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Electron for TEM
Electron for TEM, Total:180 items.
In the international standard classification, Electron for TEM involves: Optical equipment, Optics and optical measurements, Metrology and measurement in general, Analytical chemistry, Education, Testing of metals, Optoelectronics. Laser equipment, Technical drawings, Surface treatment and coating, Air quality, Materials for the reinforcement of composites, Physics. Chemistry, Products of the textile industry, Photography, Telecommunication terminal equipment, Linear and angular measurements, Farming and forestry, Protection against crime, Electronic tubes, Protection against dangerous goods, Welding, brazing and soldering, Electronic components in general, Electronic display devices, Protection against fire, Medical equipment, Road vehicle systems, Plastics, Construction materials, Paints and varnishes.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron for TEM
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
- GB/T 28044-2011 General guide of detection method for nanomaterial biological effect by transmission electron microscope (TEM)
- GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
- GB/Z 21738-2008 Fundamental structures of one dimensional nano-materials.High resolution
transmission electron microscopy characterization
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB/T 28044-2011(英文版) General guide of detection method for nanomaterial biological effect by transmission electron microscope
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 42208-2022 Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy
- GB/T 27510-2011 Fresnel lens in DLP, CRT, LCOS and LCD projection television screen
- GB/T 30543-2014 Nanotechnologies.Characterization of single-wall carbon nanotubes using transmission electron microscopy
- GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
- GB/T 27765-2011 Testing methods of SiO, TiO, FeO and AlO nanoparticles biological effect by transmission electron microscope (TEM)
Professional Standard - Machinery, Electron for TEM
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5383-1991 Specification for transmission electron microscope
- JB/T 5584-1991 Test method of transmission electron microscope amplification
- JB/T 5585-1991 Test method of transmission electron microscope resolution
- JB/T 5586-1991 Classification and basic parameter of transmission electron microscope
Group Standards of the People's Republic of China, Electron for TEM
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
- T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
- T/CNTAC 21-2018 Test method for identification of graphene materials in fibres– Transmission electron microscope (TEM) method
- T/GDAQI 111-2023 Evaluation method for depth of field of medical electronic endoscope
- T/GDAQI 94-2022 Evaluation method for limit resolution of medical electronic endoscope
National Metrological Verification Regulations of the People's Republic of China, Electron for TEM
Professional Standard - Education, Electron for TEM
- JY/T 011-1996 General Principles of Transmission Electron Microscopy
- JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
International Organization for Standardization (ISO), Electron for TEM
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
- ISO 13794:2019 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
- ISO 10312:2019 Ambient air — Determination of asbestos fibres — Direct transfer transmission electron microscopy method
- ISO/TS 22292:2021 Nanotechnologies — 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
- ISO 20263:2017 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
- ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 14490-5:2017 Optics and photonics - Test methods for telescopic systems - Part 5: Test methods for transmittance
- ISO 12239:2021 Smoke alarms using scattered light, transmitted light or ionization
Korean Agency for Technology and Standards (KATS), Electron for TEM
- KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
- KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
- KS I ISO 10312-2008(2018) Ambient air－Determination of asbestos fibers－Direct-transfer transmission electron microscopy method
- KS I ISO 13794-2008(2018) Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method
- KS D 8544-2016 Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
- KS M 0044-1999
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS B ISO 12239:2021 Smoke alarms using scattered light, transmitted light or ionization
- KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
- KS F 2592-2014 Standard test method for electronic cone penetration of soils
国家市场监督管理总局、中国国家标准化管理委员会, Electron for TEM
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
KR-KS, Electron for TEM
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
- KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
- KS B ISO 12239-2021 Smoke alarms using scattered light, transmitted light or ionization
- KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
工业和信息化部, Electron for TEM
- YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
British Standards Institution (BSI), Electron for TEM
- BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- 15/30292710 DC BS ISO 19214. Guidelines for growth direction determination of wirelike crystals by transmission electron microscopy
- BS ISO 13794:2019 Ambient air. Determination of asbestos fibres. Indirect-transfer transmission electron microscopy method
- BS ISO 10312:2019 Ambient air. Determination of asbestos fibres. Direct transfer transmission electron microscopy method
- PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
- PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
- BS EN ISO 21363:2022 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
- BS ISO 21363:2020 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
- BS PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
- BS ISO 8478:2017 Optics and photonics. Camera lenses. Measurement of ISO spectral transmittance
- 18/30351714 DC BS ISO 21363. Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
- BS 4793:1972 Recommendations for specifying the optical performance of lenses for television cameras
- BS ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
- BS ISO 12239:2021 Smoke alarms using scattered light, transmitted light or ionization
