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Surface Analysis Surface Analysis System
Surface Analysis Surface Analysis System, Total:500 items.
In the international standard classification, Surface Analysis Surface Analysis System involves: Vocabularies, Analytical chemistry, Acoustics and acoustic measurements, Applications of information technology, Equipment for the chemical industry, Road engineering, Sugar. Sugar products. Starch, Linear and angular measurements, Products of the chemical industry, Solar energy engineering, Domestic, commercial and industrial heating appliances, Optics and optical measurements, Vacuum technology, Coatings and related processes used in aerospace industry, Construction materials, Radiocommunications, Industrial automation systems, Cutting tools, Test conditions and procedures in general, Electricity. Magnetism. Electrical and magnetic measurements, Microbiology, Aerospace fluid systems and components, Space systems and operations, Edible oils and fats. Oilseeds, Inorganic chemicals, Natural gas, Character symbols, Installations in buildings, Equipment for petroleum and natural gas industries, Surface treatment and coating, Powder metallurgy, Glass.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Surface Analysis Surface Analysis System
- GB/T 13592-1992 Terms relating to surface analysis
- GB/T 22461-2008 Surface chemical analysis.Vocabulary
- GB/T 28894-2012 Surface chemical analysis.Handing of specimens prior to analysis
- GB/T 21007-2007 Surface chemical analysis.Information formats
- GB/T 29557-2013 Surface chemical analysis.Depth Profiling.Measurment of sputtered depth
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
- GB/T 19499-2004 Surface chemical analysis-Data transfer format
- GB/T 42360-2023 Total Reflection X-ray Fluorescence Spectroscopic Analysis of Water for Surface Chemical Analysis
- GB/T 30815-2014 Surface chemical analysis.Guidelines for preparation and mounting of specimens for analysis
- GB/Z 32494-2016 Analysis of Surface Chemical Analysis Auger Electron Spectroscopy Chemical Information Interpretation
- GB/T 32495-2016 Surface chemical analysis.Secondary-ion mass spectrometry.Method for depth profiling of arsenic in silicon
- GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
- GB/T 20175-2006 Surface chemical analysis.Sputter depth profiling.Optimization using layered systems as reference materials
- GB/T 29732-2013 Surface chemical analysis.Medium resolution Auger electron spectrometers.Calibration of energy scales for elemental analysis
- GB/T 25187-2010 Surface chemical analysis.Auger electron spectroscopy.Description of selected instrumental performance parameters
- GB 9290-1988 Surface active agents－Technical ethoxylated fatty amines－Methods of analysis
- GB/T 9290-1988 Surface active agents--Technical ethoxylated fatty amines--Methods of analysis
- GB/T 19502-2004 Surface chemical analysis-Glow discharge optical emission spectrometry(GD-OSE)-Introduction to use
- GB/T 9290-2008 Surface active agents.Technical ethoxylated fatty amines.Method of analysis
- GB/T 42658.4-2023 Guidelines for Sample Handling, Preparation, and Mounting for Surface Chemistry Analysis Part 4: Reporting Information Related to Origin, Preparation, Handling, and Mounting of Nanoobjects Prior to Surface Analysis
- GB/T 22461.2-2023 Glossary of Surface Chemical Analysis Part 2: Scanning Probe Microscopy Terminology
- GB/T 22461.1-2023 Vocabulary for surface chemical analysis part 1: general and spectroscopic terms
- GB/T 29559-2013 Surface chemical analysis.Analysis of zinc and/or aluminium based metallic coatings by glow discharge optical emission spectrometry
- GB/T 29731-2013 Surface chemical analysis.High-resolution Auger electron spectrometers.Calibration of energy scales for elemental and chemical-state analysis
- GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
- GB/T 19768-2005 Process Analyzer Sample Handling System Performance Representation
- GB/T 19768-2005 Process Analyzer Sample Handling System Performance Representation
- GB/T 19768-2005 Process Analyzer Sample Handling System Performance Representation
- GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
- GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
- GB/T 29558-2013 Surface chemical analysis.Auger electron spectroscopy.Repeatability and constancy of intensity scale
- GB/T 42659-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration
International Organization for Standardization (ISO), Surface Analysis Surface Analysis System
- ISO/CD 20289:2017 Surface chemical analysis
- ISO 18115:2001 Surface chemical analysis - Vocabulary
- ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- ISO/CD 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: Spectral analysis of surface profiles
- ISO 14975:2000 Surface chemical analysis - Information formats
- ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles
- ISO/TR 15969:2021 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
- ISO/TR 14187:2020 Surface chemical analysis — Characterization of nanostructured materials
- ISO 18115-3:2022 Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
- ISO/DIS 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: One third octave band spectral analysis of surface profiles
- ISO 18115:2001/Amd 1:2006 Surface chemical analysis - Vocabulary; Amendment 1
- ISO 18115:2001/Amd 2:2007 Surface chemical analysis - Vocabulary; Amndment 2
- ISO 14976:1998 Surface chemical analysis - Data transfer format
- ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
- ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
- ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
- ISO 24465:2023 Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
- ISO/TR 14187:2011 Surface chemical analysis - Characterization of nanostructured materials
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO/TR 15969:2001 Surface chemical analysis - Depth profiling - Measurement of sputtered depth
- ISO 893:1989 Surface active agents; technical alkane sulfonates; methods of analysis
- ISO/TS 15338:2020 Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
- ISO 893:1978 Surface active agents — Technical sodium alkane sulphonates — Methods of analysis
- ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
- ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 14606:2022 Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
- ISO/TS 25138:2019 Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- ISO 14606:2000 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- ISO 14606:2015 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- ISO 894:1977 Surface active agents; Technical sodium primary alkylsulphates; Methods of analysis
- ISO 895:1977 Surface active agents; Technical sodium secondary alkylsulphates; Methods of analysis
- ISO 17331:2004/Amd 1:2010 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1
- ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
- ISO 6384:1981 Surface active agents; Technical ethoxylated fatty amines; Methods of analysis
- ISO 456:1973 Surface active agents; Analysis of soaps; Determination of free caustic alkali
- ISO/TS 25138:2010 Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
- ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
- ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
- ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
- ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- ISO 14706:2014 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- ISO 18115-2:2013 Surface chemical analysis.Vocabulary.Part 2: Terms used in scanning-probe microscopy
- ISO 20579-4:2018 Surface chemical analysis - Guidelines to sample handling, preparation and mounting - Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis
- ISO 16962:2017 Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
- ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
- ISO 18115-1:2010 Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy
- ISO 18115-1:2013 Surface chemical analysis .Vocabulary.Part 1: General terms and terms used in spectroscopy
- ISO/DIS 23124:2023 Surface Chemical Analysis — Measurement of lateral and axial resolutions of Raman microscope
- ISO/TR 18394:2006 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
- ISO/TR 19693:2018 Surface chemical analysis - Characterization of functional glass substrates for biosensing applications
- ISO 16962:2005 Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
- ISO/CD 20579-1:2023 Surface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysis
- ISO/DIS 20579-1:2023 Surface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysis
- ISO 20579-3:2021 Surface chemical analysis - Sample handling, preparation and mounting - Part 3: Biomaterials
- ISO 13473-2:2002 Characterization of pavement texture by use of surface profiles - Part 2: Terminology and basic requirements related to pavement texture profile analysis
- ISO/TS 15338:2009 Surface chemical analysis - Glow discharge mass spectrometry (GD-MS) - Introduction to use
- ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
- ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
- ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
- ISO 24417:2022 Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
- ISO 14952-3:2003 Space systems - Surface cleanliness of fluid systems - Part 3: Analytical procedures for the determination of nonvolatile residues and particulate contamination
- ISO 2272:1972 Surface active agents — Analysis of soaps — Determination of low contents of free glycerol spectrophotometric method
- ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
- ISO 16531:2020 Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
- ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
- ISO 16242:2011 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
- ISO/TR 23173:2021 Surface chemical analysis - Electron spectroscopies - Measurement of the thickness and composition of nanoparticle coatings
- ISO 11505:2012 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
- ISO 10418:1993 Petroleum and natural gas industries; offshore production platforms; analysis, design, installation and testing of basic surface safety systems
- ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
- ISO 6327:1981 Gas analysis; Determination of the water dew point of natural gas; Cooled surface condensation hygrometers
- ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
- ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- ISO 14952-1:2003 Space systems - Surface cleanliness of fluid systems - Part 1: Vocabulary
- ISO/FDIS 18115-1 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
- ISO 18115-1:2023 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
- ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
RO-ASRO, Surface Analysis Surface Analysis System
- STAS 11195-1987 SURFACE AGENTS Analysis method
- SR 110-9-1995 Sugar. Methods of analysis. Determination of the apparent mass
- STAS SR 13407-1998 Surface active agents - Detergents - Detarmination of water insoiuble matter content - Gravimetric method
AT-ON, Surface Analysis Surface Analysis System
- ONORM M 1113-1982 Technical surfaces; methods of surjace analyzing Surjaces techniqu.es; methodes de essai des surfaces
- ONORM M 6253 Teil.1-1985 Water analysis; determination ofanionic Surfactants by the methylene blue spectrometric method
- ONORM M 6253 Teil.2-1986 Water analysis; determination ofnonionic Surfactants using Dragendorff reagent
British Standards Institution (BSI), Surface Analysis Surface Analysis System
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- BS ISO 18115-3:2022 Surface chemical analysis. Vocabulary - Terms used in optical interface analysis
- BS ISO 14975:2000 Surface chemical analysis - Information formats
- BS ISO 14975:2001 Surface chemical analysis. Information formats
