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high power microscope magnification

high power microscope magnification, Total:24 items.

In the international standard classification, high power microscope magnification involves: Optical equipment, Optoelectronics. Laser equipment, Machine tool systems, Integrated circuits. Microelectronics.

Japanese Industrial Standards Committee (JISC), high power microscope magnification

• JIS B 7254:2007 Microscopes -- Magnification

American Society for Testing and Materials (ASTM), high power microscope magnification

• ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E1951-98 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
• ASTM E1951-02 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
• ASTM E1951-01 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
• ASTM E1951-14(2019) Standard Guide for Calibrating Reticles and Light Microscope Magnifications
• ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

British Standards Institution (BSI), high power microscope magnification

• BS ISO 8039:2014 Tracked Changes. Microscopes. Values, tolerances and symbols for magnification
• BS ISO 29301:2017 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures

Shanghai Provincial Standard of the People's Republic of China, high power microscope magnification

• DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
• DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

Defense Logistics Agency, high power microscope magnification

• DLA A-A-50207 A VALID NOTICE 3-2006 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
• DLA A-A-50207 A VALID NOTICE 2-2001 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
• DLA A-A-50207 A VALID NOTICE 1-1993 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
• DLA A-A-50207 A-1988 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
• DLA SMD-5962-89438 REV A-2004 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, 10-NONINVERTING REGISTER, MONOLITHIC SILICON

国家市场监督管理总局、中国国家标准化管理委员会, high power microscope magnification

• GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
• GB/T 22059-2018 Microscopes—Values, tolerances and symbols for magnification

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, high power microscope magnification

• GB/T 27788-2011 Microbeam analysis.Scanning electron microscopy.Guidelines for calibrating image magnification

International Organization for Standardization (ISO), high power microscope magnification

• ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
• ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures

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