- BS EN ISO 10685-1:2011 Ophthalmic optics. Spectacle frames and sunglasses electronic catalogue and identification. Product identification and electronic catalogue product hierarchy
- BS ISO 10312:1995 Ambient air. Determination of asbestos fibres. Direct-transfer transmission electron microscopy method
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
Shanghai Provincial Standard of the People's Republic of China, Electron for TEM
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
American Society for Testing and Materials (ASTM), Electron for TEM
- ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18b(2023) Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM D6056-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy
- ASTM D7201-06(2020) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
- ASTM D5756-02 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Concentration
- ASTM D5756-95 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Concentration
- ASTM D5755-95 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
- ASTM D5755-02 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
- ASTM D6480-05(2010) Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
- ASTM D5756-02(2008) Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Surface Loading
- ASTM D7201-06(2011) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
- ASTM D6281-98 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
- ASTM D5755-03 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D5755-09 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D5755-09(2014)e1 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D6281-06 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
- ASTM D6281-04 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
- ASTM D6281-09 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
- ASTM D6281-15 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM D6480-05 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
- ASTM D8526-23 Standard Test Method for Analytical Procedure Using Transmission Electron Microscopy for the Determination of the Concentration of Carbon Nanotubes and Carbon Nanotube-containing Particles in Ambient
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
European Committee for Standardization (CEN), Electron for TEM
- EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
- prEN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
- EN ISO 10685-1:2011 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 1: Product identification and electronic catalogue product hierarchy (ISO 10685-1:2011)
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron for TEM
- GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
- GB/T 34168-2017 Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope
- GB/T 33839-2017 Methods of transmission electron microscope for biological specimen containing carbon nanomaterials involving biological effect
AENOR, Electron for TEM
- UNE 77236:1999 AMBIENT AIR. DETERMINATION OF ASBESTOS FIBRES. DIRECT-TRANSFER TRANSMISSION ELECTRON MICROSCOPY METHOD.
- UNE 77253:2003 Ambient air. Determination of asbestos fibres -- Indirect-transfer transmission electron microscopy method
- UNE 20627:1979 MEASUREMENTS OF INCIDENTAL IONIZING RADIATION FROM ELECTRONIC TUBES
- UNE-EN ISO 13697:2007 Optics and photonics - Lasers and laser-related equipment - Test methods for specular reflectance and regular transmittance of optical laser components (ISO 13697:2006)
Association Francaise de Normalisation, Electron for TEM
- NF ISO 10312:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert direct
- FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
- NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
- NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
- NF ISO 13794:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert indirect
- NF X43-050:2021 Air quality - Determination of the asbestos fiber concentration by transmission electron microscopy - Indirect method
- NF EN ISO 21363:2022 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à transmission
- NF X43-067*NF ISO 10312:2020 Ambient air - Determination of asbestos fibres - Direct transfer transmission electron microscopy method
- NF X43-054*NF ISO 13794:2020 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
- NF EN ISO 13697:2006 Optique et photonique - Lasers et équipements associés aux lasers - Méthodes d'essai du facteur de réflexion spéculaire et du facteur de transmission des composants optiques laser
PH-BPS, Electron for TEM
- PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
Danish Standards Foundation, Electron for TEM
- DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
- DS/ISO/TS 22292:2021 Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
- DS/EN ISO 13697:2006 Optics and photonics - Lasers and laser-related equipment - Test methods for specular reflectance and regular transmittance of optical laser components
Japanese Industrial Standards Committee (JISC), Electron for TEM
- JIS K 3850-3:2000 Measuring method for airborne fibrous particles -- Part 3: Indirect-transfer transmission electron microscopy method
- JIS K 3850-2:2000 Measuring method for airborne fibrous particles -- Part 2: Direct-transfer transmission electron microscopy method
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
GOSTR, Electron for TEM
- GOST R 58566-2019 Optics and photonics. Lenses for optical electronic systems. Test methods
- PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry
German Institute for Standardization, Electron for TEM
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 21363:2022-03 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020); German version EN ISO 21363:2022
- DIN IEC 60562:1980 Measurements of incidental ionizing radiation from electronic tubes
- DIN IEC 60562:1980-05 Measurements of incidental ionizing radiation from electronic tubes
- DIN EN 100012:1995 Basic specification: X-ray inspection of electronic components; German version EN 100012:1995
- DIN ISO 14490-5:2018 Optics and photonics - Test methods for telescopic systems - Part 5: Test methods for transmittance (ISO 14490-5:2017)
- DIN EN ISO 13697:2006-08 Optics and photonics - Lasers and laser-related equipment - Test methods for specular reflectance and regular transmittance of optical laser components (ISO 13697:2006); German version EN ISO 13697:2006
ES-UNE, Electron for TEM
- UNE-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020) (Endorsed by Asociación Española de Normalización in February of 2022.)
AT-ON, Electron for TEM
- OENORM EN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
未注明发布机构, Electron for TEM
- DIN EN ISO 21363:2022 Nanotechnologies – measurements of particle size and particle shape distributions using transmission electron microscopy
RU-GOST R, Electron for TEM
- GOST 8998-1974 Lenses for telephone switchboards. Specifications
- GOST R 8.697-2010 State system for ensuring the uniformity of measurements. Interpenar spacings in crystals. Method for measurement by means of a transmission electron microscope
- GOST 19438.8-1975 Low-power electronic tubes and valves. Methods of measurement of current due to the cathode electron emission
- GOST R 59742-2021 Optics and photonics. Lasers and laser-related equipment. Optical elements for laser equipment. Test methods for specular reflectance and regular transmittance
IX-IX-IEC, Electron for TEM
- IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy
Professional Standard - Aquaculture, Electron for TEM
- SC/T 7209.3-2007 Diagnostic Protocols for Mikrocytosis of Oyster- Part 3: Transmission Electron Microscopy Method
- SC/T 7207.3-2007 Diagnostic protocols for Marteiliosis of Oyster- Part 3: Transmission Electron Microscopy Method
- SC/T 7205.3-2007 Diagnostic Protocols for Bonamiosisof Oyster-Part 3: Transmission Electron Microscopy Method
Professional Standard - Judicatory, Electron for TEM
Professional Standard - Public Safety Standards, Electron for TEM
- GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
Fujian Provincial Standard of the People's Republic of China, Electron for TEM
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Association of German Mechanical Engineers, Electron for TEM
BR-ABNT, Electron for TEM
VN-TCVN, Electron for TEM
- TCVN 6502-1999 Ambient air.Determination of asbestos bibres.Direct-transfer transmission electron microscopy method
YU-JUS, Electron for TEM
- JUS N.R1.199-1988 Measurestents of incidental ionizing radiation from electronic tubes
Professional Standard - Electron, Electron for TEM
- SJ/Z 9013-1987 Measurements of ionizing radiation from electronic tubes
- SJ 3196-1989 Test methods for transmitting coefficient of secondary electron of electronic materials
Professional Standard - Commodity Inspection, Electron for TEM
- SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method
Electronic Components, Assemblies and Materials Association, Electron for TEM
- ECA 448-20-1989 Method 20 Test Method for Electromechanical Components Test Method for Lens Face Touch Temperature
- ECA EIA-448-20-1989 Method 20 Test Method for Electromechanical Components Test Method for Lens Face Touch Temperature
Society of Automotive Engineers (SAE), Electron for TEM
- SAE J1647-1995 Plastic Materials and Coatings for Use in or on Optical Parts Such as Lenses and Reflectors of High-Intensity Discharge Forward Lighting Devices Used in Motor Vehicles, Recommended Practice March 1995
Institute of Interconnecting and Packaging Electronic Circuits (IPC), Electron for TEM
American National Standards Institute （ANSI), Electron for TEM
- ASTM D6281-23 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM) (Standard + Redline PDF Bundle)
International Electrotechnical Commission (IEC), Electron for TEM
- IEC 60562:1976 Measurements of incidental ionizing radiation from electronic tubes
- IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
Lithuanian Standards Office , Electron for TEM
- LST EN ISO 13697:2006 Optics and photonics - Lasers and laser-related equipment - Test methods for specular reflectance and regular transmittance of optical laser components (ISO 13697:2006)