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High frequency device test

High frequency device test, Total:500 items.

In the international standard classification, High frequency device test involves: Electricity. Magnetism. Electrical and magnetic measurements, Applications of information technology, Electromechanical components for electronic and telecommunications equipment, Materials for aerospace construction, Power stations in general, Road vehicle systems, Character sets and information coding, Optics and optical measurements, Transformers. Reactors, Semiconductor devices, Lubricants, industrial oils and related products, Power transmission and distribution networks, Components and accessories for telecommunications equipment, Transport, Equipment for the chemical industry, Equipment for petroleum and natural gas industries, Special measuring equipment for use in telecommunications, Protection against crime, Audio, video and audiovisual engineering, Radiocommunications, Telecontrol. Telemetering, Information technology (IT) in general, Integrated circuits. Microelectronics, Electrical and electronic testing, Industrial furnaces, Rectifiers. Convertors. Stabilized power supply, Electronic tubes, Components for electrical equipment, Geology. Meteorology. Hydrology, Telecommunication systems, Printed circuits and boards, Software development and system documentation, Iron and steel products, Fibre optic communications, Lamps and related equipment, Telecommunication terminal equipment, Fuels, Fasteners for aerospace construction, Acoustics and acoustic measurements, On-board equipment and instruments, Magnetic materials, Electronic components in general, Vocabularies, Electrical accessories, Non-destructive testing, Protection against fire, Optoelectronics. Laser equipment, Industrial automation systems, Piezoelectric and dielectric devices, Insulating fluids, Farming and forestry, Road vehicles in general, Test conditions and procedures in general, Switchgear and controlgear, Environmental testing, Mining equipment, Electromagnetic compatibility (EMC), Capacitors, Medical equipment, Shipbuilding and marine structures in general, Sports equipment and facilities, Lubrication systems, Radiation protection, Semiconducting materials, Aircraft and space vehicles in general.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, High frequency device test

GB/T 12115-1989 Measuring methods for high frequency signal generators
GB/T 12272-1990 Measuring method of radio-frequency high potential withstanding voltage for radio-frequency coaxial connectors
GB 12272-1990 RF coaxial connector resistance to RF high potential voltage test method
GB/T 43031-2023 Test method for frequency response parameters of optical devices used in communications
GB/T 12114-1989 Generic specification of high frequency signal generators
GB/T 13170.4-1991 Test charts of reflection for television.High-frequency test chart
GB/T 28789-2012 Video traffic incident detector
GB/T 26962-2011 Spcifications for high-frequency electromagnetic field comprehensive water treatment device
GB 6996.4-1986 High-frequency test chart of transparencies for television
GB/T 6996.4-1986 High-frequency test chart of transparencies for television
GB/T 18902-2002 Performance requirements and test methods for UHF Measuring Distance Equipment(DME)
GB/T 15151.2-1994 Measuring methods for frequency counters
GB/T 13184-1991 Measuring methods for sweep signal generators
GB/T 12271-1990 Measuring methods of RF insertion loss for radio-frequency coaxial connectors
GB/T 42025-2022 Intelligent manufacturing—Radio frequency identification system—Test methods for UHF RFID system performance
GB/T 12180-1990 Test methods for general purpose low frequency signal generators
GB/T 26830-2011 Non-destructive testing instruments.High frequency constant potential X-ray equipment
GB/T 3789.18-1991 Measurements of the electrical properties of transmitting tubes--Measuring methods of high frequency loss for interelectrode insulators
GB/T 43023-2023 Nonlinear Measurement Guidelines for RF Surface Acoustic Wave (SAW) Devices and Bulk Acoustic Wave (BAW) Devices
GB/T 18897-2002 Performance requirements and test methods for Doppler very high frequency omnidirectional radio range
GB/T 18310.18-2001 Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-18: Tests-dry heat-high temperature endurance
GB/T 6587.8-1986 Line frequency and voltage tests for electronic measuring instruments
GB/T 21021-2007 RF connector, connector cable assemblies and cable.Intermodulation level measurement
GB/T 43027-2023 High voltage power converter module testing method
GB/T 10066.31-2007 Test methods for electroheat installations.Part 31: High-frequency induction heating installation.Test methods for the determination of power output of the generator
GB/T 12270-1990 Electrical tests and measuring procedures for radio-frequency coaxial connectors screening effectiveness

Jiangsu Provincial Standard of the People's Republic of China, High frequency device test

DB32/T 3416-2018 UHF radio frequency identification reader sensitivity test method
DB32/T 3415-2018 Test method for minimum activation power of UHF radio frequency identification tags

Electronic Components, Assemblies and Materials Association, High frequency device test

ECA 186-8E-1978 Passive Electronic Component Parts, Test Methods for; Method 8: Vibration, High Frequency
ECA 186-7E-1978 Passive Electronic Component Parts, Test Methods for; Method 7: Vibration Fatigue Test (Low Frequency, 10 to 55 Hertz)
ECA 483-1981 Standard Method of Test for Effective Series Resistance (ESR) and Capacitance of Multilayer Ceramic Capacitors at High Frequencies Editorially Corrected - February 1982

International Telecommunication Union (ITU), High frequency device test

ITU-R REPORT SM.2125-1-2011 Parameters of and measurement procedures on H/V/UHF monitoring receivers and stations
ITU-R F.1487 SPANISH-2000 Testing of HF Modems with Bandwidths of Up to About 12 kHz Using Ionospheric Channel Simulators
ITU-R F.1487 FRENCH-2000 TESTING OF HF MODEMS WITH BANDWIDTHS OF UP TO ABOUT 12 kHz USING IONOSPHERIC CHANNEL SIMULATORS

YU-JUS, High frequency device test

JUS N.S5.605-1985 Testing of high-frequency surgical equipment
JUS N.N6.136-1981 Radiocommunications. TV receivers. Methods of measurements. Electrical measurement at audio-fre- quencies. Conditions of measurements.
JUS N.A5.732-1984 Bask environmental testing procedures. Test Fda. Random vi brat ion wide band — Reproducibility High
JUS N.R4.220-1984 Radio-frequency connectors. General reguirements and testing
JUS N.A5.544-1989 Bigh-voltage test technicpies. Application gui?e for measuring ?evices

Professional Standard - Electricity, High frequency device test

DL/T 849.4-2004 General technical specification of test instruments used for power equipments Part 4: very low frequency high voltage generator
DL/T 846.11-2016 General Specifications for High Voltage Test Equipment Part 11: UHF Partial Discharge Detector
DL/T 848.4-2004 General technical specification of high voltage test devices Part 4: triple-frequency test transformer
DL/T 848.4-2019 General technical requirements for high-voltage test equipment Part 4: Triple frequency test transformer equipment
DL/T 846.13-2020 General Specifications for High Voltage Test Equipment Part 13: Arrester Monitor Testers
DL/T 1694.1-2017 Calibration specifications for high-voltage testing instruments and equipment Part 1: UHF partial discharge on-line monitoring device
DL/T 848.2-2004 General technical specification of high voltage test devices Part 2: power frequency high voltage test device
DL/T 848.2-2018 General Specifications for High Voltage Test Devices Part 2: Power Frequency High Voltage Test Devices
DL/T 2278-2021 Technical specification for partial discharge live detection equipment by high frequency method
DL/T 2033-2019 Test method for power unit of high voltage frequency converter used in thermal power plant
DL/T 1694.6-2020 Calibration specifications for high-voltage testing instruments and equipment Part 6: Ultra-low frequency dielectric loss tester for power cables
DL/T 846.1-2004 General technical specifications for high voltage test equipments Part 1: high voltage divider measuring system
DL/T 846.1-2016 General Specifications for High Voltage Test Equipment Part 1: High Voltage Divider Measurement System
DL/T 1534-2016 UHF detection method for partial discharge of oil-immersed power transformer
DL/T 690-1999 Synthetic testing of high-voltage alternating current circuit-breakers
DL/T 846.3-2004 General technical specifications for high voltage test equipments Part 3: high voltage switch integrate detector
DL/T 849.5-2004 General technical specification of test instruments used for power equipments Part 5: oscillating wave high voltage generator
DL/T 849.5-2019 General Specifications for Special Test Instruments for Power Equipment Part 5: Oscillating Wave High Voltage Generator
DL/T 849.6-2004 General technical specification of test instruments used for power equipments Part 6: high voltage resonant test system
DL/T 849.6-2016 General Specifications for Special Test Instruments for Power Equipment Part 6: High Voltage Resonance Test Device
DL/T 846.3-2017 General technical requirements for high-voltage test equipment Part 3: High-voltage switch comprehensive characteristic tester
DL/T 1694.3-2017 Calibration specification for high-voltage testing instruments and equipment Part 3: High-voltage switch action characteristic tester
DL/T 848.1-2004 General technical specification of high voltage test devices Part 1: high voltage DC generator
DL/T 848.1-2019 General Specifications for High Voltage Test Devices Part 1: DC High Voltage Generators
DL/T 1119-2010 General technical conditions of measuring instruments for power frequency parameters of transmission lines

Society of Automotive Engineers (SAE), High frequency device test

SAE J2521-2013 Disc and Drum Brake Dynamometer Squeal Noise Test Procedure
SAE J3002-2021 Disc and Drum Brake Dynamometer Low-Frequency Noise Test Procedure
SAE TS332-2-1987 TS332 Test for Electrical Connectors High Temperature Cyclic Endurance

Professional Standard - Electron, High frequency device test

SJ 20551-1995 Test methods for high ferequency interference field tester
SJ 20550-1995 General specification for high frequency interference field tester
SJ 1789-1981 Method of measurement for maximum operational frequency of silicon single phase bridge rectifiers,up to 5A
SJ 20938-2005 Microwave circuits.Measuring methods for frequency converters
SJ 442-1973 Measurement conditions for high-voltage rectifier tubes
SJ 1488-1979 Method of measurement for rated high-frequency on-state mean current Ir of reverse blocking high-frequency thyristors
SJ 50033/1-1994 Semiconductor discrete device.Detail specification for type 3DA150 high frequency and power transistor
SJ 50033/103-1996 Semiconductor discrete devices--Detail specification for Type 3DA89 high-frequency power transistor
SJ 1230-1977 Methods of measurement for high frequency rectified current of germanium detector diodes
SJ/T 11227-2000 Detail specification for electronic components.Type 3DA98 NPN silicon high-frequency power transistor
SJ/T 10370.2-1993 Measuring methods on TV channel signal generator
SJ 1880-1981 Methods of measurement for frequency drift of gas laser devices
SJ 50033/159-2002 Semiconductor discrete devices Detail specification for type 3DG142 silicon UHF low-noise transistor
SJ 20059-1992 Semiconductor discrete device.Detail specification for silicon NPN high-frequency low-power transistor of type 3DG111
SJ 20060-1992 Semiconductor discrete device.Detail specification for silicon NPN high-frequency low-power transistor of type 3DG120
SJ 50033/160-2002 Semiconductor discrete devices Detail specification for type 3DG122 silicon UHF low-noise transistor
SJ 50033/158-2002 Semiconductor discrete devices Detail specification for type 3DG44 silicon UHF low-noise transistor
SJ 50033/154-2002 Semiconductor discrete devices Detail specification for type 3DG251 silicon UHF low-noise transistor
SJ 50033/75-1995 Semiconductor discrete devices.Detail specification for type 3DG135 Silicon ultra high frequency low-power transistor
SJ 50033/67-1995 Semiconductor discrete device.Detail specification for type 3DD103 high-voltage low-frequency and high-power transistor
SJ/T 11848-2022 Semiconductor discrete device 3DG2484 type NPN silicon high frequency low power transistor detailed specifications
SJ/T 11846-2022 Voltage regulator low-frequency noise parameter test method
SJ 20175-1992 Semiconductor discrete device--Detail specification for NPN silicon ultra-high frequency low-power transistor of Type 3DG918
SJ 3123-1988 Detail specification for electronic components--Ambient-rated bipolar transistors for high frequency amplification,Type 3DG1779
SJ/T 10960-1996 Detailed specifications for electronic components - 3CG844 silicon PNP ambient-rated transistors for high frequency amplification
SJ/T 11849-2022 Detailed specifications for semiconductor discrete devices 3DG3500 and 3DG3501 type NPN silicon high-frequency low-power transistors
SJ/T 11043-1996 Test method for high frequency dielectric losses and permittivity of electronic glass
SJ 3120-1988 Detail specification for electronic component--Ambient-rated bipolar transistors for high frequency amplification,Type 3DG1215
SJ 3121-1988 Detail specification for electronic components--Ambient-rated bipolar transistors for high frequency amplification,Type 3DG2464
SJ 3122-1988 Detail specification for electronic components--Ambient-rated bipolar transistors for high frequency amplification,Type 3DG3177
SJ 50033/95-1995 Semiconductor discrete devices.Detail specification for type 3DG144 NPN silicon high-frequency Low-noise Low-power transistor
SJ 50033/94-1995 Semiconductor discrete devices.Detail specification for type 3DG143 NPN silicon high-frequency Low-noise Low-power transistor
SJ 50033/93-1995 Semiconductor discrete devices.Detail specification for type 3DG142 NPN silicon high-frequency Low-noise Low-power transistor

ECIA - Electronic Components Industry Association, High frequency device test

186-8E-1978 Passive Electronic Component Parts@ Test Methods for; Method 8: Vibration@ High Frequency
EIA-970-2013 Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
TEP 138-1962 Noise Figure Testing of RF Amplifier Tubes (TEP 38)

Military Standard of the People's Republic of China-General Armament Department, High frequency device test

GJB 383.24-1994 Telemetry system, subsystem test method and high frequency power amplifier test method
GJB 383.2A-1997 Telemetry system and sub-system test methods Telemetry high-frequency preamplifier test methods
GJB 383.2-1987 Telemetry system and sub-system test methods Telemetry high-frequency preamplifier test methods
GJB 360.15-1987 Test methods for electronic and electrical components High frequency vibration test
GJB 9387-2018 Microwave mixer test methods
GJB 33/001-1989 Blank detailed specification for high frequency low power transistors for semiconductor discrete devices
GJB 383.22-1994 Telemetry system, subsystem test method Telemetry frequency synthesizer test method
GJB 383.29-1997 Telemetry system and sub-system testing methods Telemetry downconverter testing methods
GJB 33/14A-2021 Semiconductor discrete device 3DG44 type silicon ultra-high frequency low noise transistor detailed specification
GJB 33A/14-2003 Semiconductor discrete device 3DG44 type silicon ultra-high frequency low noise transistor detailed specification

Guangdong Provincial Standard of the People's Republic of China, High frequency device test

DB44/T 1905-2016 UHF radio frequency identification (RFID) chip test method

Hebei Provincial Standard of the People's Republic of China, High frequency device test

DB13/T 5695-2023 GaN HEMT RF device trap effect test method
DB13/T 5696-2023 Rapid defect screening method for GaN HEMT RF power devices based on high temperature reverse bias test
DB13/T 5018-2019 Technical Requirements and Test Methods for Expressway Video Surveillance Networking

Korean Agency for Technology and Standards (KATS), High frequency device test

KS C 6044-2002 Testing methods of high frequency inductors and intermediate frequency transformers for electronic equipment
KS C 6044-1979 Testing methods of high frequency inductors and intermediate frequency transformers for electronic equipment
KS C IEC 61922:2006 High-frequency induction heating installations－Test methods for the determination of power output of the generator
KS B 6847-1999(2019) Test code of high and medium frequency induction furnace for steel melting
KS C IEC 61083-1-2006(2016) Instruments and software used for measurements in high-voltage impulse tests Part 1：Requirements for instruments
KS C 0264-1995(2000) ELECTROMAGNETIC COMPATIBILITY-TESTING AND MEASUREMENT TECHNIQUES-RADIATED, RADIO-FREQUENCY, ELECTROMAGNETIC FIELD IMMUNITY TEST
KS C IEC 61083-1-2006(2021) Instruments and software used for measurements in high-voltage impulse tests Part 1：Requirements for instruments
KS C 6301-2002 TESTING METHODS FOR LOW FREQUENCY TRANSFORMERS AND INDUCTORS
KS C 6301-1987 TESTING METHODS FOR LOW FREQUENCY TRANSFORMERS AND INDUCTORS
KS C IEC 62024-1:2006 High frequency inductive components-Electrical characteristics and measuring methods-Part 1:Nanohenry range chip inductor
KS C IEC 62024-1:2017 High frequency inductive components－Electrical characteristics and measuring methods－Part 1：Nanohenry range chip inductor
KS C IEC 62025-2:2018 High frequency inductive components — Non-electrical characteristics and measuring methods — Part 2: Test methods for non-electrical characteristics
KS C IEC 61083-1:2006 Instruments and software used for measurement in High-voltage impulse tests－Part 1：Requirements for instruments
KS C 0267-1995(2000) ELECTROMAGNETIC COMPATIBILITY-TESTING AND MEASUREMENT TECHNIQNES -IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO FREQUENCY FIELDS
KS C IEC 61308-2012(2017) High-frequency dielectric heating installations－Test methods for the determination of power output
KS C IEC 61308-2012(2022) High-frequency dielectric heating installations－Test methods for the determination of power output
KS C 2117-1996(2021) Testing method for complex dielectric constant of nonmetallic magnetic materials at high frequencies
KS C IEC 60581-7-2003(2018)
KS R 0016-1971(2010) Method of high and low temperature test for automobile parts
KS C IEC 60749-6:2020 Semiconductor devices — Mechanical and climatic test methods — Part 6: Storage at high temperature
KS C IEC 61083-1:2022 Instruments and software used for measurements in high-voltage and high-current tests — Part 1: Requirements for instruments for impulse tests
KS C IEC 60747-7-1:2006 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors－Section One：Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification
KS C IEC 60747-7-1-2006(2016) Semiconductor devices－Discrete devices－Part 7：Bipolar transistors－Section One：Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification
KS C IEC 60747-7-1-2006(2021) Semiconductor devices－Discrete devices－Part 7：Bipolar transistors－Section One：Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification
KS C IEC 61308:2012 High-frequency dielectric heating installations－Test methods for the determination of power output
KS C IEC 62024-2:2018 High frequency inductive components — Electrical characteristics and measuring methods — Part 2: Rated current of inductors for DC to DC converters
KS C IEC 60749-4:2020 Semiconductor devices — Mechanical and climatic test methods — Part 4: Damp heat, steady state,highly accelerated stress test(HAST)
KS C 2117-1996(2016) Testing method for complex dielectric constant of nonmetallic magnetic materials at high frequencies
KS C IEC 60642:2018 Piezoelectric ceramic resonators and resonator units for frequency control and selection — Chapter I: Standard values and conditions — Chapter II: Measuring and test conditions
KS C IEC 60642-2023 Piezoelectric Ceramic Resonators and Resonator Units for Frequency Control and Selection Chapter 1 Standard Values and Conditions Chapter 2 Measurement and Test Conditions
KS C IEC 61083-2:2019 Instruments and software used for measurement in high-voltage and highcurrent tests – Part 2: Requirements for software for tests with impulse voltages and currents
KS C IEC 61922-2006(2016) High-frequency induction heating installations－Test methods for the determination of power output of the generator
KS C IEC 61922-2006(2021) High-frequency induction heating installations－Test methods for the determination of power output of the generator

Japanese Industrial Standards Committee (JISC), High frequency device test

JIS C 5321:1997 Methods of test for high frequency inductors and intermediate frequency transformers for electronic equipment
JIS C 62024-1:2022 High frequency inductive components -- Electrical characteristics and measuring methods -- Part 1: Nanohenry range chip inductor
JIS C 62025-2:2009 High frequency inductive components -- Non-electrical characteristics and measuring methods -- Part 2: Test methods for non-electrical characteristics
JIS C 62024-2:2022 High frequency inductive components -- Electrical characteristics and measuring methods -- Part 2: Rated current of inductors for DC to DC converters
JIS C 62024-1:2006 High frequency inductive components -- Electrical characteristics and measuring methods -- Part 1: Nanohenry range chip inductor
JIS C 61300-2-18:2009 Fiber optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-18: Tests -- High temperature
JIS C 62024-1:2011 High frequency inductive components -- Electrical characteristics and measuring methods -- Part 1: Nanohenry range chip inductor
JIS C 62024-2:2011 High frequency inductive components -- Electrical characteristics and measuring methods -- Part 2: Rated current of inductors for DC to DC converters
JIS C 6435:1989 Testing methods for low frequency transformers and inductors

Group Standards of the People's Republic of China, High frequency device test

T/CASAS 029-2023 Test method for microwave characteristics of Sub-6GHz GaN radio-frequency devices
T/CIMA 0058-2022
T/SDIE 3-2017 UHF electronic tag performance test specification
T/AI 107-2018 High efficiency Media Coding—Video Conformance Testing
T/CSTM 00986-2023 Test method for the complex permittivity of high-frequency dielectric substrates －Balanced-type circular disk resonator method
T/SHDSGY 113-2022 Radio frequency front end semiconductor test software
T/CEC 505-2021 Guidelines for insulation tests of dry-type high-frequency transformers for power electronic transformers
T/CEC 398-2020 Technical specifications for nanocrystalline alloy strip products for high frequency transformers
T/CAIACN 008-2022 High-Resolution Wireless Audio；Technical Requirements, Terminal Specification and Test Methods
T/UWA 005.3-4-2022 High Dynamic Range (HDR) Video Technology Part 3-4: Technical Requirements and Test Methods Playback Software
T/CASMES 45-2022 Function test system of blower inverter controller
T/CSEE 0226-2021 Specifications for Insulation Frequency Domain Dielectric Spectrum Test Device
T/CSEE 0158-2020 Partial discharge ultra-high frequency measurement method under GIS field impact withstand voltage test
T/UWA 012.7-2022 "Baichengqianping" UHD Encoder Test Method
T/IAWBS 009-2019 High Voltage Bias Steady-state Temperature Humidity Test for Power Semiconductor Devices
T/CSEE 0222-2021 Technical guidelines for UHF detection and separation of multiple partial discharge sources in oil-immersed transformers (reactors)

国家能源局, High frequency device test

NB/SH/T 0987-2019 High-frequency linear vibration (SRV) standard test piece wear volume determination method

工业和信息化部, High frequency device test

SJ/T 11766-2020 Test method for low-frequency noise parameters of optocoupler devices
SJ/T 11769-2020 General requirements for testing methods of low-frequency noise parameters of electronic components
SJ/T 1486-2016 Semiconductor discrete device 3CG180 type silicon PNP high frequency high back voltage low power transistor detailed specification
YD/T 1353-2015 High-speed optical detector-preamplifier assembly technical requirements and test methods for optical communications
SJ/T 11768-2020 Resistor low frequency noise parameter testing method
SJ/T 1477-2016 Semiconductor discrete device 3CG120 type silicon PNP high frequency low power transistor detailed specifications
SJ/T 1480-2016 Semiconductor discrete device 3CG130 type silicon PNP high frequency low power transistor detailed specification
SJ/T 1472-2016 Semiconductor discrete device 3CG110 type silicon PNP high frequency low power transistor detailed specification
YD/T 2827.5-2015 Measurement methods for passive intermodulation levels of wireless communication RF and microwave devices Part 5: Filter devices

American National Standards Institute （ANSI), High frequency device test

ANSI/ATIS 0600421-2001 In-Line Filter for Use with Voiceband Terminal Equipment Operating on the Same Wire Pair with High Frequency (up to 10 MHz) Devices
ANSI/INCITS/ISO/IEC 14496-4/AMD 8:2009 Information technology - Coding of audio-visual objects - Part 4: Conformance testing for MPEG-4 - Amendment 8: High Efficiency Advanced Audio Coding, audio BIFS, and structured audio conformance
ANSI/CEA 2006-B-2009 Testing & Measurement Methods for Mobile Audio Amplifiers
ANSI/EIA 483:1981 Ceramic Capacitors at High Frequencies, Method of Test for Effective Series Resistance (ESR) and Capacitance for Multilayer
ANSI/ASTM A1013:2000 Test Method for High Frequency (10 kHz - 1 MHz) Core Loss of Soft Magnetic Core Components at Controlled Temperatures using the Voltmeter-Ammeter-Wattmeter Method
ANSI/IEEE 1160:1993 Test Procedure for High-Purity Germanium Crystals for Radiation Detectors

Electronic Industrial Alliance (U.S.), High frequency device test

EIA RS-186-8E-1978 STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 8: VIBRATION, HIGH FREQUENCY

Electronic Components, Assemblies and Materials Association, High frequency device test

