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array spotter
array spotter, Total:112 items.
In the international standard classification, array spotter involves: Analytical chemistry, Fibre optic communications, Environmental protection, Mechanical structures for electronic equipment, Non-destructive testing, Medical equipment, Piezoelectric and dielectric devices, Electrical and electronic testing, Electronic component assemblies, Resistors, Integrated circuits. Microelectronics, Audio, video and audiovisual engineering, Welding, brazing and soldering, Road vehicle systems, Aerospace fluid systems and components, Materials for aerospace construction, Electrical equipment for working in special conditions, Aerospace electric equipment and systems, Electricity. Magnetism. Electrical and magnetic measurements, Semiconductor devices.
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, array spotter
工业和信息化部, array spotter
- YD/T 3024-2016 Array Erbium Doped Fiber Amplifier
- YD/T 3541-2019 Optical fiber array for planar optical waveguide devices
- SJ/T 11523-2015 Speaker performance test method for line array loudspeaker systems
- SJ/T 11714-2018 Main performance testing methods of acoustic waveguides for loudspeaker line arrays
American Society for Testing and Materials (ASTM), array spotter
- ASTM D1769-77(1982)e1 Method of Test for Linear Density of Cotton Fibers (Array Sample)
- ASTM E2597-07e1 Standard Practice for Manufacturing Characterization of Digital Detector Arrays
- ASTM E2736-17 Standard Guide for Digital Detector Array Radiography
- ASTM E2736-10 Standard Guide for Digital Detector Array Radiology
- ASTM E2736-17(2022) Standard Guide for Digital Detector Array Radiography
- ASTM E2597-07 Standard Practice for Manufacturing Characterization of Digital Detector Arrays
- ASTM E2597/E2597M-22 Standard Practice for Manufacturing Characterization of Digital Detector Arrays
- ASTM E2597/E2597M-14 Standard Practice for Manufacturing Characterization of Digital Detector Arrays
- ASTM E2737-10(2018) Standard Practice for Digital Detector Array Performance Evaluation and Long-Term Stability
- ASTM E2698-18 Standard Practice for Radiographic Examination Using Digital Detector Arrays
- ASTM E2698-18e1 Standard Practice for Radiographic Examination Using Digital Detector Arrays
- ASTM E2884-13 Standard Guide for Eddy Current Testing of Electrically Conducting Materials Using Conformable Sensor Arrays
- ASTM E2737-10 Standard Practice for Digital Detector Array Performance Evaluation and Long-Term Stability
- ASTM E2698-10 Standard Practice for Radiological Examination Using Digital Detector Arrays
Group Standards of the People's Republic of China, array spotter
- T/CAEPI 17-2019 Array muffler technical requirements
- T/GDMA 39-2021 Delayed Surface Acoustic Wave Sensor Array Specifications
- T/CSEE /Z0028-2017 Guidelines for the detection and location of discharge points in substations based on antenna arrays
- T/CAIACN 005-2021 Method of measuring sound field characteristics of loudspeaker array by aircraft
Defense Logistics Agency, array spotter
- DLA MIL-PRF-19500/474 G-2008 SEMICONDUCTOR DEVICE, SILICON, MULTIPLE DIODE ARRAYS, TYPES 1N5768, 1N5770, 1N5772, 1N5774, 1N6100, 1N6101, 1N6496, 1N6506, 1N6507, 1N6508, 1N6509, 1N6510, AND 1N6511, JAN, JANTX, JANTXV, AND JANS
- DLA DSCC-DWG-07005-2006 RESISTOR, CHIP, FIXED, FILM, 8 PIN ARRAY, STYLE 1206
- DLA A-A-59769 VALID NOTICE 1-2011 Resistor Networks, Ball Grid Array Terminators General Requirements for
- DLA A-A-59769 A-2013 RESISTOR NETWORKS, BALL GRID ARRAY TERMINATORS GENERAL REQUIREMENTS FOR
- DLA SMD-5962-94730 REV E-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-97522 REV B-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-97523 REV B-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-97524 REV B-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-97525 REV B-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-85155 REV G-2006 MICROCIRCUIT, MEMORY, BIPOLAR, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-85065 REV B-2010 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-88637 REV D-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-87528 REV A-2011 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-87530 REV A-2011 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-89841 REV K-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE ARRAY LOGIC (EEPLD), MONOLITHIC SILICON
- DLA MIL-DTL-27434/9 A-2008 ADAPTER, CONNECTOR, COAXIAL, RADIOFREQUENCY, BETWEEN SERIES, SERIES LC, SOCKET CONTACT, TO SERIES N, SOCKET CONTACT, TYPE UG?70A/U
- DLA SMD-5962-98513 REV A-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 13000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-92252 REV E-2011 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 5000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-88638 REV D-2011 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC CELL ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-95521 REV C-2013 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 10,000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-89713 REV G-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 4200 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-89948 REV G-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 2000 GATE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA MIL-DTL-27434/15 A-2008 ADAPTER, CONNECTOR, COAXIAL, RADIOFREQUENCY, BETWEEN SERIES, SERIES BNC, PIN CONTACT, TO SERIES HN, SOCKET CONTACT, RIGHT ANGLE, TYPE UG?59B/U
- DLA SMD-5962-00543 REV C-2003 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 72,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-01508 REV D-2005 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 32,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-01515 REV E-2005 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 72,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-01518 REV D-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 32,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-91695 REV A-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY (600 GATES), MONOLITHIC SILICON
- DLA MIL-M-38510/508 A VALID NOTICE 1-2010 Microcircuits, Memory, Digital, CMOS One-Time Programmable Array Logic, Monolithic Silicon
- DLA SMD-5962-91568 REV B-2013 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ONE-TIME PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA MIL-DTL-27434/15 A VALID NOTICE 1-2013 Adapter, Connector, Coaxial, Radiofrequency, Between Series, Series BNC, Pin Contact, to Series HN, Socket Contact, Right Angle, Type UG-559B/U
- DLA MIL-DTL-27434/10 A-2008 ADAPTER, CONNECTOR, COAXIAL, RADIOFREQUENCY, BETWEEN SERIES, SERIES LC, SOCKET CONTACT, TO SERIES N, SOCKET CONTACT, FLANGE MOUNT, TYPE UG?71A/U
