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optical microscope, scanning electron microscope

optical microscope, scanning electron microscope, Total:22 items.

In the international standard classification, optical microscope, scanning electron microscope involves: Air quality, Non-ferrous metals, Optical equipment, Vocabularies, Linear and angular measurements, Optics and optical measurements, Waxes, bituminous materials and other petroleum products.


Professional Standard - Commodity Inspection, optical microscope, scanning electron microscope

  • SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy

Japanese Industrial Standards Committee (JISC), optical microscope, scanning electron microscope

  • JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS K 0132:1997 General rules for scanning electron microscopy
  • JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy

Korean Agency for Technology and Standards (KATS), optical microscope, scanning electron microscope

International Organization for Standardization (ISO), optical microscope, scanning electron microscope

  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
  • ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy

American Society for Testing and Materials (ASTM), optical microscope, scanning electron microscope

  • ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

National Metrological Technical Specifications of the People's Republic of China, optical microscope, scanning electron microscope

  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery, optical microscope, scanning electron microscope

National Metrological Verification Regulations of the People's Republic of China, optical microscope, scanning electron microscope

British Standards Institution (BSI), optical microscope, scanning electron microscope

KR-KS, optical microscope, scanning electron microscope

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