ECA EIA-970-2013 Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

Association Francaise de Normalisation, High frequency device test

NF C48-229:1987 Intrusion detection - Very-high frequency motion detectors - Specific standard.
NF C79-663*NF EN 61922:2003 High-frequency induction heating installations - Test methods for the determination of power output of the generator
NF EN 2591-225:2008 Série aérospatiale - Organes de connexion électrique et optique - Méthodes d'essais - Partie 225 : tenue en haute tension HF
NF C41-105*NF EN 61083-1:2001 Instruments and software used for measurement in high-voltage impulse tests - Part 1 : requirements for instruments
NF EN 61083-1:2001 Appareils et logiciels utilisés pour les mesures pendant les essais de choc à haute tension - Partie 1 : prescriptions pour les appareils
NF EN 60512-21-1:2011 Connecteurs pour équipements électroniques - Essais et mesures - Partie 21-1 : essais de résistance aux fréquences radioélectriques - Essai 21a : résistance parallèle aux fréquences radioélectriques
NF C93-370-1*NF EN IEC 62024-1:2018 High frequency inductive components - Electrical characteristics and measuring methods - Part 1 : nanohenry range chip inductor
NF EN 2591-224:2008 Série aérospatiale - Organes de connexion électrique et optique - Méthodes d'essais - Partie 224 : fuite HF
NF C93-370-2*NF EN IEC 62024-2:2020 High frequency inductive components - Electrical characteristics and measuring methods - Part 2 : rated current of inductors for DC to DC converters
NF C93-370-2*NF EN 62024-2:2015 High frequency inductive components - Electrical characteristics and measuring methods - Part 2 : rated current of inductors for DC to DC converters
NF C93-370-1:2013 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: nanohenry range chip inductor
NF C93-560-1-6*NF EN IEC 61169-1-6:2022 Radio-frequency connectors - Part 1-6 : electrical test methods - RF power
NF EN IEC 61169-1-6:2022 Connecteurs pour fréquences radioélectriques Partie 1-6 : méthodes d'essai électrique - Puissance RF
NF EN IEC 60749-12:2018 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 12 : vibrations, fréquences variables
NF C41-108*NF EN 61083-2:2013 Instruments and software used for measurement in high-voltage and high-current tests - Part 2 : requirements for software for tests with impulse voltages and currents
NF C93-400-21-1*NF EN 60512-21-1:2011 Connectors for electronic equipment - Tests and measurements - Part 21-1 : R.F. resistance tests - Test 21a : R.F. shunt resistance.
NF EN 61308:2006 Installations de chauffage diélectrique haute fréquence - Méthodes d'essais pour la détermination de la puissance de sortie
NF U05-001/A2*NF ISO 11784/A2:2010 Radiofrequency identification of animals - Code structure - Amendment 2 : indication of an advanced transponder
NF EN IEC 62025-2:2019 Composants inductifs à haute fréquence - Caractéristiques non électriques et méthodes de mesure - Partie 2 : méthodes d'essai pour caractéristiques non électriques
NF EN 60749-6:2017 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 6 : stockage à haute température
NF C96-022-4*NF EN 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)
NF C93-371-2:2005 High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2 : test methods for non-electrical characteristics.
NF C79-662*NF EN 61308:2006 High-frequency dielectric heating installations - Test methods for the determination of power output.
NF C79-662:1997 High-frequency dielectric heating installations. Test methods for the determination of power output.
NF C93-557:2001 RF connectors, connector cable assemblies and cables - Intermodulation level measurement.
NF C41-083-3:2021 Instruments and software used for measurement in high-voltage and high current tests - Part 3 : requirements for hardware for tests with alternating and direct voltages and currents
NF ISO 9838:2023 Fixations de skis alpins et de randonnée - Semelles d'essai pour les essais de fixations de skis
NF C97-010-3*NF EN 61260-3:2016 Electroacoustics - Octave-band and fractional-octave-band filters - Part 3 : periodic tests
NF EN 61260-3:2016 Électroacoustique - Filtres de bande d'octave et de bande d'une fraction d'octave - Partie 3 : essais périodiques
NF C74-365:2009 Medical electrical equipment - Part 2-2 : particular requirements for the basic safety and essential performance of high frequency surgical equipment and high frequency surgical accessories.
NF EN 50209:2000 Essai de l'isolation des barres et des bobines des machines à haute tension
NF ISO 9462:2023 Fixations de skis alpins - Exigences et méthodes d'essai
NF EN 61083-2:2013 Appareils et logiciels utilisés pour les mesures pendant les essais à haute tension et haute intensité - Partie 2 : exigences pour le logiciel pour les essais avec des tensions et des courants de choc
NF EN IEC 62024-2:2020 Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de mesure - Partie 2 : courant assigné des bobines d'induction pour des convertisseurs continu-continu

国家广播电视总局, High frequency device test

GY/T 330-2020 Ultra high definition high dynamic range video system color bar test chart
GY/T 329-2020 Test images for subjective evaluation of 4K ultra-high definition video image quality

RU-GOST R, High frequency device test

GOST R 51799-2001 High power radio frequency connectors. Basic parameters and technical requirements. Methods of tests and measurements
GOST 27694-1988 Integrated circuits. Low-, intermediate- and high-frequency amplifiers. Methods for measuring electric parameters
GOST 20271.1-1991 Microwave electronic devices. Methods of measuring electrical parameters
GOST R 59389.2-2021 Information technology. Radio frequency identification device performance test methods. Part 2. Test methods for interrogator performance
GOST 20271.3-1991 Microwave electronic devices. Methods of measuring of modulating impulse parameters
GOST R 51665-2000 Power combiners for low, medium and high frequency transmitters. Basic parameters. General technical requirements. Methods of measurements
GOST R 59389.1-2021 Information technology. Radio frequency identification device performance test methods. Part 1. Test methods for system performance
GOST R 51742-2001 Broadcasting transmitters, fixed AM modulated, ranges of low frequency, mean frequency and high frequency. Main parameters, technical requirements and methods of measurement
GOST R 59389.4-2021 Information technology. Radio frequency identification device performance test methods. Part 4. Test methods for performance of HF RFID gates in libraries

Professional Standard - Aerospace, High frequency device test

QJ 2349-1992 Microwave Mixer Test Method
QJ 2220.4-1994 Test method for coating electrical insulation performance Test method for relative dielectric constant at power frequency, audio frequency and high frequency
QJ 2220.5-1994 Test method for coating electrical insulation performance Test method for dielectric loss tangent at power frequency, audio frequency and high frequency
QJ 1990.3-1990 Electrical performance test method of electrical insulating adhesives Dielectric loss angle at power frequency and high frequency
QJ 10007/11-2008 Detail specification for 3DG182 type silicon high-frequency low-power high-backvoltage transistors for semiconductor discrete devices used in aerospace
QJ 1996-1990 Microwave device test method
QJ 3048-1998 Component testing station test software development specification
QJ 10007/10-2008 Detail specification of 3DG122, 3DG130 silicon high-frequency low-power transistors for aerospace semiconductor discrete devices
QJ 10007/5-2008 Detail specification of 3CG110, 3CG130 silicon high-frequency low-power transistors for aerospace semiconductor discrete devices

PL-PKN, High frequency device test

PN T04500 ArkusZ02-1973 Receivers for fre?uency modulation broadcast transmissions Basic methods of measurement on high-frequency stages
PN T01207-01-1992 Semiconductor devices Discrete devices BipoLar transistors Blank detail specification for ambient-rated bipolar transistors for Iow and high-frequency amplification
PN T06503-1973 Audio fre?uency generators General re?uirements and tests
PN T80240-1971 Electronic components Connec?ors tor Iow trequencies General requirement$ and tes?ing
PN-EN IEC 62024-2-2020-12 E High frequency inductive components -- Electrical characteristics and measuring methods -- Part 2: Rated current of inductors for DC-to-DC converters (IEC 62024-2:2020)
PN E06104-1988 Hi?h-voltage alternatint! turrcnt contactors Rcquirements and tcsling proccdures
PN A55543-1991 Stuffing mixers. Basic parameters, requirements and testing methods
PN T04545-1968 Induttrial radio interference Radio Interference suppreisort and filteri Me?hod* of measurements of higMrequency characterlstics
PN-EN IEC 61083-3-2021-08 E Instruments and software used for measurement in high-voltage and high-current tests -- Part 3: Requirements for hardware for tests with alternating and direct voltages and currents (IEC 61083-3:2020)

Standard Association of Australia （SAA）, High frequency device test

AS 61083.1:2006 Instruments and software used for measurement in high-voltage impulse tests - Requirements for instruments
AS 2362.9:1990 Automatic fire detection and alarm systems - Methods of test for actuating devices - High frequency disturbance test
AS 2909.4:1986 Methods of measurement on radio receivers for various classes of emission - Radio-frequency measurements on receivers for frequency-modulated sound-broadcasting emissions
AS IEC 61260.3:2019 Electroacoustics — Octave‑band and fractional‑octave‑band filters, Part 3: Periodic tests

