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X-ray Electron Spectroscopy Applications

X-ray Electron Spectroscopy Applications, Total:378 items.

In the international standard classification, X-ray Electron Spectroscopy Applications involves: Optics and optical measurements, Analytical chemistry, Electricity. Magnetism. Electrical and magnetic measurements, Electronic components in general, Linear and angular measurements, Protection against crime, Non-destructive testing, Optical equipment, Metrology and measurement in general, Nuclear energy engineering, Radiation measurements, Medical sciences and health care facilities in general, Non-ferrous metals, Paper and board, Medical equipment, Physics. Chemistry, Surface treatment and coating, Corrosion of metals, Applications of information technology, Paints and varnishes, Radiation protection, Edible oils and fats. Oilseeds, ENVIRONMENT. HEALTH PROTECTION. SAFETY, Petroleum products in general, Processes in the food industry, Non-metalliferous minerals, Refractories, Lubricants, industrial oils and related products, Soil quality. Pedology, Rubber and plastics products, Semiconductor devices, Ceramics, Products of the chemical industry, Metalliferous minerals.

American Society for Testing and Materials (ASTM), X-ray Electron Spectroscopy Applications

ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E2108-10 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E995-04 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1523-03 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1523-09 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E902-05 Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E2735-14 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy 40;XPS41; Experiments
ASTM E2735-13 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM F1467-99(2005)e1 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E2108-00 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM F1467-11 Standard Guide for Use of an X-Ray Tester (x2248;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM E2108-05 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM F1467-99 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM F1467-99(2005) Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM E3309-21 Standard Guide for Reporting of Forensic Primer Gunshot Residue (pGSR) Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
ASTM C1255-93(1999) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-18 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-93(2005) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-11 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM E3284-23 Standard Practice for Training in the Forensic Examination of Primer Gunshot Residue (pGSR) Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
ASTM E721-07 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E721-01 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E721-94 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E984-06 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
ASTM ISO/ASTM 51431-05 Standard Practice for Dosimetry in Electron Beam and X-Ray (Bremsstrahlung) Irradiation Facilities for Food Processing
ASTM E721-16 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E722-94(2002) Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
ASTM E722-04e2 Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
ASTM E722-09 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
ASTM E721-22 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E984-12 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
ASTM E720-94 Standard Guide for Selection and Use of Neutron-Activation Foils for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E2120-10 Standard Practice for Performance Evaluation of the Portable X-Ray Fluorescence Spectrometer for the Measurement of Lead in Paint Films
ASTM D4294-21 Standard Test Method for Sulfur in Petroleum and Petroleum Products by Energy Dispersive X-ray Fluorescence Spectrometry
ASTM F2617-08 Standard Test Method for Identification and Quantification of Chromium, Bromine, Cadmium, Mercury, and Lead in Polymeric Material Using Energy Dispersive X-ray Spectrometry
ASTM D6481-14 Standard Test Method for Determination of Phosphorus, Sulfur, Calcium, and Zinc in Lubrication Oils by Energy Dispersive X-ray Fluorescence Spectroscopy
ASTM D5839-15 Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM E720-11 Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E722-04 Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
ASTM E722-04e1 Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

German Institute for Standardization, X-ray Electron Spectroscopy Applications

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 6827-1:2020-10 Recording in medical application of ionizing radiation - Part 1: Therapy with electron accelerators as well as X-ray and gamma-ray therapy systems
DIN 6809-1:1976 Clinical dosimetry; therapeutical application of x-ray, gamma-ray and electron beams
DIN EN 60601-2-54:2010 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (IEC 60601-2-54:2009); German version EN 60601-2-54:2009
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN EN 62220-1-2:2009 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1-2: Determination of the detective quantum efficiency - Detectors used in mammography (IEC 62220-1-2:2007); German version EN 62220-1-2:2007
DIN EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3: Inductively coupled plasma and atomic absorption spectrometry methods (ISO 21587-3:2007); English version of DIN EN ISO 21587-3:2007-12
DIN EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-
DIN EN ISO 13032:2023-06 Petroleum and related products - Determination of low concentration of sulfur in automotive fuels - Energy-dispersive X-ray fluorescence spectrometric method (ISO/DIS 13032:2023); German and English version prEN ISO 13032:2023 / Note: Date of issue 202...
DIN 6809-4:1988 Clinical dosimetry; applications of X-rays with peak voltages between 10 and 100 kV in radiotheraphy and soft tissue diagnostics
DIN EN 12543-5:1999 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubes; German version EN 12543-5:1999
DIN 6809-6:2020 Clinical dosimetry - Part 6: Application of high energy photon and electron radiation in teleradiotherapy
DIN 6809-6:2020-11 Clinical dosimetry - Part 6: Application of high energy photon and electron radiation in teleradiotherapy
DIN EN IEC 62220-2:2022-11 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 2: Determination of dual-energy subtraction efficiency - Detectors used for dual-energy radiographic imaging (IEC/CDV 62220-2:2022); German and English version prEN ...

International Organization for Standardization (ISO), X-ray Electron Spectroscopy Applications

ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO/FDIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
ISO 16795:2004 Nuclear energy - Determination of Gd<(Index)2>O<(Index))3> content of gadolinium fuel pellets by X-ray fluorescence spectrometry
ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO 19668:2017 Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
ISO 9167-2:1994 Rapeseed - Determination of glucosinolates content - Part 2: Method using x-ray fluorescence spectrometry
ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 20903:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
ISO 10058-3:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
ISO 22581:2021 Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containi
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO/ASTM 51431:2005 Practice for dosimetry in electron beam and X-ray (bremsstrahlung) irradiation facilities for food processing
ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3: Inductively coupled plasma and atomic absorption spectrometry methods
ISO 20565-3:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-
ISO/TS 9516-4:2021 Iron ores — Determination of various elements by X-ray fluorescence spectrometry — Part 4: Performance-based method using fusion preparation method

British Standards Institution (BSI), X-ray Electron Spectroscopy Applications

BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
20/30423741 DC BS ISO 19318. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
BS ISO 19318:2021 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
BS ISO 20903:2019 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
23/30461294 DC BS ISO 18118. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 18118:2015 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS EN 60601-2-54:2009 Medical electrical equipment - Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
BS EN 60601-2-54:2010 Medical electrical equipment. Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
IEC 62607-6-21:2022 Nanomanufacturing. Key control characteristics. - Part 6-21: Graphene-based material. Elemental composition, C/O ratio: X-ray photoelectron spectroscopy
BS ISO 18118:2005 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS EN ISO 10058-3:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method). Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
BS EN ISO 10058-3:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
BS EN 62220-1-2:2007 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Determination of the detective quantum efficiency - Detectors used in mammography
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Inductively coupled plasma and atomic absorption spectrometry methods
BS EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method). Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
BS EN ISO 20565-3:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method). Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-A
BS EN 61262-5:1995 Characteristics of electro-optical X-ray image intensifiers for medical electrical equipment.. Determination of the detective quantum efficiency
BS EN 60601-2-54:2009+A2:2019 Medical electrical equipment. Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 22581:2021 Surface chemical analysis. Near real-time information from the X-ray photoelectron spectroscopy survey scan. Rules for identification of, and correction for, surface contamination by carbon-containing compounds
BS EN IEC 62220-2-1:2023 Medical electrical equipment. Characteristics of digital X-ray imaging devices - Determination of dual-energy subtraction efficiency. Detectors used for dual-energy radiographic imaging

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray Electron Spectroscopy Applications

GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 30702-2014 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
GB/T 2679.11-2008 Paper and board.Qualitative analysis of mineral filler and mineral coating.SEM/EDAX Method
GB/T 2679.11-1993 Paper and board. Qualitative analysis of mineral filler and mineral coating. SEM/EDAX method
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
GB/T 32869-2016 Nanotechnologies.Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
GB/Z 21277-2007 Rapid screening of lead,mercury,chromium,cadmium and bromine of regulated substances in electrical and electronic equipment.X-ray fluorescence spectrometry
GB/T 12162.4-2010/ISO 4037 4-2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
GB/T 12162.4-2010/ISO 4037 4:2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
GB/T 12162.4-2010 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy.Part 4:Calibration of area and personal dosemeters in low energy X reference radiation fields

Professional Standard - Electron, X-ray Electron Spectroscopy Applications

SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
SJ/T 11094-1996 Performance parameters and methods of measurement for medical X-ray image intensifier television systems

