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Chromatographic peak negative peak
Chromatographic peak negative peak, Total:37 items.
In the international standard classification, Chromatographic peak negative peak involves: Meat, meat products and other animal produce, Insulating fluids, Farming and forestry, Nuclear energy engineering, Fibre optic communications, Analytical chemistry, Non-ferrous metals, Optoelectronics. Laser equipment, Semiconductor devices.
Inner Mongolia Provincial Standard of the People's Republic of China, Chromatographic peak negative peak
Korean Agency for Technology and Standards (KATS), Chromatographic peak negative peak
- KS C 2375-2006(2021) Analytical method of polychlorinated biphenyls(PCBs)by gas chromatography peak pattern comparison
- KS C 2375-2006(2016) Analytical method of polychlorinated biphenyls(PCBs)by gas chromatography peak pattern comparison
- KS C 2375-2006 Analytical method of polychlorinated biphenyls(PCBs)by gas chromatography peak pattern comparison
- KS M 1915-2009 Phthalic anhydride for industrial use－Methods of test－Determination of 1,4-naphthaquinone content－Colorimetric method
Group Standards of the People's Republic of China, Chromatographic peak negative peak
ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc., Chromatographic peak negative peak
- ASHRAE BN-97-4-1997 Symposium on Advanced Methods for Calculating Peak Cooling Loads
- ASHRAE SE-99-1-2-1999 Effect of Beam Solar Radiation Distribution on Peak Cooling Loads
- ASHRAE 3673-1993 Laboratory Testing of Control Strategies to Reduce Peak Air- Conditioning Loads
- ASHRAE 183-2007 Peak Cooling and Heating Load Calculations in Buildings Except Low-Rise Residential buildings
- ASHRAE BN-97-10-3-1997 Thermal Storage Incorporated in the Mechanical System for Printing Works to Offset Peak Loads
American Gas Association, Chromatographic peak negative peak
- AGA GEOP S-2-1987 GEOP Series: Supplemental Gases - Peak Shaving/Base Load, Book 2, Vol. I (XY8701)
Hunan Provincial Standard of the People's Republic of China, Chromatographic peak negative peak
- DB43/T 1929-2020 Technical regulations for green high-quality and efficient cultivation of Kyoho grapes
International Organization for Standardization (ISO), Chromatographic peak negative peak
- ISO/CD 6863 Preparation of Plutonium and Uranium spikes for Isotope Dilution Mass Spectrometry (IDMS)
- ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
American National Standards Institute （ANSI), Chromatographic peak negative peak
- ANSI/TIA/EIA 492CAAB-2000 Detail Specification for Class IVa Dispersion Unshifted Single-Mode Optical Fibers with Low Water Peak
- ANSI/TIA-492CAAB-2000 Detail Specification for Class IVa Dispersion Unshifted Single-Mode Optical Fibers with Low Water Peak
TIA - Telecommunications Industry Association, Chromatographic peak negative peak
- TIA/EIA-492CAAB-2000 Detail Specification for Class IVa Dispersion-Unshifted Single-Mode Optical Fibers with Low Water Peak
American Society for Testing and Materials (ASTM), Chromatographic peak negative peak
- ASTM E827-07 Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
- ASTM E827-95 Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
- ASTM E827-02 Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
- ASTM C1871-22 Standard Test Method for Determination of Uranium Isotopic Composition by the Double Spike Method Using a Thermal Ionization Mass Spectrometer
- ASTM C1871-18a Standard Test Method for Determination of Uranium Isotopic Composition by the Double Spike Method Using a Thermal Ionization Mass Spectrometer
- ASTM C1871-18 Standard Test Method for Determination of Uranium Isotopic Composition by the Double Spike Method Using a Thermal Ionization Mass Spectrometer
国家市场监督管理总局、中国国家标准化管理委员会, Chromatographic peak negative peak
- GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- GB/T 24981.1-2020 Test methods of rare earth long afterglow phosphors—Part 1: Determination of emission dominantpeak and chromaticity coordinates
British Standards Institution (BSI), Chromatographic peak negative peak
- BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
(U.S.) Telecommunications Industries Association , Chromatographic peak negative peak
- TIA-492CAAB-2000 Detail Specification for Class IVa Dispersion-Unshifted Single-Mode Optical Fibers with Low Water Peak
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Chromatographic peak negative peak
- GB/T 14634.2-2010 Test methods of rare earth three-band phosphors for fluorescent lamps.Part 2:Determination of emission dominantpeak and chromaticity
- GB/T 24981.1-2010 Test methods of long afterglow phosphors activated by rare earths.Part 1:Determination of emission dominantpeak and chromaticity coordinates
- GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
Professional Standard - Electron, Chromatographic peak negative peak
- SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices
- SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode.Part 12: Peak-emission wavelength and spectral radiant bandwidth
- SJ 2658.12-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width