International Electrotechnical Commission (IEC), High frequency device test

IEC 61922:2002 High-frequency induction heating installations - Test methods for the determination of power output of the generator
IEC 61083-1:2021 Instruments and software used for measurements in high-voltage and high-current tests - Part 1: Requirements for instruments for impulse tests
IEC 62024-1:2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
IEC 62024-1:2008/COR1:2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor corrigendum 1
IEC 62025-2:2019 High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2: Test methods for non-electrical characteristics
IEC 61300-2-14:2021 RLV Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-14: Tests - High optical power
IEC 61083-1:2001 Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments
IEC 62024-2:2020 RLV High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC-to-DC converters
IEC 62024-1:2002 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
IEC 62024-1:2017 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
IEC 61083-2:2013 Instruments and software used for measurement in high-voltage and high-current tests - Part 2: Requirements for software for tests with impulse voltages and currents
IEC 60747-7-1:1989 Semiconductor devices; discrete devices; part 7: bipolar transistors; section one: blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification
IEC 62024-2:2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC to DC converter
IEC 61083-3:2020 Instruments and software used for measurement in high-voltage and high-current tests - Part 3: Requirements for hardware for tests with alternating and direct voltages and currents
IEC 62025-2:2005 High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2: Test methods for non-electrical characteristics
IEC 62025-2:2019 RLV High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2: Test methods for non-electrical characteristics
IEC 61308:2005 High-frequency dielectric heating installations - Test methods for the determination of power output
IEC 61308:1994 High-frequency dielectric heating installations - Test methods for the determination of power output
IEC 62037:1999 RF connectors, connector cable assemblies and cables - Intermodulation level measurement
CISPR 11:2015/AMD2:2019 Amendment 2 - Requirements for semiconductor power converters (SPC)/ Improvement of repeatability for measurements in the frequency range 1-18 GHz
CISPR 11-2015/AMD2-2019 Amendment 2 - Requirements for semiconductor power converters (SPC)/ Improvement of repeatability for measurements in the frequency range 1-18 GHz
IEC 61097-8:1998 Global maritime distress and safety system (GMDSS) - Part 8: Shipborne watchkeeping receivers for the reception of digital selective calling (DSC) in the maritime MF, MF/HF and VHF bands - Operational and performance requirements, methods of testing and r
IEC 61169-47:2015 Radio-frequency connectors - Part 47: Sectional specification for radio-frequency coaxial connectors with clamp coupling, typically for use in 75 Ώ cable networks (type F-Quick)
IEC 62802:2017 Measurement method of a half-wavelength voltage and a chirp parameter for Mach-Zehnder optical modulator in high-frequency radio on fibre (RoF) systems
IEC 61300-2-14:2021 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-14: Tests - High optical power
IEC 61169-47:2012 Radio- frequency connectors - Part 47: Sectional specification - Radio frequency coaxial connectors with clamp coupling, typically for use in 75 cable networks (type F-Quick)
IEC 62024-2:2020 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC-to-DC converters

British Standards Institution (BSI), High frequency device test

BS EN 61922:2003 High-frequency induction heating installations - Test methods for the determination of power output of the generator
BS EN 62024-1:2002 High frequency inductive components - Electrical characteristics and measuring methods - Nanohenry range chip inductor
BS EN IEC 62024-1:2018 High frequency inductive components. Electrical characteristics and measuring methods. Nanohenry range chip inductor
BS EN IEC 61169-1-6:2022 Radio-frequency connectors - Electrical test methods. RF power.
BS EN IEC 62024-2:2020 High frequency inductive components. Electrical characteristics and measuring methods. Rated current of inductors for DC-to-DC converters
BS EN 62024-1:2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
BS EN 61083-2:2013 Instruments and software used for measurement in high-voltage and high-current tests. Requirements for software for tests with impulse voltages and currents
BS EN 60749-6:2017 Semiconductor devices. Mechanical and climatic test methods - Storage at high temperature
BS EN IEC 62025-2:2019 High frequency inductive components. Non-electrical characteristics and measuring methods - Test methods for non-electrical characteristics
BS EN 62025-2:2005 High frequency inductive components. Non-electrical characteristics and measuring methods. Test methods for non-electrical characteristics
BS EN 62024-2:2009 High frequency inductive components - Electrical characteristics and measuring methods - Rated current of inductors for DC to DC converters
13/30293221 DC BS EN 61083-1. Instruments and software used for measurements in high-voltage and high-current tests. Part 1. Requirements for hardware for impulse tests. 'Proposed Horizontal Standard'
BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods - Damp heat, steady state, highly accelerated stress test (HAST)
PD IEC TS 61169-1-51:2020 Radio frequency connectors. Technical specification of electrical tests. Uncertainty specification of frequency domain test for return loss
21/30443246 DC BS EN IEC 60512-28-100. Connectors for electrical and electronic equipment. Tests and measurements - Part 28-100. Signal integrity tests up to 2 000 MHz. Tests 28a to 28g
23/30470844 DC BS EN IEC 60512-28-100. Connectors for electrical and electronic equipment. Tests and measurements - Part 28-100. Signal integrity tests up to 2 000 MHz. Tests 28a to 28g
BS EN 61260-2:2016+A1:2017 Electroacoustics. Octave-band and fractional-octave band filters - Pattern evaluation tests
BS EN 62674-1:2012 High frequency inductive components. Fixed surface mount inductors for use in electronic and telecommunication equipment
BS EN IEC 61169-1-2:2019 Radio-frequency connectors - Electrical test methods. Insertion loss
BS EN IEC 60966-2-8:2022 Radio frequency and coaxial cable assemblies - Detail specification for cable assemblies for radio and TV receivers. Frequency range up to 3000 MHz, Screening class A++, IEC 61169-47 connectors
BS EN IEC 61083-3:2021 Instruments and software used for measurement in high-voltage and high-current tests. Requirements for hardware for tests with alternating and direct voltages and currents
BS EN 62037:2000 RF connectors, connector cable assemblies and cables - Intermodulation level measurement
BS EN IEC 63137-1:2019 Standard test radio-frequency connectors. Generic specification. General requirements and test methods
22/30440624 DC BS EN 62024-2. High frequency inductive components. Electrical characteristics and measuring methods - Part 2. Rated current of inductors for DC-to-DC converters
18/30388259 DC BS EN 62024-2. High frequency inductive components. Electrical characteristics and measuring methods. Part 2. Rated current of inductors for DC to DC converters
BS PD IEC TS 61169-1-51:2020 Radio frequency connectors. Technical specification of electrical tests. Uncertainty specification of frequency domain test for return loss
BS EN 61260-3:2016 Tracked Changes. Electroacoustics. Octave-band and fractional-octave-band filters. Periodic tests
BS EN 61308:2006 High-frequency dielectric heating installations - Test methods for the determination of power output
23/30450435 DC BS EN IEC 62024-1. High frequency inductive components. Electrical characteristics and measuring methods - Part 1. Nanohenry range chip inductor
21/30435531 DC BS EN IEC 62803-2. Transmitting and receiving equipment for radiocommunication. Frequency response of optical-to-electric conversion device in high-frequency radio over fibre systems. Part 2. Measurement method of common-mode rejection ratio of optical...
BS EN 62271-101:2006+A1:2010 High-voltage switchgear and controlgear. Synthetic testing
BS EN 62271-101:2006 High-voltage switchgear and controlgear - Synthetic testing
BS EN 61300-2-18:2005 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-18: Tests - Dry heat - High temperature endurance
BS EN IEC 61169-1-5:2022 Radio frequency connectors - Electrical test methods. Rise time degradation
BS EN 62025-1:2007 High frequency inductive components - Non-electrical characteristics and measuring methods - Fixed, surface mounted inductors for use in electronic and telecommunication equipment
BS EN 61922:2002 High-frequency induction heating installations. Test methods for the determination of power output of the generator
BS EN ISO 12156-1:2023 Diesel fuel. Assessment of lubricity using the high-frequency reciprocating rig (HFRR) - Test method

German Institute for Standardization, High frequency device test

DIN EN 61922:2003 High-frequency induction heating installations - Test methods for the determination of power output of the generator (IEC 61922:2002); German version EN 61922:2002
DIN EN 61083-1:2002 Instruments and software used for measurements in high-voltage impulse tests - Part 1: Requirements for instruments (IEC 61083-1:2001); German version EN 61083-1:2001
DIN 48600:1979 Industrial electro-heat equipment; power measurement on high-frequency appliances for induction heating equipment, measuring method for determination of power output of high-frequency generators
DIN EN IEC 60749-12:2018-07 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017); German version EN IEC 60749-12:2018 / Note: DIN EN 60749-12 (2003-04) remains valid alongside this standard until 2021-01-17.
DIN EN IEC 62024-2:2022-11 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC-to-DC converters (IEC 51/1409/CD:2022); Text in German and English / Note: Date of issue 2022-10-14*Intended as replaceme...
DIN EN 62024-1:2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor (IEC 62024-1:2008); German version EN 62024-1:2008
DIN 45999-1:1981 Harmonized system of quality assessment for electronic components; generic specification; radio frequency coaxial connectors
DIN EN 61308:2006-09 High-frequency dielectric heating installations - Test methods for the determination of power output (IEC 61308:2005); German version EN 61308:2006 / Note: DIN EN 61308 (1997-08) remains valid alongside this standard until 2008-12-01.
DIN EN IEC 62025-2:2021-11 High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2: Test methods for non-electrical characteristics (IEC 62025-2:2019); German version EN IEC 62025-2:2019 / Note: DIN EN 62025-2 (2005-08) remains valid a...
DIN EN 60749-6:2017-11 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017 / Note: DIN EN 60749-6 (2003-04) remains valid alongside this standard until 2020-04-07.
DIN EN 62025-2:2005 High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2: Test methods for non-electrical characteristics (IEC 62025-2:2005); German version EN 62025-2:2005
DIN EN IEC 62024-2:2021-10 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC-to-DC converters (IEC 62024-2:2020); German version EN IEC 62024-2:2020 / Note: DIN EN 62024-2 (2009-08) remains valid al...
DIN EN IEC 62024-1:2019-02 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor (IEC 62024-1:2017); German version EN IEC 62024-1:2018 / Note: DIN EN 62024-1 (2008-10) remains valid alongside this standard...
DIN ISO 9838:2019-12 Alpine and touring ski-bindings - Test soles for ski-binding tests (ISO 9838:2019) / Note: DIN ISO 9838 (2016-08) remains valid alongside this standard until 2020-05-31.*To be replaced by DIN ISO 9838 (2022-06).
DIN EN 61260-3:2016-09 Electroacoustics - Octave-band and fractional-octave-band filters - Part 3: Periodic tests (IEC 61260-3:2016); German version EN 61260-3:2016
DIN 53483-3:1969-07 Testing of Insulating Materials; Determination of Dielectric Properties; Measuring Cells for Liquids for Frequencies up to 100 MHz
DIN EN IEC 62024-2:2019 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC to DC converters (IEC 51/1264/CD:2018); Text in German and English
DIN EN 60749-23:2011-07 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011); German version EN 60749-23:2004 + A1:2011 / Note: DIN EN 60749-23 (2004-10) remains valid alongside this standard unt...
DIN IEC 60642:1988-04 Piezoelectric ceramic resonators and resonator units for frequency control and selection; standard values and conditions; measuring and test conditions; identical with IEC 60642, edition 1979
DIN ISO 9462:2015-07 Alpine ski-bindings - Requirements and test methods (ISO 9462:2014) / Note: To be replaced by DIN ISO 9462 (in preparation).
DIN IEC 60642:1988 Piezoelectric ceramic resonators and resonator units for frequency control and selection; standard values and conditions; measuring and test conditions; identical with IEC 60642, edition 1979
DIN EN 12483:1999-08 Liquid pumps - Pump units with frequency inverters - Guarantee and compatibility tests; German version EN 12483:1999

Professional Standard - Ocean, High frequency device test

HY/T 0280-2019 Specification for high frequency ground wave radar in situ evaluation

Professional Standard - Post and Telecommunication, High frequency device test

YD/T 647-1994 Quality grading criteria of HF and LF noise testers
YD/T 1156-2001 Test Specification for High.End Router
YD/T 1353-2005 Technical requirements and test methods of the high speed photodetector-preamplifier used for the optical fiber communication
YD/T 515-1992 Technical conditions for multimode optical fiber frequency-domain bandwidth tester
YD/T 704-1993 Inspection and test methods for voice band modem

Consumer Electronics Association （U.S.), High frequency device test

CEA-490-A-2001 Test Methods of Measurement for Audio Amplifiers
CEA-2006-B-2009 Testing& Measurement Methods for Mobile Audio Amplifiers
CEA-490-A-2004 Standard Test Methods of Measurement for Audio Amplifiers
CEA-2006-A-2004 Testing& Measurement Methods for Mobile Audio Amplifiers
CEA-2031 ERTA-2007 Testing and Measurement Methods for Mobile Loudspeaker Systems
CEA-2031-2006 Testing and Measurement Methods for Mobile Loudspeaker Systems

National Metrological Verification Regulations of the People's Republic of China, High frequency device test

JJG(民航) 051-1999 Verification Regulation of MODEL NAV-705B VHF Navigation Test Equipment
JJG(电子) 04043-1991 Verification Regulations for CTG-1 High Frequency CV Characteristic Tester
JJG(电子) 04015-1988 QZ3, QZ4 type high-frequency low-power transistor NF tester trial verification regulations
JJG 197-1979 Verification Regulation of LCCG-1 Type HF Inductance and Capacitance Meter
JJG(电子) 01001-1987 SCP-2 type time-domain frequency detector trial test procedure
JJG(邮电) 032-1995 Verification rules for dual-tone multi-frequency telephone tester
JJG(电子) 04048-1995 QG-29 high-frequency transistor Gf (Kf), F (Nf), AGC tester verification regulations
JJG(电子) 04011-1987 Trial specification for verification of QG21-QG25 high frequency low-power transistor F testers

Defense Logistics Agency, High frequency device test

DLA MIL-S-19500/9 B VALID NOTICE 3-2011 Semiconductor Device, Transistor, PNP, Germanium, High Frequency, 25 Milliwatt, Type JAN-2N128
DLA MIL-PRF-19500/522 A VALID NOTICE 2-2008 Semiconductor Device, Transistor, NPN, Silicon, High-Frequency Types 2N6603 and 2N6604 JAN, JANTX, and JANTXV
DLA MIL-PRF-19500/522 A VALID NOTICE 3-2013 Semiconductor Device, Transistor, NPN, Silicon, High-Frequency Types 2N6603 and 2N6604 JAN, JANTX, and JANTXV
DLA MIL STD 750 5 F-2012 TEST METHOD STANDARD HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES PART 5: TEST METHODS 5000 THROUGH 5999
DLA MIL-S-19500/341 B VALID NOTICE 3-2011 Semiconductor Device, Transistor, NPN, Silicon, High-Frequency, Power Types 2N3375, 2N3553, and 2N4440 JAN, JANTX, and JANTXV
DLA MIL-S-19500/341B-1968 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH-FREQUENCY, POWER TYPES 2N3375, 2N3553, AND 2N4440 JAN, JANTX, AND JANTXV
DLA MIL-S-19500/339 VALID NOTICE 3-2011 Semiconductor Device, Diode, Silicon, Video Detector Types 1N358A, 1N358AR, 1N358AM, and 1N358AMR
DLA MIL-PRF-19500/398 J-2010 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH-FREQUENCY, TYPES 2N3866, 2N3866A, 2N3866UB, 2N3866AUB, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC

Canadian Standards Association (CSA), High frequency device test

CSA ISO/IEC 14496-4-06-CAN/CSA AMD 8 CORR 1:2009 Information technology ?Coding of audio-visual objects ?Part 4: Conformance testing AMENDMENT 8: High Efficiency Advanced Audio Coding, audio BIFS, and structured audio conformance
CSA ISO/IEC 14496-4-06-CAN/CSA AMD 8:2006 Information technology - Coding of audio-visual objects - Part 4: Conformance testing AMENDMENT 8: High Efficiency Advanced Audio Coding, audio BIFS, and structured audio conformance
CAN/CSA-ISO/IEC 14496-4H:2006 Information technology - Coding of audio-visual objects - Part 4: Conformance testing AMENDMENT 8: High Efficiency Advanced Audio Coding, audio BIFS, and structured audio conformance

National Metrological Technical Specifications of the People's Republic of China, High frequency device test

JJF 1895-2021 Calibration Specification for Semiconductor Devices DC and Low Frequency Parameters Test Equipments

Danish Standards Foundation, High frequency device test

DS/EN 61083-2:2013 Instruments and software used for measurement in high-voltage and high-current tests - Part 2: Requirements for software for tests with impulse voltages and currents
DS/EN IEC 61300-2-14:2021 Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 2-14: Tests – High optical power
DS/EN 61300-2-18:2005 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures -- Part 2-18: Tests - Dry heat - High temperature endurance
DS/EN 62024-1:2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
DS/EN 60512-21-1:2010 Connectors for electronic equipment - Tests and measurements - Part 21-1: R.F. resistance tests - Test 21a: R.F. shunt resistance
DS/EN 61083-1:2002 Instruments and software used for measurements in high-voltage impulse tests - Part 1: Requirements for instruments
DS/EN 62025-2:2005 High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2: Test methods for non-electrical characteristics
DS/EN 62024-2:2009 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC to DC converters
DS/EN 61308:2006 High-frequency dielectric heating installations - Test methods for the determination of power output
DS/IEC 747-7-1:1990 Semiconductor devices. Discrete devices. Part 7: Bipolar transistors. Section one: Blank detail specification for ambient-rated bipolar transistors for low and high-frequenc amplification
DS/EN 60749-4/Corr.1:2004 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
DS/EN 60749-4:2003 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
DS/IEC/TR 61305-6:2005 Household high-fidelity audio equipment and systems – Methods of measuring and specifying the performance – Part 6: Listening tests on loudspeakers – Single stimulus ratings and paired comparisons
DS/EN IEC 61083-3:2021 Instruments and software used for measurement in high-voltage and high-current tests – Part 3: Requirements for hardware for tests with alternating and direct voltages and currents

European Committee for Electrotechnical Standardization（CENELEC）, High frequency device test

EN 61083-2:2013 Instruments and software used for measurement in high-voltage and high-current tests - Part 2: Requirements for software for tests with impulse voltages and currents
EN 61922:2002 High-frequency induction heating installations - Test methods for the determination of power output of the generator
EN IEC 61083-3:2021 Instruments and software used for measurement in high-voltage and high-current tests - Part 3: Requirements for hardware for tests with alternating and direct voltages and currents
EN 62024-1:2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
EN IEC 62025-2:2019 High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2: Test methods for non-electrical characteristics
EN 62024-2:2009 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC to DC converters
EN IEC 62024-2:2020 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC-to-DC converters
EN 61300-2-18:2005 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures Part 2-18: Tests - Dry heat - High temperature endurance
EN IEC 61169-1-6:2022 Radio-frequency connectors - Part 1-6: Electrical test methods - RF power
EN 62025-2:2005 High frequency inductive components Non-electrical characteristics and measuring methods Part 2: Test methods for non-electrical characteristics
EN 61260-3:2016 Electroacoustics - Octave-band and fractional-octave-band filters - Part 3: Periodic tests
EN 62802:2017 Measurement methods of a half-wavelength voltage and a chirp parameter for Mach-Zehnder optical modulators in highfrequency radio on fibre (RoF) Systems

AENOR, High frequency device test

UNE-EN 61083-2:2014 Instruments and software used for measurement in high-voltage and high-current tests - Part 2: Requirements for software for tests with impulse voltages and currents
UNE-EN 61083-1:2002 Instruments and software used for measurement in high-voltage impulse tests -- Part 1: Requirements for instruments.
UNE-EN 61300-2-18:2006 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures -- Part 2-18: Tests - Dry heat - High temperature endurance
UNE-EN 60749-12:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 12: Vibration, variable frequency.
UNE-EN 60749-4:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST).

Professional Standard - Light Industry, High frequency device test

QB/T 2986-2008 Auxiliaries for lamps.Particular requirements for electronic invertors and convertors for high-frequency operation of cold start tubular discharge lamps(neon tubes).Peformance requirements

ES-UNE, High frequency device test

UNE-EN IEC 61083-3:2021 Instruments and software used for measurement in high-voltage and high-current tests - Part 3: Requirements for hardware for tests with alternating and direct voltages and currents (Endorsed by Asociación Española de Normalización in May of 2021.)
UNE-EN 60512-21-1:2010 Connectors for electronic equipment - Tests and measurements -- Part 21-1: R.F. resistance tests - Test 21a: R.F. shunt resistance (Endorsed by AENOR in October of 2010.)
UNE-EN IEC 62025-2:2019 High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2: Test methods for non-electrical characteristics (Endorsed by Asociación Española de Normalización in December of 2019.)
UNE-EN IEC 60749-12:2018 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
UNE-EN IEC 62024-1:2018 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor (Endorsed by Asociación Española de Normalización in April of 2018.)
UNE-EN IEC 62024-2:2020 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC-to-DC converters (Endorsed by Asociación Española de Normalización in July of 2020.)
UNE-EN IEC 61169-1-6:2023 Radio-frequency connectors - Part 1-6: Electrical test methods - RF power
UNE-EN 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Española de Normalización in July of 2017.)
UNE-EN 61260-3:2016 Electroacoustics - Octave-band and fractional-octave-band filters - Part 3: Periodic tests (Endorsed by AENOR in July of 2016.)

Taiwan Provincial Standard of the People's Republic of China, High frequency device test

CNS 15074-2007 Method of test for evaluating lubricity of diesel fuels by the high-frequency reciprocating rig (HFRR)
CNS 9237-1988 Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 3 Altitude Immersion)

Acoustical Society of America (ASA), High frequency device test

ASA S3.42-1992 Testing Hearing Aids with a Broad-Band Noise Signal

CENELEC - European Committee for Electrotechnical Standardization, High frequency device test

EN IEC 62024-1:2018 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
EN 60512-21-1:2010 Connectors for electronic equipment - Tests and measurements - Part 21-1: R.F. resistance tests - Test 21a: R.F. shunt resistance
EN 61083-1:1993 Digital recorders for measurements in high-voltage impulse tests Part 1: Requirements for digital recorders
EN 62024-1:2002 High frequency inductive components - Electrical characteristics and measuring methods Part 1: Nanohenry range chip inductor
EN 61300-2-18:1997 Fibre Optic Interconnecting Devices and Passive Components Basic Test and Measurement Procedures Part 2-18: Tests - Dry Heat - High Temperature Endurance
EN 61308:1996 High-Frequency Dielectric Heating Installations Test Methods for the Determination of Power Output
EN 62037:1999 RF Connectors@ Connector Cable Assemblies and Cables Intermodulation Level Measurement

国家市场监督管理总局、中国国家标准化管理委员会, High frequency device test

GB/T 40853.1-2021 High frequency inductive components—Electrical characteristics and measuring method—Part 1：Nanohenry range chip inductor

FI-SFS, High frequency device test

SFS 2663-1975

GM Europe, High frequency device test

KR-KS, High frequency device test

KS C IEC 62025-2-2018 High frequency inductive components — Non-electrical characteristics and measuring methods — Part 2: Test methods for non-electrical characteristics
KS C IEC 60749-6-2020 Semiconductor devices — Mechanical and climatic test methods — Part 6: Storage at high temperature
KS C IEC 61083-1-2022 Instruments and software used for measurements in high-voltage and high-current tests — Part 1: Requirements for instruments for impulse tests
KS C IEC 60581-7-2003(2023)
KS C IEC 62024-2-2018 High frequency inductive components — Electrical characteristics and measuring methods — Part 2: Rated current of inductors for DC to DC converters
KS C IEC 60749-4-2020 Semiconductor devices — Mechanical and climatic test methods — Part 4: Damp heat, steady state,highly accelerated stress test(HAST)
KS C IEC 60642-2018 Piezoelectric ceramic resonators and resonator units for frequency control and selection — Chapter I: Standard values and conditions — Chapter II: Measuring and test conditions
KS C IEC 61083-2-2019 Instruments and software used for measurement in high-voltage and highcurrent tests – Part 2: Requirements for software for tests with impulse voltages and currents

Shaanxi Provincial Standard of the People's Republic of China, High frequency device test

DB61/T 1435-2021 General Test and Test Procedures for Radio Frequency Coaxial Connectors and Cable Assemblies for Commercial Satellite Use

International Organization for Standardization (ISO), High frequency device test

ISO/IEC 13818-4:1998/Amd 1:1999 Information technology — Generic coding of moving pictures and associated audio information — Part 4: Conformance testing — Amendment 1: Advanced Audio Coding (AAC) conformance testing
ISO/IEC 14496-4:2004/Amd 8:2005/Cor 1:2008 Information technology - Coding of audio-visual objects - Part 4: Conformance testing; Amendment 8: High Efficiency Advanced Audio Coding, audio BIFS, and structured audio conformance
ISO/IEC 14496-4:2004/Amd 8:2005 Information technology — Coding of audio-visual objects — Part 4: Conformance testing — Amendment 8: High Efficiency Advanced Audio Coding, audio BIFS, and structured audio conformance
ISO 11784:1996/Amd 2:2010 Radio frequency identification of animals - Code structure - Amendment 2: Indication of an advanced transponder
ISO/IEC 14496-4:2004/Amd 6:2005/Cor 1:2007 Information technology - Coding of audio-visual objects - Part 4: Conformance testing; Amendment 6: Advanced Video Coding conformance; Technical Corrigendum 1

