ZH
RU
ES

Technical parameters of electronic probe

Technical parameters of electronic probe, Total:78 items.

In the international standard classification, Technical parameters of electronic probe involves: Protection against fire, Optics and optical measurements, Analytical chemistry, Thermodynamics and temperature measurements, Test conditions and procedures in general, Non-destructive testing, Applications of information technology, Equipment for petroleum and natural gas industries, Telecommunications in general, Electromagnetic compatibility (EMC), Vacuum technology, Microprocessor systems, Electric filters, Piezoelectric and dielectric devices, Ceramics, Products of the textile industry, Optoelectronics. Laser equipment, Radiocommunications, Components and accessories for telecommunications equipment, Vocabularies, Semiconductor devices, Law. Administration, Rubber and plastics products, Electrical engineering in general, Mobile services.

PL-PKN, Technical parameters of electronic probe

PN G03351-1991 Cable terminals, probe heads, well logging heads. Types, principal parameters, dimensions, technical requirements
PN G02316-1991 Measuring meters for hydrogeology. Electrical water level meters with recorders. Types, principal parameters and technical requirements

Yunnan Provincial Standard of the People's Republic of China, Technical parameters of electronic probe

DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Technical parameters of electronic probe

GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 25755-2010 Vacuum technology.Sputter-ion pumps.Measurement of performance characteristics
GB/T 7774-2007 Vacuum technology.Turbomolecular pumps.Measurement of performance characteristics

International Organization for Standardization (ISO), Technical parameters of electronic probe

ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 14594:2003 Analyse par microfaisceaux - Analyse par microsonde électronique (Microsonde de Castaing) - Lignes directrices pour la détermination des paramètres expérimentaux pour la spectrométrie à dispersion de longueur d'onde
ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes

British Standards Institution (BSI), Technical parameters of electronic probe

19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO/IEC 14662:2010 Information technology - Open-edi reference model
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
PD IEC TR 62878-2-9:2022 Device embedding assembly technology. Guidelines. Concept of JISSO level in the electronic assembly technology industries
BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes

Korean Agency for Technology and Standards (KATS), Technical parameters of electronic probe

KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 14594:2012 Microbeam analysis－Electron probe microanalysis－Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy

KR-KS, Technical parameters of electronic probe

KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy

American Society for Testing and Materials (ASTM), Technical parameters of electronic probe

ASTM E2730-21 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-22 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-10(2015)e1 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-10 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM D6747-02e1 Standard Guide for Selection of Techniques for Electrical Detection of Potential Leak Paths in Geomembrane
ASTM D6747-04 Standard Guide for Selection of Techniques for Electrical Detection of Potential Leak Paths in Geomembrane
ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-09 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy

Japanese Industrial Standards Committee (JISC), Technical parameters of electronic probe

JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy

国家市场监督管理总局、中国国家标准化管理委员会, Technical parameters of electronic probe

GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)

RU-GOST R, Technical parameters of electronic probe

GOST 26114-1984 Non-destructive testing. Flow detection equipment on the basic of particle accelerators. Main parameters and general technical requirements
GOST 14213-1989 Logging cable tips, sonde heads and logging tools heads. Types, main parameters, dimensions and technical requirements
GOST 23872-1979 Electromagnetic compatibility of radio-electronic equipment. Nomenclature of parameters and technical data classification
GOST 27201-1987 Personal computers. Types, basic parameters, general requirements
GOST 27075-1986 Piezoelectric filters for industrial and domestic radioelectronic equipment application. Basic parameters
GOST 27124-1986 Piezoelectric rezonators for industrial and domestic radioelectronic equipment application. Basic parameters
GOST 23411-1984 Electronic cash register machines. General specifications
GOST 11612.0-1981 Photomultipliers. Measuring methods of the electric and lighttechnics parameters
GOST R 51771-2001 Domestic radioelectronic equipment. Input and output parameters and types of connectors. Technical requirements
GOST 27299-1987 Semiconductor optoelectronic devices. Terms, definitions and letter symbols of parameters
GOST R 59606-2021 Optics and photonics. Photodetector devices of second and next-generations. Methods for photoelectric parameters measuring and determination of characteristics
GOST R 59607-2021 Optics and photonics. Semiconducting photoelectric detectors. Photoelectric and photoreceiving devices. Methods of measuring photoelectric parameters and determining characteristics
GOST 25640-1983 Foam rubber products for industrial, agricultural and transport engineering. Specifications
GOST 30377-1995 Electromagnetic compatibility of technical means. Force electrical equipment. Limits for the low frequency periodical electromagnetic fields
GOST R 56172-2014 Radio stations and repeaters of DMR standard. Basic parameters. Technical requirements

