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Electron microscope x

Electron microscope x, Total:7 items.

In the international standard classification, Electron microscope x involves: Optical equipment, Physics. Chemistry.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron microscope x

• GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
• GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
• GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
• GB 7667-1996 The dose of X-rays leakage from electron microscope
• GB 7667-2003 The dose of X-rays leakage from electron microscope

Fujian Provincial Standard of the People's Republic of China, Electron microscope x

• DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

International Organization for Standardization (ISO), Electron microscope x

• ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

Others:   x-ray scanning electron microscope, Electron microscope x, electron microscope electron microscope, SEM x-ray, SEMx, scanning electron microscope x-ray, SEM x, Electron microscope + electron microscope, scanning electron microscope x-ray, xSEM, x SEM, SEM and x, Electron microscope x-ray, electron microscope characteristic x-ray, Electron microscope + x-ray, SEM detection x, scanning electron microscope x-ray, x-ray scanning electron microscope, x-ray scanning electron microscope, X electron microscope sample preparation.