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thin film diffractometer
thin film diffractometer, Total:172 items.
In the international standard classification, thin film diffractometer involves: Optics and optical measurements, Products of the textile industry, Radiation protection, Linear and angular measurements, Vocabularies, Organic chemicals, Photography, Testing of metals, Rubber and plastics products, Analytical chemistry, Optoelectronics. Laser equipment, Mechanical structures for electronic equipment, Occupational safety. Industrial hygiene, Plastics, Non-destructive testing, Packaging materials and accessories, Products of non-ferrous metals, Products of the chemical industry, Production of metals, Ceramics, Medical equipment, Surface treatment and coating, Electrical accessories, Non-metalliferous minerals, Electronic display devices, Radiation measurements, Non-ferrous metals, Vacuum technology, Welding, brazing and soldering, Education, Applications of information technology, Mechanical testing, Protection of and in buildings, Manufacturing processes in the rubber and plastics industries, Electromechanical components for electronic and telecommunications equipment, Inorganic chemicals, Aerosol containers, Particle size analysis. Sieving.
Professional Standard - Machinery, thin film diffractometer
IT-UNI, thin film diffractometer
- UNI 7577-1976 Textiles from film. Characterization of textiles from film and relevant more usual manufactured goods.
- UNI 7578-1976 Textiles from film. Tests on bags made out of woven polyolefin tapes.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, thin film diffractometer
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB/T 8362-1987 Retained austenite in steel--Quantitative determination--Method of X-ray diffractometer
- GB/T 26598-2011 Transparent conductive thin film speciation for optical instruments
- GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
- GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
- GB/T 28609-2012 Optical functional films.Polyethylene terephthalate(PET).Determination of birefringence
- GB/T 26332.6-2022 Optics and photonics—Optical coatings—Part 6: Minimum requirements for reflecting coatings
- GB/T 26332.1-2010 Optics and optical instruments.Optical coatings.Part 1:Definitions
- GB/T 26332.5-2022 Optics and photonics—Optical coatings—Part 5: Minimum requirements for antireflecting coatings
- GB/T 29658-2013 High-purity sputtering aluminium and aluminium alloy target used in electronic film
- GB/T 27583-2011 Optical functional films.Determination of reflected glare
- GB/T 25898-2010(英文版) Instrumented nanoindentation test—Indentation hardness and modulus of thin film
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 25898-2010 Instrumented nanoindentation test.Indentation hardness and modulus of thin film
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, thin film diffractometer
- GJB/J 5463-2005 Verification regulation for measurement equipment of optical film refractive index and thickness
Military Standard of the People's Republic of China-General Armament Department, thin film diffractometer
- GJB 8687-2015 Calibration procedures for optical film refractive index and thickness testers
- GJB 3032-1997 Specification for sputtered molybdenum disulfide-based self-lubricating solid films
RU-GOST R, thin film diffractometer
- GOST R 8.698-2010 State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer
- GOST R 53655.2-2009 Plastics film and sheeting. Determination of impact resistance by the free-falling weight method. Part 2. Instrumented puncture test
National Metrological Verification Regulations of the People's Republic of China, thin film diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Verification Regulation for Polycrystalline X-Ray Diffractometer
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
Professional Standard - Education, thin film diffractometer
- JY 141-1982 Light interference, diffraction, polarization demonstrator
- JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
- JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
American Society for Testing and Materials (ASTM), thin film diffractometer
- ASTM E2444-05 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2244-05 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-11 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-11(2018) Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2444-11 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2444-11(2018) Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2246-02 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-05 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-02 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-05 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-02 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-11 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-11e1 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-11e1 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-11e1 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2444-05e1 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2444-11e1 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2246-11(2018) Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-11(2018) Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E915-96 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-16 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM F136-98e1 Standard Specification for Wrought Titanium-6 Aluminum-4 Vanadium ELI (Extra Low Interstitial) Alloy (UNS R56401) for Surgical Implant Applications
- ASTM F136-08 Standard Specification for Wrought Titanium-6 Aluminum-4 Vanadium ELI (Extra Low Interstitial) Alloy for Surgical Implant Applications (UNS R56401)
