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Electron Microscopy

Electron Microscopy, Total:437 items.

In the international standard classification, Electron Microscopy involves: Optics and optical measurements, Optical equipment, Analytical chemistry, Document imaging applications, Information sciences. Publishing, Applications of information technology, Vocabularies, Computer graphics, Microprocessor systems, Electronic components in general, Equipment for petroleum and natural gas industries, Ergonomics, Textile auxiliary materials, Optoelectronics. Laser equipment, Metrology and measurement in general, Medical equipment, Electronic tubes, Photography, Welding, brazing and soldering, Testing of metals, Glass, Air quality, Linear and angular measurements, Education, Electronic component assemblies, Interface and interconnection equipment, Protection against crime, Electronic display devices, Acoustics and acoustic measurements, Audio, video and audiovisual engineering, Test conditions and procedures in general, Thermodynamics and temperature measurements, Technical drawings, Surface treatment and coating, Products of the chemical industry, Production of metals, Materials for the reinforcement of composites, Integrated circuits. Microelectronics, Construction materials, Raw materials for rubber and plastics, Physics. Chemistry, Data storage devices, Occupational safety. Industrial hygiene.

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron Microscopy

GB/T 34831-2017 Nanotechnologies—Electron microscopy imaging of noble metal nanoparticles—High angle annular dark field imaging method
GB/T 33838-2017 Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness
GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
GB/T 34002-2017 Microbeam analysis—Analytical transmission electron microscopy—Methods for calibrating image magnification by using reference materials having periodic structures
GB/T 20225.1-2017 Electronic document management—Vocabulary—Part 1：Electronic document imaging
GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Microscopy

GB/T 42886-2023 Microscope digital imaging displays information about the imaging performance of the microscope to the user
GB/T 20225-2006 Electronic imaging.Vocabulary
GB/T 43087-2023 Method for determining the interface position in cross-sectional images of layered materials using microbeam analysis and electron microscopy
GB/T 23414-2009 Microbeam analysis.Scanning electron microscopy.Vocabulary
GB/Z 20495-2006 Electronic imaging. Human and organizational issues for successful Electronic Image Management(EIM)implementation
GB/T 21636-2008 Microbeam analysis.Electron probe microanalysis (EPMA).Vocabulary
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 41805-2022 Methodology for the quantitative inspection of the defect on optics surface—Microscopic scattering dark-field imaging
GB/T 22057.1-2008 Microscopes-Imaging distances related to mechanical reference planes-Part 1:Tube length 160mm
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/Z 19736-2005 Electronic imaging.Guidance for selection of document image compression methods
GB/T 22092-2018 Micrometer head and depth micrometer with electronic digital display
GB/T 22092-2008 Fixed micrometer and depth micrometer with electronic digital display
GB/T 32055-2015 Microbeam analysis.Electron probe microanalysis.Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
GB/T 21638-2008 Guide for electron beam microanalysis of defect in steel materials
GB/T 22057.2-2008 Microscopes-Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems
GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
GB/T 15247-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for determining the carbon content of steels using calibration curve method
GB/T 19665-2005 General specification for electronic infrared imaging thermometer of body skin
GB/T 18988.1-2003 Radionuclide imaging device--Characteristics and test conditions--Part 1: Positron emission tomograph
GB/T 18988.1-2013 Radionuclide imaging device.Characteristics and test conditions.Part 1:Positron emission tomograph
GB/T 43088-2023 Method for determination of dislocation density in metallic thin crystal specimens by microbeam analysis and electron microscopy
GB/T 30543-2014 Nanotechnologies.Characterization of single-wall carbon nanotubes using transmission electron microscopy
GB/T 28044-2011 General guide of detection method for nanomaterial biological effect by transmission electron microscope (TEM)
GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis

International Organization for Standardization (ISO), Electron Microscopy

ISO/CD 18221:2023 Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance
ISO 18221:2016 Microscopes - Microscopes with digital imaging displays - Information provided to the user regarding imaging performance
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/TR 14105:2001 Electronic imaging - Human and organizational issues for successful Electronic Image Management (EIM) implementation
ISO 11962:2002 Micrographics - Image mark (blip) used with 16 mm and 35 mm roll microfilm
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO/TS 12029:2007 Electronic imaging - Forms design optimization for electronic image management
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 20263:2023 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO/TS 22292:2021 Nanotechnologies — 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
ISO 12231:2005 Photography - Electronic still picture imaging - Vocabulary
ISO 12231:2012 Photography - Electronic still picture imaging - Vocabulary
ISO 20263:2017 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 11962:2002/cor 1:2006 Micrographics - Image mark (blip) used with 16 mm and 35 mm roll microfilm; Technical Corrigendum 1
ISO 12651:1999 Electronic imaging - Vocabulary
ISO 29301:2017 Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
ISO 12651-1:2012 Electronic document management - Vocabulary - Part 1: Electronic document imaging
ISO 15740:2013 Photography.Electronic still picture imaging.Picture transfer protocol (PTP) for digital still photography devices
ISO 15739:2013 Photography - Electronic still-picture imaging - Noise measurements
ISO 15739:2017 Photography - Electronic still-picture imaging - Noise measurements
ISO 15739:2003 Photography - Electronic still-picture imaging - Noise measurements
ISO 15739 Photography — Electronic still-picture imaging — Noise measurements
ISO 15739:2023 Photography — Electronic still-picture imaging — Noise measurements
ISO 12231-1:2020 Photography - Electronic still picture imaging terminology - Part 1: Supplemental vocabulary
ISO/TR 15801:2004 Electronic imaging - Information stored electronically - Recommendations for trustworthiness and reliability
ISO/TR 12033:2009 Document management - Electronic imaging - Guidance for the selection of document image compression methods
ISO 9345-2:2014 Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems
ISO 15740:2008 Photography - Electronic still picture imaging - Picture transfer protocol (PTP) for digital still photography devices
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO/TS 12033:2001 Electronic imaging - Guidance for selection of document image compression methods
ISO 9345:2019 Microscopes — Imaging distances related to mechanical reference planes — Part 2: Infinity-corrected optical systems
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO/TR 12231-2:2022 Photography — Electronic still picture imaging terminology — Part 2: Other defined terms
ISO 12234-3:2016 Electronic still picture imaging - Removable memory - Part 3: XMP for digital photography
ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO 15740:2005 Photography - Electronic still picture imaging - Picture transfer protocol (PTP) for digital still photography devices
ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
ISO 10312:1995 Ambient air - Determination of asbestos fibres - Direct-transfer transmission electron microscopy method
ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO/TR 12037:1998 Electronic imaging - Recommendations for the expungement of information recorded on write-once optical media
ISO 12233:2017 Photography - Electronic still picture imaging - Resolution and spatial frequency responses

British Standards Institution (BSI), Electron Microscopy

BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 9345:2019 Microscopes. Interfacing dimensions for imaging components
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
18/30342638 DC BS ISO 9345. Microscopes. Interfacing dimensions for imaging components
BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 12651:1999 Electronic imaging - Vocabulary
BS ISO 12651:2000 Electronic imaging. Vocabulary
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 14648-2:2001 Micrographics. Quality control of COM recorders that generate images using a single internal display system - Method of use
BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
BS EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Test methods for wavefront aberrations
PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 14648-1:2001 Micrographics. Quality control of COM recorders that generate images using a single internal display system - Characteristics of the software test target
BS PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
BS 7012-3:1997 Light microscopes - Imaging distances related to mechanical reference planes for tube length 160 mm
BS ISO 14648-2:2002 Micrographics - Quality control of COM recorders that generate images using a single internal display system - Method of use
BS ISO 9345-2:2014 Microscopes. Imaging distances related to mechanical reference planes. Infinity-corrected optical systems
BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
BS ISO 29301:2017 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
BS ISO 12234-2:2001 Electronic still-picture imaging - Removable memory - TIFF/EP image data format
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 15739:2017 Photography. Electronic still-picture imaging. Noise measurements
BS ISO 15739:2013 Photography. Electronic still-picture imaging. Noise measurements
BS ISO 12231-1:2020 Photography. Electronic still picture imaging terminology. Supplemental vocabulary
BS EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Test methods for optical properties other than wavefront aberrations
BS ISO 12234-3:2016 Electronic still picture imaging. Removable memory. XMP for digital photography
BS ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 14648-1:2002 Micrographics - Quality control of COM recorders that generate images using a single internal display system - Characteristics of the software test target
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS IEC 62679-3-3:2016 Electronic paper displays - Optical measuring methods for displays with integrated lighting units
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
22/30431331 DC BS ISO 15739. Photography. Electronic still-picture imaging. Noise measurements
19/30391754 DC BS ISO 12231. Photography. Electronic still picture imaging. Supplemental vocabulary
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 15739:2023 Tracked Changes. Photography. Electronic still-picture imaging. Noise measurements
BS ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
BS ISO 12653-1:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Characteristics
BS ISO 12653-1:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Characteristics
BS IEC 62899-302-2:2018 Printed electronics - Equipment. Inkjet. Imaging-based measurement of droplet volume
BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN 62220-1-3:2008 Medical electrical equipment — Characteristics of digital X-ray imaging devices — Part 1-3: Determination of the detective quantum efficiency — Detectors used in dynamic imaging
BS ISO 12233:2017 Photography. Electronic still picture imaging. Resolution and spatial frequency responses
BS ISO 12233:2014 Photography. Electronic still picture imaging. Resolution and spatial frequency responses

Korean Agency for Technology and Standards (KATS), Electron Microscopy

KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS A ISO 12231-2015(2020) Photography－Electronic still picture imaging－Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS X ISO 11962:2007 Micrographics－Image mark(blip) used with 16 mm and 35 mm roll microfilm
KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS A ISO 15739:2018 Photography — Electronic still-picture imaging — Noise measurements
KS A ISO 15739:2015 Photography－Electronic still-picture cameras－Noise measurementsNoise measurements
KS M 0044-1999
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS B ISO 14880-2:2013 Optics and photonics ― Microlens arrays ― Part 2: Test methods for wavefront aberrations
KS B ISO 14880-2:2008 Optics and photonics-Microlens arrays-Part 2:Test methods for wavefront aberrations
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS C IEC 60151-16-2003(2008) Measurements of the electrical properties of electronic tubes and valves－Part 16：Methods of measurement for television picture tubes
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS A ISO 12233:2018 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
KS C IEC 60151-16:2003 Measurements of the electrical properties of electronic tubes and valves-Part 16:Methods of measurement for television picture tubes
KS C IEC 60151-16:2013 Measurements of the electrical properties of electronic tubes and valves－Part 16：Methods of measurement for television picture tubes
KS A ISO 12234-2-2006(2021) Electronic still-picture imaging－Removable memory－Part 2：TIFF/EP image data format
KS A ISO 12234-2-2006(2016) Electronic still-picture imaging－Removable memory－Part 2：TIFF/EP image data format
KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS C IEC 61675-1:2012 Radionuclide imaging devices－Characteristics and test conditions－Part 1：Positron emission tomographs
KS C IEC 61675-1:2017 Radionuclide imaging devices — Characteristics and test conditions — Part 1: Positron emission tomographs
KS C IEC 62563-1:2019 Medical electrical equipment — Medical image display systems — Part 1: Evaluation methods
KS B ISO 9345-1-2016(2021) Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS I ISO 10312:2008 Ambient air-Determination of asbestos fibers-Direct-transfer transmission electron microscopy method
KS I ISO 13794:2008 Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method
KS I ISO 10312-2008(2018) Ambient air－Determination of asbestos fibers－Direct-transfer transmission electron microscopy method
KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS X ISO 14648-2:2007 Micrographics-Quality control of COM recorders that generate images using a single internal display system-Part 2:Method of use
KS B ISO 9345-2-2016(2021) Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS A ISO 12234-1-2016(2021) Electronic still-picture imaging－Removable memory－Part 1：Basic removable-memory model

Association Francaise de Normalisation, Electron Microscopy

NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
NF X21-016*NF ISO 15932:2014 Microbeam analysis - Analytical electron microscopy - Vocabulary
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
NF Z42-010-2:1993 Electronic imaging - Scanning of office documents - Part2:Acquisition of electronic imaging management systems - Guidelines for a request for proposals
NF C95-211:1974 ELECTRONIC TUBES WITH QUALITY CONFORMANCE PROCEDURES. CATHODE RAY AND STORAGE TUBES. PARTICULAR REQUIREMENTS.
NF Z42-001:1994 Imagerie électronique - Vocabulaire - Partie 1 : termes généraux.
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
NF EN IEC 62563-2:2021 Appareils électromédicaux - Systèmes d'imagerie médicale - Partie 2 : essais d'acceptation et de constance des systèmes d'imagerie médicale
FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
NF ISO 13794:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert indirect
NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
NF Z42-011-2:2001 Electronic imaging - Part 2 : verification of the informations stored on CD media.