- PD ISO/TR 14187:2020 Surface chemical analysis. Characterization of nanostructured materials
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
- BS ISO 14976:1998 Surface chemical analysis - Data transfer format
- BS EN 61725:1997 Analytical expression for daily solar profiles
- DD ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles. Spectral analysis of texture profiles
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
- DD ISO/TR 15969:2001 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
- BS DD ISO/TR 15969:2001 Surface chemical analysis - Depth profiling - Measurement of sputtered depth
- BS PD ISO/TR 15969:2021 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
- BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
- BS DD ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Spectral analysis of texture profiles
- BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
- 21/30385921 DC BS ISO 18115-3. Surface chemical analysis. Vocabulary. Part 3. Terms used in optical interface analysis
- BS 6351-2:1983 Electric surface heating - Guide to the design of electric surface heating systems
- BS ISO 24465:2023 Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
- BS ISO 18115-1:2010 Surface chemical analysis - Vocabulary - General terms and terms used in spectroscopy
- BS ISO 18115-1:2013 Surface chemical analysis. Vocabulary. General terms and terms used in spectroscopy
- 21/30440164 DC BS ISO 14606. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
- BS DD ISO/TS 25138:2011 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
- BS ISO 14606:2022 Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
- PD ISO/TR 15969:2021 Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
- BS EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- 21/30404376 DC BS ISO 24465. Surface chemical analysis. Determination of the minimum detectability of Surface Plasmon Resonance device
- BS 6829-0:1991 Analysis of surface active agents (raw materials) - General introduction
- BS ISO 14606:2015 Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
- BS ISO 14606:2000 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- BS ISO 14606:2001 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
- BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
- BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
- BS ISO 14707:2015 Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
- BS ISO 14707:2000 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
- BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
- PD ISO/TR 19693:2018 Surface chemical analysis. Characterization of functional glass substrates for biosensing applications
- BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- PD IEC TR 63176:2019 Process analysis technology systems as part of safety instrumented systems
- PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
- PD ISO/TS 25138:2019 Tracked Changes. Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- BS DD ISO/TS 15338:2009 Surface chemical analysis - Glow discharge Mass spectrometry (GD-MS) - Introduction to use
- BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
- BS 6829-1.3:1988 Analysis of surface active agents (raw materials). General methods. Method for determination of alkalinity
- PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
- BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
- BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
- BS PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
- BS ISO 16962:2017 Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
- BS ISO 20579-4:2018 Surface chemical analysis. Guidelines to sample handling, preparation and mounting. Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis
- BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- BS ISO 14952-3:2003 Space systems. Surface cleanliness of fluid systems - Analytical procedures for the determination of nonvolatile residues and particulate contamination
- BS PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
- BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
- BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
- BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 24417:2022 Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
- BS EN 61115:1994 Expression of performance of sample handling systems for process analyzers
- BS ISO 17973:2016 Tracked Changes. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS 6351-3:1983 Electric surface heating - Code of practice for the installation, testing and maintenance of electric surface heating systems
- BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
- BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
- 20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
- BS ISO 14952-3:2004 Space systems - Surface cleanliness of fluid systems - Analytical procedures for the determination of nonvolatile residues and particulate contamination
- BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
- BS 684-1.7:1976 Methods of analysis of fats and fatty oils - Physical methods - Determination of surface-drying time
- BS ISO 16242:2011 Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
- BS EN ISO 6327:2008 Gas analysis. Determination of the water dew point of natural gas. Cooled surface condensation hygrometers
- BS 6829-4.6:1988 Analysis of surface active agents (raw materials). Ethylene oxide adducts. Method for determination of hydroxyl value
- BS ISO 13473-2:2002 Characterization of pavement texture by use of surface profiles - Terminology and basic requirements related to pavement texture profile analysis
- BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
- 21/30405786 DC BS ISO 24417. Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
- 17/30324738 DC BS ISO 20579-1. Surface chemical analysis. Guidelines to sample handling, preparation and mounting. Part 1. Guidelines to handling of specimens prior to analysis
- BS PD ISO/TR 23173:2021 Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings
- 23/30420097 DC BS ISO 23124 Surface Chemical Analysis. Measurement of lateral and axial resolutions of Raman microscope
- PD ISO/TR 23173:2021 Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings
- BS EN ISO 6327:1987 Gas analysis - Determination of the water dew point of natural gas - Cooled surface condensation hygrometers
- BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
- BS 6829-1.6:1991 Analysis of surface active agents (raw materials). General methods. Method for determination of solubility in water
- BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
- BS 6829-4.5:1989 Analysis of surface active agents (raw materials). Ethylene oxide adducts. Method for determination of sulphated ash
- BS ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
- BS 4359-4:1995 Determination of the specific surface area of powders - Recommendations for methods of determination of metal surface area using gas adsorption techniques
- 17/30325154 DC BS ISO 20579-2. Surface chemical analysis. Guidelines to sample handling, preparation and mounting. Part 2. Guidelines to preparation and mounting of specimens prior to analysis
- BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
YU-JUS, Surface Analysis Surface Analysis System
- JUS H.E0.005-1979 Surface active agents. Glossarj. List V. Analysis
- JUS H.E8.053-1992 Surface active agents.Technical ethoxylated fatty amines. Methods of analysis
- JUS H.F8.302-1988 Natural gas. Determlnation of the nater dew point of natural gas. Coole? surface condBttsation hygrometers
Defense Logistics Agency, Surface Analysis Surface Analysis System
Standard Association of Australia （SAA）, Surface Analysis Surface Analysis System
- AS ISO 18115:2006 Surface chemical analysis - Vocabulary
- AS ISO 14975:2006 Surface chemical analysis - Information formats
- AS ISO 14976:2006 Surface chemical analysis - Data transfer format
- AS ISO 18116:2006 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
- AS ISO 14606:2006 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
- AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
- AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- AS ISO 17974:2006 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
- AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
Korean Agency for Technology and Standards (KATS), Surface Analysis Surface Analysis System
Japanese Industrial Standards Committee (JISC), Surface Analysis Surface Analysis System
- JIS K 0147:2004 Surface chemical analysis -- Vocabulary
- JIS K 0142:2000 Surface chemical analysis -- Information formats
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
- JIS K 0154:2017 Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis
- JIS K 0141:2000 Surface chemical analysis -- Data transfer format
- JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- JIS K 0146:2002 Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials
- JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
- JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- JIS K 0148:2005 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
- JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
- JIS K 0150:2009 Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
- JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
- JIS K 0147-1:2017 Surface chemical analysis -- Vocabulary -- Part 1: General terms and terms used in spectroscopy
- JIS K 0144:2001 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
- JIS K 0144:2018 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
未注明发布机构, Surface Analysis Surface Analysis System
- BS ISO 18117:2009(2015) Surface chemical analysis — Handling of specimens prior to analysis
- BS ISO 14975:2000(2012) Surface chemical analysis — Information formats
- BS 6829-0:1991(2008) Analysis of surface active agents (raw materials) — Part 0 : General introduction
- ISO 14976:1998/Cor 1:1999 Surface Chemical Analysis Data Transfer Format Technical Corrigendum 1
- BS 6351-2:1983(1999) Electric surface heating — Part 2 : Guide to the design of electric surface heating systems
- BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
- BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
- BS EN 61115:1994(2000) Expression of performance of sample handling systems for process analyzers
- BS 6351-3:1993(1999) Electric surface heating — Part 3 : Code of practice for the installation, testing and maintenance of electric surface heating systems
- BS EN ISO 6327:2008(2009) Gas analysis — Deter - mination of the water dew point of natural gas — Cooled surface condensation hygro - meters
Association Francaise de Normalisation, Surface Analysis Surface Analysis System
- NF ISO 18117:2009 Analyse chimique des surfaces - Manipulation des échantillons avant analyse
- NF X21-065*NF ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- NF ISO 18116:2006 Analyse chimique des surfaces - Lignes directrices pour la préparation et le montage des échantillons destinés à l'analyse
- NF X21-052/A2:2008 Surface chemical analysis - Vocabulary - Amendment 2.
- NF X21-052/A1:2008 Surface chemical analysis - Vocabulary - AMENDMENT 1.
- NF X21-056*NF ISO 18116:2006 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
- NF ISO 17560:2006 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage du bore dans le silicium par profilage d'épaisseur
- NF ISO 893:1990 Agents de surface - Alcanesulfonates techniques - Méthode d'analyse.
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
- NF T73-292*NF EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analysis method.
- NF EN 14670:2005 Agents de surface - Dodécylsulfate de sodium - Méthode d'analyse
- NF X21-062*NF ISO 14606:2008 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- NF T73-275:1982 Surface active agents. Technical ethoxylated fatty amines. Methods of analysis.
- NF T73-233*NF ISO 893:1990 Surface active agents. Technical alkane sulfonates. Methods of analysis.
- NF ISO 14606:2008 Analyse chimique des surfaces - Profilage d'épaisseur par bombardement - Optimisation à l'aide de systèmes mono- ou multicouches comme matériaux de référence
- NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
- NF T73-232:1978 Surface active agents. Technical sodium secondary alkylsulphates. Methods of analysis.
- NF T73-231:1978 Surface active agents. Technical sodium primary alkylsulphates. Methods of analysis.
- NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
- NF ISO 14707:2006 Analyse chimique des surfaces - Spectrométrie d'émission optique à décharge luminescente - Introduction à son emploi
- NF X21-069-1:2010 Surface chemical analysis - Vocabulary - Part 1 : general terms and terms used in spectroscopy.
- NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
- NF ISO 16242:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie des électrons Auger (AES)
- NF V08-037:2003 Microbiology of food products - Food environement surfaces - Taking of samples intended for microbiological analysis.
- NF X20-521:1981 Gas analysis. Determination of the water dew point of natural gas. Cooled surface condensation hygromete%rs.
- NF ISO 14237:2010 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage des atomes de bore dans le silicium à l'aide de matériaux dopés uniformément
- NF X20-521*NF EN ISO 6327:2008 Gas analysis - Determination of the water dew point of natural gas - Cooled surface condensation hygrometers.
- NF X21-072*NF ISO 16242:2012 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES).
- NF T73-011:1959 Surface active agents. Technical sodium salts of sulphuric esters of amido-alcohols derived from fatty acids. Analytical method.
- NF ISO 24236:2006 Analyse chimique des surfaces - Spectroscopie des électrons Auger - Répétabilité et constance de l'échelle d'énergie
- NF ISO 17974:2009 Analyse chimique des surfaces - Spectromètres d'électrons Auger à haute résolution - Étalonnage des échelles d'énergie pour l'analyse élémentaire et de l'état chimique
- NF C46-225*NF EN 61115:1994 Expression of performance of sample handling systems for process analyzers.
- NF EN 61115:1994 Expression des qualités de fonctionnement des systèmes de manipulation d'échantillon pour analyseurs de processus
- NF EN ISO 10418:2004 Industries du pétrole et du gaz naturel - Plates-formes de production en mer - Analyse, conception, installation et essais des systèmes essentiels de sécurité de surface
- NF X21-067*NF ISO 17974:2009 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis.
- NF T73-289*NF EN 14667:2005 Surface active agents - Determination of low boiling solvents in liquid formulations - Gas chromatographic method
- NF EN ISO 6327:2008 Analyse des gaz - Détermination du point de rosée des gaz naturels - Hygromètres à condensation à surface refroidie
- NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
- FD X21-063*FD ISO/TR 22335:2008 Surface chemical analysis - Depth profiling - Measurement of sputtering rate : mesh-replica method using a mechanical stylus profilometer
- XP P98-831-2*XP CEN/TS 13036-2:2012 Road and airfield surface characteristics - Test methods - Part 2 : assessment of the skid resistance of a road pavement surface by the use of dynamic measuring systems
- NF EN ISO 12944-4:2017 Peintures et vernis - Anticorrosion des structures en acier par systèmes de peinture - Partie 4 : Types de surface et de préparation de surface
- NF B30-108-1:1989 Glassware. Hydrolytic resistance of the interior surfaces of glass containers. Part 1 : determination by titration method and classification.
