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Spectral analysis instrument formerly

Spectral analysis instrument formerly, Total:350 items.

In the international standard classification, Spectral analysis instrument formerly involves: Special measuring equipment for use in telecommunications, Fibre optic communications, Optics and optical measurements, Test conditions and procedures in general, Electronic components in general, Optoelectronics. Laser equipment, Quality, Analytical chemistry, Linear and angular measurements, Fuels, Refractories, Technical drawings, Optical equipment, Audio, video and audiovisual engineering, Testing of metals, Lubricants, industrial oils and related products, Non-ferrous metals, Electromagnetic compatibility (EMC), Electricity. Magnetism. Electrical and magnetic measurements, Metrology and measurement in general, Petroleum products in general, Ferrous metals, Products of the chemical industry, Milk and milk products, Air quality, Radiation measurements, Non-destructive testing, Natural gas, Nuclear energy engineering, Laboratory medicine, Non-metalliferous minerals, Coals, Soil quality. Pedology.

British Standards Institution (BSI), Spectral analysis instrument formerly

BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS EN 62129:2006 Calibration of optical spectrum analyzers
BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS EN 61280-1-1:1998 Optical fibre amplifiers.Basic spectrum analyzers - Transmitter output optical power measurement for single-mode optical fibre cable
BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS EN 61290-5-2:2004 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Electrical spectrum analyser method
BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
PD IEC TR 61292-2:2003 Optical amplifier technical reports. Theoretical background for noise figure evaluation using the electrical spectrum analyzer
19/30398879 DC BS EN 61290-1-1. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
BS EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1:Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
BS 1902-9.2:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of silica refractories by X-ray fluorescence
BS EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
18/30387381 DC BS EN 61290-1-1 Ed.4.0. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS EN 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
BS EN 61290-1-2:2007 Optical amplifiers. Test methods. Power and gain parameters. Electrical spectrum analyzer method
BS ISO 22309:2011 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
BS 6200-3.31.3:2002 Sampling and analysis of iron, steel and other ferrous metals. Methods of analysis. Determination of tin. Flame atomic absorption spectrometric method (extraction as Sn-SCN)
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 15471:2016 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
BS EN ISO 10058-1:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method). Apparatus, reagents, dissolution and determination of gravimetric silica
BS 1902 Sec.9.1:1987 Methods of testing refractory materials. Chemical analysis by instrumental methods. Analysis of alumino-silicate refractories by X-ray fluorescence
BS EN ISO 10058-1:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and determination of gravimetric silica (ISO 10058-1:2008)
BS 1902 Sec.9.2:1987 Methods of testing refractory materials. Chemical analysis by instrumental methods. Analysis of silica refractories by X-ray fluorescence

International Electrotechnical Commission (IEC), Spectral analysis instrument formerly

IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:1998 Optical fibre amplifiers - Basic specification - Part 1-1: Test methods for gain parameters - Optical spectrum analyzer
IEC 61290-5-1:2000 Optical fibre amplifiers - Basic specification - Part 5-1: Test methods for reflectance parameters - Optical spectrum analyser
IEC 61290-10-1:2003 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters; Pulse method using an optical switch and optical spectrum analyzer
IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer
IEC 61290-2-2:1998 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
IEC 61290-5-2:2003 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters; Electrical spectrum analyser method
IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
IEC 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
IEC 61290-10-2:2007 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
IEC 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyser
IEC 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
IEC 61290-1-2:1998 Optical fibre amplifiers - Basic specification - Part 1-2: Test methods for gain parameters - Electrical spectrum analyzer
IEC TR 61292-2:2003 Optical amplifier technical reports - Part 2: Theoretical background for noise figure evaluation using the electrical spectrum analyzer
IEC 61290-5-3:2002 Optical fibre amplifiers - Basic specifications - Part 5-3: Test methods for reflectance parameters; Reflectance tolerance test method using electrical spectrum analyzer

Danish Standards Foundation, Spectral analysis instrument formerly

DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
DS/EN 62129:2006 Calibration of optical spectrum analyzers
DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
DS/EN 61290-1-2:2006 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
DS/EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3: Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser

Japanese Industrial Standards Committee (JISC), Spectral analysis instrument formerly

JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
JIS C 6122-10-1:2007 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
JIS C 6122-1-1:2011 Optical amplifiers -- Test methods -- Part 1-1: Power and gain parameters -- Optical spectrum analyzer method
JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
JIS C 6122-10-2:2010 Optical amplifiers -- Test methods -- Part 10-2: Multichannel parameters -- Pulse method using a gated optical spectrum analyzer
JIS C 6122-10-4:2012 Optical amplifiers -- Test methods -- Part 10-4: Multichannel parameters -- Interpolated source subtraction method using an optical spectrum analyzer
JIS C 6122-5-1:2001 Optical fiber amplifiers -- Test methods -- Part 5-1: Test methods for reflectance parameters -- Optical spectrum analyzer test method
JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS C 6122-3-2:2006 Optical amplifiers -- Test methods -- Part 3-2: Noise figure parameters -- Electrical spectrum analyzer method
JIS C 6122-1-2:2011 Optical amplifiers -- Test methods -- Part 1-2: Power and gain parameters -- Electrical spectrum analyzer method
JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis

European Committee for Electrotechnical Standardization（CENELEC）, Spectral analysis instrument formerly

EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
EN 61290-5-1:2006 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method
EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
EN 61290-5-2:2004 Optical amplifiers Test methods Part 5-2: Reflectance parameters Electrical spectrum analyser method
EN 61290-5-3:2002 Optical Fibre Amplifiers - Basic Specification Part 5-3: Test Methods for Reflectance Parameters - Reflectance Tolerance Using an Electrical Spectrum Analyser
EN 61290-1-2:2005 Optical amplifiers - Test methods Part 1-2: Power and gain parameters - Electrical spectrum analyzer method

Association Francaise de Normalisation, Spectral analysis instrument formerly

NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
NF EN 61290-5-1:2006 Amplificateurs optiques - Méthodes d'essais - Partie 5-1 : paramètres de réflectance - Méthode d'analyseur de spectre optique
NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
NF EN 61290-3-1:2004 Amplificateurs optiques - Méthodes d'essai - Partie 3-1 : paramètres du facteur de bruit - Méthode d'analyseur du spectre optique
NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
NF EN IEC 61290-1-1:2020 Amplificateurs optiques - Méthodes d'essai - Partie 1-1 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre optique
NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
NF C93-845-2*NF EN 62150-2:2011 Fibre optic active components and devices - Test and measurement procedures - Part 2 : ATM-PON transceivers.
NF EN 61290-10-2:2008 Amplificateurs optiques - Méthodes d'essai - Partie 10-2 : paramètres à canaux multiples - Méthode d'impulsion utilisant un analyseur de spectre optique stroboscopique
NF EN 61290-10-1:2009 Amplificateurs optiques - Méthodes d'essai - Partie 10-1 : paramètres à canaux multiples - Méthode d'impulsion utilisant un interrupteur optique et un analyseur de spectre optique
NF EN 62129-1:2016 Étalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la fréquence optique - Partie 1 : analyseurs de spectre optique
NF C93-805-10-4*NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4 : multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
NF EN 61290-10-4:2007 Amplificateurs optiques - Méthodes d'essai - Partie 10-4 : paramètres à canaux multiples - Méthode par soustraction de source interpolée en utilisant un analyseur de spectre optique
NF C93-805-5-2*NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2 : reflectance parameters - Electrical spectrum analyser method
NF EN 61290-5-2:2004 Amplificateurs optiques - Méthodes d'essai - Partie 5-2 : paramètres du facteur de réflexion - Méthode de l'analyseur de spectre électrique
NF C93-805-10-2:2003 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer.
NF C93-805-10-2*NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer
NF EN 61290-3-2:2009 Amplificateurs optiques - Méthodes d'essais - Partie 3-2 : paramètres du facteur de bruit - Méthode de l'analyseur spectral électrique
NF C93-805-1-2*NF EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2 : power and gain parameters - Electrical spectrum analyzer method.
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
NF EN 61290-1-2:2006 Amplificateurs optiques - Méthodes d'essai - Partie 1-2 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre électrique
NF C93-805-5-3*NF EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3 : test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser.
NF EN 61290-5-3:2002 Amplificateurs à fibres optiques - Spécification de base - Partie 5-3 : méthodes d'essai des paramètres de réflectance - Tolérance de réflectance en utilisant un analyseur de spectre électrique
NF C93-805-10-1*NF EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1 : multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
NF A06-902*NF EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry.
NF EN ISO 13196:2015 Qualité du sol - Analyse rapide d'une sélection d'éléments dans les sols à l'aide d'un spectromètre de fluorescence X à dispersion d'énergie portable ou portatif

ES-UNE, Spectral analysis instrument formerly

UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
UNE-EN 61290-10-1:2009 Optical amplifiers - Test methods -- Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (Endorsed by AENOR in July of 2009.)
UNE-EN 61290-5-1:2006 Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006). (Endorsed by AENOR in October of 2006.)
UNE-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (Endorsed by AENOR in May of 2008.)
UNE-EN 61290-5-2:2004 Optical amplifiers - Test methods -- Part 5-2: Reflectance parameters - Electrical spectrum analyser method (Endorsed by AENOR in September of 2004.)
UNE-EN 61290-3-2:2008 Optical amplifier test methods -- Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (Endorsed by AENOR in February of 2009.)
UNE-EN 61290-1-2:2005 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (Endorsed by AENOR in March of 2006.)
UNE-EN 61290-10-4:2007 Optical amplifiers - Test methods -- Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007). (Endorsed by AENOR in November of 2007.)
UNE-EN ISO 23674:2023 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
UNE-EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification -- Part 5-3: Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser. (Endorsed by AENOR in October of 2002.)

ZA-SANS, Spectral analysis instrument formerly

SANS 62129:2008 Calibration of optical spectrum analyzers
SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method

Lithuanian Standards Office , Spectral analysis instrument formerly

LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)
LST EN 61290-3-1-2004 Optical amplifiers. Test methods. Part 3-1: Noise figure parameters. Optical spectrum analyzer method (IEC 61290-3-1:2003)
LST EN 61290-10-1-2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009)
LST EN 61290-1-1-2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006)
LST EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)
LST EN 61290-10-2-2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007)
LST EN 61290-10-4-2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007)
LST EN 61290-5-2-2004 Optical amplifiers. Test methods. Part 5-2: Reflectance parameters. Electrical spectrum analyser method (IEC 61290-5-2:2003)
LST EN 61290-1-2-2006 Optical amplifiers. Test methods. Part 1-2: Power and gain parameters. Electrical spectrum analyzer method (IEC 61290-1-2:2005)
LST EN 61290-3-2-2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008)
LST EN 61290-5-3-2003 Optical fibre amplifiers. Basic specification. Part 5-3: Test methods for reflectance parameters. Reflectance tolerance using an electrical spectrum analyzer (IEC 61290-5-3:2002)

German Institute for Standardization, Spectral analysis instrument formerly

DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
DIN EN 62129 Berichtigung 1:2008 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006, Corrigendum to DIN EN 62129:2007-01; German version CENELEC-Cor. :2006 to EN 62129:2006
DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN 51820:2013-12 Testing of lubricants - Analysis of greases by infrared spectrometer - Recording and interpretation of an infrared spectrum / Note: Applies in conjunction with DIN 51451 (2004-09).
DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN EN 61290-10-1:2010-01 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009 / Note: DIN EN 61290-10-1 (2004-02) remains valid along...
DIN EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008
DIN EN 61290-10-4:2008-02 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007 / Note: Applies in conjunction with DIN EN 61291...
DIN EN 61290-10-2:2008-07 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008 / Note: DIN EN 61290-10-2 (2004-02) remains valid alongside this stan...
DIN EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
DIN EN 61290-3-2:2009-06 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008 / Note: DIN EN 61290-3-2 (2003-08) remains valid alongside this standard until 2011-10-01....
DIN EN IEC 61290-1-1:2019 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 86C/1563/CD:2018); Text in German and English
DIN EN IEC 61290-1-1:2022-07 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020); German version EN IEC 61290-1-1:2020 / Note: DIN EN 61290-1-1 (2016-03) remains valid alongside this standard until 2023-10...
DIN EN 61290-1-2:2006-07 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005 / Note: DIN EN 61290-1-2 (1999-08) remains valid alongside this standard until 2008-10-0...
DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
DIN EN 61290-1-2:2006 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005
DIN EN 61290-5-2:2004-12 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
DIN ISO 22309:2015-11 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above (ISO 22309:2011)
DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN EN 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2015); German version EN 61290-1-1:2015
DIN EN 61290-10-1:2010 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009
DIN EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
DIN 51577-4:2023-07 Testing of mineral oil hydrocarbons and similar products - Determination of chlorine and bromine content - Analysis by energy dispersive X-ray spectrometry with low cost instruments / Note: Date of issue 2023-06-09*Intended as replacement for DIN 51577...
DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
DIN EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3: Test methods for reflectance parameters; Reflectance tolerance using an electrical spectrum analyser (IEC 61290-5-3:2002); German version EN 61290-5-3:2002
DIN 51577-4:1994-02 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
DIN EN ISO 23674:2022-12 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022); German version EN ISO 23674:2022
DIN EN ISO 21587-1:2007-12 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica (ISO 21587-1:2007); German version EN ISO 21587-1:2007
DIN 51577-4:2023-11 Testing of mineral oil hydrocarbons and similar products - Determination of chlorine and bromine content - Part 4: Analysis by energy dispersive X-ray spectrometry with low cost instruments

Group Standards of the People's Republic of China, Spectral analysis instrument formerly

T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer

Korean Agency for Technology and Standards (KATS), Spectral analysis instrument formerly

KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
KS C IEC 61290-5-1-2007(2022) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS C IEC 61290-5-1-2007(2017) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS C IEC 61290-3-1-2005(2020) Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
KS C IEC 61290-3-1:2005 Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 15471:2005 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
KS C IEC 61290-3-2-2005(2020) Optical amplifiers－Part 3－2：Test methods for noise figure parameters－Electrical spectrum analyzer method
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS C IEC 61290-10-1-2005(2020) Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS C IEC 61290-10-2-2005(2020) Optical amplifiers－Test methods－Part 10－2：Multichannel parameters－Pulse method using a gated optical spectrum analyzer
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS C IEC 61290-10-1:2005 Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS C IEC 61290-10-2:2005 Optical amplifiers－Test methods－Part 10－2：Multichannel parameters－Pulse method using a gated optical spectrum analyzer
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 17974:2011 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS C IEC 61290-5-3-2003(2018)
KS D ISO 15471-2005(2020) Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS C IEC 61290-5-3:2003 Basic specification for optical amplifier test methods－Part 5－3：Test methods for reflectance parameters－Reflectance tolerance using an electrical spectrum analyser
KS E ISO 10086-1:2007 Coal－Methods for evaluating flocculants for use in coal preparation－Part 1：Basic parameters

IEC - International Electrotechnical Commission, Spectral analysis instrument formerly

PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)

Professional Standard - Electron, Spectral analysis instrument formerly

SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum

CZ-CSN, Spectral analysis instrument formerly

CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
CSN 42 0648 Cast.9-1986 Chemical analysis of metallic chromium. Determination of bismuth, lead and zinc by the polarographic method and determination of lead by the atomic absorption method

EEMUA - Engineering Equipment and Materials Users Association, Spectral analysis instrument formerly

PUB NO 175-1995 EEMUA Code of Practice for Calibration and Checking Process Analysers (Formerly IP Code 340)

IN-BIS, Spectral analysis instrument formerly

IS 12803-1989

RU-GOST R, Spectral analysis instrument formerly

GOST 4.450-1986 Product-quality index system. Instruments for spectral analysis. Nomenclature of indices
GOST 8.197-2013 State system for ensuring the uniformity of measurements. State verification scheme for instruments measuring of the spectral radiance, spectral radiant power, spectral irradiance, spectral radiant intensity, power and radiant intensity in spectral range
GOST 8.552-2013 State system for ensuring the uniformity of measurements. State verification schedule for instruments measuring the radiant flux, irradiance, spectral irradiance and exposure in spectral range from 0,0004 to 0,400 mcm
GOST 18229-1981 Spektrometric charge-sensitive preamplifiers for semiconductor radiation detectors. Types, basic parameters and methods of measurements
GOST 8.625-2013 State system for ensuring the traceability of measurements. Chromato-mass-spectrometric multipurpose analyzers for measurement of persistent organic compounds in foodstuffs, feed-stuffs and agricultural productions. Verification procedure
GOST R 55992.1-2014 In vitro diagnostic medical devices for fluorescent and immunofluorescent analysis of ?dried spot? of newborn's blood. Part 1. Instruments and accessories for fluorescent and immunofluorescent analysis of ?dried spot? of newborn's blood. Technical require

International Organization for Standardization (ISO), Spectral analysis instrument formerly

ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 10110-14:2003 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 14: Wavefront deformation tolerance
ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
ISO 23674:2022 Cosmetics — Analytical methods — Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 10136-5:1993 Glas and glassware; analysis of extract solutions; part 5: determination of iron(III) oxide by molecular absorption spectrometry and flame atomic absorption spectrometry
ISO 6326-4:1994 Natural gas; determination of sulfur compounds; part 4: gas chromatographic method using a flame photometric detector for the determination of hydrogen sulfide, carbonyl sulfide and sulfur-containing odorants
ISO 10136-4:1993 Glass and glassware; analysis of extract solutions; part 4: determination of aluminium oxide by molecular absorption spectrometry
ISO 10136-1:1993 Glas and glassware; analysis of extract solutions; part 1: determination of silicon dioxide by molecular absorption spectrometry
ISO 10136-6:1993 Glass and glassware; analysis of extract solutions; part 6: determination of boron(III) oxide by molecular absorption spectrometry

CENELEC - European Committee for Electrotechnical Standardization, Spectral analysis instrument formerly

EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
EN 61290-10-2:2003 Optical amplifiers - Test methods Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
EN 61290-10-1:2003 Optical amplifiers Test methods Part 10-1: Multichannel parameters Pulse method using an optical switch and optical spectrum analyzer
EN 61290-1-2:1998 Optical Fibre Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters Electrical Spectrum Analyzer

Standard Association of Australia （SAA）, Spectral analysis instrument formerly

AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS/NZS 3580.15:2014
AS 2300.1.8.2:1991 Methods of chemical and physical testing for the dairying industry - General methods and principles - Assessment of instrumental methods - Infrared spectrometric analysis of milk
AS 2300.1.8:2008
AS 4479.4:1999 Analysis of soils - Determination of metals in aqua regia extracts of soil by inductively coupled plasma-atomic emission spectrometry

Shanxi Provincial Standard of the People's Republic of China, Spectral analysis instrument formerly

DB1404/T 18-2021 Inspection and testing laboratory instrument analysis method validation requirements Spectroscopy

American National Standards Institute （ANSI), Spectral analysis instrument formerly

ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
ANSI/TIA-455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
ANSI/TIA-455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
ANSI/TIA-455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
ANSI/TIA/EIA 455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
ANSI/TIA-455-207-2000 FOTP207 - IEC 61290-1-2- Optical Fiber Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer
ANSI/TIA/EIA 455-207-2000 FOTP207 - IEC 61290-1-2- Optical Fiber Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer

未注明发布机构, Spectral analysis instrument formerly

DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method

American Society for Testing and Materials (ASTM), Spectral analysis instrument formerly

ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D7941/D7941M-23 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM D7941/D7941M-14 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM E1009-95(2000) Standard Practice for Evaluating an Optical Emission Vacuum Spectrometer to Analyze Carbon and Low-Alloy Steel
ASTM D7417-17 Standard Test Method for Analysis of In-Service Lubricants Using Particular Four-Part Integrated Tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity, and Laser Particle Counter)
ASTM D7751-12 Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
ASTM D7417-10 Standard Test Method for Analysis of In-Service Lubricants Using Particular Four-Part Integrated Tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity, and Laser Particle Counter)
ASTM E2056-04(2010) Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
ASTM E2056-04(2016) Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
ASTM D8470-22 Standard Practice for Development and Implementation of Instrument Performance Tests for Use on Multivariate Online, At-Line and Laboratory Spectroscopic Based Analyzer Systems
ASTM D6122-21 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-20a Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-20 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-22 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM D8438/D8438M-23 Standard Test Methods for Use of Hyperspectral Sensors for Soil Nutrient Analysis of Ground Based Samples
ASTM E498-95(2006) Standard Test Methods for Leaks Using the Mass Spectrometer Leak Detector or Residual Gas Analyzer in the Tracer Probe Mode
ASTM D4927-10 Standard Test Methods for Elemental Analysis of Lubricant and Additive Components8212;Barium, Calcium, Phosphorus, Sulfur, and Zinc by Wavelength-Dispersive X-Ray Fluorescence Spectroscopy
ASTM E498/E498M-11 Standard Practice for Leaks Using the Mass Spectrometer Leak Detector or Residual Gas Analyzer in the Tracer Probe Mode
ASTM C1429-99 Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Double-Standard Multi-Collector Gas Mass Spectrometer
ASTM C1429-99(2004) Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Double-Standard Multi-Collector Gas Mass Spectrometer
ASTM C1428-18(2023) Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Single–Standard Gas Source Multiple Collector Mass Spectrometer Method
ASTM C1429-21 Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Double-Standard Multi-Collector Gas Mass Spectrometer
ASTM C1428-99 Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Single-Standard Gas Source Multiple Collector Mass Spectrometer Method
ASTM C1429-99(2009) Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Double-Standard Multi-Collector Gas Mass Spectrometer
ASTM C1742-10 Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Double Standard Single-Collector Gas Mass Spectrometer Method
ASTM C1429-99(2014) Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Double-Standard Multi-Collector Gas Mass Spectrometer
ASTM C1428-99(2005) Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Single-Standard Gas Source Multiple Collector Mass Spectrometer Method
ASTM E1336-11 Standard Test Method for Obtaining Colorimetric Data From a Visual Display Unit by Spectroradiometry

U.S. Air Force, Spectral analysis instrument formerly

AIR FORCE A-A-59751 A VALID NOTICE 1-2012 Analyzer, Spectrum, 2.9 GHZ RF with Internal Tracking Generator
AIR FORCE A-A-59751-2004 ANALYZER, SPECTRUM, 2.9 GHZ RF WITH INTERNAL TRACKING GENERATOR

KR-KS, Spectral analysis instrument formerly

KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 15472-2003(2023)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Spectral analysis instrument formerly

GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 25187-2010 Surface chemical analysis.Auger electron spectroscopy.Description of selected instrumental performance parameters
GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser

(U.S.) Telecommunications Industries Association , Spectral analysis instrument formerly

TIA/EIA-455-209-2000 FOTP-209 IEC 61290-2-1 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
TIA/EIA-455-206-2000 FOTP-206 IEC 61290-1-1 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
TIA/EIA-455-210-2000 FOTP-210 IEC 61290-2-2 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer

Professional Standard - Energy, Spectral analysis instrument formerly

NB/SH/T 0940-2016 Test method for the analysis of in-use lubricants using a specific 4-in-1 tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity and Laser Particle Counter)

国家能源局, Spectral analysis instrument formerly

SH/T 0940-2016 Test methods for analyzing in-service lubricants using specific four-in-one testers (atomic emission spectrometry, infrared spectroscopy, viscosity and laser particle counter)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Spectral analysis instrument formerly

GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales

PL-PKN, Spectral analysis instrument formerly

PN-EN IEC 61290-1-1-2021-06 E Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)

Instrument Society of America (ISA), Spectral analysis instrument formerly

ISA 92.02.01, PART I-1998 Performance Requirements for Carbon Monoxide Detection Instruments (50-1000 ppm Full Scale) Formerly ANSI/ISA - S92.02.01, Part I - 1998
ISA 92.0.01, PART I-1998 Performance Requirements for Toxic Gas-Detection Instruments: Hydrogen Sulfide Formerly ANSI/ISA-S92.0.01, Part 1-1998; Replaces ISA-S12.15 Part 1-1990

BE-NBN, Spectral analysis instrument formerly

NBN C 71-598-220-1984

TIA - Telecommunications Industry Association, Spectral analysis instrument formerly

TIA/EIA-455-221-2001 FOTP-221-IEC 61290-5-1 - Optical Fiber Amplifiers - Basic Specification - Part 5-1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer (Please refer to IEC 61290-5-1)
TIA/EIA-455-207-2000 FOTP-207 IEC 61290-1-2 Optical Fibre Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer (Please refer to IEC 61290-1-2)

European Committee for Standardization (CEN), Spectral analysis instrument formerly

EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
prEN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)

AT-ON, Spectral analysis instrument formerly

OENORM EN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)

Association of German Mechanical Engineers, Spectral analysis instrument formerly

VDI 3869 Blatt 3-2010 Measurement of ammonia in ambient air - Sampling with diffusion separators (denuders) - Photometric or ion chromatographic analysis
VDI 3869 Blatt 4-2012 Measurement of ammonia in ambient air - Sampling with diffusive samplers - Photometric or ion chromatographic analysis

VN-TCVN, Spectral analysis instrument formerly

TCVN 7207-5-2002 Glass and glassware.Analysis of extract solutions.Part 5: Determination of iron (Ⅲ) oxide by molecular absorption spectrometry and flame atomic absorption spectrometry
TCVN 7207-4-2002 Glass and glassware.Analysis of extract solutions.Part 4: Determination of aluminium oxide by molecular absorption spectrometry
TCVN 7207-1-2002 Glass and glassware.Analysis of extract solutions.Part 1: Determination of silicon dioxide by molecular absorption spectrometry

Professional Standard - Commodity Inspection, Spectral analysis instrument formerly

SN/T 4115-2015 Determination of sulfur compounds in natural gas.Gas chromatography and sulfur chemiluminescence deterctor

PT-IPQ, Spectral analysis instrument formerly

NP ISO 10478:2001 Petroleum products Determination of aluminium and silicon in fuel oils Inductively coupled plasma emission and atomic absorption spectroscopy methods

NZ-SNZ, Spectral analysis instrument formerly

AS/NZS 3580.17:2016 Methods for sampling and analysis of ambient air Method 17: Determination of gaseous compounds in ambient air-Direct-reading cavity ring-down spectroscopy instrumental method