Korean Agency for Technology and Standards (KATS), X-ray Electron Spectroscopy Applications

KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 15472-2003(2018)
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 18118:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
KS C IEC 60601-2-54:2012 Medical electrical equipment-Parts 2-54:Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS A ISO 4037-1-2003(2018)
KS A IEC 60532-2016(2021) Radiation protection instrumentation－Installed dose ratemeters, warning assemblies and monitors－X and gamma radiation of energy between 50 keV and 7 MeV
KS C IEC 60613:2003 Electrical, thermal and loading characteristics of rotating anode X-ray tubes for medical diagnosis
KS C IEC 60613:2017 Electrical and loading characteristics of X-ray tube assemblies for medical diagnosis
KS L ISO 10058-3:2012 Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spectrophotometry(FAAS) and inductively coupled plasma atomic emission spectrometry(ICP-AES)
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS C IEC 60601-2-44:2011 Medical electrical equipment－Part 2-44：Particular requirements for the basic safety and essential performance of x-ray equipment for computed tomography
KS C IEC 60601-2-44:2017 Medical electrical equipment－Part 2-44：Particular requirements for the basic safety and essential performance of x-ray equipment for computed tomography
KS L ISO 21587-3:2012 Chemical analysis of aluminosilicate refractory products-Part 3:Inductively coupled plasma and atomic absorption spectrometry methods
KS L ISO 20565-3:2012 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)-Part 3:Flame atomic absorption spectrometry(FAAS) and inductively coupled plasma atomic emission spectrometry(ICP-AES)
KS L ISO 20565-3-2012(2017) Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spectrometry(FAAS) and inductively
KS L ISO 20565-3-2012(2022) Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)－Part 3：Flame atomic absorption spectrometry(FAAS) and inductively
KS M ISO 12980:2004 Carbonaceous materials used in the production of aluminium-Green coke and calcined coke for electrodes-Analysis using an X-ray fluorescence method
KS M ISO 12980:2013 Carbonaceous materials used in the production of aluminium－Green coke and calcined coke for electrodes－Analysis using an X-ray fluorescence method
KS A ISO 4037-2-2003(2018)
KS C IEC 61262-5-2003(2018)

Professional Standard - Judicatory, X-ray Electron Spectroscopy Applications

SF/T 0139-2023

未注明发布机构, X-ray Electron Spectroscopy Applications

BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution

Association Francaise de Normalisation, X-ray Electron Spectroscopy Applications

NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF M60-512:1984 X AND GAMMA REFERENCE RADIATIONS FOR CALIBRATING DOSEMETERS AND DOSE RATEMETERS AND FOR DETERMINING THEIR RESPONSE AS A FUNCTION OF PHOTON ENERGY.
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
NF M60-513:1990 X AND GAMMA REFERENCE RADIATIONS FOR CALIBRATING DOSEMETERS AND DOSE RATEMETERS AND FOR DETERMINING THEIR RESPONSE AS A FUNCTION OF PHOTON ENERGY. PHOTON REFERENCE RADIATIONS AT ENERGIES BETWEEN 4 MEV AND 9 MEV.
NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
NF M60-460*NF ISO 16795:2006 Nuclear energy - Determination of Gd2O3 content of gadolinium fuel pellets by X-ray fluorescence spectrometry
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NF A09-230-3:1999 Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 3 : spectrometric method.
NF M60-516:1989 NEUTRON REFERENCE RADIATIONS FOR CALIBRATING NEUTRON-MEASURING DEVICES USED FOR RADIATION PROTECTION PURPOSES AND FOR DETERMINING THEIR RESPONSE AS A FUNCTION OF NEUTRON ENERGY.
NF B40-670-3*NF EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3 : inductively coupled plasma and atomic absorption spectrometry methods
NF M60-512-3:2000 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy - Part 3 : calibration of area and personal dosemeters and the measurement of their response as a function of
NF M60-512-2:2000 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy - Part 2 : dosimetry for radiation protection over the energy ranges 8 keV to 1,3 MeV and 4 MeV to 9 MeV.
NF B49-329-3*NF EN ISO 10058-3:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 3 : flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES)
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF EN 61676/A1:2009 Appareils électromédicaux - Instruments de dosimétrie pour la mesure non invasive de la tension du tube radiogène dans la radiologie de diagnostic
NF C74-220-1-2*NF EN 62220-1-2:2007 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1-2 : determination of the detective quantum efficiency - Dectectors used in mammography
NF EN IEC 61676:2023 Appareils électromédicaux - Appareils de dosimétrie pour le mesurage non invasif de la tension du tube radiogène dans la radiologie de diagnostic
NF B49-435-3*NF EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3 : flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP
NF EN 62220-1-2:2007 Appareils électromédicaux - Caractéristiques des dispositifs d'imagerie numérique à rayonnement X - Partie 1-2 : détermination de l'efficacité quantique de détection - Détecteurs utilisés en mammographie
NF C74-167*NF EN 60601-2-54:2009 Medical electrical equipment - Part 2-54 : particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF EN IEC 62220-2-1:2023 Appareils électromédicaux - Caractéristiques des dispositifs d'imagerie à rayonnement X - Partie 2-1 : détermination de l'efficacité de soustraction à double énergie - Détecteurs utilisés en imagerie radiographique à double énergie

