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X-ray Spectrometer Energy Spectrometer
X-ray Spectrometer Energy Spectrometer, Total:90 items.
In the international standard classification, X-ray Spectrometer Energy Spectrometer involves: Analytical chemistry, Linear and angular measurements, Optics and optical measurements, Radiation measurements, Metalliferous minerals, Nuclear energy engineering, Metrology and measurement in general, Electricity. Magnetism. Electrical and magnetic measurements, Non-destructive testing, Testing of metals, Surface treatment and coating, Paint ingredients, Astronomy. Geodesy. Geography.
International Organization for Standardization (ISO), X-ray Spectrometer Energy Spectrometer
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
Korean Agency for Technology and Standards (KATS), X-ray Spectrometer Energy Spectrometer
- KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
- KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
- KS C IEC 61452:2017 Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
- KS D ISO 3497-2002(2017) Metallic coatings－Measurement of coating thickness－X-ray spectrometric methods
- KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray Spectrometer Energy Spectrometer
- GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
- GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
- GB/Z 42358-2023 Determination of Accuracy of Wavelength Dispersive X-ray Fluorescence Spectrometer for Iron Ore
- GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
British Standards Institution (BSI), X-ray Spectrometer Energy Spectrometer
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
未注明发布机构, X-ray Spectrometer Energy Spectrometer
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
American Society for Testing and Materials (ASTM), X-ray Spectrometer Energy Spectrometer
- ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
- ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
- ASTM D5381-93(2014) Standard Guide for X-Ray Fluorescence 40;XRF41; Spectroscopy of Pigments and Extenders
- ASTM E1172-22 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
- ASTM E1172-16 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
- ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E902-05 Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
Professional Standard - Machinery, X-ray Spectrometer Energy Spectrometer
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 6215-2011 Non-destructive testing instruments.The series typal table to industrial X-ray tube
- JB/T 11602.3-2013 Non-desturctive testing instruments.Measurement and evaluation of the X-ray tube voltage.Part 3: Spectrometric detect
SE-SIS, X-ray Spectrometer Energy Spectrometer
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
German Institute for Standardization, X-ray Spectrometer Energy Spectrometer
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
CZ-CSN, X-ray Spectrometer Energy Spectrometer
International Electrotechnical Commission (IEC), X-ray Spectrometer Energy Spectrometer
- IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
- IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
National Metrological Technical Specifications of the People's Republic of China, X-ray Spectrometer Energy Spectrometer
工业和信息化部/国家能源局, X-ray Spectrometer Energy Spectrometer
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
- JB/T 12962.1-2016 Energy-dispersive X-ray fluorescence spectrometers Part 1: General techniques
Institute of Electrical and Electronics Engineers (IEEE), X-ray Spectrometer Energy Spectrometer
Japanese Industrial Standards Committee (JISC), X-ray Spectrometer Energy Spectrometer
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
IN-BIS, X-ray Spectrometer Energy Spectrometer
National Metrological Verification Regulations of the People's Republic of China, X-ray Spectrometer Energy Spectrometer
- JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
- JJG 810-1993 Verification Regulation for Wavelength Dispersive X-Ray Fluorescence Spectrometers
Group Standards of the People's Republic of China, X-ray Spectrometer Energy Spectrometer
- T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
Professional Standard - Electron, X-ray Spectrometer Energy Spectrometer
- SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
Association Francaise de Normalisation, X-ray Spectrometer Energy Spectrometer
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, X-ray Spectrometer Energy Spectrometer
- GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
KR-KS, X-ray Spectrometer Energy Spectrometer
Standard Association of Australia （SAA）, X-ray Spectrometer Energy Spectrometer
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
RU-GOST R, X-ray Spectrometer Energy Spectrometer
- GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination
- GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
- GOST 25645.118-1984 Cosmic X-rays of the discrete sources. Energy spectra and angular coordinates
- GOST 22091.7-1984 X-ray devices. The methods of the measuring of the uniformity of the distribution of the energe flyx density of the X-ray over the X-ray coverage
Professional Standard - Agriculture, X-ray Spectrometer Energy Spectrometer
- JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
Professional Standard - Nuclear Industry, X-ray Spectrometer Energy Spectrometer
- EJ/T 584-1994 Portable gamma radiation instrument and gamma energy spectrometer for exploration
- EJ/T 1139-2001 γ-ray radiation meters and γ-ray spectrometers used for prospecting-characteristics and test methods
- EJ/T 584-2014 Portable gamma radiation meters and four channel gamma spectrometers used for prospecting
国家市场监督管理总局、中国国家标准化管理委员会, X-ray Spectrometer Energy Spectrometer
- GB/T 40196-2021 Method for analysing CCA and ACQ in preservative-treated wood and wood preservatives by X-ray fluorescence spectroscopy