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Sample Preparation for X-ray Photoelectron Spectroscopy

Sample Preparation for X-ray Photoelectron Spectroscopy, Total:290 items.

In the international standard classification, Sample Preparation for X-ray Photoelectron Spectroscopy involves: Analytical chemistry, Optics and optical measurements, Non-destructive testing, Linear and angular measurements, Electronic components in general, Optical equipment, Medical sciences and health care facilities in general, Electricity. Magnetism. Electrical and magnetic measurements, Products of the chemical industry, Medical equipment, Surface treatment and coating, Corrosion of metals, Testing of metals, Non-ferrous metals, Nuclear energy engineering, Refractories, Ceramics, Physics. Chemistry, Non-metalliferous minerals, Paper and board, Geology. Meteorology. Hydrology, Fuels, Petroleum products in general, Wastes, ENVIRONMENT. HEALTH PROTECTION. SAFETY, Metalliferous minerals, Air quality, Protection against crime.

International Organization for Standardization (ISO), Sample Preparation for X-ray Photoelectron Spectroscopy

ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO/FDIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 19318:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
ISO 19318:2021 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 19668:2017 Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO 20847:2004 Petroleum products - Determination of sulfur content of automotive fuels - Energy-dispersive X-ray fluorescence spectrometry
ISO 20903:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
ISO 10058-3:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
ISO 22581:2021 Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containi
ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
ISO/TS 9516-4:2021 Iron ores — Determination of various elements by X-ray fluorescence spectrometry — Part 4: Performance-based method using fusion preparation method
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3: Inductively coupled plasma and atomic absorption spectrometry methods
ISO 20565-3:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-

German Institute for Standardization, Sample Preparation for X-ray Photoelectron Spectroscopy

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN EN ISO 21587-3:2007-12 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3: Inductively coupled plasma and atomic absorption spectrometry methods (ISO 21587-3:2007); German version EN ISO 21587-3:2007
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3: Inductively coupled plasma and atomic absorption spectrometry methods (ISO 21587-3:2007); English version of DIN EN ISO 21587-3:2007-12
DIN EN ISO 10058-3:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) (ISO 10058-3:20
DIN EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-
DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
DIN EN 61262-7:2002 Medical electrical equipment - Characteristics of electro-optical X-ray image intensifiers - Part 7: Determination of the modulation transfer function (IEC 61262-7:1995); German version EN 61262-7:1995

British Standards Institution (BSI), Sample Preparation for X-ray Photoelectron Spectroscopy

BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
20/30423741 DC BS ISO 19318. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 19318:2021 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
BS 6043-2.4:2000 Methods of sampling and test for carbonaceous materials used in aluminium manufacture. Electrode coke. Analysis by X-ray fluorescence spectroscopy
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS ISO 19318:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
BS ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
23/30461294 DC BS ISO 18118. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 18118:2015 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS ISO 20903:2019 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
BS ISO 18118:2005 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS EN ISO 10058-3:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method). Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
BS EN ISO 10058-3:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
BS EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Inductively coupled plasma and atomic absorption spectrometry methods
IEC 62607-6-21:2022 Nanomanufacturing. Key control characteristics. - Part 6-21: Graphene-based material. Elemental composition, C/O ratio: X-ray photoelectron spectroscopy
BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 22581:2021 Surface chemical analysis. Near real-time information from the X-ray photoelectron spectroscopy survey scan. Rules for identification of, and correction for, surface contamination by carbon-containing compounds
BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
BS EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method). Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
BS EN ISO 20565-3:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method). Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-A
23/30409204 DC BS EN IEC 62321-3-1. DETERMINATION OF CERTAIN SUBSTANCES IN ELECTROTECHNICAL PRODUCTS - Part 3-1. Elemental Screening by X-ray fluorescence spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Sample Preparation for X-ray Photoelectron Spectroscopy

GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
GB/T 30702-2014 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
GB/T 2679.11-2008 Paper and board.Qualitative analysis of mineral filler and mineral coating.SEM/EDAX Method
GB/T 2679.11-1993 Paper and board. Qualitative analysis of mineral filler and mineral coating. SEM/EDAX method
GB/T 30701-2014 Surface chemical analysis.Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
GB/T 18882.2-2002 Chemical analysis methods for mixed rare earth oxide of ion-absorpted type RE ore-Determination of fifteen REO relative content--X-ray fluorescence spectrometric method

American Society for Testing and Materials (ASTM), Sample Preparation for X-ray Photoelectron Spectroscopy

ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM C1110-03(2008) Standard Practice for Sample Preparation for X-Ray Emission Spectrometric Analysis of Uranium in Ores Using the Glass Fusion or Pressed Powder Method
ASTM C1110-88(1997)e1 Standard Practice for Sample Preparation for X-Ray Emission Spectrometric Analysis of Uranium in Ores Using the Glass Fusion or Pressed Powder Method
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM C1110-03 Standard Practice for Sample Preparation for X-Ray Emission Spectrometric Analysis of Uranium in Ores Using the Glass Fusion or Pressed Powder Method
ASTM E1523-09 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM D7343-07 Standard Practice for Optimization, Sample Handling, Calibration, and Validation of X-ray Fluorescence Spectrometry Methods for Elemental Analysis of Petroleum Products and Lubricants
ASTM E2108-00 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM C1255-93(1999) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-18 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-93(2005) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-11 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM E2108-10 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM D7343-12 Standard Practice for Optimization, Sample Handling, Calibration, and Validation of X-ray Fluorescence Spectrometry Methods for Elemental Analysis of Petroleum Products and Lubricants
ASTM E2108-05 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM D5839-96(2001) Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM D5839-96(2006) Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM F1375-92(2005) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM B982-12 Standard Specification for Sampling and Sample Preparation of Lead and Lead Alloys for Optical Emission Spectrometric OR ICP Analysis
ASTM D5839-15(2023) Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM B982-14 Standard Specification for Sampling and Sample Preparation of Lead and Lead Alloys for Optical Emission Spectrometric or ICP Analysis
ASTM B982-14e1 Standard Specification for Sampling and Sample Preparation of Lead and Lead Alloys for Optical Emission Spectrometric or ICP Analysis
ASTM E3309-21 Standard Guide for Reporting of Forensic Primer Gunshot Residue (pGSR) Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
ASTM D5839-15 Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM E305-07 Standard Practice for Establishing and Controlling Atomic Emission Spectrochemical Analytical Curves
ASTM E305-13 Standard Practice for Establishing and Controlling Atomic Emission Spectrochemical Analytical Curves
ASTM E2994-21 Standard Test Method for Analysis of Titanium and Titanium Alloys by Spark Atomic Emission Spectrometry and Glow Discharge Atomic Emission Spectrometry (Performance-Based Method)
ASTM D5839-96 Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM E305-21 Standard Practice for Establishing and Controlling Spark Atomic Emission Spectrochemical Analytical Curves
ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM D7343-18 Standard Practice for Optimization, Sample Handling, Calibration, and Validation of X-ray Fluorescence Spectrometry Methods for Elemental Analysis of Petroleum Products and Lubricants
ASTM D7343-20 Standard Practice for Optimization, Sample Handling, Calibration, and Validation of X-ray Fluorescence Spectrometry Methods for Elemental Analysis of Petroleum Products and Lubricants
ASTM D7343-12(2017) Standard Practice for Optimization, Sample Handling, Calibration, and Validation of X-ray Fluorescence Spectrometry Methods for Elemental Analysis of Petroleum Products and Lubricants
ASTM E1741-00 Standard Practice for Preparation of Airborne Particulate Lead Samples Collected During Abatement and Construction Activities for Subsequent Analysis by Atomic Spectrometry
ASTM E2994-16 Standard Test Method for Analysis of Titanium and Titanium Alloys by Spark Atomic Emission Spectrometry and Glow Discharge Atomic Emission Spectrometry (Performance-Based Method)
ASTM D6052-97(2023) Standard Test Method for Preparation and Elemental Analysis of Liquid Hazardous Waste by Energy-Dispersive X-Ray Fluorescence
ASTM D6052-97(2016) Standard Test Method for Preparation and Elemental Analysis of Liquid Hazardous Waste by Energy-Dispersive X-Ray Fluorescence
ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
ASTM D6052-97 Standard Test Method for Preparation and Elemental Analysis of Liquid Hazardous Waste by Energy-Dispersive X-Ray Fluorescence
ASTM D6052-97(2003) Standard Test Method for Preparation and Elemental Analysis of Liquid Hazardous Waste by Energy-Dispersive X-Ray Fluorescence
ASTM D6052-97(2008) Standard Test Method for Preparation and Elemental Analysis of Liquid Hazardous Waste by Energy-Dispersive X-Ray Fluorescence
ASTM E2594-20 Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry (Performance-Based)
ASTM D8064-16 Standard Test Method for Elemental Analysis of Soil and Solid Waste by Monochromatic Energy Dispersive X-ray Fluorescence Spectrometry Using Multiple Monochromatic Excitation Beams
ASTM E2594-09 Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry (Performance-Based Method)

Association Francaise de Normalisation, Sample Preparation for X-ray Photoelectron Spectroscopy

NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
XP A06-379-1999 Guidelines for the preparation of standard routine methods with wavelength-dispersive X-ray fluorescence spectrometry.
NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
NF EN ISO 21587-3:2007 Analyse chimique des produits réfractaires d'aluminosilicates (méthode alternative à la méthode par fluorescence de rayons X) - Partie 3 : méthodes par spectrométrie d'absorption atomique (AAS) et spectrométrie d'émission atomique avec plasm...
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NF EN ISO 20565-3:2009 Analyse chimique des produits réfractaires contenant du chrome et des matières premières contenant du chrome (méthode alternative à la méthode par fluorescence de rayons X) - Partie 3 : méthodes par spectrométrie d'absorption atomique dans la ...
NF A09-230-3:1999 Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 3 : spectrometric method.
NF B40-670-3*NF EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3 : inductively coupled plasma and atomic absorption spectrometry methods
NF B49-329-3*NF EN ISO 10058-3:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3 : flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
NF B49-435-3*NF EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3 : flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP
NF EN ISO 13196:2015 Qualité du sol - Analyse rapide d'une sélection d'éléments dans les sols à l'aide d'un spectromètre de fluorescence X à dispersion d'énergie portable ou portatif

Korean Agency for Technology and Standards (KATS), Sample Preparation for X-ray Photoelectron Spectroscopy

KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 15472-2003(2018)
KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 19318:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 18118:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
KS L ISO 20565-3-2012(2017) Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spectrometry(FAAS) and inductively
KS L ISO 20565-3-2012(2022) Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spectrometry(FAAS) and inductively
KS L ISO 10058-3-2012(2022) Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spectrophotometry(FAAS) and inductively coupled plasma atom
KS L ISO 10058-3:2012 Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spectrophotometry(FAAS) and inductively coupled plasma atomic emission spectrometry(ICP-AES)
KS M ISO 20847:2006 Petroleum products－Determination of sulfur content of automotive fuels－Energy－dispersive X－ray fluorescence spectrometry
KS L ISO 10058-3-2012(2017) Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spectrophotometry(FAAS) and inductively coupled plasma atom
KS L ISO 21587-3:2012 Chemical analysis of aluminosilicate refractory products-Part 3:Inductively coupled plasma and atomic absorption spectrometry methods
KS L ISO 20565-3:2012 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)-Part 3:Flame atomic absorption spectrometry(FAAS) and inductively coupled plasma atomic emission spectrometry(ICP-AES)
KS L ISO 21079-3-2012(2022) Chemical analysis of refractories containing alumina, zirconia, and silica－Refractories containing 5 % to 45 % of ZrO2(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spec
KS L ISO 21079-3-2012(2017) Chemical analysis of refractories containing alumina, zirconia, and silica－Refractories containing 5 % to 45 % of ZrO2(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spec

国家市场监督管理总局、中国国家标准化管理委员会, Sample Preparation for X-ray Photoelectron Spectroscopy

GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
GB/T 39560.301-2020 Determination of certain substances in electrical and electronic products—Part 3-1: Screening lead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometry
GB/T 6609.30-2022 Chemical analysis methods and determination of physical performance of alumina—Part 30: Determination of trace elements—Wavelength dispersive X-ray fluorescence spectrometric method

Professional Standard - Electron, Sample Preparation for X-ray Photoelectron Spectroscopy

SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

Standard Association of Australia （SAA）, Sample Preparation for X-ray Photoelectron Spectroscopy

AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO 19318:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
AS ISO 24237:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale

未注明发布机构, Sample Preparation for X-ray Photoelectron Spectroscopy

BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Sample Preparation for X-ray Photoelectron Spectroscopy

GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）

KR-KS, Sample Preparation for X-ray Photoelectron Spectroscopy

KS D ISO 15472-2003(2023)
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

Japanese Industrial Standards Committee (JISC), Sample Preparation for X-ray Photoelectron Spectroscopy

JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
JIS T 0306:2002 Analysis of state for passive film formed on metallic biomaterials by X-ray photoelectron spectroscopy
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy

Fujian Provincial Standard of the People's Republic of China, Sample Preparation for X-ray Photoelectron Spectroscopy

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Professional Standard - Non-ferrous Metal, Sample Preparation for X-ray Photoelectron Spectroscopy

YS/T 739-2010 Determination of cryolite rate and main components of electrolyte-X-ray fluorescence spectrometric analysis method
YS/T 820.19-2012 Methods for chemical analysis of laterite nickel ores.Part 19:Determination of aluminum,chromium,iron,magnesium,manganese,nickel and silicon contents.Energy-dispersive X-ray fluorescence spectrometry

Danish Standards Foundation, Sample Preparation for X-ray Photoelectron Spectroscopy

DS/EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3: Inductively coupled plasma and atomic absorption spectrometry methods
DS/EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-
DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DS/EN ISO 10058-3:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)

RU-GOST R, Sample Preparation for X-ray Photoelectron Spectroscopy

GOST R ISO 16243-2016 State system for insuring the uniformity of measurements Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

Lithuanian Standards Office , Sample Preparation for X-ray Photoelectron Spectroscopy

LST EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-
LST EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3: Inductively coupled plasma and atomic absorption spectrometry methods (ISO 21587-3:2007)
LST EN ISO 10058-3:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) (ISO 10058-3:20

AENOR, Sample Preparation for X-ray Photoelectron Spectroscopy

UNE-EN ISO 21587-3:2008 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3: Inductively coupled plasma and atomic absorption spectrometry methods (ISO 21587-3:2007)

Anhui Provincial Standard of the People's Republic of China, Sample Preparation for X-ray Photoelectron Spectroscopy

DB34/T 2127.2-2014 Methods of Analysis of Samples for Regional Geochemical Surveys Part 2: Determination of Multielement Content by X-ray Fluorescence Spectrometry
DB34/T 3368.1-2019 Methods for the analysis of hazardous substances in printed circuit boards - Part 1: Rapid screening X-ray fluorescence spectrometry for lead, mercury, chromium, cadmium and bromine

European Committee for Standardization (CEN), Sample Preparation for X-ray Photoelectron Spectroscopy

EN ISO 20847:2004 Petroleum products - Determination of sulfur content of automotive fuels - Energy-dispersive X-ray fluorescence spectrometry (ISO 20847:2004)
EN ISO 10058-3:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) (ISO 10058-3:20
EN ISO 20565-3:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-
EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3: Inductively coupled plasma and atomic absorption spectrometry methods

International Electrotechnical Commission (IEC), Sample Preparation for X-ray Photoelectron Spectroscopy

IEC TS 62607-6-21:2022 Nanomanufacturing - Key control characteristics - Part 6-21: Graphene-based material - Elemental composition, C/O ratio: X-ray photoelectron spectroscopy

Professional Standard - Commodity Inspection, Sample Preparation for X-ray Photoelectron Spectroscopy

SN/T 2003.4-2006 Determination of lead, mercury, chromium, cadmium and bromine in electrical and electronic equipment. Part 4: Qualitative screening by energy dispersive X-ray fluorescence spectrometric method
SN/T 2003.5-2006 Determination of lead,mercury,chromium,cadmium and bromine in electrical and electronic equipment-Part 5:Quantitative screening by energy dispersive X-ray fluorescence spectrometric method
SN/T 2003.1-2005 Determination of lead,mercury,cadmium,chromium and bromine in electrical and electronic equipment-Part 1:Qualitative screening by wavelength dispersive X-ray fluorescence spectrometric method
SN/T 2003.3-2006 Determination of Lead, Mercury, Chromium, Cadmium and Bromine in electrical and electronic equipments - Part 3: Qualitative screening by X-ray fluorescence spectrometric method

Professional Standard - Public Safety Standards, Sample Preparation for X-ray Photoelectron Spectroscopy

GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy