Atomic Microscope Measurements

Atomic Microscope Measurements, Total:13 items.

In the international standard classification, Atomic Microscope Measurements involves: Materials for aerospace construction, Analytical chemistry, Nuclear energy engineering, Physics. Chemistry, Linear and angular measurements, Test conditions and procedures in general.

American Society for Testing and Materials (ASTM), Atomic Microscope Measurements

• ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
• ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
• ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
• ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy

GSO, Atomic Microscope Measurements

• GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
• BH GSO ISO 13095:2017 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

Professional Standard - Nuclear Industry, Atomic Microscope Measurements

• EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

RU-GOST R, Atomic Microscope Measurements

• GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope

International Organization for Standardization (ISO), Atomic Microscope Measurements

• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

Group Standards of the People's Republic of China, Atomic Microscope Measurements

• T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
• T/GDASE 0008-2020 Determination of Young's modulus of graphene film

German Institute for Standardization, Atomic Microscope Measurements

• DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Atomic Microscope Measurements

• GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films

Others:   atomic force microscope, What does an atomic force microscope measure, measurement of atoms, Measurement of microscope images, Measuring Microscope Effects, Measuring the structure of the microscope, The role of the measuring microscope, measure the relative atomic mass of, Atomic Force Microscopy Measurements, How is atomic mass measured, how is atomic mass measured, Measurement of Atomic Absorption, Measurement of Atomic Absorption Spectroscopy, Measurement of Atomic Mass, How to measure the mass of an atom, How to measure the mass of an atom, Why is atomic absorption measured?, Atomic Microscope Measurements, How to Measure the Weight of an Atom.