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in vitro electronic scanning

in vitro electronic scanning, Total:332 items.

In the international standard classification, in vitro electronic scanning involves: Optical equipment, Analytical chemistry, Photography, Optics and optical measurements, Physics. Chemistry, Linear and angular measurements, Vocabularies, Medical equipment, Education, Integrated circuits. Microelectronics, Semiconductor devices, Electronic display devices, Protection against crime, Thermodynamics and temperature measurements, Data storage devices, Surface treatment and coating, Document imaging applications, Microprocessor systems, Textile fibres, Construction materials, Air quality, Metrology and measurement in general, Electronic tubes, Iron and steel products, Ceramics, Languages used in information technology, On-board equipment and instruments, Paints and varnishes, Medical sciences and health care facilities in general, Applications of information technology, Electrical accessories, Electromagnetic compatibility (EMC), Paint ingredients, Software development and system documentation, Mechanical structures for electronic equipment, Lubricants, industrial oils and related products.


Japanese Industrial Standards Committee (JISC), in vitro electronic scanning

  • JIS K 0132:1997 General rules for scanning electron microscopy
  • JIS K 7542:1993 Dimensions of photographic film for electronic scanner use
  • JIS T 1507:1989 Electronic linear scanning ultrasonic diagnostic equipment
  • JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
  • JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
  • JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS T 61675-1:2016 Radionuclide imaging devices -- Characteristics and test conditions -- Part 1: Positron emission tomographs

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, in vitro electronic scanning

  • GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
  • GB/T 33838-2017 Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness

International Organization for Standardization (ISO), in vitro electronic scanning

  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 11312:1993 Photography; film dimensions; film for electronic scanner use
  • ISO 16067-2:2004 Photography - Electronic scanners for photographic images - Spatial resolution measurements - Part 2: Film scanners
  • ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 16067-1:2003 Photography - Spatial resolution measurements of electronic scanners for photographic images - Part 1: Scanners for reflective media
  • ISO 21550:2004 Photography - Electronic scanners for photographic images - Dynamic range measurements
  • ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
  • ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
  • ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
  • ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • ISO 12653-1:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Part 1: Characteristics
  • ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
  • ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
  • ISO 12653-2:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Part 2: Method of use
  • ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
  • ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
  • ISO 12653-2:2000/cor 1:2002 Electronic imaging - Test target for the black-and-white scanning of office documents - Part 2: Method of use; Technical Corrigendum 1
  • ISO 14535:2001 Photography - Room-light loading packages for electronic scanners and image-setting film and paper rolls - Dimensions and related requirements
  • ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
  • ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
  • ISO 12653-3:2014 Electronic imaging - Test target for scanning of office documents - Part 3: Test target for use in lower resolution applications
  • ISO 16000-27:2014 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • ISO 17751-2:2014 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends — Part 2: Scanning electron microscopy method
  • ISO 17751-2:2023 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends — Part 2: Scanning electron microscopy method
  • ISO 17751-2:2016 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends - Part 2: Scanning electron microscopy method

Professional Standard - Chemical Industry, in vitro electronic scanning

  • HG/T 3640-1999 Photography.Film dimension.Film for electronic scanner use

National Metrological Technical Specifications of the People's Republic of China, in vitro electronic scanning

  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery, in vitro electronic scanning

National Metrological Verification Regulations of the People's Republic of China, in vitro electronic scanning

Group Standards of the People's Republic of China, in vitro electronic scanning

国家市场监督管理总局、中国国家标准化管理委员会, in vitro electronic scanning

  • GB/T 39867-2021 Bismuth germanate scintillation crystal for positron emission tomography
  • GB/T 40826-2021 Test method for hand-arranging staple length of dehaired cashmere—Flatbed scanner method
  • GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
  • GB/T 20493.3-2018 Electronic imaging—Test target for scanning of office documents—Part3:Test target for use in lower resolution applications
  • GB/T 41126-2021 Cross-border E-commerce—Specification for information description of export trade entity

Korean Agency for Technology and Standards (KATS), in vitro electronic scanning

  • KS M 0044-1999
  • KS I 0051-1999(2019) General rules for scanning electron microscopy
  • KS A ISO 16067-2-2005(2020) Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
  • KS I 0051-1999 General rules for scanning electron microscopy
  • KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
  • KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
  • KS A ISO 16067-2:2005 Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
  • KS D ISO 16700:2013 Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
  • KS A ISO 16067-1:2005 Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media
  • KS A ISO 16067-1-2005(2020) Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media
  • KS X ISO/IEC 15780:2013 Information technology-8 mm wide magnetic tape cartridge-Helical scan recording-AIT-1 format
  • KS A ISO 21550:2005 Photography-Electronic scanners for photographic images-Dynamic range measurements
  • KS A ISO 21550-2005(2020) Photography-Electronic scanners for photographic images-Dynamic range measurements
  • KS D ISO 9220:2009 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 9220-2009(2022) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 9220-2009(2017) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 16700-2013(2018) Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
  • KS X ISO 12653-1-2007(2017) Electronic imaging-Test target for the black-and-white scanning of office documents-Part 1:Characteristics
  • KS X ISO 12653-1-2007(2022) Electronic imaging-Test target for the black-and-white scanning of office documents-Part 1:Characteristics
  • KS X ISO 12653-1:2007 Electronic imaging-Test target for the black-and-white scanning of office documents-Part 1:Characteristics
  • KS C IEC TR 61948-3:2020 Nuclear medicine instrumentation — Routine tests —Part 3: Positron emission tomographs
  • KS C IEC TR 61948-3:2017 Nuclear medicine instrumentation ─ Routine tests ─ Part 3: Positron emission tomographs
  • KS X ISO 12653-2-2007(2022) Electronic imaging-Test target for the black-and-white scanning of office documents-Part 2:Method of use
  • KS X ISO 12653-2-2007(2017) Electronic imaging-Test target for the black-and-white scanning of office documents-Part 2:Method of use
  • KS X ISO 12653-2:2007 Electronic imaging-Test target for the black-and-white scanning of office documents-Part 2:Method of use
  • KS K ISO 17751-2:2019 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends — Part 2: Scanning electron microscopy method

PT-IPQ, in vitro electronic scanning

SE-SIS, in vitro electronic scanning

  • SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
  • SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

RU-GOST R, in vitro electronic scanning

  • GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
  • GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
  • GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
  • GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
  • GOST R 56109-2014 Medical electrical equipment. Positron emission tomographs together with X-ray equipment for computed tomography. Technical requirements for governmental purchases
  • GOST R 56108-2014 Medical electrical equipment. Positron emission tomograph. Technical requirements for governmental purchases
  • GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
  • GOST R 8.630-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Methods for verification
  • GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
  • GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
  • GOST 19438.21-1979 Low-power electronic tubes and valves for output cascades of TV line scanninp. Methods of measurement of electrice parametres and test for service time
  • GOST R 56123-2014 Medical electrical equipment. Single photon emission computed tomographs. Technical requirements for governmental purchases
  • GOST ISO 16000-27-2017 Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • GOST R IEC/TO 61948-2-2008 Nuclear medicine instrumentation. Routine tests. Part 2. Scintillation cameras and single photon emission computed tomography imaging
  • GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope

Professional Standard - Military and Civilian Products, in vitro electronic scanning

  • WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

British Standards Institution (BSI), in vitro electronic scanning

  • BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
  • BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media
  • BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
  • BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • BS ISO 21550:2004 Photography - Electronic scanners for photographic images - Dynamic range measurements
  • BS ISO 12653-1:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Characteristics
  • BS ISO 12653-1:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Characteristics
  • BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
  • BS ISO 12653-2:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Method of use
  • BS ISO 12653-2:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Method of use
  • 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • PD IEC/TR 61948-3:2018 Tracked Changes. Nuclear medicine instrumentation. Routine tests. Positron emission tomographs
  • BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
  • 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
  • BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
  • 18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
  • BS ISO 12653-3:2014 Electronic imaging. Test target for scanning of office documents. Test target for use in lower resolution applications
  • 18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
  • BS EN IEC 61675-1:2022 Tracked Changes. Radionuclide imaging devices. Characteristics and test conditions. Positron emission tomographs
  • BS ISO 14535:2001 Photography - Room-light loading packages for electronic scanners and image-setting film and paper rolls - Dimensions and related requirements
  • BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
  • BS EN ISO 17751-2:2023 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Scanning electron microscopy method
  • DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • BS EN ISO 17751-2:2016 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends. Scanning Electron Microscopy method
  • 20/30423980 DC BS EN IEC 61675-1. Radionuclide imaging devices. Characteristics and test conditions. Part 1. Positron emission tomographs
  • BS EN 50090-6-2:2021 Home and Building Electronic Systems (HBES) - IoT Semantic Ontology model description
  • 12/30228339 DC BS ISO 16000-27. Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • BS EN 62656-5:2017 Standardized product ontology register and transfer by spreadsheets. Interface for activity description
  • BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