Association Francaise de Normalisation, Technical parameters of electronic probe

NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF EN 1071-4:2006 Céramiques techniques avancées - Méthodes d'essai pour revêtements céramiques - Partie 4 : détermination de la composition chimique par microanalyse avec sonde électronique (MASE)

CZ-CSN, Technical parameters of electronic probe

CSN 85 6170 Za-1988
CSN 35 6530-1986 Electronic oscilloscopes. Summary of parameters, generál technical conditions and methods of testing
CSN 35 8793 Cast.1-1986 Microprocessor integrated circuits. Technical terms, definltions and symbols of electrlcal parameters
CSN 35 6857-1978 Electrodynamic equipment for generating harmonic vibration Fundamental technical parámeters
CSN 35 8851-1987 Semiconductor optoelectronic devices. Nomenclature, definition and letter symbols of parameters

Standard Association of Australia （SAA）, Technical parameters of electronic probe

AS ISO/IEC 14662:2005 Information technology - Open-edi reference model

US-FCR, Technical parameters of electronic probe

FCR NE-F-11-4T-1972 DETERMINATION OF A FIGURE OF MERIT FOR PUO2-UO2 FUEL PELLET HOMOGENEITY BY USE OF AN ELECTRON MICROPROBE (INACTIVE FOR NEW DESIGN)

Danish Standards Foundation, Technical parameters of electronic probe

DS/EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)

Lithuanian Standards Office , Technical parameters of electronic probe

LST EN 1071-4-2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)

ES-UNE, Technical parameters of electronic probe

UNE-EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA) (Endorsed by AENOR in April of 2006.)

German Institute for Standardization, Technical parameters of electronic probe

DIN EN 1071-4:2006-05 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA); German version EN 1071-4:2006

BELST, Technical parameters of electronic probe

STB GOST R 51771-2002 Domestic radio-electronic equipment. Input and output parameters and types of connectors. Technical requirements

SE-SIS, Technical parameters of electronic probe

SIS SEN 01 02 66-1968 Electrotechnical vocabulary Detection and measurement of ionizing radiation by electric means

International Telecommunication Union (ITU), Technical parameters of electronic probe

ITU-R QUESTION 243/7-2006 Characterization of technical parameters and interference effects and possible interference mitigation techniques for passive sensors operating in the Earth exploration-satellite service (passive)
ITU-R QUESTION 2437-2006 Characterization of technical parameters and interference effects and possible interference mitigation techniques for passive sensors operating in the Earth exploration-satellite service (passive)
ITU-R RAPPORT SM.2153-2 FRENCH-2011

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector, Technical parameters of electronic probe

QUESTION 243/7-2006 Characterization of technical parameters and interference effects and possible interference mitigation techniques for passive sensors operating in the Earth exploration-satellite service (passive)

RO-ASRO, Technical parameters of electronic probe

STAS 7148/1-1980 STEAM TURBINES FOR THE OPERATION OF ELECTRIC GENERATORS Functional parameters and technical requirements for quality

Group Standards of the People's Republic of China, Technical parameters of electronic probe

T/SHSFJD 0001-2020 Electronic data deposit certificate specification based on block chain technology