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Sensitivity test

Sensitivity test, Total:125 items.

In the international standard classification, Sensitivity test involves: Materials for aerospace construction, Semiconductor devices, Applications of information technology, Vibrations, shock and vibration measurements, Medical equipment, Telecommunications in general, Electrical accessories.

Military Standards (MIL-STD), Sensitivity test

DOD A-A-53918-1989 PROJECTOR, VISUAL ACUITY TEST

(U.S.) Telecommunications Industries Association , Sensitivity test

TIA TSB62-12-2001 ITM-12 Microbend Sensitivity Test Methods

TIA - Telecommunications Industry Association, Sensitivity test

TSB62-12-2001 ITM-12 Microbend Sensitivity Test Methods

Korean Agency for Technology and Standards (KATS), Sensitivity test

KS C IEC PAS 62179-2003(2008) Electrostatic discharge (ESD) sensitivity testing－Human body model (HBM)
KS B ISO 5347-15-2014(2019) Methods for the calibration of vibration and shock pick-ups — Part 15: Testing of acoustic sensitivity
KS B ISO 5347-15:2014 Methods for the calibration of vibration and shock pick-ups — Part 15: Testing of acoustic sensitivity
KS B ISO 5347-19:2014 Methods for the calibration of vibration and shock pick-ups — Part 19: Testing of magnetic field sensitivity
KS B 0713-15-2001 Methods for the calibration of vibration and shock pick-ups-Part 15:Testing of acoustic sensitivity
KS B ISO 16063-33:2020 Methods for the calibration of vibration and shock transducers —Part 33: Testing of magnetic field sensitivity
KS B 0713-19-2001 Methods for the calibration of vibration and shock pick-ups-Part 19:Testing of magnetic field sensitivity
KS B ISO 5347-16-2014(2019) Methods for the calibration of vibration and shock pick-ups — Part 16: Testing of mounting torque sensitivity
KS B 0713-18-2001 Methods for the calibration of vibration and shock pick-ups-Part 18:Testing of transient temperature sensitivity
KS B 0713-17-2001 Methods for the calibration of vibration and shock pick-ups-Part 17:Testing of fixed temperature sensitivity
KS B 0713-11-2001 Methods for the calibration of vibration and shock pick-ups-Part 11:Testing of transverse vibration sensitivity
KS B 0713-16-2001 Methods for the calibration of vibration and shock pick-ups-Part 16:Testing of mounting torque sensitivity
KS B ISO 5347-13:2014 Methods for the calibration of vibration and shock pick-ups — Part 13: Testing of base strain sensitivity
KS B ISO 5347-16:2014 Methods for the calibration of vibration and shock pick-ups — Part 16: Testing of mounting torque sensitivity
KS B 0713-12-2001 Methods for the calibration of vibration and shock pick-ups-Part 12:Testing of transverse shock sensitivity
KS B ISO 5347-18:2014 Methods for the calibration of vibration and shock pick-ups — Part 18: Testing of transient temperature sensitivity
KS B 0713-13-2001 Methods for the calibration of vibration and shock pick-ups-Part 13:Testing of base strain sensitivity

ESD - ESD ASSOCIATION, Sensitivity test

TR5.4-03-2011 Electrostatic Discharge Sensitivity Testing Latch-Up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits Transient Latch-up Testing – Component Level Supply Transient Stimulation
TR5.4-04-2013 Electrostatic Discharge Sensitivity Testing Transient Latch-up Testing
SP5.5.1-2004 Sensitivity Testing Transmission Line Pulse (TLP) Component Level
ESD DS5.3:1993 Charged Device Model (CDM) Electrostatic Discharge Sensitivity Testing
SP5.3.2-2004 Sensitivity Testing Socketed Device Model (SDM) Component Level
STM5.5.1-2008 Electrostatic Discharge Sensitivity Testing – Transmission Line Pulse (TLP ) – Component Level
S5.3.1-2009 Electrostatic Discharge Sensitivity Testing – Charged Device Model (CDM) – Component Level
STM5.5.1-2014 Electrostatic Discharge Sensitivity Testing – Transmission Line Pulse (TLP) – Component Level
STM5.5.1-2016 Electrostatic Discharge Sensitivity Testing – Transmission Line Pulse (TLP) – Device Level
JS-002-2014 Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
STM 5.3.1-1999 Electrostatic Discharge Sensitivity Testing Charged Divice Model (cdm) Component Level
TR5.5-04-2018 Electrostatic Discharge Sensitivity Testing Transmission Line Pulse (TLP) – User and Application Guide
ESD DS5.3.1:2007 Standard for Electrostatic Discharge Sensitivity Testing – Charged Device Model (CDM) – Component Level
SP5.5.2-2007 ELECTROSTATIC DISCHARGE SENSITIVITY TESTING - VERY FAST TRANSMISSION LINE PULSE (VF-TLP) - COMPONENT LEVEL
TR5.5-03-2014 Electrostatic Discharge Sensitivity Testing – Very-Fast Transmission Line Pulse (VF-TLP) – Round Robin Analysis
SP5.2.2-2012 The Electrostatic Discharge Sensitivity Testing Machine Model (MM) Alternative Test Method: Split Signal Pin Component Level
SP5.4-2004 Latch-Up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits Transient Latch-up Testing – Component Level Supply Transient Stimulation
TR5.3.1-01-2018 For Electrostatic Discharge Sensitivity Testing Contact Charged Device Model (CCDM) vs. Field Induced CDM (FICDM) a Case Study
SP5.3.3-2018 Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Testing – Component Level Low-Impedance Contact CDM as an Alternative CDM Characterization Method

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Sensitivity test

JEDEC JESD22-A115C-2010 Electrostatic Discharge (ESD) Sensitivity Testing, Machine Model (MM)
JEDEC JESD22-A115B-2010 Electrostatic Discharge (ESD) Sensitivity Testing, Machine Model (MM)

Jiangsu Provincial Standard of the People's Republic of China, Sensitivity test

DB32/T 3416-2018 UHF radio frequency identification reader sensitivity test method

Electrostatic Discharge Association (ESDA), Sensitivity test

ANSI/ESD STM5.5.1-2008 Electrostatic Discharge Sensitivity Testing Transmission Line Pulse (TLP) - Component Level
ANSI/ESD SP5.5.2-2007 Electrostatic Discharge Sensitivity Testing Very Fast Transmission Line Pulse (VF-TLP) - Component Level

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Sensitivity test

GB/T 13823.4-1992 Methods for the calibration of vibration and shock pick-ups.Testing of magnetic field sensitivity
GB/T 13823.17-1996 Methods for the calibration of vibration and shock pick-ups. Testing of acoustic sensitivity
GB/T 13823.8-1994 Methods for the calibration of vibration and shock pick-ups Testing of transverse vibration sensitivity
GB/T 13823.9-1994 Methods for the calibration of vibration and shock pick-ups. Testing of transverse shock sensitivity
GB/T 13823.5-1992 Methods for the calibration of vibration and shock pick-ups.Testing of mounting torque sensitivity
GB/T 13823.6-1992 Methods for the calibration of vibration and shock pick-ups. Testing of base strain sensitivity
GB/T 13823.15-1995 Methods for calibration of vibration and shock pick-ups. Testing of transient temperature sensitivity
GB/T 20485.31-2011 Methods for the calibration of vibration and shock transducers.Part 31:Testing of transverse vibration sensitivity

British Standards Institution (BSI), Sensitivity test

BS IEC 62615:2010 Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
BS 6955-15:1994 Calibration of vibration and shock pick-ups. Method of test for acoustic sensitivity
BS 6955-17:1994 Calibration of vibration and shock pick-ups. Method of test for fixed temperature sensitivity
BS 6955-13:1994 Calibration of vibration and shock pick-ups. Method of test for base strain sensitivity
BS ISO 16063-33:2017 Methods for the calibration of vibration and shock transducers. Testing of magnetic field sensitivity
BS ISO 16063-34:2019 Methods for the calibration of vibration and shock transducers - Testing of sensitivity at fixed temperatures
BS EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
BS EN 60749-26:2006 Semiconductor devices - Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
BS EN 60749-27:2006+A1:2012 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
BS EN 60749-26:2014 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
18/30376778 DC BS ISO 16063-34. Methods for the calibration of vibration and shock transducers. Part 34. Testing of sensitivity at fixed temperatures
BS EN IEC 60749-26:2018 Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
BS EN IEC 60749-28:2022 Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
20/30419235 DC BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods. Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

BE-NBN, Sensitivity test

NBN S 21-109-1988 Components of automatic fire detection Systems Part 9 : Fire sensitivity test

FI-SFS, Sensitivity test

SFS 5179 E-1985 This standard is approved in English

CEN - European Committee for Standardization, Sensitivity test

EN ISO 8596:2018 Ophthalmic optics - Visual acuity testing - Standard and clinical optotypes and their presentation

Association Francaise de Normalisation, Sensitivity test

NF S12-112:2009 Ophthalmic optics - Visual acuity testing - Standard optotype and its presentation.
E90-350-15:1994 Methods for the calibration of vibration and shock pick-ups. Part 15 : testing of acoustic sensitivity.
NF E90-350-15:1994 Méthodes pour l'étalonnage de capteurs de vibrations et de chocs - Partie 15 : essai de sensibilité acoustique.
NF E90-350-16:1994 Méthodes pour l'étalonnage de capteurs de vibrations et de chocs - Partie 16 : essai de sensibilité de couple de serrage.
E90-350-17:1994 Methods for the calibration of vibration and shock pick-ups. Part 17 : testing of fixed temperature sensitivity.
NF E90-350-17:1994 Méthodes pour l'étalonnage de capteurs de vibrations et de chocs - Partie 17 : essai de sensibilité de température fixe.
NF ETS 300050:1994 Méthodes pour l'étalonnage de capteurs de vibrations et de chocs - Partie 18 : essai de sensibilité de température transitoire.
NF EN 2591-209:1994 Méthodes pour l'étalonnage de capteurs de vibrations et de chocs - Partie 18 : essai de sensibilité de température transitoire.
E90-350-16:1994 Methods for the calibration of vibration and shock pick-ups. Part 16 : testing of mounting torque sensitivity.
NF E90-350-12:1994 Méthodes pour l'étalonnage de capteurs de vibrations et de chocs - Partie 12 : essai de sensibilité aux chocs transversaux.
NF EN 60749-27:2006 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 27 : essai de la sensibilité aux décharges électrostatiques (DES) - Modèle de machine (MM)
NF EN 60749-27/A1:2013 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 27 : essai de sensibilité aux décharges électrostatiques (DES) - Modèle de machine (MM)
NF C96-022-26:2006 Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM).
NF C96-022-27*NF EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM).
NF B43-352*NF EN 13234:2007 Advanced technical ceramics - Mechanical properties of ceramic composites at ambient temperature - Evaluation of the resistance to crack propagation by notch sensitivity testing

European Committee for Standardization (CEN), Sensitivity test

EN ISO 8596:2009 Ophthalmic optics - Visual acuity testing - Standard optotype and its presentation (ISO 8596:2009)
EN ISO 8596:2018/A1:2020 Ophthalmic optics - Visual acuity testing - Standard and clinical optotypes and their presentation - Amendment 1 (ISO 8596:2017/Amd1:2019)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Sensitivity test

GB/T 20485.33-2018 Methods for the calibration of vibration and shock transducers—Part 33: Testing of magnetic field sensitivity

