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electronic analysis

electronic analysis, Total:136 items.

In the international standard classification, electronic analysis involves: Natural gas, Analytical chemistry, Optical equipment, Vocabularies, Non-destructive testing, Optics and optical measurements, Test conditions and procedures in general, Printed circuits and boards, Protection against fire, Electrical engineering in general, Electronic components in general, Information technology (IT) in general, Jewellery, Education, Electricity. Magnetism. Electrical and magnetic measurements, Non-ferrous metals.

国家市场监督管理总局、中国国家标准化管理委员会, electronic analysis

GB/T 27896-2018 Test method for water vapor content of natural gas—Electronic moisture analyzers
GB/T 41072-2021 Surface chemical analysis—Electron spectroscopies—Guidelines for ultraviolet photoelectron spectroscopy analysis
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, electronic analysis

GB/T 27896-2011 Test method for water vapor content of natural gas using.Electronic moisture analyzers
GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
GB/T 21636-2008 Microbeam analysis.Electron probe microanalysis (EPMA).Vocabulary
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 19501-2013 Microbeam analysis.General guide for electron backscatter diffraction analysis
GB/T 32055-2015 Microbeam analysis.Electron probe microanalysis.Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 15075-1994 Method for testing EPMA instrument
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 15247-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for determining the carbon content of steels using calibration curve method
GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 30703-2014 Microbeam analysis.Guidelines for orientation measurement using electron backscatter diffraction
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
GB/T 17506-1998 The method of electron probe micro analysis as corrosive layer on ferrous metals of ship
GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA

Korean Agency for Technology and Standards (KATS), electronic analysis

KS D ISO 14595:2012 Microbeam analysis-Electron probe microanalysis-Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14594:2012 Microbeam analysis－Electron probe microanalysis－Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS C IEC 60050-551-20:2021 International Electrotechnical Vocabulary(IEV) — Part 551-20: Power electronics — Harmonic analysis
KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2021) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS M 0036-2008 General rules for ion-selective electrode method
KS D 1951-1999(2006) Method for chemical analysis of oxygen－Free copper products for electron tubes

IET - Institution of Engineering and Technology, electronic analysis

SWTH FUNC-2006 The Switching Function: analysis of power electronic circuits

International Organization for Standardization (ISO), electronic analysis

ISO 14594:2003 Analyse par microfaisceaux - Analyse par microsonde électronique (Microsonde de Castaing) - Lignes directrices pour la détermination des paramètres expérimentaux pour la spectrométrie à dispersion de longueur d'onde
ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 23833:2006 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 14595:2003 Analyse par microfaisceaux - Microanalyse par sonde à électrons - Lignes directrices pour les spécifications des matériaux de référence certifiés (CRM) (Première édition)
ISO/PRF 14595 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 14595:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
ISO 14595:2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 23692:2021 Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 14595:2003/Cor 1:2005 Analyse par microfaisceaux - Microanalyse par sonde à électrons - Lignes directrices pour les spécifications des matériaux de référence certifiés (CRM) RECTIFICATIF TECHNIQUE 1 (Première édition)
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1

British Standards Institution (BSI), electronic analysis

BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA) Vocabulary
BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 14595:2023 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 14595:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
BS ISO 14595:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
22/30430960 DC BS ISO 14595. Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
20/30393735 DC BS ISO 23692. Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS 3727-20:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Spectrographic method

Association Francaise de Normalisation, electronic analysis

NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.
NF X21-016*NF ISO 15932:2014 Microbeam analysis - Analytical electron microscopy - Vocabulary
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-001:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs).
NF C01-551-20:2001 Electrotechnical Vocabulary - Part 551-20 : power electronics - Harmonic analysis.
NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF ISO 11938:2012 Analyse par microfaisceaux - Analyse par microsonde électronique (microsonde de Castaing) - Méthodes d'analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d'onde
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.

KR-KS, electronic analysis

KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS C IEC 60050-551-20-2021 International Electrotechnical Vocabulary(IEV) — Part 551-20: Power electronics — Harmonic analysis
KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

American Society for Testing and Materials (ASTM), electronic analysis

ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

CN-STDBOOK, electronic analysis

图书 a-4565 Practical Methods for Electron Microanalysis

AENOR, electronic analysis

UNE 21302-551-20:2004 Electrotechnical Vocabulary - Part 551-20: Power electronics - Harmonic analysis

National Metrological Verification Regulations of the People's Republic of China, electronic analysis

JJG 901-1995 Verification Regulation of Electron Probe Microanalyzer

Institute of Interconnecting and Packaging Electronic Circuits (IPC), electronic analysis

IPC TM-650 2.3.28-2004 Ionic Analysis of Circuit Boards, Ion Chromatography Method Revision A

Yunnan Provincial Standard of the People's Republic of China, electronic analysis

DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method

Japanese Industrial Standards Committee (JISC), electronic analysis

JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy

International Electrotechnical Commission (IEC), electronic analysis

IEC 60050-551-20:2001/AMD1:2017 Amendment 1 - International electrotechnical vocabulary - Part 551-20: Power electronics - Harmonic analysis
IEC 60050-551-20:2001 International Electrotechnical Vocabulary - Part 551-20: Power electronics; Harmonic analysis

Group Standards of the People's Republic of China, electronic analysis

T/CA 224-2022 E-sports data analyst
T/CA 225-2022 E-sports tactical analyst

U.S. Air Force, electronic analysis

AIR FORCE A-A-58042 A VALID NOTICE 1-2012 Analyzer, Digital Data, Electronic Test

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, electronic analysis

GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens

RU-GOST R, electronic analysis

GOST R 52520-2006 Platinum. Methods of arc atomic-emission analysis
GOST R 52951-2008 Palladium. Methods of arc atomic-emission analysis

Professional Standard - Education, electronic analysis

JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy

Professional Standard - Electron, electronic analysis

SJ/T 10904-1996 Determination of fluorine in electronic glass - Ion-selective electrode method