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SEM magnification 50 times

SEM magnification 50 times, Total:17 items.

In the international standard classification, SEM magnification 50 times involves: Optical equipment.

American Society for Testing and Materials (ASTM), SEM magnification 50 times

• ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Shanghai Provincial Standard of the People's Republic of China, SEM magnification 50 times

• DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家市场监督管理总局、中国国家标准化管理委员会, SEM magnification 50 times

• GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, SEM magnification 50 times

• GB/T 27788-2011 Microbeam analysis.Scanning electron microscopy.Guidelines for calibrating image magnification

Korean Agency for Technology and Standards (KATS), SEM magnification 50 times

• KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
• KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification

International Organization for Standardization (ISO), SEM magnification 50 times

• ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
• ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

Association Francaise de Normalisation, SEM magnification 50 times

• NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.

British Standards Institution (BSI), SEM magnification 50 times

• BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
• BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Japanese Industrial Standards Committee (JISC), SEM magnification 50 times

• JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

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