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X-ray electron microscope

X-ray electron microscope, Total:32 items.

In the international standard classification, X-ray electron microscope involves: Optical equipment, Protection against crime, Optics and optical measurements, Analytical chemistry, Physics. Chemistry, Paints and varnishes, Paper and board.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray electron microscope

• GB 7667-1996 The dose of X-rays leakage from electron microscope
• GB 7667-2003 The dose of X-rays leakage from electron microscope
• GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
• GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
• GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
• GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
• GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
• GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
• GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
• GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
• GB/T 2679.11-2008 Paper and board.Qualitative analysis of mineral filler and mineral coating.SEM/EDAX Method
• GB/T 2679.11-1993 Paper and board. Qualitative analysis of mineral filler and mineral coating. SEM/EDAX method
• GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry

Professional Standard - Commodity Inspection, X-ray electron microscope

• SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method

Fujian Provincial Standard of the People's Republic of China, X-ray electron microscope

• DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Professional Standard - Judicatory, X-ray electron microscope

• SF/T 0139-2023

IX-IX-IEC, X-ray electron microscope

• IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy

Professional Standard - Public Safety Standards, X-ray electron microscope

• GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
• GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
• GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
• GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
• GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
• GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
• GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
• GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy

British Standards Institution (BSI), X-ray electron microscope

• 15/30292710 DC BS ISO 19214. Guidelines for growth direction determination of wirelike crystals by transmission electron microscopy

International Organization for Standardization (ISO), X-ray electron microscope

• ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
• ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

Association of German Mechanical Engineers, X-ray electron microscope

• VDI/VDE 5575 Blatt 4-2011 X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors
• VDI/VDE 5575 Blatt 7-2011 X-Ray optical systems - Refractive X-ray lenses
• VDI/VDE 5575 Blatt 3-2011 X-ray optical systems - Capillary X-ray lenses

American Society for Testing and Materials (ASTM), X-ray electron microscope

• ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations

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