国家市场监督管理总局、中国国家标准化管理委员会, X-ray Electron Spectroscopy Applications

GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
GB/T 41105.3-2021 Non-destructive testing—Measurement and evaluation of the X-ray tube voltage—Part 3:Spectrometric method
GB/T 39560.301-2020 Determination of certain substances in electrical and electronic products—Part 3-1: Screening lead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometry

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, X-ray Electron Spectroscopy Applications

GB/T 33352-2016 General rules of screening application of restricted substances in electrical and electronic products—X-Ray fluorescence spectrometry
GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）

KR-KS, X-ray Electron Spectroscopy Applications

KS D ISO 15472-2003(2023)
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

Professional Standard - Public Safety Standards, X-ray Electron Spectroscopy Applications

GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy

Guangdong Provincial Standard of the People's Republic of China, X-ray Electron Spectroscopy Applications

DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy
DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy

Standard Association of Australia （SAA）, X-ray Electron Spectroscopy Applications

AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO 19318:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
AS/NZS 3200.2.44:2000 Medical electrical equipment - Particular requirements for safety - X-ray equipment for computed tomography
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
AS ISO 24237:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
AS/NZS 4356.5:1996 Medical electrical equipment - Characteristics of electro-optical X-ray image intensifiers - Determination of the detective quantum efficiency

Fujian Provincial Standard of the People's Republic of China, X-ray Electron Spectroscopy Applications

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Professional Standard - Nuclear Industry, X-ray Electron Spectroscopy Applications

EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis

Military Standard of the People's Republic of China-General Armament Department, X-ray Electron Spectroscopy Applications

GJB 5814-2006 Testing method of X-ray dose enhancement effect for military electronic devices
GJB/Z 40.2-1993 Military vacuum electronic device series type spectrum cathode ray tube
GJB 7350-2011 Test method of pulse γ-ray radiation effects for military electronic devices

GOSTR, X-ray Electron Spectroscopy Applications

PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry
PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry
GOST 32139-2019 Petroleum and petroleum products. Determination of sulfur content by energy dispersive X-ray fluorescence spectrometry method

Japanese Industrial Standards Committee (JISC), X-ray Electron Spectroscopy Applications

JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
JIS T 0306:2002 Analysis of state for passive film formed on metallic biomaterials by X-ray photoelectron spectroscopy
JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS K 0470:2008 Determination of arsenic and lead in clay and sand using energy-dispersive X-ray fluorescence spectrometry
JIS Z 4751-2-44:2012 Medical electrical equipment -- Part 2-44: Particular requirements for the basic safety and essential performance of X-ray equipment for computed tomography
JIS Z 4751-2-54:2012 Medical electrical equipment -- Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
JIS Z 4751-2-54:2017 Medical electrical equipment -- Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy

AT-ON, X-ray Electron Spectroscopy Applications

ONORM S 5233-1987 Dosimeters for use in radiotherapy with ionization Chambers forX-rays, y -rays and electron beams

工业和信息化部/国家能源局, X-ray Electron Spectroscopy Applications

JB/T 12962.1-2016 Energy-dispersive X-ray fluorescence spectrometers Part 1: General techniques

Professional Standard - Non-ferrous Metal, X-ray Electron Spectroscopy Applications

YS/T 739-2010 Determination of cryolite rate and main components of electrolyte-X-ray fluorescence spectrometric analysis method
YS/T 644-2007 Determination method of Pt-Rn alloy film.Determination of alloyed Pt content and alloyed Rn content by X-ray photoelectron spectroscopy

Danish Standards Foundation, X-ray Electron Spectroscopy Applications

DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DS/EN 60601-2-54:2009 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
DS/EN 62220-1-2:2008 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1-2: Determination of the detective quantum efficiency - Detectors used in mammography
DS/EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-

SE-SIS, X-ray Electron Spectroscopy Applications

SIS SS-ISO 8963:1990 Dosimetry of X and γ reference radiations for radiation protection over the energy range from 8 keV to 1,3 MeV

Professional Standard - Medicine, X-ray Electron Spectroscopy Applications

YY/T 0829-2011 Characteristics and test methods for imaging system of positron emission and X-ray computed tomography
YY/T 1766.3-2023 Image quality evaluation methods for X-ray computed tomography equipment Part 3: Performance evaluation for dual-energy imaging and energy spectroscopy applications
YY/T 0590.2-2010 Medical electrical equipment.Characteristics of digital X-ray imaging devices.Part 1-2 : Determination of the detective quantum efficiency. Detectors used in mammography
YY 9706.268-2022 Medical electrical equipment Part 2-68: X-ray image guides for electron accelerators, light ion beam therapy equipment and radionuclide beam therapy equipment

American National Standards Institute （ANSI), X-ray Electron Spectroscopy Applications

ANSI N43.3-2008 General Radiation Safety - Installations Using Non-Medical X-Ray and Sealed Gamma-Ray Sources, Energies Up to 10 MeV
ANSI N43.3-1993 American National Standard for General radiation safety - Installations using Non-Medical X-ray and Sealed Gamma-Ray Sources, Energies Up To 10 MeV

European Committee for Standardization (CEN), X-ray Electron Spectroscopy Applications

EN ISO 9167-2:1997 Rapeseed - Determination of Glucosinolates Content - Part 2: Method Using X-Ray Fluorescence Spectrometry
EN 60613:1990 Electrical, thermal and loading characteristics of rotating anode X-ray tubes for medical diagnosis
EN ISO 20565-3:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-

VN-TCVN, X-ray Electron Spectroscopy Applications

TCVN 3172-2008 Petroleum and petroleum products.Determination of sulfur by energy-dispersive X-ray fluorescence spectrometry
TCVN 7249-2008 Standard practice for dosimetry in electron beam and X-ray (bremsstrahlung) irradiation facilities for food processing

Professional Standard - Commodity Inspection, X-ray Electron Spectroscopy Applications

SN/T 2003.4-2006 Determination of lead, mercury, chromium, cadmium and bromine in electrical and electronic equipment. Part 4: Qualitative screening by energy dispersive X-ray fluorescence spectrometric method
SN/T 2003.5-2006 Determination of lead,mercury,chromium,cadmium and bromine in electrical and electronic equipment-Part 5:Quantitative screening by energy dispersive X-ray fluorescence spectrometric method
SN/T 2003.1-2005 Determination of lead,mercury,cadmium,chromium and bromine in electrical and electronic equipment-Part 1:Qualitative screening by wavelength dispersive X-ray fluorescence spectrometric method
SN/T 2003.3-2006 Determination of Lead, Mercury, Chromium, Cadmium and Bromine in electrical and electronic equipments - Part 3: Qualitative screening by X-ray fluorescence spectrometric method

International Electrotechnical Commission (IEC), X-ray Electron Spectroscopy Applications

IEC 60601-2-54:2015 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
IEC 60601-2-54:2018 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
IEC TS 62607-6-21:2022 Nanomanufacturing - Key control characteristics - Part 6-21: Graphene-based material - Elemental composition, C/O ratio: X-ray photoelectron spectroscopy
IEC 60601-2-54:2009/AMD1:2015 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
IEC 60601-2-54:2009/AMD2:2018 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy; Amendment 2
IEC 60601-2-54:2009 IEC 60601-2-54, Ed. 1: Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
IEC 60601-2-35:2020 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
IEC 60601-2-54:2022 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
IEC 60601-2-54:2022 RLV Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
IEC 62220-1-2:2007 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1-2: Determination of the detective quantum efficiency - Detectors used in mammography
IEC 60601-2-44:2009 Medical electrical equipment - Part 2-44: Particular requirements for the basic safety and essential performance of X-ray equipment for computed tomography
IEC 60601-2-54:2009+AMD1:2015+AMD2:2018 CSV Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
IEC 61262-2:1994 Medical electrical equipment - Characteristics of electro-optical X-ray image intensifiers - Part 2: Determination of the conversion factor
IEC 62220-2-1:2023 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 2-1: Determination of dual-energy subtraction efficiency - Detectors used for dual-energy radiographic imaging

Professional Standard - Machinery, X-ray Electron Spectroscopy Applications

JB/T 11602.3-2013 Non-desturctive testing instruments.Measurement and evaluation of the X-ray tube voltage.Part 3: Spectrometric detect

RU-GOST R, X-ray Electron Spectroscopy Applications

GOST R ISO 16243-2016 State system for insuring the uniformity of measurements Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
GOST 32139-2013 Petroleum and petroleum products. Determination of sulfur content by method of energy dispersive X-ray fluorescence spectrometry
GOST R ISO/ASTM 51431-2012 Practice for dosimetry in electron beam and X-ray (bremsstrahlung) irradiation facilities for food processing
GOST 33305-2015 Lubricating oils. Method for determination of phosphorus, sulfur, calcium and zinc by energy dispersive X-ray fluorescence spectroscopy
GOST R IEC 61262-5-1999 Medical electrical equipment. Characteristics of electro-optical X-ray image intensifiers. Part 5. Determination of the detective quantum efficiency
GOST R 50267.2.54-2013 Medical electrical equipment. Part 2-54. Particular requirements for basic safety and essential performance of the X-ray equipment for radiography and radioscopy

AENOR, X-ray Electron Spectroscopy Applications

UNE-EN 60601-2-54:2010 Medical electrical equipment -- Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
UNE-EN 62220-1-2:2008 Medical electrical equipment - Characteristics of digital X-ray imaging devices -- Part 1-2: Determination of the detective quantum efficiency - Detectors used in mammography.

European Committee for Electrotechnical Standardization（CENELEC）, X-ray Electron Spectroscopy Applications

EN 60613:2010 Electrical and loading characteristics of X-ray tube assemblies for medical diagnosis
FprEN IEC 60601-2-54:2022 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
EN 62220-1-2:2007 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1-2: Determination of the detective quantum efficiency - Detectors used in mammography

Group Standards of the People's Republic of China, X-ray Electron Spectroscopy Applications

T/CAME 10-2019 Specification for clinical application quality testing in image fusion software of positron emission tomography and computed tomography（PET/CT）

ES-UNE, X-ray Electron Spectroscopy Applications

UNE-EN 60601-2-54:2010/A1:2015 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
UNE-EN 60601-2-45:2011/A1:2015 Medical electrical equipment - Part 2-45: Particular requirements for the basic safety and essential performance of mammographic X-ray equipment and mammographic stereotactic devices (Endorsed by AENOR in November of 2015.)
UNE-EN 60601-2-54:2009/A2:2019 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (Endorsed by Asociación Española de Normalización in July of 2019.)

Lithuanian Standards Office , X-ray Electron Spectroscopy Applications

LST EN 60601-2-54-2009 Medical electrical equipment -- Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (IEC 60601-2-54:2009)
LST EN ISO 20565-3:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 3: Flame atomic absorption spectrometry (FAAS) and inductively coupled plasma atomic emission spectrometry (ICP-

Indonesia Standards, X-ray Electron Spectroscopy Applications

SNI ISO/ASTM 51431:2010 Practice for dosimetry in electron beam and X-ray (bremsstrahlung)irradiation facilities for food processing

CENELEC - European Committee for Electrotechnical Standardization, X-ray Electron Spectroscopy Applications

EN 60601-2-54:2009 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (Incorporates Amendment A1: 2015)