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Spectrum of a silicon wafer

Spectrum of a silicon wafer, Total:500 items.

In the international standard classification, Spectrum of a silicon wafer involves: Testing of metals, Semiconducting materials, Non-ferrous metals, Analytical chemistry, Ferroalloys, Powder metallurgy, General methods of tests and analysis for food products, Leather technology, Optical equipment, Non-metalliferous minerals, Solar energy engineering, Ferrous metals, Insulating fluids, Ceramics, Water quality, Conducting materials, Integrated circuits. Microelectronics, Products of the chemical industry, Metalliferous minerals, Terminology (principles and coordination), Environmental protection, Coals, Natural gas, Inorganic chemicals, Iron and steel products, Fuels, Cutting tools, Organic chemicals, Fibre optic communications, Refractories, Materials for the reinforcement of composites, Glass, Electricity. Magnetism. Electrical and magnetic measurements, Physics. Chemistry, Optics and optical measurements, Vocabularies, Optoelectronics. Laser equipment, Lubricants, industrial oils and related products, Pesticides and other agrochemicals, Nuclear energy engineering, Radiation measurements, Semiconductor devices, Electromechanical components for electronic and telecommunications equipment, Air quality, Waxes, bituminous materials and other petroleum products, Cinematography.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Spectrum of a silicon wafer

GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
GB/T 12964-2003 Monocrystalline silicon polished wafers
GB/T 29506-2013 300 mm polished monocrystalline silicon wafers
GB/T 26601-2011 Microscopes.Spectral filters
GB/T 30656-2014 Polished monocrystalline silicon carbide wafers
GB/T 30656-2023 Silicon carbide single crystal polished wafer
GB/T 42789-2023 Test method for surface gloss of silicon wafer
GB/T 26065-2010 Specification for polished test silicon wafers
GB/T 17169-1997 Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection
GB/T 4058-1995 Test method for detection of oxidation induced defects in polished silicon wafers
GB/T 4058-2009 Test method for detection of oxidation induced defects in polished silicon wafers
GB/T 19921-2005 Test method of particles on silicon wafer surfaces
GB/T 29055-2019(英文版) Multi crystalline silicon wafers for photovoltaic solar cell
GB/T 32281-2015 Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock.Secondary ion mass spectrometry
GB/T 14140.1-1993 Silicon slices and wafers--Measuring of diameter--Optical projecting method
GB/T 6621-1995 Test methods for surface flatness of silicon polished slices
GB/T 24577-2009 Test methods for analyzing organic contaminants on silicon water surfaces by thermal desorption gas chromatography
GB/T 6624-1995 Standard method for measuring the surface quality of polished silicon slices by visual inspection
GB/T 6624-2009 Standard method for measuring the surface quality of polished silicon slices by visual inspection
GB/T 42902-2023 Laser Scattering Method for Testing Surface Defects of Silicon Carbide Epitaxial Wafers
GB/T 30701-2014 Surface chemical analysis.Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
GB/T 24575-2009 Test method for measuring surface sodium, aluminum, potassium, and iron on silicon and epi substrates by secondary ion mass spectrometry
GB/T 26068-2018 Measurement of Carrier Recombination Lifetime of Silicon Wafer and Ingot Non-contact Microwave Reflection Photoconductivity Decay Method
GB/T 14849.10-2016 Methods for chemical analysis of industrial silicon - Part 10: Determination of mercury content by atomic fluorescence spectrometry
GB/T 29057-2023 Practice for evaluating polycrystalline silicon rods by zone fusion pulling and spectroscopic analysis
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
GB/T 36705-2018 Test method for carrier concentration of gallium nitride substrates—Raman spectrum method
GB/T 31351-2014 Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers
GB/T 4333.4-2007 Ferrosilicon-Determination of aluminium content-The chromazurol S spectrophotometric method,the EDTA titrimetric method and the flame atomic absorption spectrometric method
GB/T 14849.5-2010 Chemical analysis of slion metal.Part 5: Determination of elements content.Analysis using an X-ray fluorescence method
GB/T 29513-2013 Chemical analysis of ferric-containing dust and sludge by XRF.Fused cast bead method
GB/T 21114-2007 X-ray Fluorescence Spectrochemical Analysis of Refractory Materials - Molten Glass Disk Method
GB/T 4333.8-1988 Methods for chemical analysis of ferrosilicon--The atomic absorption spectrometric method for the determination of calcium content
GB/T 35306-2023 Determination of Carbon and Oxygen Content in Silicon Single Crystal Low Temperature Fourier Transform Infrared Spectroscopy
GB/T 223.5-2008 Steel and iron.Determination of acid-soluble silicon and total silicon content.Reduced molybdosilicate spectrophotometric method
GB/T 6730.62-2005 Iron ores-Determination of calcium,silicon,manganese,titanium,phosphorus magnesium,aluminium and barium content Wavelength dispersive X-ray fluorescence spectrometric method
GB/T 32814-2016 Silicon-based MEMS fabrication technology.Specification for criterion of the SOI wafer based MEMS process
GB/T 2590.3-1981 Zirconium and hafnium oxides--Determination of silicon content--Silicon-molybdenum blue photometric method
GB/T 2592.9-1981 Thallium--Determination of silicon content--Isoamyl alcohol extraction molybdenum blue absorption photometric method
GB/T 1831-1979 Determination of silicon dioxide content in tin concentrates--Silicon molybdenum blue photometric method
GB/T 20931.5-2007 Methods for chemical analysis of lithium Determination of silicon content Molybdenum blue spectrophotometric method
GB/T 14849.5-2014 Methods for chemical analysis of silicon metal.Part 5:Determination of impurity contents.X-ray fluorescence method
GB/T 24198-2009 Ferronickel.Determination of nickel,silicon,phosphorus,manganese,cobalt,chromium,and copper contents.Wavelength dispersive X-ray fluorescence spectrometry(Routine method)
GB/T 14506.28-1993 Silicate rocks. Determination of contents of major and minor elements. X-ray fluorescence spectrometric method
GB/T 24231-2009 Chrome ores.Determination of magnesium,aluminum,silicon,calcium,titanium,vanadium,chrome,manganese,iron and nickel content.Wavelength dispersive X-ray fluorescence spectrometric method
GB/T 4333.9-1988 Methods for chemical analysis of ferrosilicon--The flame atomic absorption spectrometric method for the determination of aluminium content
GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
GB/T 26179-2010 The spectroradiometric measurement of light sources
GB/T 14849.8-2015 Methods for chemical analysis of silicon metal.Part 8:Determination of copper content.Atomic absorption spectrometric method
GB/T 42794-2023 Determination of nickel iron carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium and copper content by spark source atomic emission spectrometry
GB/T 24579-2009 Test methods for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy
GB 2128-1980 Determination of silicon dioxide content in xenotime concentrates--Silicon molybdenum blue photometric method
GB/T 14501.4-1993 Spectrophotometric determination of silicon in uranium hexafluoride
GB/T 5059.5-2014 Ferromolybdenum.Determination of silicon content.Sulphuric acid dehydration gravimetric method and molybdenum blue spectrophotometric method
GB/T 6730.9-2016 Iron ores.Determination of silicon content.Silicomolybdic blue spectrophotometric method reduced by ammonium ferrous sulfate
GB/T 6730.9-2006 Iron ores. Determination of silicon contents The silicomolybdic blue spectrophotometric method by ammonium ferrous sulfate
GB/T 11213.4-2006 Sodium hydroxide for chemical fiber use.Determination of silicon content.Reduced molybdosilicate spectrophotometric method
GB/T 11073-1989 Standard method for measuring radial resistivity variation on silicon slices
GB/T 11073-2007 Standard method for measuring radial resistivity variation on silicon slices
GB/T 26070-2010 Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method
GB/T 11213.4-1989 Sodium hydroxide for chemical fiber use--Determination of silicon mass fraction--Reduced molybdo silicate spectrometric method
GB/T 1819.12-2004 Methods for chemical analysis of tin concentrates Determination of silicon dioxide content-The silicomolybdenum blue spectrophotometric method
GB/T 24583.8-2009 Vanadium-Nitrogen alloy.Determination of silicon，manganese，phosphorus，aluminum content.Inductively coupled plasma atomic emission spectrometric method
GB/T 29851-2013 Test method for measuring boron and aluminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry
GB/T 42907-2023 Non-contact eddy current induction method for testing non-equilibrium carrier recombination lifetime in silicon ingots, blocks and wafers
GB/T 15244-2013 Microbeam analysis.Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry

Japanese Industrial Standards Committee (JISC), Spectrum of a silicon wafer

JIS H 0613:1978 Visual inspection for sliced and lapped silicon wafers
JIS H 0615:2021 Test method for determination of impurity concentrations in silicon crystal by photoluminescence spectroscopy
JIS H 0615:1996 Test method for determination of impurity concentrations in silicon crystal by photoluminescence spectroscopy
JIS H 0614:1996 Visual inspection for silicon wafers with specular surfaces
JIS K 0164:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe

Professional Standard - Non-ferrous Metal, Spectrum of a silicon wafer

YS/T 985-2014 Polished reclaimed silicon wafers
YS/T 230.4-1994 High pure indium--Determination of silicon content--Spectrochemical method
YS/T 227.11-1994 Determination of silicon content in tellurium (n-butanol extraction silicon molybdenum blue absorptiometry)
YS/T 569.9-2006 Determination of silicon content in thallium by isoamyl alcohol extraction silicon molybdenum blue absorptiometry
YS/T 568.3-2006 Determination of silicon content in zirconium oxide and hafnium oxide silicon molybdenum blue absorptiometry
YS/T 1600-2023 Determination of trace impurity elements in silicon carbide single crystal —Glow discharge mass spectrometry
YS/T 981.3-2014 Methods for chemical analysis of high pure indium.Determination of silicon content.Molybdenum blue spectrophotometric method
YS/T 226.5-2009 Methods for chemical analysis of selenium.Part 5:Determination of silicon content.Molybdenum blue spectrophotometric method
YS/T 226.7-1994 Determination of the amount of arsenic in selenium (silicon molybdenum blue absorptiometry)

国家市场监督管理总局、中国国家标准化管理委员会, Spectrum of a silicon wafer

GB/T 12964-2018 Monocrystalline silicon polished wafers
GB/T 40312-2021 Ferrophosphorus—Determination of phosphorus, silicon, manganese and titanium content—Wavelength dispersive X-ray fluorescence spectrometry method (fused cast bead method)
GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
GB/T 5687.13-2021 Ferrochromium—Determination of chromium, silicon, manganese, titanium, vanadium, iron contents—Wavelength dispersive X-ray fluorescence spectrometry (fused cast bead method)
GB/T 19921-2018 Test method for particles on polished silicon wafer surfaces
GB/T 40279-2021 Test method for thickness of films on silicon wafer surface—Optical reflection method
GB/T 4333.8-2022 Ferrosilicon—Determination of calcium content—Flame atomic absorption spectrometry
GB/T 41497-2022 Ferrovanadium—Determination of vanadium,silicon,phosphorus,manganese,aluminum,iron content—Wavelength dispersive X-ray fluorescence spectrometry
GB/T 39145-2020 Test method for the content of surface metal elements on silicon wafers—Inductively coupled plasma mass spectrometry
GB/T 37673-2019 Determination of silicon,aluminum,iron,calcium,magnesium,sodium,potassium,phosphorus,titanium,manganese,strontium and barium in coal ash—X-ray fluorescence spectrometric method
GB/T 7731.5-2021 Ferrotungsten—Determination of silicon content—Silicomolybdenum blue spectrophotometric method
GB/T 21114-2019 Refractories—Chemical analysis by X-ray fluorescence(XRF)—Fused cast-bead method
GB/T 40311-2021 Vanadium slag—Determination of multi-element contents—Wavelength dispersive X-ray fluorescence spectrometry(fused cast bead method)
GB/T 40915-2021 Determination of SiO2，Al2O3，Fe2O3，K2O，Na2O，CaO，MgO content of soda-lime-silica glass by X-ray fluorescence spectrometric method
GB/T 41325-2022 Low density crystal originated pit polished monocrystalline silicon wafers for integrated circuit
GB/T 24581-2022 Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method
GB/T 223.90-2021 Iron, steel and alloy—Determination of silicon content—Inductively coupled plasma atomic emission spectrometric method
GB/T 8704.6-2020 Ferrovanadium—Determination of silicon content—The sulfuric acid dehydration gralimetric method and the silicomolybdic blue photometric method
GB/T 24583.8-2019 Vanadium-nitrogen—Determination of silicon, manganese, phosphorus, aluminum content—Inductively coupled plasma atomic emission spectrometric method

工业和信息化部, Spectrum of a silicon wafer

YB/T 4780-2019 Determination of silicon, calcium and aluminum content in calcium silicon alloys by wavelength dispersive X-ray fluorescence spectrometry (cast glass plate method)
SJ/T 11629-2016 Online photoluminescence analysis method of silicon wafers and cells for solar cells
YB/T 4907-2021 Determination of ferromanganese, manganese-silicon alloys and metal manganese manganese, silicon, iron and phosphorus contents by wavelength dispersive X-ray fluorescence spectrometry
YB/T 6026-2022 Determination of silicon, manganese, phosphorus, sulfur and titanium content in pig iron by wavelength dispersive X-ray fluorescence spectrometry
YB/T 4531-2016 Determination of iron phosphorus silicon content by silicon molybdenum blue spectrophotometry
YB/T 6012-2022 Determination of multi-element content of blast furnace slag by X-ray fluorescence spectrometry (powder tabletting method)
YS/T 1300-2019 Determination of methyldichlorosilane, trimethylchlorosilane and methyltrichlorosilane in chlorosilanes by gas chromatography mass spectrometry
YB/T 5156-2016 Determination of Silicon in High Purity Graphite Products Silicon-Molybdenum Blue Spectrophotometry
YB/T 6028-2022 Determination of ferromanganese, manganese-silicon alloy, metallic manganese and magnesium content by flame atomic absorption spectrometry
YB/T 6027-2022 Determination of ferromanganese, manganese-silicon alloy, metallic manganese-calcium content by flame atomic absorption spectrometry
YS/T 1060-2015 Determination of other chlorosilanes in trichlorosilane for silicon epitaxy by gas chromatography
YS/T 1059-2015 Determination of total carbon in trichlorosilane for silicon epitaxy by gas chromatography
YS/T 1290-2018 Determination of silane content in polycrystalline silicon production tail gas by gas chromatography
YB/T 4983-2022 Determination of phosphorus, iron, phosphorus, silicon, manganese and titanium content by inductively coupled plasma atomic emission spectrometry
YS/T 987-2021 Determination of carbon content in chlorosilanes by gas chromatography mass spectrometry
YB/T 4936-2021 Determination of ferromanganese, manganese-silicon alloy, and metallic manganese-copper content by dicyclohexanone oxalyl dihydrazone spectrophotometry and flame atomic absorption spectrometry
YB/T 6057-2022 Determination of iron, silicon, aluminum, calcium, magnesium and manganese content in steel slag by inductively coupled plasma optical emission spectrometry
YB/T 4726.4-2021 Determination of silicon content in iron-containing dust sludge Ferrous ammonium sulfate reduction-silicon molybdenum blue spectrophotometry
YB/T 4566.4-2016 Determination of silicon, manganese, phosphorus and aluminum content in ferrovanadium nitride by inductively coupled plasma atomic emission spectrometry
YB/T 6037-2022 Determination of the contents of magnesium oxide, aluminum oxide, silicon dioxide, calcium oxide, titanium dioxide, chromium trioxide and ferric oxide in fused magnesia chromium sand by wavelength dispersive X-ray fluorescence spectrometry (fused plate me