- DLA SMD-5962-08224 REV A-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 4,000,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-01508 REV E-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 32,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-01515 REV F-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 72,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-90965 REV H-2011 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 2,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-04220 REV D-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 1,000,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-08224 REV B-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 4,000,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-92156 REV K-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 8000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-01515 REV G-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 72,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-93168 REV B-2013 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-93247 REV B-2013 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-01508 REV H-2013 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 32,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-87539 REV K-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE, PROGRAMMABLE ARRAY LOGIC, MONOLITHIC SILICON
- DLA SMD-5962-95520 REV C-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 2500 GATES, MONOLITHIC SILICON
- DLA SMD-5962-00543 REV D-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 72,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-96837 REV A-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY 8000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-04219 REV C-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 250,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-04220 REV C-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 1,000,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-04221 REV C-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 2,000,000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-08224-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 4,000,000 GATES, MONOLITHIC SILICON
British Standards Institution (BSI), array spotter
- BS EN 60191-6-16:2007 Mechanical standardization of semiconductor devices - Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
- BS EN 62137-4:2014 Electronics assembly technology. Endurance test methods for solder joint of area array type package surface mount devices
- BS EN 62777:2016 Quality evaluation method for the sound field of directional loudspeaker array system
U.S. Military Regulations and Norms, array spotter
Professional Standard - Machinery, array spotter
- JB/T 11279-2012 Non-destructive testing instruments.Eddy current line array probe
- JB/T 11780-2014 Non-destructive testing instrument.Characterization and verification of array eddy current testing instrument
NEMA - National Electrical Manufacturers Association, array spotter
Military Standard of the People's Republic of China-General Armament Department, array spotter
- GJB 4907-2003 General requirements for assembly of ball grid array packaged devices
- GJB 597A/18-2003 Semiconductor integrated circuit CMOS gate array device specifications
- GJB 10176-2021 General specification for plate array multilayer ceramic fixed capacitors
Professional Standard - Electron, array spotter
- SJ 20758-1999 Semiconductor integrated circuits Specification for COMS gate array devices
国家市场监督管理总局、中国国家标准化管理委员会, array spotter
- GB/T 38240-2019 Non-destructive testing instruments—Standard practice for manufacturing characterization of digital detector arrays
European Committee for Electrotechnical Standardization(CENELEC), array spotter
- EN 62777:2016 Quality evaluation method for the sound field of directional loudspeaker array system
- EN 60191-6-13:2007 Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array and Fine-pitch Land Grid Array (FBGA/FLGA)
- EN 60191-6-13:2016 Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA)
Association Francaise de Normalisation, array spotter
- NF C97-327*NF EN 62777:2016 Quality evaluation method for the sound field of directional loudspeaker array system
- NF A89-512:2012 Non-destructive testing of welds - Ultrasonic testing - Use of automated phased array technology
German Institute for Standardization, array spotter
- DIN EN 62777:2016-11 Quality evaluation method for the sound field of directional loudspeaker array systems (IEC 62777:2016); German version EN 62777:2016
- DIN ISO 11217:1994 Aerospace; hydraulic system fluid contamination; location of sampling points and criteria for sampling; identical with ISO 11217:1993
ES-UNE, array spotter
- UNE-EN 62777:2016 Quality Evaluation Method for the Sound Field of Directional Loudspeaker Array System (Endorsed by AENOR in July of 2016.)
GB-REG, array spotter
工业和信息化部/国家能源局, array spotter
- JB/T 13150-2017 Non-destructive testing instrument Eddy current detector with variable array probe
International Organization for Standardization (ISO), array spotter
- ISO 13588:2012 Non-destructive testing of welds - Ultrasonic testing - Use of automated phased array technology
Professional Standard - Urban Construction, array spotter
- CJ/T 172-2002 Mini impact dot matrix printer of electronic taximeter
国家药监局, array spotter
- YY/T 1869-2023 Detector array dose measurement system performance and test methods
Korean Agency for Technology and Standards (KATS), array spotter
RO-ASRO, array spotter
- STAS 11176/3-1984 SAMPLING OSCILOSCOPES Method of expression of oscilloscope characteristics
IEC - International Electrotechnical Commission, array spotter
- IEC 62777:2016 Quality evaluation method for the sound field of directional loudspeaker array systems (Edition 1.0)
KR-KS, array spotter
- KS P 1018-2012(2022) The technology for gene expression analysis using DNA microarrays-Methods for isolation of genomic samples and quality control
Electronic Components, Assemblies and Materials Association, array spotter
- ECA 540H000-1998 Sectional Specification for Burn-In Sockets Used with Ball Grid Array Devices for Use in Electronic Equipment
- ECA 540HAAA-2000 Detail Specification for Burn-In Sockets Used with Ball Grid Array Devices for Use in Electronic Equipment
Professional Standard - Electricity, array spotter
- DL/T 2086-2020 Microphone array measurement method for noise of high voltage transmission lines and substations
European Committee for Standardization (CEN), array spotter
- EN 3662-006:2006 Aerospace series - Circuit breakers, three-pole, temperature compensated, rated current 20 A to 50 A - Part 006: With polarized signal contact - Bus-bar version - Product standard