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What does an atomic force microscope use

What does an atomic force microscope use, Total:21 items.

In the international standard classification, What does an atomic force microscope use involves: Physics. Chemistry, Nuclear energy engineering, Test conditions and procedures in general, Materials for aerospace construction, Analytical chemistry, Ceramics, Linear and angular measurements.

American Society for Testing and Materials (ASTM), What does an atomic force microscope use

• ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
• ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
• ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
• ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
• ASTM E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps

Professional Standard - Nuclear Industry, What does an atomic force microscope use

• EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, What does an atomic force microscope use

• GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic steps

German Institute for Standardization, What does an atomic force microscope use

• DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

International Organization for Standardization (ISO), What does an atomic force microscope use

• ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
• ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, What does an atomic force microscope use

• GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement

British Standards Institution (BSI), What does an atomic force microscope use

• BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
• 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
• BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
• 23/30461942 DC BS ISO 19606. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy

ESDU - Engineering Sciences Data Unit, What does an atomic force microscope use

• SPB-M6-1-2010 Apr.08: Interfacial and Rheological Properties of Asphaltenes Investigated using AFM
• SPB-M14-1-2010 Sept.10: Interactions and rheological properties of Asphaltenes studied by Atomic Force Microscopy
• SPB-M6-2-2010 Apr.08: Colloidal Interactions Between Asphaltene and Different Surfaces Measured by Atomic force microscopy (AFM)

Japanese Industrial Standards Committee (JISC), What does an atomic force microscope use

• JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
• JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy

RU-GOST R, What does an atomic force microscope use

• GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope

Others:   What does an atomic force microscope measure?, What does an atomic force microscope detect, What does an atomic force microscope measure?, What does an atomic force microscope measure?, What does an atomic force microscope measure, Measuring Roughness Using Atomic Force Microscopy, What does an atomic force microscope measure?, What does an atomic force microscope use.