国家市场监督管理总局、中国国家标准化管理委员会, Electron Microscopy

GB/T 22055-2022 Microscopes—Interfacing dimensions for imaging components
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)

RU-GOST R, Electron Microscopy

GOST 13.1.503-1989 Reprography. Micrography. Retrival units for microforms or frames of microforms. General technical requirements
GOST R IEC 61675-1-2013 Radionuclide imaging devices. Characteristics and test conditions. Part 1. Positron emission tomographs
GOST R ISO 4967-2009 Steel. Determination of content of nonmetallic inclusions. Micrographic method using standard diagrams
GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
GOST IEC 61675-1-2011 Radionuclide imaging devices. Characteristics and test conditions. Part 1. Positron emission tomographs
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification

Japanese Industrial Standards Committee (JISC), Electron Microscopy

JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS Z 6016:2003 Electronic imaging process of paper documents and microfilmed documents
JIS Z 6015:1997 Electronic imaging -- Vocabulary
JIS Z 6015:2010 Electronic imaging -- Vocabulary
JIS K 0132:1997 General rules for scanning electron microscopy
JIS Z 6014:1995 Micrographics -- Test charts for digitizing image -- Description and use in electronic imagery
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7132-1:2009 Microscopes -- Imaging distances related to mechanical reference planes -- Part 1: Tube length 160 mm
JIS B 7132-1:2022 Microscopes -- Imaging distances related to mechanical reference planes -- Part 1: Tube length 160 mm
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS Z 6014:2008 Test chart for digitizing image -- Description and use in electronic imagery
JIS B 7132-2:2009 Microscopes -- Imaging distances related to mechanical reference planes -- Part 2: Infinity-corrected optical systems
JIS Z 6017:2006 Document management -- Long-term preservation for electronic imaging documents
JIS Z 6017:2013 Document management -- Long-term preservation for electronic imaging documents
JIS B 7132-2:2022 Microscopes -- Imaging distances related to mechanical reference planes -- Part 2: Infinity-corrected optical systems
JIS H 7804:2005 Method for particle size determination in metal catalysts by electron microscope
JIS Z 6016:2008 Electronic imaging process of paper documents and microfilmed documents
JIS Z 6016:2015 Electronic imaging process of paper documents and microfilmed documents

Association for Information and Image Management (AIIM), Electron Microscopy

AIIM TR19-1993 Electronic Imaging Output Displays
AIIM TR34-1996 Sampling Procedures for Inspection by Attributes of Images in Electronic Image Management (EIM) and Micrographic Systems
AIIM TR29-1993 Electronic Imaging Output Printers
AIIM TR17-1989 Facsimile and Its Role in Electronic Imaging
AIIM TR27-1996 Electronic Imaging Request for Proposal (RFP) Guidelines
AIIM TR26-2000 Resolution as It Relates to Photographic and Electronic Imaging
AIIM TR32-1994 Paper Forms Design Optimization for Electronic Image Management (EIM)
AIIM TR35-1995 Human and Organizational Issues for Successful Electronic Image Management (EIM) Implementation

Standard Association of Australia （SAA）, Electron Microscopy

AS/NZS ISO 12029:2007 Electronic imaging - Forms design optimization for electronic image management
HB 177-2003 ISO/TR 14105 Electronic imaging - Human and organizational for successful Electronic Image Management (EIM) implementation
AS ISO 15739:2022 Photography — Electronic still-picture imaging — Noise measurements
AS ISO 15801:2006 Electronic imaging - Information stored electronically - Recommendations for trustworthiness and reliability
AS ISO 12231.1:2022 Photography — Electronic still picture imaging terminology, Part 1: Supplemental vocabulary

IECQ - IEC: Quality Assessment System for Electronic Components, Electron Microscopy

PQC 39/RU 0014-1995 Electronic Equipment: Receiving Picture Tubes A57LPE0IX0I
PQC 39/RU 0016 IS 1-1995 Electronic Equipment: Receiving Picture Tubes 61LK5C-1
PQC 39/RU 0013 ISSUE 1-1994 Electronic Equipment: Receiving Picture Tubes A33LPE01X01@ A33LPE02X01@ A33LPEO3X01
PQC 39/SU 0008-1990 Detail Specification for Electronic Components Receiving Picture Tube 40LK12B
PQC 39/SU 0005-1989 Detail Specification for Electronic Components Receiving Picture Tube 50LK2B
PQC 39/CS 0001-1992 Detail Specification for Electronic Components Colour Television Picture Tube A59TMZ40X01
PQC 39/SU 0004-1990 Detail Specification for Electronic Components Receiving Picture Tube 6ILK3B@ 6ILK4B
PQC 39/RU 0015-1995 Electronic Equipment: Receiving Picture Tubes A5ILPE02X0I@ A5ILPE03X0I@ A5ILPE04X0I@ A5ILPE05X0I@ A5ILPE06X0I@ A5ILPE07X0I
PQC 39/SU 0002-1987 Detail Specification for Electronic Components Receiving Picture Tube 31LK4B
PQC 39/SU 0007-1990 Detail Specification for Electronic Components Receiving Picture Tube I6LK8B
PQC 39/SU 0006-1990 Detail Specification for Electronic Components Receiving Picture Tube 6ILK5C-I (Amendment -1992)
PQC 39/SU 0005-1990 "Detail Specification for Electronic Components Receiving Picture Tube ""50cm 100 Degree""; (Amendment 1-1993)"

Danish Standards Foundation, Electron Microscopy

DS/ISO 12651:2000 Electronic imaging - Vocabulary
DS/ISO/TS 22292:2021 Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
DS/ISO 12651-1:2012 Electronic document management - Vocabulary - Part 1: Electronic document imaging
DS/ISO 15739:2013 Photography - Electronic still-picture imaging - Noise measurements
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/ISO 12234-1:2012 Electronic still-picture imaging - Removable memory - Part 1: Basic removable-memory model
DS/ISO 12231-1:2020 Photography – Electronic still picture imaging terminology – Part 1: Supplemental vocabulary

ZA-SANS, Electron Microscopy

SANS 12651:2005 Electronic imaging - Vocabulary
ARP 076-2006 Electronic imaging - Human and organizational issues for successful Electronic Image Management (EIM) implementation
ARP 073-2006 Electronic imaging - Guidance for selection of document image compression methods
SANS 15801:2005 Electronic imaging - Information stored electronically - Recommendations for trustworthiness and reliability
SANS 12029:2007 Electronic imaging - Forms design optimization for electronic image management

Professional Standard - Petroleum, Electron Microscopy

SY/T 6844-2011 Micro conductivity imaging logging tool
SY 6844-2011 Microresistivity Imaging Logging Tool
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

国家能源局, Electron Microscopy

SY/T 6844-2021 Microresistivity imaging logging tool
SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

Professional Standard - Machinery, Electron Microscopy

JB/T 5480-1991 Diaphragm of electron microscope
JB/T 5481-1991 Lamp filament of electron microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 6842-1993 Test method of scanning electron microscope
JB/T 5383-1991 Specification for transmission electron microscope
JB/T 5384-1991 Scanning electron microscope - Technical specification
JB/T 5584-1991 Test method of transmission electron microscope amplification
JB/T 5585-1991 Test method of transmission electron microscope resolution
JB/T 5586-1991 Classification and basic parameter of transmission electron microscope

PL-PKN, Electron Microscopy

PN T04830-09-1990 Electronic tubes Colour picture tubes Yoltage test
PN T04830-04-1985 Electronic tubes Colour picture tubes Methods of measurement of cut-off voltage
PN T04830-06-1987 Electronic tubes Colour picture tubes Method of measurement of focusing voltage
PN T04830-07-1987 Electronic tubes Colour picture tubes Methods of measurements of modulation voltage
PN T06441-1980 Electronic tubes Black-and-white television picture tubes General re?uirements and test
PN T04830-00-1990 Electronic tubes ' Colour picture tubes Methods of electrical and electrooptical tests Genera
PN T04830-10-1990 Electronic tubes Colour picture tubes Method of measurement of stray emission
PN T04830-08-1990 Electronic tubes Colour picture tubes Method of determination of raster centering displacement
PN T04830-05-1985 Electronic tubes Colour picture tubes Methods of measurement of filament current, anod? current and cathode current

American Society for Testing and Materials (ASTM), Electron Microscopy

ASTM E3060-16 Standard Guide for Subvisible Particle Measurement in Biopharmaceutical Manufacturing Using Dynamic (Flow) Imaging Microscopy
ASTM E3060-23 Standard Guide for Subvisible Particle Measurement in Biopharmaceutical Manufacturing Using Dynamic (Flow) Imaging Microscopy
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM D3849-95a(2000) Standard Test Method for Carbon Black - Primary Aggregate Dimensions from Electron Microscope Image Analysis
ASTM D3849-07 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM D3849-22 Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E3143-18b(2023) Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes

Professional Standard - Agriculture, Electron Microscopy

NY/T 2222-2012 Test for the average diameter and component of animal fiber.Microscopic image analyser

CZ-CSN, Electron Microscopy

CSN 35 8566-1980 Picture tubes /kinescopes/. Method for measuring the extenni conductive layer resiiunce
CSN 35 8920-1969 Electronic tube base K 14/20. Base for colour picture tubes
CSN IEC 151-28:1993 Measurements of the electrical properties of electronic tubes. Part 28: Methods of coulor television picture tubes

KR-KS, Electron Microscopy

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS A ISO 15739-2018 Photography — Electronic still-picture imaging — Noise measurements
KS A ISO 15739-2018(2023) Photography — Electronic still-picture imaging — Noise measurements
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS A ISO 12233-2018 Photography — Electronic still picture imaging — Resolution and spatial frequency responses
KS A ISO 12233-2018(2023) Photography — Electronic still picture imaging — Resolution and spatial frequency responses
KS B ISO 9345-2-2023 Microscopes — Imaging distances related to mechanical reference planes — Part 2: Infinity-corrected optical systems
KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS C IEC 62563-1-2019 Medical electrical equipment — Medical image display systems — Part 1: Evaluation methods
KS B ISO 9345-1-2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-2-2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS A ISO 12234-1-2016 Electronic still-picture imaging－Removable memory－Part 1：Basic removable-memory model

CN-STDBOOK, Electron Microscopy

图书 a-4565 Practical Methods for Electron Microanalysis

National Metrological Technical Specifications of the People's Republic of China, Electron Microscopy

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Group Standards of the People's Republic of China, Electron Microscopy

T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/QGCML 1940-2023
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
T/CAIA YQ007-2021 General test method for photoelectric performance of electron multiplying charge coupled imaging device

National Metrological Verification Regulations of the People's Republic of China, Electron Microscopy

JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Education, Electron Microscopy

JY/T 011-1996 General Principles of Transmission Electron Microscopy
JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
JY/T 010-1996 General principles of analytical scanning electron microscopy

VE-FONDONORMA, Electron Microscopy

COVENIN 789-1975

Professional Standard - Electron, Electron Microscopy

SJ/T 10545-1994 Blank detail specification for electron gun of black-and white picture tube
SJ/Z 9010.16-1987 Measurements of electrical properties of electronic tubes and valves--Part 16: Methods of measurement for television picture tubes
SJ/Z 9010.28-1987 Measurement of electrical properties of electronic tubes Part 28 Methods of measurement of color TV picture tubes

Association of German Mechanical Engineers, Electron Microscopy

DVS 2803-1974 Electron-beam welding in microscopy (survey)

German Institute for Standardization, Electron Microscopy

DIN 44402-17:1973-07 Measurements of the electrical properties of electronic tubes; methods of measurement for television picture tubes
DIN EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006); English version of DIN EN ISO 14880-2:2007-03
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN ISO 12231:2018 Photography - Electronic still picture imaging - Vocabulary (ISO 12231:2012); Text in German and English
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN 6847-6:2012-09 Medical electron accelerators - Part 6: Electronic portal imaging device(EPID) - Constancy testing

Canadian General Standards Board （CGSB), Electron Microscopy

CGSB 72.11-93-CAN/CGSB AMD 1-2000 Microfilms Et Images Electroniques - Preuve Documentaire

U.S. Air Force, Electron Microscopy

AIR FORCE AFGS-87213 B CHG NOTICE 1-1996 DISPLAYS, AIRBORNE, ELECTRONICALLY/OPTICALLY GENERATED

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Electron Microscopy

IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC/JEDEC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components [Superseded: IPC TM-650 2.6.22]

European Committee for Standardization (CEN), Electron Microscopy

EN ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)

International Telecommunication Union (ITU), Electron Microscopy

ITU-R BR.1355-2-2004 Viewing conditions for the assessment of telecine transfers of film images on a television display

国家药监局, Electron Microscopy

YY/T 1719-2023 General technical requirements for positron emission tomography and magnetic resonance imaging equipment
YY/T 1878-2023 Digital technical requirements for positron emission tomography equipment
YY/T 1835-2022 Breast positron emission tomography device performance and test methods

Professional Standard - Public Safety Standards, Electron Microscopy

GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)

Shanghai Provincial Standard of the People's Republic of China, Electron Microscopy

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Electron Microscopy

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

International Electrotechnical Commission (IEC), Electron Microscopy

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
IEC 60151-16:1968 Measurements of the electrical properties of electronic tubes. Part 16 : Methods of measurement for television picture tubes
IEC 60151-28:1978 Measurements of the electrical properties of electronic tubes. Part 28 : Methods of measurement of colour television picture tubes
IEC 61675-1:1998 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs
IEC 62679-3-3:2016 Electronic paper displays - Part 3-3: Optical measuring methods for displays with integrated lighting units

VN-TCVN, Electron Microscopy

TCVN 6855-16-2001 Measurements of the electrical properties of electronic tubes and valves.Part 16: Methods of measurement of television picture tubes
TCVN 6502-1999 Ambient air.Determination of asbestos bibres.Direct-transfer transmission electron microscopy method

TR-TSE, Electron Microscopy

TS 2506-1977 MEASUREMENTS OF THE ELECTRICAL PROPERTIES OF ELECTRONIC TUBES AND VALVES PART 16 : METHODS OF MEASUREMENT FPROPERTIES OF ELECTRONIC TUBES

Jiangsu Provincial Standard of the People's Republic of China, Electron Microscopy

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

工业和信息化部, Electron Microscopy

YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy

Professional Standard - Judicatory, Electron Microscopy

SF/T 0139-2023

IT-UNI, Electron Microscopy

UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

AENOR, Electron Microscopy

UNE-ISO/TR 15801:2008 IN Electronic imaging -- Information stored electronically -- Recommendations for trustworthiness and reliability
UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).

TH-TISI, Electron Microscopy

TIS 1557-1998 Measurements of the electrical properties of electronic tubes and valves.part 16: methods of measurement for television picture tubes
TIS 1558-1998 Measurements of the electrical properties of electronic tubes.part 28: methods of measurement for colour televisition picture tubes

SE-SIS, Electron Microscopy

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

European Committee for Electrotechnical Standardization（CENELEC）, Electron Microscopy

EN 61675-1:2014 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs

Defense Logistics Agency, Electron Microscopy

DLA SMD-5962-86018 REV D-2006 MICROCIRCUIT, LINEAR, AC PLASMA DISPLAY DRIVERS, MONOLITHIC SILICON

ES-UNE, Electron Microscopy

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Electron Microscopy

GJB 5384.22-2005 Test methods of performance for pyrotechnic composition Part 21: Concentration determination of solid smoke particles quantities Electron microscope method

Military Standard of the People's Republic of China-General Armament Department, Electron Microscopy

GJB 8684.22-2015 Test methods for pyrotechnic properties - Part 22: Determination of smoke solid particle number concentration by electron microscopy

PH-BPS, Electron Microscopy

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

IN-BIS, Electron Microscopy

Lithuanian Standards Office , Electron Microscopy

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

Professional Standard - Medicine, Electron Microscopy

YY/T 0890-2013 Electronic portal imaging device using in radiotherapy.Functional performance characteristics and test methods

卫生健康委员会, Electron Microscopy

WS 817-2023 Positron emission tomography (PET) equipment quality control testing standards