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Atomic Force Microscopy
Atomic Force Microscopy, Total:22 items.
In the international standard classification, Atomic Force Microscopy involves: Physics. Chemistry, Thermodynamics and temperature measurements, Materials for aerospace construction, Analytical chemistry, Test conditions and procedures in general, Optics and optical measurements, Linear and angular measurements, Nuclear energy engineering.
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Atomic Force Microscopy
- GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
Group Standards of the People's Republic of China, Atomic Force Microscopy
ESDU - Engineering Sciences Data Unit, Atomic Force Microscopy
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
American Society for Testing and Materials (ASTM), Atomic Force Microscopy
- ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
- ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
International Organization for Standardization (ISO), Atomic Force Microscopy
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
British Standards Institution (BSI), Atomic Force Microscopy
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Atomic Force Microscopy
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
German Institute for Standardization, Atomic Force Microscopy
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
国家市场监督管理总局、中国国家标准化管理委员会, Atomic Force Microscopy
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
Professional Standard - Nuclear Industry, Atomic Force Microscopy
- EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool
Professional Standard - Machinery, Atomic Force Microscopy
- JB/T 5585-1991 Test method of transmission electron microscope resolution