- ASTM F136-13(2021)e1 Standard Specification for Wrought Titanium-6Aluminum-4Vanadium ELI (Extra Low Interstitial) Alloy for Surgical Implant Applications (UNS R56401)
- ASTM F1367-98(2011) Standard Specification for Chromium Sputtering Targets for Thin Film Applications
- ASTM F2187-02 Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
- ASTM E915-19 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-10 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-21 Standard Practice for Verifying the Alignment of X-Ray Diffraction Instruments for Residual Stress Measurement
- ASTM F1709-97 Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
- ASTM F1709-97(2016) Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
- ASTM F1709-97(2002) Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
- ASTM F1709-97(2008) Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
- ASTM E2120-00 Standard Practice for the Performance Evaluation of the Portable X-Ray Fluorescence Spectrometer for the Measurement of Lead in Paint Films
- ASTM F2359-04(2011) Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
- ASTM F2360-08(2015)e1 Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
- ASTM F2359-04(2019) Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
- ASTM E1458-92 Standard Test Method for Calibration Verification of Laser Diffraction Particle Sizing Instruments Using Photomask Reticles
- ASTM E2872-14 Standard Guide for Determining Cross-Section Averaged Characteristics of a Spray Using Laser-Diffraction Instruments in a Wind Tunnel Apparatus
- ASTM E2872-14(2019) Standard Guide for Determining Cross-Section Averaged Characteristics of a Spray Using Laser-Diffraction Instruments in a Wind Tunnel Apparatus
- ASTM F2359-04 Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
- ASTM F2360-04 Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
- ASTM E2245-11 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E1458-12(2022) Standard Test Method for Calibration Verification of Laser Diffraction Particle Sizing Instruments Using Photomask Reticles
工业和信息化部, thin film diffractometer
- HG/T 5854-2021 Optical functional thin film coating type reflective film
- YB/T 5338-2019 X-ray diffractometer method for quantitative determination of austenite in steel
- JB/T 13935-2020 Non-destructive testing instrument ultrasonic detection ultrasonic diffraction sound time detector
PL-PKN, thin film diffractometer
- PN C99282-06-1989 Radiographic medical films Qualitative and usable characteristic of films for X-ray radiography
Taiwan Provincial Standard of the People's Republic of China, thin film diffractometer
- CNS 13788-1996 Methods of Test for Water Vapor Transmission Rate of Plastic Films and Sheets (Instrument Method)
Association Francaise de Normalisation, thin film diffractometer
- NF S10-133:2005 Optics and optical instruments - Diffractive optics - Vocabulary.
- NF T54-199:1999 Plastics - Films and sheets made of polymers for industrial purposes - Light transmission reduction ratio measurement of a pigmented film or sheet
- NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
- NF EN ISO 18452:2016 Céramiques techniques - Détermination de l'épaisseur des films céramiques avec un profilomètre à contact
Occupational Health Standard of the People's Republic of China, thin film diffractometer
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
Group Standards of the People's Republic of China, thin film diffractometer
- T/ZZB 0514-2018 Optical Reflector Film for TFT-LCD Panel Display
- T/CPIA 0036.1-2022 Retroreflective optical films for photovoltaic modules Part 1: Films for tinned ribbon surfaces
- T/GDCA 018-2023 General principles of facial mask for radiofrequency appliance
- T/ZZB 1790-2020 Sputter equipment for Cu-In-Ga-Se thin film solar cells
Korean Agency for Technology and Standards (KATS), thin film diffractometer
- KS M 3088-1994 Testing methods for water vapor transmission rate of plastic film and sheeting(instrument method)
- KS M 3088-2013 Testing methods for water vapor transmission rate of plastic film and sheeting(instrument method)
- KS A ISO/ASTM 51275:2005 Practice for use of a radiochromic film dosimetry system
- KS D ISO 16413:2021 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
- KS M 3088-2009 Testing methods for water vapor transmission rate of plastic film and sheeting(instrument method)
- KS M ISO 7765-2-2002(2017) Plastics film and sheeting－Determination of impact resistance by the free－falling dart method－Part 2：Instrumented puncture test
- KS M ISO 7765-2-2002(2022) Plastics film and sheeting－Determination of impact resistance by the free－falling dart method－Part 2：Instrumented puncture test
National Metrological Technical Specifications of the People's Republic of China, thin film diffractometer
- JJF 1447-2014 Calibration Specification for Ultrasonic Flaw Detectors by Time-of-Flight Diffraction
- JJF 1488-2014 Calibration Specification for Rubber and Plastic Film Gage
- JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
Society of Automotive Engineers (SAE), thin film diffractometer
American National Standards Institute （ANSI), thin film diffractometer
国家市场监督管理总局、中国国家标准化管理委员会, thin film diffractometer
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
- GB/T 40023-2021 Non-destructive testing instruments—Ultrasonic time-of-flight diffraction instrument—Technical requirements
- GB/T 39849-2021 Non-destructive testing instruments—Ultrasonic time-of-flight diffraction instrument—Methods of performance tests
- GB/T 40293-2021 Test method for refractive index of infrared optical chalcogenide films
- GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
- GB/T 40279-2021 Test method for thickness of films on silicon wafer surface—Optical reflection method
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
Professional Standard - Ferrous Metallurgy, thin film diffractometer
- YB/T 5337-2006 Determination method of metal lattice constant X-ray diffractometer method
- YB/T 5338-2006 X-ray Diffraction Method for Quantitative Determination of Retained Austenite in Steel
- YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
British Standards Institution (BSI), thin film diffractometer
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- 20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- PD IEC TR 63258:2021 Nanotechnologies. A guideline for ellipsometry application to evaluate the thickness of nanoscale films
- BS ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements alignment and positioning, data collection, data analysis and reporting
- BS ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Japanese Industrial Standards Committee (JISC), thin film diffractometer
- JIS K 7129:2008 Plastics --Film and sheeting -- Determination of water vapour transmission rate -- Instrumental method
- JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
- JIS K 7129:1992 Testing methods for water vapor transmission rate of plastic film and sheeting (instrument method)
- JIS R 1635:1998 Test method for visible light transmittance of fine ceramic thin films
- JIS R 1694:2012 Measurement of spectral transmittance of fine ceramic thin films under humid condition
- JIS R 1698:2015 Measurement of spectral reflectance of fine ceramics thin films under humid condition
Professional Standard - Non-ferrous Metal, thin film diffractometer
- YS/T 819-2012 High-purity sputtering copper target used in electronic film
- YS/T 893-2013 High-purity sputtering titanium target used in electronic film
- YS/T 718-2009 Flat magneting sputtering target.Niobium target for optical coating
- YS/T 719-2009 Flat magneting sputtering target.Silicon target for optical coating
- YS/T 1025-2015 High-purity tungsten and tungsten alloy sputtering target used in electronic film
- YS/T 839-2012 Test method for measurement of insulator thickness and refractive index on silicon substrates by ellipsometry
Lithuanian Standards Office , thin film diffractometer
- LST EN ISO 15902:2005 Optics and optical instruments - Diffractive optics - Vocabulary (ISO 15902:2004)
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- LST EN ISO 17636-1:2013 Non-destructive testing of welds - Radiographic testing - Part 1: X- and gamma-ray techniques with film (ISO 17636-1:2013)
Jiangsu Provincial Standard of the People's Republic of China, thin film diffractometer
- DB32/T 3792-2020 Graphene film light transmittance test light transmittance instrument method
Professional Standard - Chemical Industry, thin film diffractometer
- HG/T 5854～5857-2021 Coated reflective films for optical functional films, triacetyl cellulose (TAC) anti-glare films, anti-fouling cured films, and transparent cured films for cover plates (2021)
- HG/T 5297～5300-2018 Diffusion composite polyethylene terephthalate (PET) film, high temperature resistant transparent high barrier film, transparent polyethylene terephthalate (PET) hardened film for indium tin oxide (ITO) coating and indium tin Refractive index matching cur
International Organization for Standardization (ISO), thin film diffractometer
- ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- ISO/ASTM 51275:2002 Practice for use of a radiochromic film dosimetry system
- ISO/ASTM 51275:2004 Practice for use of a radiochromic film dosimetry system
- ISO/ASTM 51275:2013 Practice for use of a radiochromic film dosimetry system
- IEC TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
- IEC/TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
- ISO 17636-1:2013 Non-destructive testing of welds - Radiographic testing - Part 1: X- and gamma-ray techniques with film
- ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
- ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
- ISO 7765-2:2022 Plastics film and sheeting — Determination of impact resistance by the free-falling dart method — Part 2: Instrumented puncture test
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
German Institute for Standardization, thin film diffractometer
- DIN 15551-3:2013-12 Radiation sensitive films - Cellulose nitrate film - Part 3: Terms and definitions, properties, utilization, storage
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN ISO 7765-2:2009 Plastics film and sheeting - Determination of impact resistance by the free-falling dart method - Part 2: Instrumented puncture test (ISO 7765-2:1994); English version of DIN ISO 7765-2:2009-02
- DIN ISO 7765-2:2023 Plastics film and sheeting - Determination of impact resistance by the free-falling dart method - Part 2: Instrumented puncture test (ISO 7765-2:2022)
European Committee for Standardization (CEN), thin film diffractometer
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Danish Standards Foundation, thin film diffractometer
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Professional Standard - Customs, thin film diffractometer
- HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer
AENOR, thin film diffractometer
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
(U.S.) Ford Automotive Standards, thin film diffractometer
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, thin film diffractometer
- GB/T 33826-2017 Measurement of nanofilm thickness on glass substrate—Profilometric method
- GB/T 36053-2018 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
KR-KS, thin film diffractometer
- KS D ISO 16413-2021 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
未注明发布机构, thin film diffractometer
RO-ASRO, thin film diffractometer
- STAS 10157-1975 PAINTS AND VARNISHES Determination of film gloss by measuring specular reflexion
Standard Association of Australia （SAA）, thin film diffractometer
CZ-CSN, thin film diffractometer
- CSN 02 3400-1986 Plain bearings. Calculation of static load and fluid — film radial plain bearings