Korean Agency for Technology and Standards (KATS), Spectrum of a silicon wafer

KS E 3076-2017 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
KS E 3076-2022 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
KS M ISO 5400-2012(2022) Leather－Determination of total silicon content－Reduced molybdosilicate spectrometric method
KS M ISO 5400:2012 Leather-Determination of total silicon content-Reduced molybdosilicate spectrometric method
KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
KS D 1683-2004 Method for emission spectrochemical analysis of silver ingot
KS D 0078-2008(2018) Test method for determination of impurity concentrations in silicon crystal by photoluminescence spectroscopy
KS D ISO 4139-2002(2017) Metallic and other non-organic coatings－Measurement of coating thicknesses－Fizeau multiple-beam interferometry method
KS D 0262-2002(2017) Visual inspection for sliced and lapped silicon wafers
KS D 0262-2002(2022) Visual inspection for sliced and lapped silicon wafers
KS D 0262-2002 Visual inspection for sliced and lapped silicon wafers
KS D 0261-2012 Visual inspection for silicon wafers with specular surfaces
KS D 0261-2012(2022) Visual inspection for silicon wafers with specular surfaces
KS D ISO 4139:2002 Ferrosilicon－Determination of aluminium content－Flame atomic absorption spectrometric method
KS D ISO 7530-8-2012(2017) Nickel alloys－Flame atomic absorption spectrometric analysis－Part 8：Determination of silicon content
KS E ISO 9516-2003(2008) Iron ores－Determination of silicon, calcium, manganese, aluminium, titanium, magnesium, phosphorus, sulfur and potassium－Wavelength dispersive X-ray fluorescence spectrometric method
KS D ISO 7530-8-2012(2022) Nickel alloys－Flame atomic absorption spectrometric analysis－Part 8：Determination of silicon content
KS E ISO 5997-2001(2016) Chromium ores and concentrates ― Determination of silicon content ― Molecular absorption spectrometric method and gravimetric method
KS B ISO TR 17055-2008(2018) Steel－Determination of silicon content－Inductively coupled plasma atomic emission spectrometric method
KS E ISO 9516:2010 Iron ores－Determination of silicon, calcium, manganese, aluminium, titanium, magnesium, phosphorus, sulfur and potassium－Wavelength dispersive X-ray fluorescence spectrometric method
KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
KS C 0256-2002 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
KS M ISO 5400-2012(2017) Leather－Determination of total silicon content－Reduced molybdosilicate spectrometric method
KS E ISO 5997:2001 Chromium ores and concentrates－Determination of silicon content－Molecular absorption spectrometric method and gravimetric method
KS E ISO 5997-2001(2021) Chromium ores and concentrates ― Determination of silicon content ― Molecular absorption spectrometric method and gravimetric method
KS D ISO 17560:2003 Surface chemical analysis－Secondary-on mass spectrometry－ Method for depth profiling of boron in silicon
KS M ISO 5935:2006 Crude sodium borates for industrial use－Determination of total and alkali-soluble silica contents－Molybdosilicate spectrometric method
KS M ISO 5935:2010 Crude sodium borates for industrial use－Determination of total and alkali-soluble silica contents－Molybdosilicate spectrometric method
KS M ISO 6382:2004 General method for determination of silicon content－Reduced molybdosilicate spectrophotometric method
KS D ISO 808-2002(2022) Aluminium and aluminium alloys－Determination of silicon－Spectrophotometric method with the reduced silicomolybdic complex
KS D ISO 1975:2003 Magnesium and magnesium alloys－Determination of silicon－Spectrophotometric method with the reduced silicomolybdic complex
KS C 0256-2002(2017) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
KS D ISO 7530-8:2012 Nickel alloys－Flame atomic absorption spectrometric analysis－Part 8：Determination of silicon content
KS D ISO 4829-2:2005 Steel and iron－Determination of total silicon content－Reduced molybdosilicate spectrophotometric method－Part 2：Silicon contents between 0.01 and 0.05 %
KS D ISO 808:2002 Aluminium and aluminium alloys－Determination of silicon－Spectrophotometric method with the reduced silicomolybdic complex
KS E ISO 2598-2-2012(2022) Iron ores－Determination of silicon content－Part 2: Reduced molybdosilicate spectrophotometric method
KS E ISO 2598-2-2012(2017) Iron ores－Determination of silicon content－Part 2: Reduced molybdosilicate spectrophotometric method
KS B ISO TR 17055:2008 Steel－Determination of silicon content－Inductively coupled plasma atomic emission spectrometric method
KS D ISO 4829-2002(2007) Steel and iron－Determination of total silicon content－Reduced molybdosilicate spectrophotometric method－Part 2：Silicon contents between 0.01 and 0.05 %
KS A ISO 20859:2010 Cinematography－Spectral response of photographic audio reproducers for analog dye sound racks on 35 mm film
KS M ISO 3430-2007(2012) Sodium fluoride primarily used for the production of aluminium－Determination of silica content－Reduced molybdosilicate spectrophotometric method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Spectrum of a silicon wafer

GB/T 4333.5-2016 Ferrosillicon—Determination of silicon, manganese, aluminium, calcium, chromium and iron contents—Wavelength dispersive X-ray fluorescence spectrometry (Fused cast bead method)
GB/T 35309-2017 Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies
GB/T 33236-2016 Polycrystalline silicon—Determination of trace elements—Glow discharge mass spectrometry method
GB/T 33465-2016 Determination of chlorine and silicon in gasoline by inductively coupled plasma optical emission spectrometry（ICP-OES）
GB/T 5195.15-2017 Fluorspar—Determination of calcium,aluminum,silicon,phosphorus,sulfur,potassium,iron,barium and lead content—Wavelength dispersive X-ray fluorescence spectrometric method
GB/T 35306-2017 Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry
GB/T 33647-2017 Determination of silicon content in motor gasoline—Inductively coupled plasma optical emission spectrometry (ICP-OES)
GB/T 4702.6-2016 Chromium metal—Determination of iron, aluminium, silicon and copper content—Inductively coupled plasma atomic emission spectrometry method

Association Francaise de Normalisation, Spectrum of a silicon wafer

NF A07-520:1971 Analysis of aluminium silicon and aluminium-silicon-copper alloys by emission spectrography.
FD A06-326*FD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al in ferro-silicon by X-ray fluorescence spectrometry
NF T90-007:2001 Water quality - Determination of soluble silicates - Molecular absorption spectrometric method.
NF T77-152:1987 Basic silicones for industrial use. Determination of silicon content (silicon content less than 1 per cent (m/m)). Method by atomic absorption spectrometry.
NF C57-203*NF EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing.
NF A08-341:1987 Chemical analysis of steel. Determination of silicon content. Flame atomic absorption spectrometric method.
NF T77-162:1988 Basic silicones for industrial use. Determination of ratios phenyl/silicium and phenyl/methyl. Near infrared spectrometric method.
NF ISO 7530-8:2007 Alliages de nickel - Analyse par spectrométrie d'absorption atomique dans la flamme - Partie 8 : dosage du silicium
NF A10-186:1977 Chemical analysis of ferroalloys. Determination of aluminium in ferrosilicon. Atomic absorption spectrometric method.
NF EN ISO 2613-1:2023 Analyse du gaz naturel - Teneur en silicium du biométhane - Partie 1 : détermination de la teneur totale en silicium par spectrométrie d'émission atomique (SEA)
NF EN 50513:2009 Tranches de silicium solaires - Fiche technique et information produit sur les tranches au silicium cristallin pour la fabrication de cellules solaires
NF A20-415:1984 Iron ores. Determination of silicon content. Reduced molybdosilicate spectrophotometric method.
NF X21-051*NF ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
NF EN ISO 21587-3:2007 Analyse chimique des produits réfractaires d'aluminosilicates (méthode alternative à la méthode par fluorescence de rayons X) - Partie 3 : méthodes par spectrométrie d'absorption atomique (AAS) et spectrométrie d'émission atomique avec plasm...
NF A06-341-2*NF EN ISO 4829-2:2016 Steel - Determination of total silicon content - Reduced molybdosilicate spectrophotometric method - Part 2 : silicon contents between 0,01% and 0,05 %
NF A08-908*NF ISO 7530-8:2007 Nickel alloys - Flame atomic absorption spectrometric analysis - Part 8 : determination of silicon content.
NF T77-156:1987 Basic silicones for industrial use. Determination of introduced peroxydes content. Infra-red spectrometric method.
NF B49-418:1970 Chemical analysis of refractory materials (high). Silica materials, siliceous fireclay and fireclay materials. Determination of lithium, potassium and sodium (flame photometric method).
NF A06-341-2:1990 Steel and cast iron. Determination of total silicon content. Reduced molybdosilicate spectrophotometric method. Part 2 : silicon contents between 0,01 and 0,05 per cent.
NF C96-050-9*NF EN 62047-9:2012 Semiconductor devices - Micro-electromechanical devices - Part 9 : wafer to wafer bonding strength measurement for MEMS.
NF X43-275:2002 Qualité de l'air - Air des lieux de travail - Dosage d'éléments présents dans l'air des lieux de travail par spectrométrie atomique
NF T90-053*NF EN ISO 16264:2004 Water quality - Determination of soluble silicates by flow analysis (FIA and CFA) and photometric detection

Professional Standard - Machinery, Spectrum of a silicon wafer

JB/T 5590-1991 Optical filter of optical spectrum instrument
JB/T 9334-1999 Microscopes.The fundamental specification for spectral filters