CZ-CSN, High frequency device test

CSN 70 0552-1961 Testing of glass containers. Determination of seam height.
CSN 34 5642-1982 Electrical apparatus and eguipment. Measuring methods in highvoltage tests
CSN 35 8234 Cast.2-1984 Capacitors. Methods of deteiminating of temperature rise at load by permissible reactive power and h. f. current

MSS - Manufacturers Standardization Society of the Valve and Fittings Industry., High frequency device test

SP-75-2004 Specification for High Test@ Wrought@ Butt Welding Fittings

Lithuanian Standards Office , High frequency device test

LST EN 61083-1-2002 Instruments and software used for measurements in high- voltage impulse tests. Part 1: Requirements for instruments (IEC 61083-1:2001)
LST EN 60512-21-1-2010 Connectors for electronic equipment - Tests and measurements -- Part 21-1: R.F. resistance tests - Test 21a: R.F. shunt resistance (IEC 60512-21-1:2010)
LST EN 62025-2-2005 High frequency inductive components. Non-electrical characteristics and measuring methods. Part 2: Test methods for non-electrical characteristics (IEC 62025-2:2005)
LST EN 62024-2-2009 High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC to DC converters (IEC 62024-2:2008)
LST EN 62024-1-2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor (IEC 62024-1:2008)
LST EN 61300-2-14-2013 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures -- Part 2-14: Tests - High optical power (IEC 61300-2-14:2012)
LST EN 60749-12-2003 Semiconductor devices. Mechanical and climatic test methods. Part 12: Vibrations, variable frequency (IEC 60749-12:2002)
LST EN IEC 61083-3:2021 Instruments and software used for measurement in high-voltage and high-current tests - Part 3: Requirements for hardware for tests with alternating and direct voltages and currents (IEC 61083-3:2020)

Institute of Electrical and Electronics Engineers (IEEE), High frequency device test

IEEE Std 433-2009 IEEE Recommended Practice for Insulation Testing™ of AC Electric Machinery with High Voltage at Very Low Frequency - Redline
IEEE Unapproved Draft Std P433/D16 Oct 2009 Draft Recommeded Practice for Insulation Testing of AC Electric Machinery with High Voltage at Very Low Frequency
IEEE Std 184-1969 IEEE Test Procedure for Frequency-Modulated Mobile Communications Receivers
IEEE 185-1974 IEEE/IHF Standard Methods of Testing Frequency Modulation Broadcast Receivers
ANSI/IEEE STD 185-1975 IEEE/IHF Standard Methods of Testing Frequency Modulation Broadcast Receivers
IEEE 1122-1998 Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests
IEEE 1122-1987 Digital recorders for measurement in high-voltage impulse tests
ANSI/IEEE Std 469-1988 IEEE Recommended Practice for Voice-Frequency Electrical-Noise Tests of Distribution Transformers
IEEE Std 469-1977 IEEE Recommended Practice for Voice-Frequency Electrical-Noise Tests of Distribution Transformers

Professional Standard - Aviation, High frequency device test

HB 6136.2-1987 Flight Test Instrument (Static) Calibration Specification Altitude

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., High frequency device test

IEEE 184-1969 TEST PROCEDURE FOR FREQUENCY-MODULATED MOBILE COMMUNICATIONS RECEIVERS
IEEE C37.41-1981 Design Tests for High-Voltage Fuses@ Distribution Enclosed Single-Pole Air Switches@ Fuse Disconnecting Switches@ and Accessories
IEEE 469-1977 RECOMMENDED PRACTICE FOR VOICE-FREQUENCY ELECTRICAL-NOISE TESTS OF DISTRIBUTION TRANSFORMERS
IEEE C62.42.6-2018 Guide for the Application of Surge-Protective Components in Surge Protective Devices and Equipment Ports—Part 6 High Frequency Signal Isolation Transformers

U.S. Military Regulations and Norms, High frequency device test

ARMY MIL-D-63147 VALID NOTICE 2-2013 Dispenser Test Adapter Assembly

ITU-T - International Telecommunication Union/ITU Telcommunication Sector, High frequency device test

ITU-T K.126-2017 Surge protective component application guide – High frequency signal isolation transformers (Study Group 5)

Indonesia Standards, High frequency device test

SNI 09-4056-1996 Method of high and low temperatur test for motor vehicle parts

AT-ON, High frequency device test

ONORM EN 54 Teil.8-1989 Components ofautomatic fire detection Systems; high temperature heat detectors

SE-SIS, High frequency device test

SIS SS-IEC 427:1991 Synthetic testing of high-voltage altemating current circuit-breakers
SIS SMS 2987-1974 Door and window fittings. Door dosers Testing
SIS SS IEC 790:1989 High-voltage test technique — Oscilloscopes and peak voltmeters for impulse tests

Professional Standard - Geology, High frequency device test

DZ 0039.11-1992 Basic environmental test conditions and methods for geological instrument products High temperature/high pressure comprehensive test

TR-TSE, High frequency device test

TS 2098-1975 BASIC ENVIROMENTAL TESTING PROCEDURES TEST Fda .- RANDOM VIBRATION WIDE BAND — REPRODUCIBILITY HIGH

Professional Standard - Petrochemical Industry, High frequency device test

SH/T 0784-2006 Standard test method for determining extreme pressure properties of lubricating grease using a high-frequency, linear-oscillation (SRV) test machine
SH/T 0721-2002 Standard test method for measuring friction and wear properties of lubricating grease using a high-frequency, linear-oscillation (SRV) test machine

European Telecommunications Standards Institute (ETSI), High frequency device test

ETSI ETR 040-1992 Advanced Testing Methods (ATM); Profile Test Specifications and Conformance Test Reports

ETSI - European Telecommunications Standards Institute, High frequency device test

ETR 040-1992 Advanced Testing Methods (ATM); Profile Test Specifications and Conformance Test Reports

Association of German Mechanical Engineers, High frequency device test

VDI/VDE/DGQ/DKD 2622 Blatt 14.1-2015 Calibration of measuring equipment for electrical quantities - HF signal generators with analog modulation

未注明发布机构, High frequency device test

DIN EN 61169-1:1995 High-frequency connectors Part 1: Basic specification General requirements and measurement methods

TH-TISI, High frequency device test

TIS 1865-1999 Semiconductor devices-discrete devices part 7:bipolar transistors section 1:blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification

IN-BIS, High frequency device test

IS 9741 Pt.1-1981

CH-SNV, High frequency device test

SN ISO 9838:2021 Alpine and touring ski-bindings - Test soles for ski-binding tests

American Society for Testing and Materials (ASTM), High frequency device test

ASTM D7217-05 Standard Test Method for Determining Extreme Pressure Properties of Solid Bonded Films Using a High-Frequency, Linear-Oscillation (SRV) Test Machine
ASTM D7217-11 Standard Test Method for Determining Extreme Pressure Properties of Solid Bonded Films Using a High-Frequency, Linear-Oscillation (SRV) Test Machine
ASTM D8227-18 Standard Test Method for Determining the Coefficient of Friction of Synchronizer Lubricated by Mechanical Transmission Fluids (MTF) Using a High-Frequency, Linear-Oscillation (SRV) Test Machine
ASTM D8227-20 Standard Test Method for Determining the Coefficient of Friction of Synchronizer Lubricated by Mechanical Transmission Fluids (MTF) Using a High-Frequency, Linear-Oscillation (SRV) Test Machine
ASTM D6079-11 Standard Test Method for Evaluating Lubricity of Diesel Fuels by the High-Frequency Reciprocating Rig (HFRR)

Society of Motion Picture and Television Engineers (SMPTE), High frequency device test

SMPTE RP 64-1999 Specifications for Audio-Focusing Test Film for 35-mm Audio Reproducers, Photographic Type
SMPTE RP 90-1999 Specifications for Type U Audio Level and Multifrequency Test Film for 16-mm Audio Reproducers, Magnetic Type
SMPTE RP 92-1995 Specifications for Audio Level and Multifrequency Test Films for 8-mm Type S Audio Reproducers, Magnetic Type

United States Navy, High frequency device test

NAVY MIL-PRF-32226-2006 FLAME DETECTOR, ADVANCED FIRE AND SMOKE SENSOR SYSTEM (AFSSS)