American National Standards Institute （ANSI), Sensitivity test

ANSI/ESD SP14.5-2021 Electrostatic Discharge Sensitivity Testing Near-Field Immunity Scanning Component/Module/PCB Level

International Organization for Standardization (ISO), Sensitivity test

ISO 5347-19:1993 Methods for the calibration of vibration and shock pick-ups; part 19: testing of magnetic field sensitivity
ISO 16063-33:2017 Methods for the calibration of vibration and shock transducers - Part 33: Testing of magnetic field sensitivity
ISO 5347-15:1993 Methods for the calibration of vibration and shock pick-ups; part 15: testing of acoustic sensitivity
ISO 5347-11:1993 Methods for the calibration of vibration and shock pick-ups; part 11: testing of transverse vibration sensitivity
ISO 5347-16:1993 Methods for the calibration of vibration and shock pick-ups; part 16: testing of mounting torque sensitivity
ISO 5347-13:1993 Methods for the calibration of vibration and shock pick-ups; part 13: testing of base strain sensitivity
ISO 5347-18:1993 Methods for the calibration of vibration and shock pick-ups; part 18: testing of transient temperature sensitivity
ISO 16063-31:2009/WD Amd 1 Methods for the calibration of vibration and shock transducers — Part 31: Testing of transverse vibration sensitivity — Amendment 1

KR-KS, Sensitivity test

KS B ISO 16063-33-2020 Methods for the calibration of vibration and shock transducers —Part 33: Testing of magnetic field sensitivity

ZA-SANS, Sensitivity test

SANS 16063-31:2009 Methods for the calibration of vibration and shock transducers Part 31: Testing of transverse vibration sensitivity

CZ-CSN, Sensitivity test

RU-GOST R, Sensitivity test

GOST ISO 16063-31-2013 Mechanical vibration. Methods for the calibration of vibration and shock transducers. Part 31. Testing of transverse vibration sensitivity

International Electrotechnical Commission (IEC), Sensitivity test

IEC 60749-27:2003 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing; Machine model (MM)
IEC 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Danish Standards Foundation, Sensitivity test

DS/EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
DS/EN 60749-27/A1:2013 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

ES-UNE, Sensitivity test

UNE-EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)
UNE-EN 60749-27:2006/A1:2012 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
UNE-EN IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by Asociación Española de Normalización in May of 2018.)
UNE-EN IEC 60749-28:2022 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)
UNE-EN 60749-28:2017 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)

International Telecommunication Union (ITU), Sensitivity test

ITU-R SM.2096-2016 Test procedure for measuring direction finder sensitivity in the VHF/UHF frequency range
ITU-R SM.1840-2007 Test procedure for measuring the sensitivity of radio monitoring receivers using analogue-modulated signals

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector, Sensitivity test

ITU-R SM.2096-0-2016 Test procedure for measuring direction finder sensitivity in the VHF/UHF frequency range

German Institute for Standardization, Sensitivity test

DIN EN ISO 8596:2009 Ophthalmic optics - Visual acuity testing - Standard optotype and its presentation (ISO 8596:2009); English version of DIN EN ISO 8596:2009-10

Lithuanian Standards Office , Sensitivity test

LST EN 60749-27-2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006)
LST EN 60749-27-2006/A1-2013 Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006/A1:2012)

European Committee for Electrotechnical Standardization（CENELEC）, Sensitivity test

EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Incorporates Amendment A1: 2012)
EN IEC 60749-28:2022 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
EN 60749-28:2017 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Sensitivity test

IPC TM-650 2.6.9.1-1995 Test to Determine Sensitivity of Electronic Assemblies to Ultrasonic Energy
IPC TM-650 2.6.9.2-1995 Test to Determine Sensitivity of Electronic Components to Ultrasonic Energy

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc., Sensitivity test

ASHRAE SF-98-20-1-1998 Test Method for Describing Directional Sensitivity of Anemometers for Low-Velocity Measurements Indoors