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X-ray Spectroscopy and Electron Spectroscopy
X-ray Spectroscopy and Electron Spectroscopy, Total:14 items.
In the international standard classification, X-ray Spectroscopy and Electron Spectroscopy involves: Analytical chemistry, Linear and angular measurements, Non-destructive testing, Electronic components in general, Optics and optical measurements.
International Organization for Standardization (ISO), X-ray Spectroscopy and Electron Spectroscopy
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
Korean Agency for Technology and Standards (KATS), X-ray Spectroscopy and Electron Spectroscopy
- KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray Spectroscopy and Electron Spectroscopy
- GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
- GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
- GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
British Standards Institution (BSI), X-ray Spectroscopy and Electron Spectroscopy
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
未注明发布机构, X-ray Spectroscopy and Electron Spectroscopy
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
American Society for Testing and Materials (ASTM), X-ray Spectroscopy and Electron Spectroscopy
- ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Professional Standard - Electron, X-ray Spectroscopy and Electron Spectroscopy
- SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy