraction
YS/T 976-2014 Determination of α-alumina content in calcined alumina by X-ray diffraction

British Standards Institution (BSI), Diffraction peak crystal form

BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
BS ISO 19950:2015 Aluminium oxide primarily used for the production of aluminium. Determination of alpha alumina content. Method using X-ray diffraction net peak areas
BS ISO 20203:2005 Carbonaceous materials used in the production of aluminium. Calcined coke. Determination of crystallite size of calcined petroleum coke by X-ray diffraction
BS EN 61747-30-1:2012 Liquid crystal display devices. Measuring methods for liquid crystal display modules. Transmissive type
BS ISO 20203:2006 Carbonaceous materials used in the production of aluminium - Calcined coke - Determination of crystallite size of calcined petroleum coke by X-ray diffraction
21/30447603 DC BS EN IEC 61747-30-1. Liquid crystal display devices - Part 30-1. Measuring methods for liquid crystal display modules. Transmissive type

工业和信息化部, Diffraction peak crystal form

SH/T 1827-2019 Determination of crystallinity of plastics by X-ray diffraction method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Diffraction peak crystal form

GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals

Japanese Industrial Standards Committee (JISC), Diffraction peak crystal form

JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry

German Institute for Standardization, Diffraction peak crystal form

DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN EN 1330-11:2007-09 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycristalline and amorphous materials; Trilingual version EN 1330-11:2007
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycristalline and amorphous materials; Trilingual version EN 1330-11:2007
DIN 50433-1:1976 Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction
DIN EN 61747-30-1:2013-03 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type (IEC 61747-30-1:2012); German version EN 61747-30-1:2012 / Note: DIN EN 61747-6 (2004-12) remains valid alongside this standard until 2...
DIN EN 61747-6-2:2012-02 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type (IEC 61747-6-2:2011); German version EN 61747-6-2:2011

European Committee for Standardization (CEN), Diffraction peak crystal form

EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 1: General principles

Association Francaise de Normalisation, Diffraction peak crystal form

NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
NF EN 1330-11:2007 Essais non destructifs - Terminologie - Partie 11 : diffraction des rayons X de matériaux polycristallins et amorphes
NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
NF EN 13925-3:2005 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 3 : appareillage
NF EN 13925-1:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1 : principes généraux
NF A09-020-11*NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11 : Terms used in X-ray diffraction from polycrystalline and amorphous materials.
NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
NF X43-600-1*NF ISO 16258-1:2015 Workplace Air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: direct-on-filter method
NF ISO 16258-2:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 2 : méthode indirecte d'analyse
NF C93-547-30-1*NF EN 61747-30-1:2013 Liquid crystal display devices - Part 30-1 : measuring methods for liquid crystal display modules - Transmissive type
NF C93-547-6-2*NF EN 61747-6-2:2012 Liquid crystal display devices - Part 6-2 : measuring methods for liquid crystal display modules - Reflective type
NF EN 61747-6-2:2012 Dispositifs d'affichage à cristaux liquides - Partie 6-2 : méthodes de mesure pour les modules d'affichage à cristaux liquides - Type réflexible
NF EN 61747-30-1:2013 Dispositifs d'affichage à cristaux liquides - Partie 30-1 : méthodes de mesure pour les modules d'affichage à cristaux liquides - Type transmissif
NF ISO 16258-1:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 1: méthode directe d'analyse sur filtre

Danish Standards Foundation, Diffraction peak crystal form

DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
DS/EN 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
DS/EN 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type

Lithuanian Standards Office , Diffraction peak crystal form

LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
LST EN 1330-11-2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
LST EN 61747-6-2004 Liquid crystal and solid-state display devices. Part 6: Measuring methods for liquid crystal modules. Transmissive type (IEC 61747-6:2004)
LST EN 61747-6-2-2011 Liquid crystal display devices -- Part 6-2: Measuring methods for liquid crystal display modules - Reflective type (IEC 61747-6-2:2011)
LST EN 61747-30-1-2012 Liquid crystal display devices -- Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type (IEC 61747-30-1:2012)

AENOR, Diffraction peak crystal form

UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
UNE-EN 1330-11:2008 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycrystalline and amorphous materials