German Institute for Standardization, Surface Analysis Surface Analysis System
- DIN ISO/TS 13473-4:2009-02 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
- DIN ISO/TS 13473-4:2009 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
- DIN EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method; German version EN 14670:2005
- DIN EN 61725:1998-03 Analytical expression for daily solar profiles (IEC 61725:1997); German version EN 61725:1997
- DIN 28400-6:1980-10 Vacuum technology; terms and definitions, surface analysis techniques
- DIN 28400-6:1980 Vacuum technology; terms and definitions, surface analysis techniques
- DIN EN 14670:2005-09 Surface active agents - Sodium dodecyl sulfate - Analytical method; German version EN 14670:2005
- DIN ISO 13473-2:2004 Characterization of pavement texture by use of surface profiles - Part 2: Terminology and basic requirements related to pavement texture profile analysis (ISO 13473-2:2002)
- DIN ISO 13473-2:2004-07 Characterization of pavement texture by use of surface profiles - Part 2: Terminology and basic requirements related to pavement texture profile analysis (ISO 13473-2:2002)
- DIN ISO 11505:2018-02 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry (ISO 11505:2012)
- DIN EN 61115:1994 Expression of performance of sample handling systems for process analyzers (IEC 61115:1992); German version EN 61115:1993
- DIN EN ISO 6327:2008-04 Gas analysis - Determination of the water dew point of natural gas - Cooled surface condensation hygrometers (ISO 6327:1981); German version EN ISO 6327:2008
- DIN ISO 16242:2020-05 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English
- DIN ISO 16962:2018 Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry (ISO 16962:2017)
- DIN EN 61115:1994-08 Expression of performance of sample handling systems for process analyzers (IEC 61115:1992); German version EN 61115:1993
Group Standards of the People's Republic of China, Surface Analysis Surface Analysis System
- T/ZSA 110-2022 Specific surface area and pore size analyzer
- T/SHDSGY 040-2022 Technical specification of LIN-36 facial expression feature analysis system
- T/SHMHZQ 093-2021 Artificial intelligence specifications for image analysis system of NLP facial expression behavior characteristics
Professional Standard - Chemical Industry, Surface Analysis Surface Analysis System
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Surface Analysis Surface Analysis System
- GB/T 33498-2017 Surface chemical analysis—Characterization of nanostructured materials
- GB/T 32996-2016 Surface chemical analysis—Analysis of metal oxide films by glow-discharge optical emission spectrometry
- GB/T 32997-2016 Surface chemical analysis—General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
- GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
- GB/T 32999-2016 Surface chemical analysis—Depth profiling—Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
- GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
KR-KS, Surface Analysis Surface Analysis System
American Society for Testing and Materials (ASTM), Surface Analysis Surface Analysis System
- ASTM E673-98E1 Standard Terminology Relating to Surface Analysis
- ASTM E673-01 Standard Terminology Relating to Surface Analysis
- ASTM E673-03 Standard Terminology Relating to Surface Analysis
- ASTM E673-02 Standard Terminology Relating to Surface Analysis
- ASTM E673-02b Standard Terminology Relating to Surface Analysis
- ASTM E673-02a Standard Terminology Relating to Surface Analysis
- ASTM D1001-51 Specification for Sieve Analysis of Granular Mineral Surfacing for Asphalt Roofing and Shingles
- ASTM E1829-14(2020) Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E1829-02 Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E1829-97 Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E1829-09 Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E1078-14(2020) Standard Guide for Specimen Preparation and Mounting in Surface Analysis
- ASTM E1829-14 Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E1078-14 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
- ASTM D452-91(1997)e1 Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
- ASTM D452-91(2008) Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
- ASTM D452/D452M-19 Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
- ASTM E1078-97 Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis
- ASTM E1257-93(2003) Standard Guide for Evaluating Grinding Materials Used for Surface Preparation in Spectrochemical Analysis
- ASTM E1078-02 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
- ASTM E1577-95(2000) Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
- ASTM E1577-11 Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
- ASTM E1577-04 Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
- ASTM E1078-09 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
- ASTM F1375-92(2005) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
- ASTM D451-91(1996)e1 Standard Test Method for Sieve Analysis of Granular Mineral Surfacing For Asphalt Roofing Products
- ASTM D451/D451M-17 Standard Test Method for Sieve Analysis of Granular Mineral Surfacing For Asphalt Roofing Products
- ASTM F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
- ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
- ASTM D2674-72(1998) Standard Test Methods for Analysis of Sulfochromate Etch Solution Used in Surface Preparation of Aluminum
- ASTM E3149-18 Standard Guide for Facial Image Comparison Feature List for Morphological Analysis
- ASTM D2674-72(2021) Standard Methods of Analysis of Sulfochromate Etch Solution Used in Surface Preparation of Aluminum
- ASTM E950/E950M-09(2018) Standard Test Method for Measuring the Longitudinal Profile of Traveled Surfaces with an Accelerometer-Established Inertial Profiling Reference
- ASTM C715-90(2006) Standard Test Method for Nickel on Steel for Porcelain Enameling by Photometric Analysis
- ASTM C715-90(2011)e1 Standard Test Method for Nickel on Steel for Porcelain Enameling by Photometric Analysis
- ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ET-QSAE, Surface Analysis Surface Analysis System
AENOR, Surface Analysis Surface Analysis System
- UNE-EN 61725:1998 ANALYTICAL EXPRESSION FOR DAILY SOLAR PROFILES.
- UNE 55517:1984 SURFACE ACTIVE AGENTS. ANALYSIS OF TECHNICAL ALKYLBETAINES
- UNE 55510:1991 SURFACE ACTIVE AGENTS. TECHNICAL ALKANE SULFONATES. METHODS OF ANALYSIS.