Group Standards of the People's Republic of China, Spectrum of a silicon wafer

T/CPIA 0037-2022 Specifications for Photovoltaic Crystalline Wafers
T/CQCAA 0005-2020 Determination of mercury in silicon dioxide -Atomic Fluorescence Spectrometry
T/ZPP 016-2022 Photovoltaic silicon wafer debonding and inserting integrated technical requirements
T/IAWBS 005-2018 6 inch polished monocrystalline silicon carbide wafers
T/ZZB 0648-2018 200 mm heavily phosphorus-doped single crystalline Czochralski silicon polished wafers
T/NXCL 017-2022 300 mm heavily phosphorus-doped single crystaline Czochralski silicon polished wafers
T/NXCL 016-2022 200 mm heavily antimony-doped single crystaline Czochralski silicon polished wafer
T/CPIA 0038-2022 Electroplated diamond wire for photovoltaic silicon wafer cutting
T/IAWBS 014-2021 Test method for dislocation density of silicon carbide polished wafers
T/CSTM 00061-2018 Nickel alloy—Determination of silicon content—Flame atomic absorption spectrometric method
T/CPIA 0022-2020 Evaluation Requirements for Green Factory in Photovoltaic Silicon Wafer Manufacturing Industry
T/QAS 040-2021 Determination of silicon brine by inductively coupled plasma emission spectrometry
T/ICMTIA SM0027-2022 300mm p-type silicon single crystal polished wafer for advanced memory technology
T/CPIA 0021-2020 Green Design Product Evaluation Technical Specification for Photovoltaic Silicon Wafers
T/SQIA 057-2023 Technical requirements for carbon footprint assessment of crystalline silicon photovoltaic cell
T/GMES 004-2018 Determination of various components in chromite by X-ray fluorescence spectrometry (powder compression)
T/NAIA 0214-2023 Determination of Major Elements in Coal Gangue by Powder Compression-X-ray Fluorescence Spectrometry
T/GMES 005-2018 Determination of multiple components in flux X-ray fluorescence spectrometry (cast glass flake method)
T/CGWSTC 001-2022 Determination of various components in ceramic raw materials X-ray fluorescence spectrometry (powder compression)
T/SDAQI 036-2021 Determination of silicon, aluminum, iron, titanium, calcium, magnesium, potassium, sodium, manganese, phosphorus in ilmenite by X-ray fluorescence spectremetry
T/CMES 08003-2020 Determination of content of high carbon ferrochromium silicon molybdenum blue spectrophotometry
T/CSTM 00014-2019 Iron and steel-Determination of silicon content- Inductively coupled plasma atomic emission spectrometric method
T/CASAS 032-2023 Test method for the content of metal elements on the surface of silicon carbide wafer—Inductively coupled plasma mass spectrometry
T/CNIA 0101-2021 Technical specification for green design product evaluation silicon carbide single crystal polished wafer
T/CGIA 013-2019 Determination of silicon content in graphene materials — Molybdenum blue spectrophotometry
T/GDAQ 00003-2022 Optical grade silica gel for optical devices
T/CMES 08008-2020 Determination of molybdenum, iron, phosphorus, copper, silicon, tin, antimony by inductively coupled plasma atomic emission spectrometry
T/IAWBS 010-2019 Detection method for measuring the surface Detection method for measuring the surface quality and micropipe densityof polished monocrystalline silicon carbide wafers-Laser Scattering Method
T/NAIA 015-2020 Determination of Iron, Manganese, Lead and Silicon in Gasoline Direct Injection-Inductively Coupled Plasma Emission Spectrometry
T/NAIA 0128-2022 Rapid Determination of Aluminum Hydroxide Determination of Element Content by X-ray Fluorescence Spectroscopic Analysis (Tablet)
T/SCS 000012-2021 Determination of trace elements in boron carbide–silicon carbide pellets by Inductively coupled plasma optical emission spectrometry

RU-GOST R, Spectrum of a silicon wafer

GOST 16412.9-1991 Iron powder. Method of photoelectric spectral analysis of silicon, manganese and phosphorus
GOST 9853.6-1979 Sponge titanium. Spectral method for the determination of silicon, iron and nickel
GOST 18385.2-1979 Niobium. Spectral method for the determination of silicon, titanium and iron
GOST 23687.2-1979 Alloy of copper-beryllium. Spectral method of the determination of magnesium, iron, aluminium, silicon, lead
GOST 851.10-1993 Primary magnesium. Spectral method for determination of silicon, iron, nickel, aluminium, copper and mangenese
GOST 851.10-1987 Primary magnesium. Srectral method for the determination of silicon, iron, nickel, aluminium, copper, marganese content
GOST R ISO 7530-8-2017 Nickel alloys. Flame atomic absorption spectrometric method. Part 8. Determination of silicon content
GOST 13637.1-1993 Gallium. Atomic-emission method for the determination of aluminium, iron, bismuth, silicon, magnesium, manganese, copper, nickel, tin, lead, chromium and zinc
GOST 13637.1-1977 Gallium. Spectral method for the determination of aluminium, iron, bismuth, silicon, magnesium, manganese, copper, nickel, tin, lead and chromium
GOST 23862.4-1979 Rare-earth metals and their oxides. Spectral method of determination of vanadium, iron, cobalt, silicon, manganese, copper, nickel, lead, titanium, chromium
GOST 9717.2-1982 Copper. Method of spectral analysis of metal standart specimens with photographic registration of spectrum
GOST R 52144-2003 Zinc concentrates. Spectrophotometric method of silicon dioxide content determination
GOST R 50233.4-1992 Niobium pentoxide. Atomic-emission method for determination of titanium, silicon, iron, nickel, aluminium, magnesium, manganse, cobalt, chromium, lead and zirconium

IT-UNI, Spectrum of a silicon wafer

GOSTR, Spectrum of a silicon wafer

GOST 9853.23-1996 Sponge titanium. Spectral method for determination of silicon, iron, nickel
GOST 9717.2-2018 Copper. Method of spectral analysis by metal standard specimens with photographic registration of spectrum

AENOR, Spectrum of a silicon wafer

UNE 59027:1988 LEATHER. DETERMINATION OF TOTAL SILICON CONTENT. REDUCED MOLYBDOSILICATE SPECTROMETRIC METHOD
UNE 35056-1:1983 FERROSILICON. DETERMINATION OF ALUMINIUM CONTENT. FLAME ATOMIC ABSORPTION SPECTROMETRIC METHOD
UNE 38167:1993 ALUMINIUM AND ALUMINIUM ALLOYS. DETERMINATION OF SILICON. SPECTROPHOTOMETRIC METHOD WITH THE REDUCED SILICOMOLYBDIC COMPLEX.

ES-UNE, Spectrum of a silicon wafer

UNE 59027:1988 ERRATUM LEATHER. DETERMINATION OF TOTAL SILICON CONTENT. REDUCED MOLYBDOSILICATE SPECTROMETRIC METHOD
UNE-EN ISO 4829-2:2016 Steels - Determination of total silicon contents - Reduced molybdosilicate spectrophotometric method - Part 2: Silicon contents between 0,01 % and 0,05 % (ISO 4829-2:2016)

British Standards Institution (BSI), Spectrum of a silicon wafer

BS 7012-6:1998 Light microscopes. Specification for spectral filters
BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
BS ISO 17331:2004+A1:2010 Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
BS EN ISO 4829-2:2016 Steels. Determination of total silicon contents. Reduced molybdosilicate spectrophotometric method. Silicon contents between 0,01 % and 0,05 %
BS 7455-8:1992 Analysis of nickel alloys by flame atomic absorption spectrometry. Method for determination of silicon
BS 7709-1:1993 Analysis of extract solutions of glass. Method for determination of silicon dioxide by molecular absorption spectrometry
BS ISO 12926:2012 Aluminium fluoride for industrial use. Determination of trace elements. Wavelength dispersive X-ray fluorescence spectrometric method using pressed powder tablets
BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS EN ISO 4829-1:2018 Steel and cast iron. Determination of total silicon contents. Reduced molybdosilicate spectrophotometric method. Silicon contents between 0,05 % and 1,0 %
BS ISO 19087:2018 Workplace air. Analysis of respirable crystalline silica by Fourier-Transform Infrared spectroscopy
BS 7020-5.2:1993 Analysis of iron ores. Methods for the determination of silicon content. Reduced molybdosilicate spectrophotometric method
BS ISO 4443:2022 Cryolite primarily used for the production of aluminium. Determination of elements. Wavelength-dispersive X-ray fluorescence spectrometric method using pressed powder tablets
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS EN IEC 63202-1:2019 Photovoltaic cells - Measurement of light-induced degradation of crystalline silicon photovoltaic cells
BS ISO 12926:2013 Aluminium fluoride for industrial use. Determination of trace elements. Wavelength dispersive X-ray fluorescence spectrometric method using pressed powder tablets
PD ISO/TR 28980:2007 Ophthalmic optics. Spectacle lenses. Parameters affecting lens power measurement

Professional Standard - Electron, Spectrum of a silicon wafer

SJ/T 11502-2015 Specification for polished monocrystalline silicon carbide wafers
SJ 3198-1989 Method for determination of Silicon,Iron,Magnesium and Copper in vacuum Silicon-Aluminium alloy by emission spectrum
SJ/T 11504-2015 Test method for measuring surface quality of polished monocrystalline silicon carbide
SJ/T 11869-2022 Detailed specifications for silicon substrate white light power light emitting diode chips
SJ/T 11868-2022 Detailed specifications for silicon substrate blue power light emitting diode chips
SJ/T 11503-2015 Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers
SJ/Z 3206.5-1989 Treatment methods for sensitized plate and film photograph for chemical analysis using spectrum
SJ/T 11867-2022 Detailed specifications for silicon substrate blue light low-power light-emitting diode chips
SJ 2594-1985 Method for the analysis of boron and metalic impurities in pure SiC14-Spectro-chemical method
SJ/T 11491-2015 Test methods for measurement of interstitial oxygen content in silicon by short baseline infrared absorption spectrometry

中国有色金属工业总公司, Spectrum of a silicon wafer

YS/T 25-1992 Silicon polishing wafer surface cleaning method

Hebei Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

DB13/T 5091-2019 Determination of ferromanganese, manganese silicon, ferromanganese nitride and metal manganese silicon, manganese and phosphorus content Wavelength dispersive X-ray fluorescence spectrometry (cast glass method)
DB13/T 2855-2018 Determination of molybdenum iron silicon, phosphorus and copper content by inductively coupled plasma atomic emission spectrometry

Professional Standard - Commodity Inspection, Spectrum of a silicon wafer

SN/T 0770-1999 Determination of silicon oxide in middle carbon flake graphite.Molybdenum blue photometric method
SN/T 2489-2010 Determination of Cr、Mn、P、Si contents in pig-irons-Photoelectric emission spectroscopic method
SN/T 2749-2010 Determination of manganese,silicon,aluminum,calcium,titanium in rare earth ferrosilicon.Wave dispersive X-ray fluorescence spectrometry method
SN/T 2950-2011 Determination of silicon, aluminum, calcium, iron, phosphorus, chromium, titanium content in export rare earth magnesium ferrosilicon X-ray fluorescence spectrometry
SN/T 3604-2013 Determination of copper, silicon, manganese, zinc, aluminum and iron in zinc concentrate ore.X-ray fluorescence spectrometry
SN/T 1118-2002 Determination of chromium, silicon, iron, aluminum, magnesium and calcium in chrome ore-Wavelength dispersive X-ray fluorescence spectrometry
SN/T 3915-2014 Determination of magnesium,silicon,titanium,manganese, iron,nickel,copper,zinc, gallium in aluminum and aluminum alloy.X ray fluorescence spectrometry
SN/T 3346-2012 Determination of silicon,manganese,phosphorus,chromium,vanadium in chrome-vanadium steel.Wave dispersive X-ray fluorescence spectrometry
SN/T 3347-2012 Determination of silicon,manganese,phosphorus,chromium and titanium in chrome-manganese-titanium steel.Wave dispersive X-ray fluorescence spectrometry
SN/T 3348-2012 Determination of silicon,manganese,phosphorus,chromium,nickel and tungsten in chrome-nickel-tungsten steel.Wave-length dispersive X-ray fluorescence spectrometry
SN/T 3795-2014 Screening of cobalt dichloride in the silicone and other polymer.Wavelength dispersive X-ray fluorescence spectrometric method
SN/T 3916-2014 Determination of molybdenum, iron, lead, copper, silicon, calcium in molybdenum concentrates by X-ray fluorescence spectrometry
SN/T 3187-2012 Determination of sodium,magnesium,aluminium,silicon,calcium,vanadium,iron,nickel,copper,lead,arsenic in crude oil.Wavelength dispersive X-ray fluorescence spectrometry
SN/T 3093-2012 Determination of sodium,aluminium,silicon,sulfur,calcium,vanadium,iron,nickel in residual fuel oil.Wavelength dispersive X-ray fluorescence spectrometry
SN/T 3789-2014 Determination of aluminum,cobalt,copper,manganese,molybdenum, nickel,phosphorus,sulfur,silicon, titanium in stainless steel.Wavelength dispersive X-ray fluorescence spectrometry
SN/T 3113-2012 Ferromolybdenum.Determination of silicon contents.Silicomolybdic blue spectrophotometric method
SN/T 0832-1999 Determination of iron,silicon,calcium,manganese,aluminium,titanium,magnesium and phosphorus in iron ores for import and export.Wavelength dispersive X-ray fluorescence spectrometric method
SN/T 2953-2011 Determination of silicon, manganese, phosphorus and chromium in pig iron by inductively coupled plasma atomic emission spectrometry
SN/T 2638.1-2010 Determination of manganese,iron,silicon,aluminum,calcium,magnesium,titanium,potassium and phosphorus in manganese ores for import and export.Wavelength dispersive X-ray fluorescence spectrometric method
SN/T 2254-2009 Determination of aluminum,silicon,vanadium in residual fuel oils.Inductively coupled plasma atomic emission spectrometry
SN/T 4304-2015 Determination of aluminum, magnesium, lead, silicon in barium chloride dihydrate for export.Inductively coupled plasma atomic emission spectrometry
SN/T 2949-2011 Determination of silicon dioxide, ferric oxide, aluminum oxide, calcium oxide and magnesium oxide in talc for export X-ray fluorescence spectrometry

International Organization for Standardization (ISO), Spectrum of a silicon wafer

ISO 5400:1984 Leather; Determination of total silicon content; Reduced molybdosilicate spectrometric method
ISO 9502:1993 Metallurgical-grade fluorspar; determination of silica content; reduced-molybdosilicate spectrometric method
ISO 5438:1993 Acid-grade and ceramic-grade fluorspar; determination of silica content; reduced-molybdosilicate spectrometric method
ISO 9502:1989 Metallurgical-grade fluorspar — Determination of silica content — Reduced-molybdosilicate spectrometric method
ISO 4139:1979 Ferrosilicon; determination of aluminium content; Flame atomic absorption spectrometric method
ISO 17331:2004 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
ISO 6774:1981 Cinematography; Spectral response of photographic sound reproducers for 8 mm Type S motion-picture films; Specifications
ISO 5438:1985 Acid-grade and ceramic-grade fluorspar — Determination of silica content — Reduced molybdosilicate spectrometric method
ISO 2613-1 Analysis of natural gas — Silicon content of biomethane — Part 1: Determination of total silicon by atomic emission spectroscopy (AES)
ISO 5935:1980 Crude sodium borates for industrial use; Determination of total and alkali-soluble silica contents; Molybdosilicate spectrometric method
ISO 5935:1984 Crude sodium borates for industrial use; Determination of total and alkali-soluble silica contents; Molybdosilicate spectrometric method
ISO 2613-1:2023 Analysis of natural gas — Silicon content of biomethane — Part 1: Determination of total silicon by atomic emission spectroscopy (AES)
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 9516:1992 Iron ores; determination of silicon, calcium, manganese, aluminium, titanium, magnesium, phosphorus, sulfur and potassium; wavelength dispersive X-ray fluorescence spectrometric method
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 17331:2004/Amd 1:2010 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1
ISO 4686:1980 Iron ores — Determination of silicon content — Reduced molybdosilicate spectrophotometric method
ISO 5997:1984 Chromium ores and concentrates; Determination of silicon content; Molecular absorption spectrometric method and gravimetric method
ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
ISO 4829-2:2016 Steels - Determination of total silicon contents - Reduced molybdosilicate spectrophotometric method - Part 2: Silicon contents between 0,01 % and 0,05 %
ISO 6382:1981 General method for determination of silicon content; Reduced molybdosilicate spectrophotometric method
ISO 5400:1984 | IULTCS Leather — Determination of total silicon content — Reduced molybdosilicate spectrometric method
ISO 7530-8:1992 Nickel alloys; flame atomic absorption spectrometric analysis; part 8: determination of silicon content
ISO 4829-2:1988 Steel and iron; determinaiton of total silicon content; reduced molybdosilicate spectrophotometric method; part 2: silicon contents between 0,01 and 0,05 %
ISO 4829-1:1986 Steel and cast iron; Determination of total silicon content; Reduced molybdosilicate spectrophotometric method; Part 1 : Silicon contents between 0,05 and 1,0 %
ISO 4829-1:2018 Steel and cast iron - Determination of total silicon contents - Reduced molybdosilicate spectrophotometric method - Part 1: Silicon contents between 0,05 % and 1,0 %
ISO 2598-2:1992 Iron ores; determination of silicon content; part 2: reduced molybdosilicate spectrophotometric method
ISO/TR 17055:2002 Steel - Determination of silicon content - Inductively coupled plasma atomic emission spectrometric method

PL-PKN, Spectrum of a silicon wafer

PN C04348-1970 Solid fuels. Determinatiom of silicon, aluminium, iron, calcium and mag- nesium in ashes by the spectrogra- phic method
PN H04155-09-1986 Chemical analysis of silica raw materials and refractory products Method spectrographic
PN Z04018-02-1991 Air purity protection Tests for free crystalline silica content Determination of free crystalline silica in total dust in work places by infrared absorption spectrophotometry
PN Z04018-03-1991 Air purity protection Tests for free crystalline silica content Determination of free crystalline silicain respirable dust in work places by infrared absorption spectrophotomery
PN BN 6045-01-1964

German Institute for Standardization, Spectrum of a silicon wafer

DIN V VDE V 0126-18-2-1:2007 Solar wafers - Part 2-1: Measuring the geometric dimensions of silicon wafers - Wafer thickness
DIN V VDE V 0126-18-3:2007 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)
DIN V VDE V 0126-18-2-2:2007 Solar wafers - Part 2-2: Measuring the geometric dimensions of silicon wafers - Variations in thickness
DIN 58750-2:1995 Test of polishing agents for optical engineering - Part 2: Polishing performance for spectacle lenses of silicate and of synthetic material
DIN V VDE V 0126-18-6:2007 Solar wafers - Part 6: Method for the measuring of substitutional atomic carbon and interstitial oxygen in silicon used for photovoltaic
DIN EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing; German version EN 50513:2009
DIN V VDE V 0126-18-2-3:2007 Solar wafers - Part 2-3: Measuring the geometric dimensions of silicon wafers - Waviness and warping
DIN EN ISO 2613-1:2023-11 Analysis of natural gas - Silicon content of biomethane - Part 1: Determination of total silicon by atomic emission spectroscopy (AES) (ISO 2613-1:2023); German version EN ISO 2613-1:2023
DIN V VDE V 0126-18-2-4:2007 Solar wafers - Part 2-4: Measuring the geometric dimensions of silicon wafers - Saw marks and step type saw marks
DIN 5030-3:1984 Spectral measurement of radiation; spectral isolation; definitions and characteristics
DIN 5030-3:2021 Spectral measurement of radiation - Spectral isolation - Definitions and characteristics
DIN EN ISO 4829-2:2016-08 Steels - Determination of total silicon contents - Reduced molybdosilicate spectrophotometric method - Part 2: Silicon contents between 0,01 % and 0,05 % (ISO 4829-2:2016); German version EN ISO 4829-2:2016
DIN 51083-6:1992 Testing of ceramic materials; chemical analysis of alumosilicates; determination of the iron and manganese content by atomic absorption spectrometry

European Committee for Standardization (CEN), Spectrum of a silicon wafer

PD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
FprEN ISO 2613-1 Analysis of natural gas - Silicon content of biomethane - Part 1: Determination of total silicon by atomic emission spectroscopy (AES) (ISO/FDIS 2613-1:2023)
prEN 10201-1988 Chemical analysis of ferrous materials; determination of silicon in steel and iron; flame atomic absoption spectrometric method
PD CEN/TR 10353:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry

Society of Motion Picture and Television Engineers (SMPTE), Spectrum of a silicon wafer

SMPTE RP 180-1999 Spectral Conditions Defining Printing Density in Motion-Picture Negative and Intermediate Films
SMPTE ST 117M-2001 Motion-Picture Film - Photographic Audio Record - Spectral Diffuse Density
SMPTE 117M-2001 Motion-Picture Film - Photographic Audio Record - Spectral Diffuse Density
SMPTE 411M-2006 Motion-Picture Film - Cinematography - Spectral Response of Photographic Audio Reproducers for Analog Dye Sound-Tracks on 35-mm Film

RO-ASRO, Spectrum of a silicon wafer

SR ISO 4139:1995 Ferrosilicon. Determination of aluminium content. Flame atomic absorption spectrometric method
STAS 11359/8-1980 NATIVE SULPHUR ORES AND CONCENTRATES Aluminium, calcium, magnesium, iron and silicon spectral analysis
STAS 10837/2-1977 SELENIUM Semiquantitative spectral determination of iron, silicon, silver, copper, magnesium, lead, tin, stibium and arsenic impurities
STAS 11464-1980 IRON AND STEEL Spectrochemical analysis
STAS SR 11039-5-1996 Silicocalcium. Determination of phosphorus content. Spectrophotometric method

YU-JUS, Spectrum of a silicon wafer

JUS H.B8.091-1980 Cryolite, natural and artificial. Determination oj' si licem content. RcduceJ molybdosilicute speetrophotometric method
JUS H.B8.176-1979 Sodium fluoride primarily used for the production of ahiminium. Determination of silicon content. Reduced molibdosilicate spectrophotometric method
JUS B.G8.305-1988 Ores and concentrates. Chromium ores and concentrates. Determination of silicon content. Spectrometric and gravimetric mcthods

Defense Logistics Agency, Spectrum of a silicon wafer

DLA DSCC-VID-V62/03638 REV B-2008 MICROCIRCUIT, LINEAR, DIFFERENTIAL COMPARATOR WITH STROBES, MONOLITHIC SILICON
DLA SMD-5962-87729 REV E-2006 MICROCIRCUIT, DIGITAL, ECL, 8-LINE MULTIPLEXER, MONOLITHIC SILICON
DLA SMD-5962-87752 REV C-2006 MICROCIRCUIT, DIGITAL, ECL, PHASE FREQUENCY DETECTOR, MONOLITHIC SILICON
DLA SMD-5962-87792 REV B-2005 MICROCIRCUIT, DIGITAL, ECL MULTIPLEXER MONOLITHIC SILICON
DLA SMD-5962-94622 REV A-2011 MICROCIRCUIT, LINEAR, LAMP DRIVER, FLUORESCENT, MONOLITHIC SILICON
DLA SMD-5962-88527 REV B-2001 MICROCIRCUIT, DIGITAL, ECL, 8-LINE MULTIPLEXER, MONOLITHIC SILICON
DLA SMD-5962-88560 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, ECL, 64-BIT RAM, MONOLITHIC SILICON
DLA SMD-5962-94622-1994 MICROCIRCUIT, LINEAR, LAMP DRIVER, FLUORESCENT, MONOLITHIC SILICON
DLA SMD-5962-87730 REV B-1991 MICROCIRCUITS, DIGITAL, ECL, 4 WIDE OR-AND/OR-AND-INVERT GATE, MONOLITHIC SILICON
DLA SMD-5962-87751 REV A-2007 MICROCIRCUIT, DIGITAL, ECL, COUNTER CONTROL LOGIC, MONOLITHIC SILICON
DLA SMD-5962-87773 REV B-2007 MICROCIRCUIT, DIGITAL, ECL, ONE SHOT MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-88577 REV C-2001 MICROCIRCUIT, DIGITAL, ECL, 3 INPUT OR-AND/OR-AND-INVERT GATE, MONOLITHIC SILICON
DLA SMD-5962-87727 REV C-2005 MICROCIRCUIT, DIGITAL, ECL, TRIPLE, 2-INPUT EXCLUSIVE OR/NOR GATE, MONOLITHIC SILICON
DLA SMD-5962-87793 REV A-2001 MICROCIRCUIT, DIGITAL, ECL, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-88684 REV A-2007 MICROCIRCUIT, DIGITAL, ECL, COUNTER DIVIDE BY 64 PRESCALER, MONOLITHIC SILICON
DLA MIL-M-38510/440C-1986 MICROCIRCUITS, DIGITAL, FOUR-BIT MICROPROCESSOR SLICE MONOLITHIC SILICON
DLA SMD-5962-06207 REV A-2006 MICROCIRCUIT, DIGITAL-LINEAR, 3 V, RS-232, RECEIVER / TRANSMITTER TRANCEIVER, MONOLITHIC SILICON
DLA MIL-M-38510/111 A VALID NOTICE 2-2008 Microcircuits, Analog Switch with Driver, Monolithic and Multi- Chip Silicon
DLA MIL-M-38510/111 A VALID NOTICE 1-2008 Microcircuits, Analog Switch with Driver, Monolithic and Multi- Chip Silicon
DLA SMD-5962-94678-1994 MICROCIRCUIT, LINEAR, 20 MSPS FLASH A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-87728 REV B-1991 MICROCIRCUITS, DIGITAL, ECL, 4 WIDE 4-3-3-3 INPUT OR-AND GATE, MONOLITHIC SILICON

Professional Standard - Ferrous Metallurgy, Spectrum of a silicon wafer

YB/T 5159-2007 Determination of trace boron in graphite products of High purty by spectroscopical method The powder method
YB/T 5159-1993 Powder method for spectroscopic determination of silicon and iron in high-purity graphite products
YB/T 4174.1-2008 Determination of Aluminum Content in Silicon Calcium Alloy by Inductively Coupled Plasma Emission Spectrometry
YB/T 4174.2-2008 Determination of Phosphorus Content in Silicon Calcium Alloy Inductively Coupled Plasma Emission Spectrometry
YB/T 5156-1993 Determination of silicon in graphite products of high purity by silicon-molybdenum blue potometric method
YB/T 5329-2009 Determination of content of vanadium silicon pentoxide by silicon molybdenum blue spectrophotometry
YB/T 4231-2010 Determination of silicon barium aluminum, silicon calcium barium and silicon calcium barium aluminum alloy aluminum, barium, iron, calcium, manganese, copper, chromium, nickel and phosphorus content by inductively coupled plasma emission spectrometry
YB/T 4462-2015 High purity ferrosilicon.Determination of boron content.Inductively coupled plasma atomic emission spectrometric method
YB/T 178.5-2012 Silicon-aluminium alloy and silicon-barium-aluminium alloy.Determination of phosphorus content.The molybdenum blue spectrophotometric method
YB/T 4461-2015 High purity ferrosilicon.Determination of zirconium and molybdenum content.Inductively coupled plasma atomic emission spectrometric method
YB/T 178.8-2012 Silicon-aluminium alloy and silicon-barium-aluminium alloy.Determination of phosphorus content.The molybdobismuthylphosphoric blue spectrophotometric method

IN-BIS, Spectrum of a silicon wafer

IS 6010-1971

American Society for Testing and Materials (ASTM), Spectrum of a silicon wafer

ASTM E463-98 Standard Test Method for Silica in Fluorspar by the Silico-Molybdate Visible Spectrometry
ASTM E463-08 Standard Test Method for Silica in Fluorspar by the Silico-Molybdate Visible Spectrometry
ASTM F523-93(1997) Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
ASTM E463-14 Standard Test Method for Determination of Silica in Fluorspar by Silico-Molybdate Visible Spectrometry
ASTM F1727-97 Standard Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers
ASTM F1619-95(2000) Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle
ASTM E1614-94(1999) Standard Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in Remote Fiber-Optic Spectroscopy and Broadband Systems
ASTM E1614-94(2021) Standard Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in Remote Fiber-Optic Spectroscopy and Broadband Systems
ASTM E1614-94(2013) Standard Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in???Remote???Fiber-Optic Spectroscopy???and Broadband???Systems
ASTM E1614-94(2004) Standard Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in Remote Fiber-Optic Spectroscopy and Broadband Systems
ASTM F534-97 Standard Test Method for Bow of Silicon Wafers
ASTM F1723-96 Standard Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy
ASTM D5184-12 Standard Test Methods for Determination of Aluminum and Silicon in Fuel Oils by Ashing, Fusion, Inductively Coupled Plasma Atomic Emission Spectrometry, and Atomic Absorption Spectrometry
ASTM D8182-18 Standard Test Method for Alloy Classification of Wear Debris using Laser-Induced Breakdown Spectroscopy (LIBS)
ASTM E388-04(2015) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
ASTM D8230-19 Standard Test Method for Measurement of Volatile Silicon-Containing Compounds in a Gaseous Fuel Sample Using Gas Chromatography with Spectroscopic Detection
ASTM F1708-96 Standard Practice for Evaluation of Granular Polysilicon by Meter-Zoner Spectroscopies
ASTM F1152-93 Standard Test Method for Dimensions of Notches on Silicon Wafers
ASTM F1152-93(2001) Standard Test Method for Dimensions of Notches on Silicon Wafers
ASTM E388-04(2023) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
ASTM D7757-22 Standard Test Method for Silicon in Gasoline and Related Products by Monochromatic Wavelength Dispersive X-ray Fluorescence Spectrometry
ASTM D6129-97(2021) Standard Test Method for Silicon in Engine Coolant Concentrates by Atomic Absorption Spectroscopy
ASTM C1842-16 Standard Test Method for The Analysis of Boron and Silicon in Uranium Hexfluoride via Fourier-Transform Infrared (FTIR) Spectroscopy
ASTM D6129-97(2015) Standard Test Method for Silicon in Engine Coolant Concentrates by Atomic Absorption Spectroscopy
ASTM D5184-00 Standard Test Methods for Determination of Aluminum and Silicon in Fuel Oils by Ashing, Fusion, Inductively Coupled Plasma Atomic Emission Spectrometry, and Atomic Absorption Spectrometry
ASTM D5184-12(2017) Standard Test Methods for Determination of Aluminum and Silicon in Fuel Oils by Ashing, Fusion, Inductively Coupled Plasma Atomic Emission Spectrometry, and Atomic Absorption Spectrometry
ASTM D5184-22 Standard Test Methods for Determination of Aluminum and Silicon in Fuel Oils by Ashing, Fusion, Inductively Coupled Plasma Atomic Emission Spectrometry, and Atomic Absorption Spectrometry
ASTM F1618-96 Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers
ASTM F1726-97 Standard Guide for Analyis of Crystallographic Perfection of Silicon Wafers
ASTM E463-14a Standard Test Method for Determination of Silica in Fluorspar by Silico-Molybdate Visible Spectrophotometry
ASTM D6129-97(2007) Standard Test Method for Silicon in Engine Coolant Concentrates by Atomic Absorption Spectroscopy
ASTM D6129-97 Standard Test Method for Silicon in Engine Coolant Concentrates by Atomic Absorption Spectroscopy
ASTM D6129-97(2002) Standard Test Method for Silicon in Engine Coolant Concentrates by Atomic Absorption Spectroscopy

Anhui Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

DB34/T 3082-2018 Determination of Calcium, Magnesium, Silicon, Iron, Aluminum, Manganese and Potassium in Calcite X-ray Fluorescence Spectrometry

Military Standard of the People's Republic of China-General Armament Department, Spectrum of a silicon wafer

GJB 2918A-2017 Specification for polished wafers of molten silicon single crystal in detector grade high resistance zone
GJB 249-1987 Silicone rubber coated nickel chromium heating element
GJB 249A-2021 Specification for silicone rubber-coated nickel-chromium heating elements

BE-NBN, Spectrum of a silicon wafer

NBN T 03-367-1988 Crude sodium borates for industrial use - Determination of total and alkali-soluble silica contents - Molybdosilicate spectrometric method

Standard Association of Australia （SAA）, Spectrum of a silicon wafer

AS 2564:1982 Aluminium ores - Determination of aluminium, silicon, iron, titanium and phosphorus contents - Wavelength dispersive X-ray fluorescence spectrometric method
AS 2564:1982(R2013)

Inner Mongolia Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

DB15/T 1242-2017 Determination of hexachlorosiloxane content in chlorosilane gas chromatography-mass spectrometry
DB15/T 1241-2017 Determination of silane content in tail gas of polysilicon produced by silane method Gas chromatography
DB15/T 1240-2017 Determination of Iron, Aluminum, Calcium, Titanium, Boron, Phosphorus in Silicon Powder by Inductively Coupled Plasma Emission Spectrometry

海关总署, Spectrum of a silicon wafer

SN/T 5349-2021 Determination of siloxane compounds in silica heat-resistant materials by gas chromatography-mass spectrometry/mass spectrometry
SN/T 5251-2020 Determination of sodium, aluminum, silicon, calcium, titanium, vanadium, manganese, iron, nickel and sulfur content in imported and exported petroleum coke by wavelength dispersive X-ray fluorescence spectrometry

American National Standards Institute （ANSI), Spectrum of a silicon wafer

BS EN ISO 2613-1:2023 Analysis of natural gas. Silicon content of biomethane Determination of total silicon by atomic emission spectroscopy (AES) (British Standard)
ANSI/ASTM D6129:1998 Test Method for Silicon in Engine Coolant Concentrates by Atomic Absorption Spectroscopy
ANSI/TIA/EIA 455-120-1996 Modeling Spectral Attenuation on Optical Fiber
ANSI/TIA/EIA 455-126-2000 Spectral Characterization of LEDs
ANSI/EIA/TIA 455-127:1991 Spectral Characterization of Multimode Lasers

VN-TCVN, Spectrum of a silicon wafer

TCVN 4156-2009 Ferrosilicon.Determination of aluminium content.Flame atomic absorption spectrometric method

KR-KS, Spectrum of a silicon wafer

KS D ISO 19272-2018(2023) Low alloyed steel — Determination of C, Si, Mn, P, S, Cr, Ni, Al, Ti and Cu - Glow discharge optical emission spectrometry (routine method)
KS M ISO 5935-2006 Crude sodium borates for industrial use－Determination of total and alkali-soluble silica contents－Molybdosilicate spectrometric method
KS D ISO 1975-2003(2023) Magnesium and magnesium alloys－Determination of silicon－Spectrophotometric method with the reduced silicomolybdic complex

Professional Standard - Aviation, Spectrum of a silicon wafer

HB 5297.11-1984 Determination of Silicon Content in Titanium Alloys by Silicon-Molybdenum Blue Absorption Spectrophotometry
HB 7716.12-2002 Spectrometric analysis of titanium alloys Part 12:Determination of silicon content-Flame atomic absorption spectrometric method
HB 6731.12-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 10:Determination of silicon content by inductivel coupled plasma atomic spectrometric method

国家能源局, Spectrum of a silicon wafer

NB/SH/T 0993-2019 Determination of silicon content in gasoline and related products by single-wavelength dispersive X-ray fluorescence spectrometry

Professional Standard - Energy, Spectrum of a silicon wafer

NB/T 11260-2023

Sichuan Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

DB51/T 1692-2013 Determination of Silicon Content in Gasoline by Inductively Coupled Plasma Emission Spectrometry

Professional Standard - Water Conservancy, Spectrum of a silicon wafer

SL 91.1-1994 Determination of silica (dissolved)(molybdosilicate method)
SL 91.2-1994 Determination of silica (dissolved)(hetropoly blue method)

Professional Standard - Chemical Industry, Spectrum of a silicon wafer

HG/T 6153-2023 Determination of ethyldichlorosilane in methylchlorosilane by gas chromatography-mass spectrometry

Danish Standards Foundation, Spectrum of a silicon wafer

DS/CEN/TR 10354:2012 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
DS/ISO 4829-2:1991 Steel and iron. Determinaiton of total silicon content. Reduced molybdosilicate spectrophotometric method. Part 2: Silicon contents between 0,01 and 0,05 %

Institute of Electrical and Electronics Engineers (IEEE), Spectrum of a silicon wafer

SMPTE RP 180:1999 RP 180:1999 - SMPTE Recommended Practice - Spectral Conditions Defining Printing Density in Motion-Picture Negative and Intermediate Films

Professional Standard - Petrochemical Industry, Spectrum of a silicon wafer

SH/T 0706-2001 Petroleum products-Determination of aluminium and silicon in fuel oils-Inductively coupled plasma emission and atomic absorption spectroscopy methods

Fujian Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

DB35/T 1146-2011 Determination of Impurity Element Content in Silicon Materials by Glow Discharge Mass Spectrometry

Liaoning Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

DB21/T 2070-2013 Chemical Analysis of Aluminosilicate Refractories by Atomic Absorption Spectrometry

Yunnan Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

DB53/T 421-2012 Determination of boron in industrial silicon by inductively coupled plasma atomic emission spectrometry
DB53/T 574-2014 Phosphate rock phosphorus, magnesium, iron, aluminum, silicon, calcium, potassium, sodium oxide content determination wavelength dispersive X-ray fluorescence spectrometry

European Committee for Electrotechnical Standardization（CENELEC）, Spectrum of a silicon wafer

EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing

ES-AENOR, Spectrum of a silicon wafer

Professional Standard - Urban Construction, Spectrum of a silicon wafer

CJ/T 141-2001 Urban water supply-Determination of silica dioxide-Molybdosilicate blue method

Heilongjiang Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

DB23/T 1906-2017 Determination of content of magnesium, aluminum, silicon, potassium, calcium and iron in graphite raw ore and concentrate X-ray fluorescence spectrometry

CZ-CSN, Spectrum of a silicon wafer

CSN ISO 808:1992 Aluminium and aluminium alloys - Determination of silicon - Spectrophotometric method with the reduced silicomolybdic complex
CSN 66 6906-1988 Spools for X-ray films

CH-SNV, Spectrum of a silicon wafer

SEV 1004-1959

BR-ABNT, Spectrum of a silicon wafer

ABNT P-MB-514-1969

ZA-SANS, Spectrum of a silicon wafer

SANS 5567:1968 Spectrographic analysis of copper

TIA - Telecommunications Industry Association, Spectrum of a silicon wafer

TIA-455-126-2007 Spectral Characterization of LEDs
TIA/EIA-455-120-1996 FOTP-120 Modeling Spectral Attenuation on Optical Fiber

International Commission on Illumination (CIE), Spectrum of a silicon wafer

CIE 63-1984 The Spectroradiometric Measurement of Light Sources (E)
CIE 151-2003 SPECTRAL WEIGHTING OF SOLAR ULTRAVIOLET RADIATION

Taiwan Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

CNS 13875-1997 Method of test for aluminum and silicon in fuel oils by ashing,fusion,inductively coupled plasma atomic emission spectrometry and atomic absorption spectrometry

National Health Commission of the People's Republic of China, Spectrum of a silicon wafer

GB 23200.53-2016 National food safety standards— Determination of flusilazole residue in foods Gas chromatography-mass spectrometry

CEN - European Committee for Standardization, Spectrum of a silicon wafer

EN ISO 4829-1:2018 Steel and cast iron - Determination of total silicon contents - Reduced molybdosilicate spectrophotometric method - Part 1: Silicon contents between 0@05 % and 1@0 %

International Electrotechnical Commission (IEC), Spectrum of a silicon wafer

IEC 61976:2000 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe nuclear gamma-ray spectrometry
IEC 62047-9:2011 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
IEC 62047-9:2011/COR1:2012 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS

Qinghai Provincial Standard of the People's Republic of China, Spectrum of a silicon wafer

DB63/T 1823-2020 Determination of Available Silicon in Soil by Citric Acid Extraction Inductively Coupled Plasma Emission Spectrometry

TN-INNORPI, Spectrum of a silicon wafer

NT 70.10-1983

Professional Standard - Rare Earth, Spectrum of a silicon wafer

XB/T 601.5-2008 Chemical analysis methods of lanthanum boride.Determination of acid dissolving silicon content.Silicon molybdenum blue spectral luminosity method

Professional Standard - Geology, Spectrum of a silicon wafer

DZ/T 0064.62-2021 Methods of analysis of groundwater quality - Part 62: Determination of silicic acid by silicon molybdenum yellow spectrophotometric method
DZ/T 0064.63-2021 Methods of analysis of groundwater quality - Part 63: Determination of silicic acid by silicon molybdenum blue spectrophotometric method

TR-TSE, Spectrum of a silicon wafer

TS 3617-1981 SODIUM FLUORIDE PRIMARILY USED FOR THE PRODUCTION OF ALUMINIUM — DETERMINATION OF SILICA CONTENT — REDUCED MOLYBDOSILICATE SPECTROPHOTOMETRIC METHOD

Professional Standard - Agriculture, Spectrum of a silicon wafer

SN/T 5578-2023 Determination of Methylcyclosiloxanes in Leather by Headspace-Gas Chromatography-Mass Spectrometry

Professional Standard - Building Materials, Spectrum of a silicon wafer

JC/T 2133-2012 Determination of impurities in silica sol for polishing solution in semiconductor industry.Inductively coupled plasma atomic emission spectrometric method