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Before doping
Before doping, Total:35 items.
In the international standard classification, Before doping involves: Insulating fluids, Semiconducting materials, Tobacco, tobacco products and related equipment, Glass, Analytical chemistry, Products of the chemical industry, Fibre optic communications, Ceramics.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Before doping
- GB/T 14847-1993 Test method for thickness of lightly doped silicon eqitaxial layers on heavily doped silicon substrates by infrared reflectance
- GB/T 14847-2010 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance
- GB/T 20176-2006 Surface chemical analysis.Secondary-ion mass spectrometry.Determination of boron atomic concentration in silicon using uniformly doped materials
RO-ASRO, Before doping
- STAS 9746-1974 DOPED TURBINE OILS Methods for determining the storage behaviour
- STAS 9848-1974 DOPPED MINERAL OILS Methods for determining chemical stability
- STAS 10091-1975 DOPED MINERAL OILS FOR SPARK IGNITION ENGINES Monogradc oils ?Extra"
- STAS 9601-1981 Doped mineral oil for spark ignition engine running in OIL R 45
- STAS 9171-1975 DOPED MINERAL OILS FOR SPARK IGNITION ENGINES Multigrade oils ?Super 1"
BE-NBN, Before doping
- NBN T 04-505-1985 Ethylene for industrial usr-Determination of hydrocarbon impurities- Gas chromato-graphic method
- NBN T 04-506-1985 Propylene for industrial use- Determination of hydrocarbon impurities- Gas chroma-tographie method
- NBN T 04-504-1985 Butadiene for industrial use - Determination of hydrocarbon impurities- Gas chromatographic merhod
- NBN T 04-503-1985 Light olefins for industrial use - Determination of hydrocarbon impurities by gsa chroma-tography-General considerations
Professional Standard - Tobacco, Before doping
German Institute for Standardization, Before doping
- DIN 50450-1:1987-08 Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell
- DIN 50450-2:1991-03 Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N<(Index)2>, Ar, He, Ne and H<(Index)2> by using a galvanic cell
- DIN 50450-4:1993 Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C<(Index)1>-C<(Index)3>-hydrocarbons in nitrogen by gas-chromatography
- DIN 50450-4:1993-09 Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C<(Index)1>-C<(Index)3>-hydrocarbons in nitrogen by gas-chromatography
- DIN 50439:1982 Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact
CL-INN, Before doping
Group Standards of the People's Republic of China, Before doping
- T/SDG 002-2020 Test method for detection of dopant (calcium chloride, calcium oxide) in desiccant for insulating glass
American Society for Testing and Materials (ASTM), Before doping
- ASTM F1366-92(1997)e1 Standard Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry
International Organization for Standardization (ISO), Before doping
- ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
- ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
Association Francaise de Normalisation, Before doping
- NF X21-070*NF ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials.
- NF ISO 14237:2010 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage des atomes de bore dans le silicium à l'aide de matériaux dopés uniformément
British Standards Institution (BSI), Before doping
- BS ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
- BS PD IEC/TR 62627-03-03:2013 Fibre optic interconecting devices and passive components. Reliability. Report on high-power reliability for metal-doped optical fibre plug-style optical attenuators
- BS ISO 21820:2021 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet photoluminescence image test method for analysing polytypes of boron- and nitrogen-doped SiC crystals
- 20/30349837 DC BS ISO 21820. Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet photoluminescence image test method for analyzing polytypes of boron and nitrogen doped SiC crystals
US-CFR-file, Before doping
- CFR 40-721.10423-2014 Protection of Environment. Part721:Significant new uses of chemical substances. Section721.10423:Complex strontium aluminate,rare earth doped (generic).
- CFR 21-106.55-2014 Food and Drugs. Part106:Infant formula quality control procedures (Eff. until 7-10-14). Section106.55:Controls to prevent adulteration from microorganisms.
Korean Agency for Technology and Standards (KATS), Before doping
- KS D ISO 14237:2003 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of boron atomic concentration in silicon using uniformly doped materials
Professional Standard - Building Materials, Before doping
- JC/T 2132-2012 Determination of doped and trace elements in barium strontium titanate (BST).Inductively coupled plasma atomic emission spectrometric method
SAE - SAE International, Before doping
- SAE GEIASTD927B-2013 Common Data Schema for Complex Systems (Formerly TechAmerica GEIA-STD-927-A; Includes Access to Additional Content)