- UNE-EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- UNE 55909:1985 SURFACE ACTIVE AGENTS. ANALYSIS OF SOAPS. DETERMINATION OF TOTAL FREE ALKALI
- UNE 55511-1:1981 SURFACE ACTIVE AGENTS. ANALYSIS OF TECHNICAL SODIUM PRIM-ALKYLSULFATES. SCOPE
- UNE 55732:1984 SURFACE ACTIVE AGENTS. TECHNICAL ETHOXYLATED FATTY AMINES. METHODE OF ANALYSIS
- UNE 55504-1:1981 SURFACE ACTIVE AGENTS. ANALYSIS OF TECHNICAL SODIUM SEC-ALKYSULPHATES. SCOPE
- UNE 55901:1985 SURFACE ACTIVE AGENTS. ANALYSIS OF SOAPS. DETERMINATION OF CAUSTIC FREE ALKALI
- UNE 55903:1985 SURFACE ACTIVE AGENTS. ANALYSIS OF SOAPS. DETERMINATION OF GLYCEROL CONTENT. TITRIMETRIC METHOD
- UNE 55714:1982 SURFACE ACTIVE AGENTS. ANALYSIS OF TECHNICAL FATTY CHAIN QUATERNARY AMMONIUM CHLORIDES. DETERMINATION OF ASH
- UNE 55713:1982 SURFACE ACTIVE AGENTS. ANALYSIS OF TECHNICAL FATTY CHAIN QUATERNARY AMMONIUM CHLORIDES. DETERMINATION OF PH
- UNE 55907:1985 SURFACE ACTIVE AGENTS. ANALYSIS OF SOAPS. DETERMINATION OF TOTAL ALKALI CONTENT AND TOTAL FATTY MATTER CONTENT
- UNE 55716:1983 SURFACE ACTIVE AGENTS. ANALYSIS OF TECHNICAL FATTY CHAIN QUATERNARY AMMONIUM CHLORIDES. DETERMINATION OF AVERAGE MOLECULAR WEIGHT
International Federation of Trucks and Engines, Surface Analysis Surface Analysis System
国家市场监督管理总局、中国国家标准化管理委员会, Surface Analysis Surface Analysis System
- GB/T 41072-2021 Surface chemical analysis—Electron spectroscopies—Guidelines for ultraviolet photoelectron spectroscopy analysis
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
- GB/T 40109-2021 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of boron in silicon
- GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy
GB-REG, Surface Analysis Surface Analysis System
ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc., Surface Analysis Surface Analysis System
- ASHRAE 3864-1995 Frequency Response Analysis of Ground-Coupled Building Envelope Surfaces
AGMA - American Gear Manufacturers Association, Surface Analysis Surface Analysis System
- 99FTM5-1999 Analysis of Micropitting on Prototype Surface Fatigue Test Gears
US-FCR, Surface Analysis Surface Analysis System
BE-NBN, Surface Analysis Surface Analysis System
- NBN T 63-110-1980 Surface active agents - Technical sodium alkane sulphonates -Methods of analysis
- NBN-ISO 893:1990 Surface active agents - Technical alkane sulfonates - Methods of analysis
- NBN T 63-102-1980 Surface active agents - Analysis of soaps - Determination of free caustic alkali
- NBN T 63-123-1980 Surface active agents - Analysis of soaps - Determination of low contents of free glycerol - Spectrophotometric method
- NBN T 63-146-1981 Surface active agents - Technical ethoxylated fatty amines - Methods of analysis
- NBN T 63-112-1980 Surface active agents - Technical sodium secondary alkylsulphates -Methods of analysis
- NBN T 63-111-1980 Surface active agents - Technical sodium primary alkylsulphates -Methods of analysis
European Committee for Standardization (CEN), Surface Analysis Surface Analysis System
- EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- EN 1264-1:2011 Water based surface embedded heating and cooling systems - Part 1: Definitions and symbols
American Gear Manufacturers Association, Surface Analysis Surface Analysis System
- AGMA 99FTM5-1999 Analysis of Micropitting on Prototype Surface Fatigue Test Gears
- AGMA 91FTM16-1991 Contact Analysis of Gears Using a Combined Finite Element and Surface Integral Method
Danish Standards Foundation, Surface Analysis Surface Analysis System
- DS/EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- DS/EN 61115:1994 Expression of performance of sample handling systems for process analyzers
- DS/EN ISO 6327:2008 Gas analysis - Determination of the water dew point of natural gas - Cooled surface condensation hygrometers
- DS/CEN/TS 13036-2:2010 Road and airfield surface characteristics - Test methods - Part 2: Assessment of the skid resistance of a road pavement surface by the use of dynamic measuring systems
Lithuanian Standards Office , Surface Analysis Surface Analysis System
- LST EN 14670-2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- LST EN 61115-2001 Expression of performance of sample handling systems for process analyzers (IEC 61115:1992)
IPC - Association Connecting Electronics Industries, Surface Analysis Surface Analysis System
ES-UNE, Surface Analysis Surface Analysis System
- UNE 55901:1986 ERRATUM SURFACE ACTIVE AGENTS. ANALYSIS OF SOAPS. DETERMINATION OF CAUSTIC FREE ALKALI
- UNE-EN 61115:1993 EXPRESSION OF PERFORMANCE OF SAMPLE HANDLING SYSTEMS FOR PROCESS ANALYZERS. (Endorsed by AENOR in April of 1996.)
