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Surface near-field optical microscopy

Surface near-field optical microscopy, Total:43 items.

In the international standard classification, Surface near-field optical microscopy involves: Analytical chemistry, Optical equipment, Non-ferrous metals, Glass.

International Organization for Standardization (ISO), Surface near-field optical microscopy

• ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
• ISO 19012-1:2007 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
• ISO 9345-1:1996 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 1: Tube length 160 mm
• ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
• ISO 9345-2:2003 Optics and optical instruments - Microscopes: Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems
• ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
• ISO 9345-2:2014 Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems
• ISO 9345:2019 Microscopes — Imaging distances related to mechanical reference planes — Part 2: Infinity-corrected optical systems

British Standards Institution (BSI), Surface near-field optical microscopy

• BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
• BS 7012-9:1997 Light microscopes - Specification for interfacing connection type C
• BS 7012-3:1997 Light microscopes - Imaging distances related to mechanical reference planes for tube length 160 mm
• BS ISO 9345-2:2003 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Infinity-corrected optical systems
• BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
• BS 7011-2.2:1998 Consumable accessories for light microscopes. Slides. Specification for materials and quality of finish
• BS ISO 9345-2:2014 Microscopes. Imaging distances related to mechanical reference planes. Infinity-corrected optical systems
• BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

Korean Agency for Technology and Standards (KATS), Surface near-field optical microscopy

• KS D 2713-2006 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
• KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
• KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
• KS B ISO 19012-1-2016(2021) Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
• KS B ISO 9345-1:2006 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
• KS B ISO 9345-1:2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
• KS B ISO 9345-1-2023 Image distance of optical and optical instrument microscopes relative to mechanical reference planes Part 1: 160 mm tube length
• KS B ISO 9345-2:2006 Optics and optical instruments-Microscopes:Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems
• KS B ISO 9345-2:2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
• KS B ISO 9345-2-2016(2021) Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
• KS B ISO 9345-1-2016(2021) Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm

KR-KS, Surface near-field optical microscopy

• KS B ISO 19012-1-2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
• KS B ISO 9345-2-2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
• KS B ISO 9345-1-2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
• KS B ISO 9345-2-2023 Microscopes — Imaging distances related to mechanical reference planes — Part 2: Infinity-corrected optical systems

RU-GOST R, Surface near-field optical microscopy

• GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope

TIA - Telecommunications Industry Association, Surface near-field optical microscopy

• TIA-573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
• TIA/EIA-573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
• EIA-546A000-1989 Sectional Specification for a Field Portable Optical Microscope for Inspection of Optical Waveguides and Related Devices
• EIA/TIA-546AA00-1990 Blank Detail Specification for Field Portable Optical Microscopes for Inspection of Optical Waveguides and Related Devices

American National Standards Institute （ANSI), Surface near-field optical microscopy

• ANSI/TIA/EIA 573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
• ANSI/EIA/TIA 546AAOO:1989 Blank Detail Specification for Field Portable Optical Microscopes for Inspection of Optical Waveguides and Related Devices / Note: Approved 1989-07-10.

German Institute for Standardization, Surface near-field optical microscopy

• DIN ISO 9345-2:2005 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems (ISO 9345-2:2003)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Surface near-field optical microscopy

• GB/T 41805-2022 Methodology for the quantitative inspection of the defect on optics surface—Microscopic scattering dark-field imaging
• GB/T 22057.2-2008 Microscopes-Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems

Japanese Industrial Standards Committee (JISC), Surface near-field optical microscopy

• JIS B 7132-2:2009 Microscopes -- Imaging distances related to mechanical reference planes -- Part 2: Infinity-corrected optical systems
• JIS B 7132-2:2022 Microscopes -- Imaging distances related to mechanical reference planes -- Part 2: Infinity-corrected optical systems

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