KR-KS, in vitro electronic scanning

  • KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS C IEC TR 61948-3-2020 Nuclear medicine instrumentation — Routine tests —Part 3: Positron emission tomographs
  • KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
  • KS K ISO 17751-2-2019 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends — Part 2: Scanning electron microscopy method

Professional Standard - Education, in vitro electronic scanning

  • JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
  • JY/T 010-1996 General principles of analytical scanning electron microscopy

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, in vitro electronic scanning

  • GB/T 23414-2009 Microbeam analysis.Scanning electron microscopy.Vocabulary
  • GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
  • GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
  • GB/T 20493.1-2006 Electronic imaging Test traget for the black-and-white scanning of office documents Part 1: Characteristics
  • GB/T 43196-2023 Nanotechnology Scanning Electron Microscopy to Measure Nanoparticle Size and Shape Distribution
  • GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
  • GB/T 20493.2-2006 Electronic imaging. Test target for the black-and-white scanning of office documents. Part 2: Method of use
  • GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
  • GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
  • GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
  • GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
  • GB/T 32869-2016 Nanotechnologies.Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • GB/T 19665-2005 General specification for electronic infrared imaging thermometer of body skin

American Society for Testing and Materials (ASTM), in vitro electronic scanning

  • ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM D8231-19 Standard Practice for the Use of a Low Voltage Electronic Scanning System for Detecting and Locating Breaches in Roofing and Waterproofing Membranes
  • ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
  • ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM E1479-16 Standard Practice for Describing and Specifying Inductively Coupled Plasma Atomic Emission Spectrometers
  • ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
  • ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
  • ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
  • ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
  • ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
  • ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
  • ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM D6059-96(2001) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
  • ASTM D6059-96 Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
  • ASTM D6059-96(2006) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
  • ASTM E3309-21 Standard Guide for Reporting of Forensic Primer Gunshot Residue (pGSR) Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
  • ASTM D8315-20 Standard Test Method for Determination of Wear Metals and Contamination Elements in Used Industrial Oils by Sweeping Flat Electrode Atomic Emission Spectrometry

Association Francaise de Normalisation, in vitro electronic scanning

  • NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
  • NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
  • NF Z42-010-1:1992 Electronic imaging - Scanning of office documents - part1:Subcontracting of scanning - Guide to detailed technical instructions for bureaux
  • NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
  • NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
  • XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
  • NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
  • NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
  • NF Z42-010-2:1993 Electronic imaging - Scanning of office documents - Part2:Acquisition of electronic imaging management systems - Guidelines for a request for proposals
  • NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
  • NF EN IEC 61675-1:2022 Dispositifs d'imagerie par radionucléides - Caractéristiques et conditions d'essai - Partie 1 : tomographes à émission de positrons
  • NF ISO 16000-27:2014 Air intérieur - Partie 27 : détermination de la poussière fibreuse déposée sur les surfaces par MEB (microscopie électronique à balayage) (méthode directe)
  • FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • NF X43-404-27*NF ISO 16000-27:2014 Indoor air - Part 27 : determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • NF G07-142-2*NF EN ISO 17751-2:2016 Textiles - Quantitative analysis of cashmere, wool, other speciality animal fibres and their blends - Part 2 : scanning electron microscopy method
  • NF EN 61303:1995 Appareils électromédicaux calibrateurs de radionucleides - Méthodes particulières pour décrire les performances
  • NF C93-476-2:2000 Mechanical structures for electronic equipment - Outdoor enclosures - Part 2 : sectional specification - Coordination dimensions for cases and cabinets.

Taiwan Provincial Standard of the People's Republic of China, in vitro electronic scanning

  • CNS 14197-1998 Electric linear scanining ultrasonic diagnostic equipment

Professional Standard - Electron, in vitro electronic scanning

  • SJ/T 11008-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11235CP line and field sweep circuits
  • SJ/T 10987-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits
  • SJ/T 11087-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7698CP horizontal and vertical sweep and chrominance processing circuits
  • SJ/T 10784-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7609CP horizontal and vertical sweep circuits (Applicable for certification)
  • SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits
  • SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices

Professional Standard - Petroleum, in vitro electronic scanning

  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Shanghai Provincial Standard of the People's Republic of China, in vitro electronic scanning

  • DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

NEMA - National Electrical Manufacturers Association, in vitro electronic scanning

  • NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
  • NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)

国家能源局, in vitro electronic scanning

  • SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

Professional Standard - Judicatory, in vitro electronic scanning

未注明发布机构, in vitro electronic scanning

  • BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
  • DIN EN IEC 61675-1:2022 Imaging systems in nuclear medicine – characteristics and test conditions – Part 1: Positron emission tomographs

European Committee for Standardization (CEN), in vitro electronic scanning

  • EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
  • EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
  • EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
  • prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

Danish Standards Foundation, in vitro electronic scanning

  • DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
  • DS/IEC/TR 61948-3:2006 Nuclear medicine instrumentation - Routine tests - Part 3: Positron emission tomographs
  • DS/EN 61675-1/A1:2008 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs
  • DS/EN 61675-1:1998 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs
  • DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

German Institute for Standardization, in vitro electronic scanning

  • DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
  • DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
  • DIN 6855-4:2016-11 Constancy testing of nuclear medicine instruments - Part 4: Positron emission tomographs (PET)
  • DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
  • DIN 6871-1:2003-02 Cyclotron systems for positron emissions tomography - Part 1: Requirements for constructional radiation protection
  • DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
  • DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
  • DIN ISO 16000-27:2014-11 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)
  • DIN EN IEC 61675-1:2022-12 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs (IEC 61675-1:2022); German version EN IEC 61675-1:2022
  • DIN 6871-2:2005-02 Cyclotron systems for positron emission tomography - Part 2: Radiation protection labyrinths and wall entrances
  • DIN EN 14437:2005-02 Cyclotron systems for positron emission tomography - Part 2: Radiation protection labyrinths and wall entrances
  • DIN EN 14664:2005-02 Cyclotron systems for positron emission tomography - Part 2: Radiation protection labyrinths and wall entrances
  • DIN EN ISO 17751-2:2016-11 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends - Part 2: Scanning Electron Microscopy method (ISO 17751-2:2016); German version EN ISO 17751-2:2016 / Note: To be replaced by DIN EN ISO 17751-2 (2022-09).
  • DIN EN ISO 17751-2:2022-09 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Part 2: Scanning electron microscopy method (ISO/DIS 17751-2:2022); German and English version prEN ISO 17751-2:2022 / Note: Date of issue 2022-08-19*I...
  • DIN EN 50090-6-2:2023-06 Home and Building Electronic Systems (HBES) - Part 6-2 IoT Semantic Ontology model description; German version EN 50090-6-2:2021
  • DIN EN 50090-6-2:2021 Home and Building Electronic Systems (HBES) - Part 6-2: IoT Semantic Ontology Model Description; German and English version prEN 50090-6-2:2020
  • DIN ISO 16000-27:2014 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)

Professional Standard - Public Safety Standards, in vitro electronic scanning

  • GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
  • GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
  • GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy

US-FCR, in vitro electronic scanning

Inner Mongolia Provincial Standard of the People's Republic of China, in vitro electronic scanning

  • DB15/T 1341-2018 Specification for calibration of electronic scanner for carded cashmere hand row length chart
  • DB15/T 981-2016 Carded cashmere hand row length test method drawing board electronic scanner method

Jiangsu Provincial Standard of the People's Republic of China, in vitro electronic scanning

  • DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

ES-UNE, in vitro electronic scanning

  • UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
  • UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
  • UNE-EN 61675-1:2014 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs (Endorsed by AENOR in August of 2014.)
  • UNE-EN IEC 61675-1:2022 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs (Endorsed by Asociación Española de Normalización in June of 2022.)
  • UNE-EN 50090-6-2:2021 Home and Building Electronic Systems (HBES)- Part 6-2 IoT Semantic Ontology model description (Endorsed by Asociación Española de Normalización in January of 2022.)
  • UNE-EN ISO 17751-2:2016 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends - Part 2: Scanning Electron Microscopy method (ISO 17751-2:2016)

Fujian Provincial Standard of the People's Republic of China, in vitro electronic scanning

  • DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

AENOR, in vitro electronic scanning

  • UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).

Lithuanian Standards Office , in vitro electronic scanning

  • LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
  • LST EN 61675-1-2001 Radionuclide imaging devices. Characteristics and test conditions. Part 1: Positron emission tomographs (IEC 61675-1:1998)
  • LST EN 61675-1-2001/A1-2008 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs (IEC 61675-1:1998/A1:2008)

AT-ON, in vitro electronic scanning

  • OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

Indonesia Standards, in vitro electronic scanning

ZA-SANS, in vitro electronic scanning

  • SANS 12653-1:2006 Electronic imaging - Test target for the black-and-white scanning of office documents Part 1: Characteristics
  • SANS 12653-2:2006 Electronic imaging - Test target for the black-and-white scanning of office documents Part 2: Method of use

Guangdong Provincial Standard of the People's Republic of China, in vitro electronic scanning

  • DB44/T 1833-2016 Electronic imaging office document scanning test target low resolution test target
  • DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy
  • DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy

BE-NBN, in vitro electronic scanning

  • NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

Association of German Mechanical Engineers, in vitro electronic scanning

  • VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
  • VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
  • VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
  • VDI 2441-2016 Process gas and waste gas cleaning by cold plasma - Barrier discharge, corona discharge, UV radiation

Society of Automotive Engineers (SAE), in vitro electronic scanning

  • SAE ARD5296-2002 Requirements for the Avionics Architecture Description Language (AADL)

American National Standards Institute (ANSI), in vitro electronic scanning

  • ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy

Professional Standard - Commodity Inspection, in vitro electronic scanning

  • SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method

European Committee for Electrotechnical Standardization(CENELEC), in vitro electronic scanning

  • EN IEC 61675-1:2022 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs

Standard Association of Australia (SAA), in vitro electronic scanning

  • AS/NZS IEC 61675.1:2022 Radionuclide imaging devices — Characteristics and test conditions, Part 1: Positron emission tomographs

Defense Logistics Agency, in vitro electronic scanning

  • DLA SMD-5962-93239 REV B-2005 MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
  • DLA SMD-5962-96827 REV A-2003 MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
  • DLA SMD-5962-96812 REV A-2003 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 10-BIT ADDRESSABLE SCAN PORTS, MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVER, MONOLITHIC SILICON
  • DLA SMD-5962-91725-1994 MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL D-TYPE LATCH, THREE-STATE OUTPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-96747-1997 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SCAN PATH SELECTOR WITH 8-BIT BIDIRECTIONAL DATA BUS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
  • DLA SMD-5962-96811 REV A-1999 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-VOLT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, WITH BUS HOLD, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

Shandong Provincial Standard of the People's Republic of China, in vitro electronic scanning

GOSTR, in vitro electronic scanning

  • PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry

Professional Standard - Post and Telecommunication, in vitro electronic scanning

  • YD/T 1690.3-2007 Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150KHz to 1GHz Part 3Measurement of Radiated Emissions-Surface Scan Method

CZ-CSN, in vitro electronic scanning

  • CSN 35 4055 Cast.6-1984 Electromechanical components for electronic equipment. Housing /shell/ electrical continuity test

YU-JUS, in vitro electronic scanning

  • JUS N.R9.071-1986 Piezoelectric vibrators. Quartz crystal units. Two mre crystal holder outline, type 18
  • JUS N.R9.070-1986 Piezoelectric vibrators. Ouartz crystal units. Two pin crystal holder outlfne, type09
  • JUS N.R9.073-1986 Piezoelectrlc vibrators. Quartz crystal unlts. Two wire crystal holder outline, type 17
  • JUS N.R9.069-1986 Piezoelectric vibrators. Quartz crystal units. Two piri crystal holder outline, type 07
  • JUS N.R9.064-1986 Piezoelectric vibrators. Ctuartz crystal units. Two wire crystal holder outline. Types 11, 14 and 15

Hubei Provincial Standard of the People's Republic of China, in vitro electronic scanning

  • DB42/T 462-2008 A Security System Construction Standard for Electronic Government External Network in Hubei Province

AT-OVE/ON, in vitro electronic scanning

  • OVE EN IEC 61675-1:2021 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs (IEC 62C/811/CDV) (english version)

Anhui Provincial Standard of the People's Republic of China, in vitro electronic scanning

  • DB34/T 3606-2020 E-government extranet city and county network overall framework design specification

BELST, in vitro electronic scanning

  • STB 2210-2011 Nano-sized carbon and non-carbon materials and composites based on them. Method for determining parameters using scan electron microscopy measurements




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