Society of Automotive Engineers (SAE), Surface Analysis Surface Analysis System
- SAE ARP4252-1989 Instrumental Methods of Determining Surface Cleanliness R(1995)
RU-GOST R, Surface Analysis Surface Analysis System
- GOST R 50001-1992 Surface active agents. Technical sodium secondary alkylsulphates. Methods of analysis
- GOST R 50002-1992 Surface active agents. Primary technical sodium alkylsulphates. Methods of analysis
(U.S.) Ford Automotive Standards, Surface Analysis Surface Analysis System
International Telecommunication Union (ITU), Surface Analysis Surface Analysis System
- ITU-T Q.604-1993 Interworking of Signalling Systems - Information Analysis Tables (Study Group XI) 5 pp
CZ-CSN, Surface Analysis Surface Analysis System
- CSN 68 1148-1994 Testing methods for surfactans and detergents. Surface active agents. Analysis of soaps. Determination of free caustic lkali
- CSN 83 0540 Cast.28-1987 Chemical and physical analysis of waste waters. Determination of anionic surfactants
- CSN 83 0540 Cast.29-1987 Chemical and physical analysis of waste waters. Determination of non-ionic surfactants
International Electrotechnical Commission (IEC), Surface Analysis Surface Analysis System
- IEC TR 63176:2019 Process analysis technology systems as part of safety instrumented systems
- IEC 61115:1992 Expression of performance of sample handling systems for process analyzers
American Society of Civil Engineers (ASCE), Surface Analysis Surface Analysis System
- ASCE GSP 176-2007 ANALYSIS OF ASPHALT PAVEMENT MATERIALS AND SYSTEMS EMERGING METHODS
Professional Standard - Machinery, Surface Analysis Surface Analysis System
- JB/T 6854-1993 Performance representation of sample handling systems for process analytical instruments
AASHTO - American Association of State Highway and Transportation Officials, Surface Analysis Surface Analysis System
- MP 17-2007 Pavement Ride Quality When Measured Using Inertial Profiling Systems
API - American Petroleum Institute, Surface Analysis Surface Analysis System
- API RP 14C-1986 RECOMMENDED PRACTICE FOR ANALYSIS@ DESIGN@ INSTALLATION AND TESTING OF BASIC SURFACE SAFETY SYSTEMS FOR OFFSHORE PRODUCTION PLATFORMS FOURTH EDITION; ERRATA - NOVEMBER 1986
- API RP 14C ERTA-1984 RECOMMENDED PRACTICE FOR ANALYSIS@ DESIGN@ INSTALLATION AND TESTING OF BASIC SURFACE SAFETY SYSTEMS FOR OFFSHORE PRODUCTION PLATFORMS (Third Edition)
AIAG - Automotive Industry Action Group, Surface Analysis Surface Analysis System
- MSA ERTA-2010 Measurement Systems Analysis (MSA) - Errata Sheet (Fourth Edition; Second Printing; Errata Sheet to MSA-4)
NATO - North Atlantic Treaty Organization, Surface Analysis Surface Analysis System
- ANEP-33-1993 Combat System Data Model for Interface Analysis (ED 1)
European Committee for Electrotechnical Standardization（CENELEC）, Surface Analysis Surface Analysis System
- EN 61115:1993 Expression of Performance of Sample Handling Systems for Process Analyzers
CEN - European Committee for Standardization, Surface Analysis Surface Analysis System
- EN ISO 6327:2008 Gas analysis - Determination of the water dew point of natural gas - Cooled surface condensation hygrometers
ITU-T - International Telecommunication Union/ITU Telcommunication Sector, Surface Analysis Surface Analysis System
- ITU-T Q.604-1989 Information Analysis Tables - Interworking of Signalling Systems (Study Group XI) 2 pp