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spectral x-ray
spectral x-ray, Total:45 items.
In the international standard classification, spectral x-ray involves: Analytical chemistry, Optics and optical measurements, Power stations in general, Vocabularies, Non-destructive testing, Fuels, Medical sciences and health care facilities in general, Ferrous metals, Petroleum products in general.
International Organization for Standardization (ISO), spectral x-ray
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
- ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
- ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- ISO 20903:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
- ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
British Standards Institution (BSI), spectral x-ray
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
- BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- BS ISO 18118:2005 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
German Institute for Standardization, spectral x-ray
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
American Society for Testing and Materials (ASTM), spectral x-ray
- ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E995-04 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1621-21 Standard Guide for X-Ray Emission Spectrometric Analysis
Professional Standard - Electricity, spectral x-ray
- DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction
Professional Standard - Agriculture, spectral x-ray
Association Francaise de Normalisation, spectral x-ray
- NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
Professional Standard - Machinery, spectral x-ray
Japanese Industrial Standards Committee (JISC), spectral x-ray
- JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis
- JIS K 0119:1997 General rules for X-ray fluorescence spectrometric analysis
- JIS K 0119:2008 General rules for X-ray fluorescence analysis
VN-TCVN, spectral x-ray
Taiwan Provincial Standard of the People's Republic of China, spectral x-ray
- CNS 12762-2000 Method of test for lead in gasoline by X-ray spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, spectral x-ray
RU-GOST R, spectral x-ray
机械电子工业部, spectral x-ray
Professional Standard - Commodity Inspection, spectral x-ray
- SN/T 3231-2012 Determination of asbestos in talcum.Polarized light microscope and X-ray diffraction method
Korean Agency for Technology and Standards (KATS), spectral x-ray
- KS D ISO 18118:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials