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spin electron diffraction

spin electron diffraction, Total:77 items.

In the international standard classification, spin electron diffraction involves: Analytical chemistry, Testing of metals, Non-destructive testing, Vocabularies, Education, Optical equipment, Optics and optical measurements, Protection against fire, Linear and angular measurements, Physics. Chemistry, Medical equipment, Electronic tubes, General methods of tests and analysis for food products, Non-metalliferous minerals, Air quality, Fruits. Vegetables.

国家市场监督管理总局、中国国家标准化管理委员会, spin electron diffraction

GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 39867-2021 Bismuth germanate scintillation crystal for positron emission tomography

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, spin electron diffraction

GB/T 36165-2018 Determination of average grain size of metal.Electron backscatter diffraction (EBSD)method
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 19501-2013 Microbeam analysis.General guide for electron backscatter diffraction analysis
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 30703-2014 Microbeam analysis.Guidelines for orientation measurement using electron backscatter diffraction
GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy

German Institute for Standardization, spin electron diffraction

DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN 6871-1:2003-02 Cyclotron systems for positron emissions tomography - Part 1: Requirements for constructional radiation protection

British Standards Institution (BSI), spin electron diffraction

BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS EN 13708:2002 Foodstuffs - Detection of irradiated food containing crystalline sugar by ESR spectroscopy
BS EN 13708:2022 Foodstuffs - Detection of irradiated food containing crystalline sugar by ESR spectroscopy
15/30292710 DC BS ISO 19214. Guidelines for growth direction determination of wirelike crystals by transmission electron microscopy
BS ISO 23703:2022 Microbeam analysis. Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
21/30395106 DC BS ISO 23703. Microbeam analysis. Guideline for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)

International Organization for Standardization (ISO), spin electron diffraction

ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO/TTA 3:2001 Polycrystalline materials - Determination of residual stresses by neutron diffraction
ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 23703:2022 Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

Professional Standard - Energy, spin electron diffraction

NB/SH/T 6015-2020 Determination of Unit Cell Parameters of ZSM-23 Molecular Sieve by X-ray Diffraction Method
NB/SH/T 6033-2021 Determination of unit cell parameters of ZSM-22 molecular sieve X-ray diffraction method
NB/SH/T 6024-2021 Determination of Relative Crystallinity of ZSM-5 Molecular Sieve X-ray Diffraction Method
NB/SH/T 0339-2021 Determination of Unit Cell Parameters of Faujasite Molecular Sieve X-ray Diffraction Method

American Society for Testing and Materials (ASTM), spin electron diffraction

ASTM E2627-13(2019) Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
ASTM E2627-13 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
ASTM E2627-10 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
ASTM D6056-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy

Professional Standard - Education, spin electron diffraction

JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

United States Navy, spin electron diffraction

NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION

SE-SIS, spin electron diffraction

SIS SEN 43 15-1962 Rotary wafer switches for electronic equipment

工业和信息化部, spin electron diffraction

YB/T 4677-2018 Determination of Texture in Steel Electron Backscattered Diffraction (EBSD) Method

Shanghai Provincial Standard of the People's Republic of China, spin electron diffraction

DB31/T 1156-2019 Electron backscatter diffraction method for technical identification of electrical fire melt marks

RU-GOST R, spin electron diffraction

GOST R 8.696-2010 State system for ensuring the uniformity of measurements. Interplanar spacings in crystals and the intensity distribution in diffraction patterns. Method for measurement by means of an electron diffractometer
GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
GOST 23197-1978 X-ray acceleration cameras. General specifications
GOST R ISO 13067-2016 State system for insuring the uniformity of measurements. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
GOST R 52829-2007 Foodstuff. Method of electron paramagnetic resonance for detection of radiation-treated food containing crystalline sugar
GOST 31652-2012 Foodstuffs. Method of electron paramagnetic resonance for detection of radiation-treated food containing crystalline sugar

Association Francaise de Normalisation, spin electron diffraction

NF ISO 24173:2009 Analyse par microfaisceaux - Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
NF V03-005:2002 Foodstuffs - Detection of irradiated food containing crystalline sugar by ESR spectroscopy.
NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.

Professional Standard - Commodity Inspection, spin electron diffraction

SN/T 3514-2013 Identification method of texture analysis for grain oriented and non-oriented electrical steels.X-ray diffraction(XRD)
SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, spin electron diffraction

GB/T 34172-2017 Microbeam analysis—Electron backscatter diffraction—Phase analysis method of metal and alloy

Group Standards of the People's Republic of China, spin electron diffraction

T/SAS 0003-2018 Bismuth germanate scintillation crystals for positron emission tomography

Professional Standard - Hygiene , spin electron diffraction

WS/T 117-1999 Specification of estimation of eye lens dose from X、γ、β rays and electron beams

Gansu Provincial Standard of the People's Republic of China, spin electron diffraction

DB62/T 2760-2017 Determination of multi-element content in cryolite by inductively coupled plasma atomic emission spectrometry

IX-IX-IEC, spin electron diffraction

IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy