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chemiluminescent spectroscopy
chemiluminescent spectroscopy, Total:38 items.
In the international standard classification, chemiluminescent spectroscopy involves: Ferroalloys, Testing of metals, Refractories, Petroleum products in general, Soil quality. Pedology, Metalliferous minerals, Analytical chemistry, Non-metalliferous minerals, Products of the chemical industry, Ferrous metals, Non-ferrous metals, Inorganic chemicals, Water quality.
Association Francaise de Normalisation, chemiluminescent spectroscopy
- NF A11-103:1977 Chemical analysis of ferroniobium. Determination of niobium by X ray fluorescence spectrometry.
- FD A06-326*FD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al in ferro-silicon by X-ray fluorescence spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, chemiluminescent spectroscopy
- GB/T 29513-2013 Chemical analysis of ferric-containing dust and sludge by XRF.Fused cast bead method
- GB/T 21114-2007 X-ray Fluorescence Spectrochemical Analysis of Refractory Materials - Molten Glass Disk Method
- GB/T 17416.2-1998 Method for chemical analysis of Zirconium ores.Determination of Zirconium and Hafnium contents.X-ray fluorescence spectrometric method
- GB/T 42360-2023 Total Reflection X-ray Fluorescence Spectroscopic Analysis of Water for Surface Chemical Analysis
- GB/T 14506.28-1993 Silicate rocks. Determination of contents of major and minor elements. X-ray fluorescence spectrometric method
- GB/T 18882.2-2002 Chemical analysis methods for mixed rare earth oxide of ion-absorpted type RE ore-Determination of fifteen REO relative content--X-ray fluorescence spectrometric method
- GB/T 12690.5-1990 Praseodymium oxide--Determination of lanthanum oxide, cerium oxide, neodymium oxide, samarium oxide and yttrium oxide contents--X ray fluorescence spectrometric method
- GB/T 8762.5-1988 Yttrium oxide of phosphor grade--Determination of trace rare earth oxide contents--Spectrochemical method and direct spectrographic method
- GB/T 12690.7-1990 Neodymium and neodymium oxide--Determination of lanthanum oxide, cerium oxide, praseodymium oxide, samarium oxide, yttrium oxide contents--X-ray fluorescence spectrometric method
- GB/T 8762.7-1988 Europium oxide of phosphor grade--Determination of cerium oxide, praseodymium oxide, samarium oxide, gadolinium oxide and dysprosium oxide contents--Spectrochemical method and direct spectrographic method
- GB/T 21191-2007 Atomic fluorescence spectrometer
国家市场监督管理总局、中国国家标准化管理委员会, chemiluminescent spectroscopy
- GB/T 21114-2019 Refractories—Chemical analysis by X-ray fluorescence(XRF)—Fused cast-bead method
- GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Professional Standard - Energy, chemiluminescent spectroscopy
- NB/SH/T 0863-2013 Standard guide for determination of chemical elements in fluid catalytic cracking catalysts by X-ray fluorescence spectrometry(XRF)
RU-GOST R, chemiluminescent spectroscopy
- GOST 33850-2016 Soils. Determination of chemical composition by X-Ray fluorescence spectrometry
PL-PKN, chemiluminescent spectroscopy
- PN H04239-1992 Chemical analysis of hardmetals. Determination of tantalum, niobium, cobalt, titanium and tungsten contents in solutions of samples by X-ray fluorescence spectrometry
Professional Standard - Chemical Industry, chemiluminescent spectroscopy
- HG/T 6150-2023 X-ray fluorescence spectrometry method for chemical composition analysis of lubricating oil hydroisomerization catalyst
- HG/T 3494-1999 Chemical reagent.Fluorescein
British Standards Institution (BSI), chemiluminescent spectroscopy
- PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
- BS PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
- BS ISO 17331:2004+A1:2010 Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS 1902-9.2:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of silica refractories by X-ray fluorescence
European Committee for Standardization (CEN), chemiluminescent spectroscopy
- CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
- PD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
IPC - Association Connecting Electronics Industries, chemiluminescent spectroscopy
- IPC TM-650 2.3.44-2016 Determination of Thickness and Phosphorus Content in Electroless Nickel (EN) Layers by X-Ray Fluorescence (XRF) Spectrometry
International Organization for Standardization (ISO), chemiluminescent spectroscopy
- ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
- ISO 17331:2004 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Professional Standard - Agriculture, chemiluminescent spectroscopy
- 水产品质量安全检验手册 1.2.4.4-2005 Chapter 1 General Introduction Section 2 Analytical Methods for Aquatic Product Inspection 4. Physicochemical Analysis (4) Atomic Fluorescence Spectrometry
Danish Standards Foundation, chemiluminescent spectroscopy
- DS/CEN/TR 10354:2012 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
Korean Agency for Technology and Standards (KATS), chemiluminescent spectroscopy
- KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
American Society for Testing and Materials (ASTM), chemiluminescent spectroscopy
- ASTM D4763-06 Standard Practice for Identification of Chemicals in Water by Fluorescence Spectroscopy
- ASTM D4763-88(2001) Standard Practice for Identification of Chemicals in Water by Fluorescence Spectroscopy
- ASTM D4763-06(2012) Standard Practice for Identification of Chemicals in Water by Fluorescence Spectroscopy
- ASTM D4763-06(2020) Standard Practice for Identification of Chemicals in Water by Fluorescence Spectroscopy
Professional Standard - Non-ferrous Metal, chemiluminescent spectroscopy
- YS/T 536.7-2009 Methods for chemical analysis of bismuth.Determination of arsenic content.Atomic fluorescence spectrometric method
- YS/T 536.11-2009 Methods for chemical analysis of bismuth.Determination of mercury content.Atomic fluorescence spectrometric method