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Indium electromigration

Indium electromigration, Total:126 items.

In the international standard classification, Indium electromigration involves: Semiconducting materials, Electromechanical components for electronic and telecommunications equipment, Semiconductor devices, Vocabularies, Electronic components in general, Test conditions and procedures in general, Printed circuits and boards, Welding, brazing and soldering, Nuclear energy engineering, Non-ferrous metals, Hydraulic energy engineering, Biology. Botany. Zoology, Geology. Meteorology. Hydrology, Applications of information technology, Particle size analysis. Sieving, Corrosion of metals, Electronic component assemblies, Adhesives, Electrical engineering in general, Languages used in information technology, Products of the textile industry, Plastics, Equipment for entertainment, Electricity. Magnetism. Electrical and magnetic measurements, Analytical chemistry, Ceramics, (No title), Air quality, Materials and articles in contact with foodstuffs.

Professional Standard - Electron, Indium electromigration

SJ 3244.1-1989 Methods of measurement for hall mobility and carrier concentration of Gallium arsenide and Indium phosphide
SJ/T 11488-2015 Test method for measuring resistivity, hall coefficient and determining hall mobility in semi-insulating GaAs single crystals

IPC - Association Connecting Electronics Industries, Indium electromigration

IPC TM-650 5.5.4.8-1998 Test Coupon D - Resistance by Electromigration
IPC TM-650 2.6.14C-2000 Resistance to Electrochemical Migration@ Solder Mask
IPC TM-650 2.6.14D-2007 Solder Mask - Resistance to Electrochemical Migration
IPC TM-650 2.6.14A-1987 Resistance to Electromigration@ Polymer Solder Mask
IPC 9691A CHINESE-2007 User Guide for the IPC-TM-650@ Method 2.6.25@ Conductive Anodic Filament (CAF) Resistance Test (Electrochemical Migration Testing)
IPC 9691A CD-2007 User Guide for the IPC-TM-650@ Method 2.6.25@ Conductive Anodic Filament (CAF) Resistance Test (Electrochemical Migration Testing)
IPC 9691A CHINESE CD-2007 User Guide for the IPC-TM-650@ Method 2.6.25@ Conductive Anodic Filament (CAF) Resistance Test (Electrochemical Migration Testing)
IPC 9691B CHINESE-2016 User Guide for the IPC-TM-650@ Method 2.6.25@ Conductive Anodic Filament (CAF) Resistance and Other Internal Electrochemical Migration Testing

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Indium electromigration

IPC TM-650 2.6.14.1-2000 Electrochemical Migration Resistance Test
IPC TR-476A-1997 Electrochemical Migration: Electrically Induced Failures in Printed Wiring Assemblies
IPC TM-650 2.6.14-2007 Solder Mask - Resistance to Electrochemical Migration Revision D
IPC 9691-2005 User Guide for the IPC-TM-650, Method 2.6.25, Conductive Anodic Filament (CAF) Resistance Test (Electrochemical Migration Testing)
IPC 9691A-2007 User Guide for the IPC-TM-650, Method 2.6.25, Conductive Anodic Filament (CAF) Resistance Test (Electrochemical Migration Testing)

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Indium electromigration

JEDEC JESD61A.01-2007 Isothermal Electromigration Test Procedure
JEDEC JESD61A-2007 Isothermal Electromigration Test Procedure
JEDEC JESD61-1997 Isothermal Electromigration Test Procedure
JEDEC JESD63-1998 Standard Method for Calculating the Electromigration Model Parameters for Current Density and Temperature
JEDEC JEP154-2008 Guideline for Characterizing Solder Bump Electromigration under Constant Current and Temperature Stress
JEDEC JESD202-2006 Method for Characterizing the Electromigration Failure Time Distribution of Interconnects Under Constant-Current and Temperature Stress

Danish Standards Foundation, Indium electromigration

DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
DS/ISO 15900:2020 Determination of particle size distribution – Differential electrical mobility analysis for aerosol particles
DS/EN ISO 9455-17:2006 Soft soldering fluxes – Test methods – Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues

CENELEC - European Committee for Electrotechnical Standardization, Indium electromigration

EN 62415:2010 Semiconductor devices - Constant current electromigration test

Association Francaise de Normalisation, Indium electromigration

NF EN 62415:2010 Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
NF C80-201*NF EN 62415:2010 Semiconductor devices - Constant current electromigration test.
NF ISO 16525-8:2014 Adhésifs - Méthodes d'essai pour adhésifs à conductivité électrique isotrope - Partie 8 : méthodes d'essai de migration électrochimique
NF T76-100-8*NF ISO 16525-8:2014 Adhesives - Test methods for isotropic electrically conductive adhesives - Part 8 : electrochemical-migration test methods
XP CEN/TS 17434:2020 Air ambiant - Détermination de la distribution granulométrique de particules d'un aérosol atmosphérique à l'aide d'un spectromètre de granulométrie à mobilité électrique (MPSS)
NF A05-215*NF EN ISO 17081:2014 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique
NF A05-215:2008 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique.
NF EN ISO 9455-17:2006 Flux de brasage tendre - Méthodes d'essai - Partie 17 : essai au peigne et essai de migration électrochimique de résistance d'isolement de surface des résidus de flux
NF A81-365-17*NF EN ISO 9455-17:2006 Soft soldering fluxes - Test methods - Part 17 : surface insulation resistance comb test and electrochemical migration test of flux residues

ES-UNE, Indium electromigration

UNE-EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)

German Institute for Standardization, Indium electromigration

DIN EN 62415:2010-12 Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
DIN EN 62415:2010 Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
DIN EN ISO 17081:2008 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique (ISO 17081:2004); English version of DIN EN ISO 17081:2008-07
DIN EN ISO 9455-17:2006 Soft soldering fluxes - Test methods - Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues (ISO 9455-17:2002); English version of DIN EN ISO 9455-17:2006-09
DIN EN ISO 9455-17:2006-09 Soft soldering fluxes - Test methods - Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues (ISO 9455-17:2002); German version EN ISO 9455-17:2006 / Note: To be replaced by DIN EN ISO 9455-17 (2022-08).

International Electrotechnical Commission (IEC), Indium electromigration

IEC 62415:2010 Semiconductor devices - Constant current electromigration test
IEC TR 62866:2014 Electrochemical migration in printed wiring boards and assemblies - Mechanisms and testing

British Standards Institution (BSI), Indium electromigration

BS EN 62415:2010 Semiconductor devices - Constant current electromigration test
BS PD IEC/TR 62866:2014 Electrochemical migration in printed wiring boards and assemblies. Mechanisms and testing
PD IEC/TR 62866:2014 Electrochemical migration in printed wiring boards and assemblies. Mechanisms and testing
BS ISO 15900:2020 Determination of particle size distribution. Differential electrical mobility analysis for aerosol particles
BS ISO 16525-8:2014 Adhesives. Test methods for isotropic electrically conductive adhesives. Electrochemical-migration test methods
19/30370177 DC BS ISO 15900. Determination of particle size distribution. Differential electrical mobility analysis for aerosol particles
BS ISO 17081:2004 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique
BS ISO 22410:2020 Corrosion of metals and alloys. Electrochemical measurement of ion transfer resistance to characterize the protective rust layer on weathering steel
BS ISO 9455-17:2003 Soft soldering fluxes - Test methods - Surface insulation resistance comb test and electrochemical migration test of flux residues
BS EN ISO 9455-17:2003 Soft soldering fluxes - Test methods - Surface insulation resistance comb test and electrochemical migration test of flux residues
BS EN ISO 9455-17:2006 Soft soldering fluxes. Test methods. Surface insulation resistance comb test and electrochemical migration test of flux residues
BS EN ISO 17081:2008 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique
BS EN ISO 17081:2014 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique
19/30361534 DC BS ISO 22410. Corrosion of metals and alloys. Electrochemical measurement of ion transfer resistance to characterize the protective rust layer on weathering steel
BS EN 1186-4:2002 Materials and articles in contact with foodstuffs - Plastics - Test methods for overall migration into olive oil by cell
PD IEC/TR 62357-200:2015 Power systems management and associated information exchange. Guidelines for migration from Internet Protocol version 4 (IPv4) to Internet Protocol version 6 (IPv6)
BS IEC 62951-2:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices

RU-GOST R, Indium electromigration

GOST 25532-1989 Photosensitive charge transfer devices. Terms and definitions

Group Standards of the People's Republic of China, Indium electromigration

T/GDASE 0010-2020 Determination of Electron Mobility in Graphene Thin Films
T/CSEE 0133.2-2019 Relational database of electric power information system (open source part) Part 2: Migration specification
T/CASAS 027-2023 Two—dimensional electron gas mobility of RF GaN HEMT epitaxial wafers—Non—contact Hall measurement method
T/SDAQI 015-2021 Textiles—Determination of heavy metal migration in accessories(Inductively coupled plasma optic emission spectrometry)
T/GDPIA 37-2021 Determination of mobile elements in post-consumer plastics Inductively coupled plasma mass spectrometry method (ICP-MS)
T/LAPRA 201-2021 Packaging glass containers — Determination of the release of lead, cadmium, arsenic, antimony and manganese — Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES) method
T/GDAQI 92-2022 Determination of migration of 18 elements such as aluminum, silver and arsenic in ceramic products Inductively coupled plasma emission spectrometry
T/LAPRA 201-2022 Alcoholic beverages contact materials and articles — Determination of the release of manganese — Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES) method

Lithuanian Standards Office , Indium electromigration

LST EN 62415-2010 Semiconductor devices - Constant current electromigration test (IEC 62415:2010)

American Nuclear Society (ANS), Indium electromigration

ANS 2.17-2010 evaluation of subsurface radionuclide transport at commercial nuclear power plants

American National Standards Institute （ANSI), Indium electromigration

ANSI/ANS 2.17-2010 Evaluation of Subsurface Radionuclide Transport at Commercial Nuclear Power Plants

American Society for Testing and Materials (ASTM), Indium electromigration

ASTM F1996-00 Standard Test Method for Silver Migration for Membrane Switch Circuitry
ASTM F1996-01 Standard Test Method for Silver Migration for Membrane Switch Circuitry
ASTM F1996-06 Standard Test Method for Silver Migration for Membrane Switch Circuitry
ASTM E1470-92(1998) Standard Test Method for Characterization of Proteins by Electrophoretic Mobility
ASTM F1996-14 Standard Test Method for Silver Migration for Membrane Switch Circuitry
ASTM E1470-92(2006) Standard Test Method for Characterization of Proteins by Electrophoretic Mobility
ASTM E2865-12(2018) Standard Guide for Measurement of Electrophoretic Mobility and Zeta Potential of Nanosized Biological Materials
ASTM E2865-12(2022) Standard Guide for Measurement of Electrophoretic Mobility and Zeta Potential of Nanosized Biological Materials
ASTM E2865-12 Standard Guide for Measurement of Electrophoretic Mobility and Zeta Potential of Nanosized Biological Materials
ASTM F76-86(1996)e1 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM F76-86(2002) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM F76-08 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM F1260M-96 Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
ASTM F1260M-96(2003) Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric]
ASTM F76-08(2016)e1 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM F76-08(2016) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

Professional Standard - Electricity, Indium electromigration

DL/T 5380-2007 Specircations of designing and planning for city and town rehabilitation of hydroelectric projects

US-ACEI, Indium electromigration

IPC TM-650 2.6.14-2000 Resistance to Electrochemical Migration, Solder Mask Revision C(Test Methods Manual)

国家能源局, Indium electromigration

NB/T 10864-2021 Specifications for planning and design of resettlement towns and cities for hydropower projects

Professional Standard - Meteorology, Indium electromigration

QX/T 72-2007 Determination of number size distribution of submicron particle by using Electrical Mobility Method

Shandong Provincial Standard of the People's Republic of China, Indium electromigration

DB37/T 2753.1-2016 E-government Public Service Cloud Platform Part 1: Application Migration

CZ-CSN, Indium electromigration

CSN 64 0248-1970 Migration of plasticizers from polyvinyl- hloride into polyetyléne Measurement by Electrical Means)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Indium electromigration

GB/T 30074-2013 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique
GB/T 38265.17-2022 Test methods for soft soldering fluxes—Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues
GB/T 26193-2010 Determination of the content of migration of Sb,As,Ba,Cd,Cr,Pb,Hg and Se from toy material.ICP-MS

ITU-T - International Telecommunication Union/ITU Telcommunication Sector, Indium electromigration

ITU-T L.1207-2018 Progressive migration of a telecommunication/ information and communication technology site to 400 VDC sources and distribution (Study Group 5)

International Organization for Standardization (ISO), Indium electromigration

ISO 17081:2004 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique (Second Edition)
ISO 17081:2014 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique
ISO 16525-8:2014 Adhesives - Test methods for isotropic electrically conductive adhesives - Part 8: Electrochemical-migration test methods
ISO/FDIS 9455-17:2018 Soft soldering fluxes — Test methods — Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues
ISO 9455-17:2002 Soft soldering fluxes - Test methods - Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues
ISO/DIS 9455-17 Soft soldering fluxes — Test methods — Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues

European Telecommunications Standards Institute (ETSI), Indium electromigration

ETSI TR 123 975-2016 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; IPv6 migration guidelines (V13.0.0; 3GPP TR 23.975 version 13.0.0 Release 13)
ETSI TR 122 983-2016 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; Services alignment and migration (V13.0.0; 3GPP TR 22.983 version 13.0.0 Release 13)

ETSI - European Telecommunications Standards Institute, Indium electromigration

TR 123 975-2016 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; IPv6 migration guidelines (V13.0.0; 3GPP TR 23.975 version 13.0.0 Release 13)
TR 123 975-2012 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; IPv6 migration guidelines (V11.0.0; 3GPP TR 23.975 version 11.0.0 Release 11)
TR 123 975-2014 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; IPv6 migration guidelines (V12.0.0; 3GPP TR 23.975 version 12.0.0 Release 12)
TR 123 975-2017 Digital cellular telecommunications system (Phase 2+) (GSM); Universal Mobile Telecommunications System (UMTS); LTE; IPv6 migration guidelines (V14.1.0; 3GPP TR 23.975 version 14.1.0 Release 14)
TR 123 975-2018 Digital cellular telecommunications system (Phase 2+) (GSM); Universal Mobile Telecommunications System (UMTS); LTE; IPv6 migration guidelines (V15.0.0; 3GPP TR 23.975 version 15.0.0 Release 15)
TR 122 983-2010 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; Services alignment and migration (V9.0.0; 3GPP TR 22.983 version 9.0.0 Release 9)
TR 122 983-2014 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; Services alignment and migration (V12.0.0; 3GPP TR 22.983 version 12.0.0 Release 12)
TR 122 983-2009 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; Services alignment and migration (V8.0.0; 3GPP TR 22.983 version 8.0.0 Release 8)
TR 122 983-2016 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; Services alignment and migration (V13.0.0; 3GPP TR 22.983 version 13.0.0 Release 13)
TR 122 983-2011 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; Services alignment and migration (V10.0.0; 3GPP TR 22.983 version 10.0.0 Release 10)
TR 122 983-2012 Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); LTE; Services alignment and migration (V11.0.0; 3GPP TR 22.983 version 11.0.0 Release 11)
TR 122 983-2018 Digital cellular telecommunications system (Phase 2+) (GSM); Universal Mobile Telecommunications System (UMTS); LTE; Services alignment and migration (V15.0.0; 3GPP TR 22.983 version 15.0.0 Release 15)
TR 122 983-2017 Digital cellular telecommunications system (Phase 2+) (GSM); Universal Mobile Telecommunications System (UMTS); LTE; Services alignment and migration (V14.0.0; 3GPP TR 22.983 version 14.0.0 Release 14)

国家质量监督检验检疫总局, Indium electromigration

SN/T 4774-2017 Determination of migration of specific elements in toy materials by inductively coupled plasma optical emission spectrometry

European Committee for Standardization (CEN), Indium electromigration

EN ISO 17081:2008 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique
EN ISO 17081:2014 Method of measurement of hydrogen permeation and determination of hydrogen uptake and transport in metals by an electrochemical technique

RO-ASRO, Indium electromigration

STAS 9455-1973 PLASTICS Determination of migration of plasticizers from polyvynil chloride in polyethylene, by measuring the variation of electrical characteristics

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Indium electromigration

GB/T 34435-2017 Determination of migratable chromium(Ⅵ) in toy materials—High performance liquid chromatography-inductively coupled plasma mass spectrometry(HPLC-ICP-MS)

国家市场监督管理总局、中国国家标准化管理委员会, Indium electromigration

GB/T 34079.2-2021 Service specification of electronic government common platform based on cloud computing—Part 2: Application deployment and data migration

ZA-SANS, Indium electromigration

SANS 9455-17:2009 Soft soldering fluxes - Test methods Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues

Association of German Mechanical Engineers, Indium electromigration

VDI 3867 Blatt 3-2012 Measurement of particles in ambient air - Determination of the particle number concentration and number size distribution of aerosols - Electrical mobility spectrometer