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Scanning Electron Microscopy and Optics

Scanning Electron Microscopy and Optics, Total:51 items.

In the international standard classification, Scanning Electron Microscopy and Optics involves: Linear and angular measurements, Vocabularies, Optical equipment, Analytical chemistry, Non-ferrous metals, Air quality, Thermodynamics and temperature measurements, Electronic display devices, Textile fibres, Physics. Chemistry, Protection against crime, Optics and optical measurements, Paints and varnishes, Medical sciences and health care facilities in general, Medical equipment.


Professional Standard - Commodity Inspection, Scanning Electron Microscopy and Optics

  • SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy

American Society for Testing and Materials (ASTM), Scanning Electron Microscopy and Optics

  • ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
  • ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM E2090-06 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-12(2020) Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
  • ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
  • ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
  • ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations

Korean Agency for Technology and Standards (KATS), Scanning Electron Microscopy and Optics

  • KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
  • KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
  • KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)

International Organization for Standardization (ISO), Scanning Electron Microscopy and Optics

  • ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
  • ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

Japanese Industrial Standards Committee (JISC), Scanning Electron Microscopy and Optics

  • JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

Group Standards of the People's Republic of China, Scanning Electron Microscopy and Optics

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Scanning Electron Microscopy and Optics

  • GB/T 36422-2018 Man-made fiber.Test method for micro morphology and diameter.Scanning electron microscope method

British Standards Institution (BSI), Scanning Electron Microscopy and Optics

  • BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
  • DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

工业和信息化部, Scanning Electron Microscopy and Optics

  • SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy

Professional Standard - Public Safety Standards, Scanning Electron Microscopy and Optics

  • GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1418-2017 Elemental Composition Examination of Forensic Science Glass Evidence Scanning Electron Microscopy/Energy Spectroscopy
  • GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
  • GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy

国家市场监督管理总局、中国国家标准化管理委员会, Scanning Electron Microscopy and Optics

  • GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air

RU-GOST R, Scanning Electron Microscopy and Optics

  • GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
  • GOST R IEC/TO 61948-2-2008 Nuclear medicine instrumentation. Routine tests. Part 2. Scintillation cameras and single photon emission computed tomography imaging

GOSTR, Scanning Electron Microscopy and Optics

  • PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry

Danish Standards Foundation, Scanning Electron Microscopy and Optics

  • DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

Association Francaise de Normalisation, Scanning Electron Microscopy and Optics

  • FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

  SEM and energy, Scanning Electron Microscopy and Optical Microscopy, SEM and Environmental SEM, optical scanning electron microscope, SEM and Optics, Optical Microscopy and Scanning Electron Microscopy, Scanning Electron Microscopy and Optics, Optical Microscope Scanning Electron Microscope, Mechanical and Optical Devices, Optical Microscopy and Scanning Electron Microscopy, Environmental SEM and SEM, SEM with, SEM Optics, optical microscope, scanning electron microscope, Scanning Electron Microscopy and Optical Electron Microscopy, Optical Microscope Scanning Electron Microscope, Optics and Optoelectronics Technology, Optics and Optical Rotation, Optics and Precision Engineering, Scanning Electron Microscopy and Optical Microscopy.

 



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