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x-ray spectrometer

x-ray spectrometer, Total:13 items.

In the international standard classification, x-ray spectrometer involves: Analytical chemistry, Radiation measurements, Nuclear energy engineering.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-ray spectrometer

• GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
• GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
• GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
• GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers

CZ-CSN, x-ray spectrometer

• CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

Korean Agency for Technology and Standards (KATS), x-ray spectrometer

• KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
• KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers

International Electrotechnical Commission (IEC), x-ray spectrometer

• IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
• IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1

Institute of Electrical and Electronics Engineers (IEEE), x-ray spectrometer

• ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

SE-SIS, x-ray spectrometer

• SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers

German Institute for Standardization, x-ray spectrometer

• DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English

IN-BIS, x-ray spectrometer

• IS 12737-1988

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