American Society for Testing and Materials (ASTM), Diffraction peak crystal form

ASTM D5357-03 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-Ray Diffraction
ASTM D5357-19 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM E2627-13(2019) Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
ASTM D5187-91(2007) Standard Test Method for Determination of Crystallite Size (Lc of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D934-80(2003) Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM D5187-91(2002) Standard Test Method for Determination of Crystallite Size (L_c) of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D5187-91(1997) Standard Test Method for Determination of Crystallite Size (L_c) of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D5357-98 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-Ray Diffraction
ASTM D8352-20 Standard Test Method for Determination of Relative Crystallinity of Zeolite Beta by X-Ray Diffraction
ASTM D5357-03(2008)e1 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM D5357-03(2013) Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM D934-08 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM E2627-13 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
ASTM D934-80(1999) Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM D5758-01(2021) Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D5187-10 Standard Test Method for Determination of Crystallite Size (Lc of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D5758-01(2011)e1 Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D934-22 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM D934-13 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM D5758-01(2015) Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D5187-10(2015)e1 Standard Test Method for Determination of Crystallite Size (Lc) of Calcined Petroleum Coke by X-Ray Diffraction
ASTM E2627-10 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
ASTM D5380-93(2003) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM D5187-21 Standard Test Method for Determination of Crystallite Size (Lc) of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D5380-93(2021) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM D3906-19 Standard Test Method for Determination of Relative X-ray Diffraction Intensities of Faujasite-Type Zeolite-Containing Materials
ASTM D3906-03(2008) Standard Test Method for Determination of Relative X-ray Diffraction Intensities of Faujasite-Type Zeolite-Containing Materials
ASTM D3906-03(2013) Standard Test Method for Determination of Relative X-ray Diffraction Intensities of Faujasite-Type Zeolite-Containing Materials
ASTM D3906-03 Standard Test Method for Determination of Relative X-ray Diffraction Intensities of Faujasite-Type Zeolite-Containing Materials
ASTM F528-99 Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
ASTM F528-99(2005) Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors

Professional Standard - Nuclear Industry, Diffraction peak crystal form

EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method

国家市场监督管理总局、中国国家标准化管理委员会, Diffraction peak crystal form

GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 37054-2018 Nanotechnology—Testing ratio of anatase to rutile in nano-titanium dioxide—X-ray diffraction
GB/T 18910.62-2019 Liquid crystal display devices—Part 6-2: Measuring methods for liquid crystal display modules—Reflective type

Professional Standard - Energy, Diffraction peak crystal form

NB/SH/T 6015-2020 Determination of Unit Cell Parameters of ZSM-23 Molecular Sieve by X-ray Diffraction Method
NB/SH/T 6033-2021 Determination of unit cell parameters of ZSM-22 molecular sieve X-ray diffraction method
NB/SH/T 6024-2021 Determination of Relative Crystallinity of ZSM-5 Molecular Sieve X-ray Diffraction Method
NB/SH/T 0339-2021 Determination of Unit Cell Parameters of Faujasite Molecular Sieve X-ray Diffraction Method

International Organization for Standardization (ISO), Diffraction peak crystal form

ISO/TTA 3:2001 Polycrystalline materials - Determination of residual stresses by neutron diffraction
ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
ISO 19950:2015 Aluminium oxide primarily used for the production of aluminium - Determination of alpha alumina content - Method using X-ray diffraction net peak areas
ISO 20203:2005 Carbonaceous materials used in the production of aluminium - Calcined coke - Determination of crystallite size of calcined petroleum coke by X-ray diffraction
ISO 16258-1:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: Direct-on-filter method
ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis

Professional Standard - Electron, Diffraction peak crystal form

SJ 20714-1998 Test method for sub-surface damege of gallium arsenide polished wafer by X-ray double crystal diffraction

IT-UNI, Diffraction peak crystal form

UNI 6966-1971

Professional Standard - Commodity Inspection, Diffraction peak crystal form

SN/T 3514-2013 Identification method of texture analysis for grain oriented and non-oriented electrical steels.X-ray diffraction(XRD)

未注明发布机构, Diffraction peak crystal form

BS ISO 20203:2005(2006) Carbonaceous materials used in the production of aluminium — Calcined of crystallite size of calcined petroleum coke by X - ray diffraction
BS EN 61747-6-2:2011(2012) Liquid crystal display devices Part 6 - 2 : Measuring methods for liquid crystal display modules — Reflective type

Professional Standard - Chemical Industry, Diffraction peak crystal form

HG/T 6149-2023 Determination of Silica Crystal Phase Content in Hydrogenation Catalyst and Its Support X-ray Diffraction Method

RU-GOST R, Diffraction peak crystal form

GOST R 8.696-2010 State system for ensuring the uniformity of measurements. Interplanar spacings in crystals and the intensity distribution in diffraction patterns. Method for measurement by means of an electron diffractometer
GOST R ISO 20203-2017 Carbonaceous materials for the production of aluminium. Calcined coke. Determination of crystallite size of calcined petroleum coke by X-ray diffraction
GOST R ISO 16258-1-2017 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Part 1. Direct-on-filter method
GOST 18604.22-1978 Transistors bipolar. Methods for measuring collector-emitter and base-emitter saturation voltage
GOST R 59738-2021 Optics and photonics. Diffraction gratings. Types, main dimensions and parameters
GOST 18604.3-1980 Transistors bipolar. Methods for measuring collector and emitter capacitances

KR-KS, Diffraction peak crystal form

KS M ISO 20203-2016 Carbonaceous materials used in the production of aluminium－Calcined coke－Determination of crystallite size(Lc) of calcined petroleum coke by X-ray diffraction

Korean Agency for Technology and Standards (KATS), Diffraction peak crystal form

KS M ISO 20203-2016(2021) Carbonaceous materials used in the production of aluminium－Calcined coke－Determination of crystallite size(Lc) of calcined petroleum coke by X-ray diffraction
KS C IEC 61747-6:2005 Liquid crystal display devices－Part 6：Measuring methods for liquid crystal modules－Transmissive type
KS M ISO 20203:2011 Carbonaceous materials used in the production of aluminium-Calcined coke-Determination of crystallite size(Lc) of calcined petroleum coke by X-ray diffraction
KS M ISO 20203:2016 Carbonaceous materials used in the production of aluminium－Calcined coke－Determination of crystallite size(Lc) of calcined petroleum coke by X-ray diffraction
KS C IEC 61747-6-2:2006 Liquid crystal display devices-Part 6-2:Measuring methods for liquid crystal modules-Reflective type

CENELEC - European Committee for Electrotechnical Standardization, Diffraction peak crystal form

EN 61747-6:2004 Liquid crystal and solid-state display devices Part 6: Measuring methods for liquid crystal modules Transmissive type
EN 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type

European Committee for Electrotechnical Standardization（CENELEC）, Diffraction peak crystal form

EN 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type

International Electrotechnical Commission (IEC), Diffraction peak crystal form

IEC 61747-6:2004 Liquid crystal and solid-state display devices - Part 6: Measuring methods for liquid crystal modules - Transmissive type
IEC 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
IEC 61747-6-2:2011/COR1:2012 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type; Corrigendum 1
IEC 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type

ES-UNE, Diffraction peak crystal form

UNE-EN 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type (Endorsed by AENOR in November of 2011.)
UNE-EN 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type (Endorsed by AENOR in October of 2012.)

Defense Logistics Agency, Diffraction peak crystal form

DLA SMD-5962-87560 REV F-2006 MICROCIRCUIT, DIGITAL, TTL-TO-ECL TRANSLATOR, MONOLITHIC SILICON
DLA SMD-5962-87508 REV E-2006 MICROCIRCUIT, DIGITAL, ECL-TO-TTL TRANSLATOR, MONOLITHIC SILICON
DLA SMD-5962-91530 REV A-2006 MICROCIRCUIT, DIGITAL, ECL, HEX TTL-TO-ECL TRANSLATOR, MONOLITHIC SILICON
DLA SMD-5962-91531 REV A-2004 MICROCIRCUIT, DIGITAL, ECL, HEX ECL-TO-TTL TRANSLATOR, MONOLITHIC SILICON
DLA SMD-5962-92075 REV B-2006 MICROCIRCUIT, DIGITAL, ECL, 68030/40 ECL/TTL CLOCK DRIVER, MONOLITHIC SILICON

U.S. Military Regulations and Norms, Diffraction peak crystal form

ARMY MIL-PRF-55310/25 D-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 25 MHz THROUGH 175 MHz, HERMETIC SEAL, SQUARE WAVE, EMITTER COUPLED LOGIC