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Nodal line semi-metal
Nodal line semi-metal, Total:499 items.
In the international standard classification, Nodal line semi-metal involves: Fasteners, Bearings, Iron and steel products, Materials for aerospace construction, Pipeline components and pipelines, Shipbuilding and marine structures in general, Integrated circuits. Microelectronics, Machine tools, Hydraulic construction, Linear and angular measurements, Semiconductor devices, Electrical accessories, Electrical wires and cables, Products of non-ferrous metals, Construction of waterways and ports, Electrical and electronic testing, Testing of metals, Aircraft and space vehicles in general, Inorganic chemicals, Analytical chemistry, Medical equipment, Cutting tools, Insulation, Machine tool systems, Shafts and couplings, Radiocommunications, Ceramics, Surface treatment and coating, Fibre optic communications, Valves, Non-ferrous metals, Coatings and related processes used in aerospace industry, Components for aerospace construction, Barrels. Drums. Canisters, Dentistry, Education, Safety of machinery, Energy and heat transfer engineering in general, Electronic components in general, Insulating materials, Characteristics and design of machines, apparatus, equipment, Telecommunication systems, Vocabularies, Occupational safety. Industrial hygiene, Chipless working equipment, Textile machinery, Astronomy. Geodesy. Geography, Aerospace electric equipment and systems, Lamps and related equipment, Glass, Electric filters, Equipment for the metallurgical industry, Textile fibres, Powder metallurgy, Protection against fire, Environmental testing, Electrical engineering in general, Packaging and distribution of goods in general, Protective equipment, Welding, brazing and soldering, Structures of buildings.
Taiwan Provincial Standard of the People's Republic of China, Nodal line semi-metal
TR-TSE, Nodal line semi-metal
- TS 925-1971 FRICTION L?NINGS FOR CLUTCHES (METALLIC, SEMIMETALLIC AND METAL -CERAMIC)
BR-ABNT, Nodal line semi-metal
BE-NBN, Nodal line semi-metal
SE-SIS, Nodal line semi-metal
- MNC 570-1970 Summary of Swedish Standards for semi-manufactured products of various metals. Strip and wire
- SIS 03 02 01-1963 Lines in general
- SIS SS 11 26 22-1983 Metallic materials - Wire - Reverse bend test
- MNC 545-1971 Summary of Swedish Standards for semi-manufactured products of light meta/ (except tubes)
- MNC 580-1992 Metallic materials — Semi-manufacturedproducts — Technical delivery requirements — Summary
HU-MSZT, Nodal line semi-metal
未注明发布机构, Nodal line semi-metal
Defense Logistics Agency, Nodal line semi-metal
- DLA MIL-DTL-17813/9-2009 EXPANSION JOINTS, PIPE, METALLIC, GIMBAL
- DLA KKK-L-370 D NOTICE 3-2001 LINING, FRICTION, (CLUTCH AND BRAKE, METALLIC, METAL-CERAMIC AND SEMI-METALLIC)
- DLA KKK-L-370 D-1988 LINING, FRICTION, (CLUTCH AND BRAKE, METALLIC, METAL-CERAMIC AND SEMI-METALLIC)
- DLA SMD-5962-86880 REV C-2003 MICROCIRCUIT, LINEAR, CMOS ARINC BUS INTERFACE, MONOLITHIC SILICON
- DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
- DLA MIL-DTL-17813/7 G-2009 EXPANSION JOINTS, PIPE, METALLIC, UNIVERSAL
- DLA SMD-5962-95834 REV J-2006 MICROCIRCUIT, LINEAR, LVDS QUAD CMOS DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON
- DLA SMD-5962-88674-1988 MICROCIRCUITS, DIGITAL, FAST CMOS, 8-BIT, NONINVERTING , BUS INTERFACE REGISTERS, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-85149 REV A-1988 MICROCIRCUIT, NMOS, BUS CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-94745-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 256K X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
- DLA SMD-5962-95826 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NOR GATE, MONOLITHIC SILICON
- DLA SMD-5962-94709-1994 MICROCIRCUIT, LINEAR, CMOS, BANG-BANG CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-85528-1986 MICROCIRCUIT, DIGITAL, CMOS, BUS ARBITER, MONOLITHIC SILICON
- DLA SMD-5962-89503 REV H-2004 MICROCIRCUIT, LINEAR, CMOS, PRECISION TIMERS, MONOLITHIC SILICON
- DLA SMD-5962-91639 REV C-2005 MICROCIRCUIT, LINEAR, CMOS QUAD DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON
- DLA SMD-5962-91640 REV C-2005 MICROCIRCUIT, LINEAR, CMOS QUAD DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON
- DLA MIL-DTL-17813/6-2009 EXPANSION JOINTS, PIPE, METALLIC, PRESSURE BALANCED
- DLA MIL-DTL-17813/8-2009 EXPANSION JOINTS, PIPE, METALLIC, HINGED
- DLA SMD-5962-95717-1995 MICROCIRCUIT, DIGITAL, CMOS, OCTAL BUS TRANSCEIVER, MONOLITHIC SILICON
- DLA A-A-52035 VALID NOTICE 2-2007 PROTRACTOR, ONE ARM: SEMICIRCULAR (CORROSION-RESISTANT ALLOY, WITH CASE)
- DLA A-A-52035 VALID NOTICE 1-2001 PROTRACTOR, ONE ARM: SEMICIRCULAR (CORROSION-RESISTANT ALLOY, WITH CASE)
- DLA A-A-52035-1991 PROTRACTOR, ONE ARM: SEMICIRCULAR (CORROSION-RESISTANT ALLOY, WITH CASE)
- DLA SMD-5962-87577 REV B-2005 MICROCIRCUIT, CMOS, OCTAL BUS TRANSCEIVER, MONOLITHIC SILICON
- DLA SMD-5962-87667 REV C-1993 MICROCIRCUIT, HIGH PERFORMANCE CMOS BUS BUFFERS, MONOLITHIC SILICON
- DLA SMD-5962-92042 REV F-2005 MICROCIRCUIT, LINEAR, CMOS, MULTIPLEXER, MONOLITHIC SILICON
- DLA SMD-5962-88750 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, QUAD ANALOG SWITCH, MONOLITHIC SILICON
- DLA SMD-5962-95794 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, OCTAL TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
- DLA SMD-5962-92094 REV C-2004 MICROCIRCUIT, LINEAR, DUAL, CMOS, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
- DLA SMD-5962-88503 REV J-2003 MICROCIRCUIT, LINEAR, DUAL MOSFET DRIVERS, MONOLITHIC SILICON
- DLA SMD-5962-95599 REV B-1999 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY 4000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-88743 REV B-1991 MICROCIRCUITS, LINEAR, 8-BIT CMOS FLASH A/D CONVERTER, MONOLITHIC SILICON
- DLA SMD-5962-89506 REV A-1993 MICROCIRCUIT, DIGITAL, FAST CMOS, BUS DRIVER, MONOLITHIC SILICON
- DLA SMD-5962-89507 REV B-2000 MICROCIRCUIT, LINEAR, HIGH SPEED CMOS, QUAD BILATERAL SWITCH, MONOLITHIC SILICON
- DLA SMD-5962-89508-1989 MICROCIRCUIT, DIGITAL, FAST CMOS, 1 OF 4 DECODER, MONOLITHIC SILICON
- DLA SMD-5962-88608 REV A-2004 MICROCIRCUIT, DIGITAL, FAST, CMOS, 10-BIT NONINVERTING REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-88656 REV A-2004 MICROCIRCUIT, DIGITAL, FAST CMOS, 9-BIT NONINVERTING REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-91532 REV C-2004 MICROCIRCUIT, LINEAR, CMOS, DUAL, LOW POWER, VOLTAGE COMPARATOR, MONOLITHIC SILICON
- DLA SMD-5962-87660 REV A-2001 MICROCIRCUITS, LINEAR, MOSFET DRIVER, DUAL POWER
- DLA SMD-5962-92009 REV B-1995 MICROCIRCUIT, DIGITAL, CMOS, VMEBUS ADDRESS CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-92010 REV B-2001 MICROCIRCUIT, DIGITAL, CMOS, VMEBUS INTERFACE CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-92093 REV C-2005 MICROCIRCUIT, LINEAR, QUAD, CMOS, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
- DLA SMD-5962-95714 REV A-1996 MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED 8-BIT BUS TRANSCEIVER, MONOLITHIC SILICON
- DLA MIL-DTL-17813/5-2009 EXPANSION JOINTS, PIPE, METALLIC, SINGLE BELLOWS, FABRICATED
- DLA SMD-5962-95629 REV A-2001 MICROCIRCUIT, LINEAR, CMOS, DUAL SPST ANALOG SWITCH, MONOLITHIC SILICON
- DLA SMD-5962-94734-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MEG X 1 DRAM, MONOLITHIC SILICON
- DLA SMD-5962-88628 REV E-2007 MICROCIRCUIT, DIGITAL, CMOS, BUS CONTROLLER REMOTE TERMINAL MONOLITHIC SILICON
- DLA SMD-5962-88635 REV A-1993 MICROCIRCUIT, DIGITAL, CMOS UV ERASABLE, PROGRAMMABLE LOGIC DEVICE
- DLA SMD-5962-88770 REV H-2003 MICROCIRCUIT, LINEAR, SINGLE POWER MOSFET DRIVER, MONOLITHIC SILICON
- DLA SMD-5962-89481 REV A-2004 MICROCIRCUIT, LINEAR, CMOS, 12-BIT, MULTIPLYING D/A CONVERTER, MONOLITHIC SILICON
- DLA SMD-5962-96514 REV D-2007 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUAD 2-INPUT NOR GATE, MONOLITHIC SILICON
- DLA SMD-5962-96522 REV B-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE 3-INPUT AND GATE, MONOLITHIC SILICON
- DLA SMD-5962-96727 REV B-2001 MICROCIRCUIT, DIGITAL, CMOS, BUS CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-96742 REV E-2000 MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, MULTIPLEXER WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
- DLA SMD-5962-95715-1996 MICROCIRCUIT, DIGITAL, CMOS, CLOCK GENERATOR DRIVER, MONOLITHIC SILICON
- DLA SMD-5962-95716-1995 MICROCIRCUIT, DIGITAL, CMOS, OCTAL LATCHING BUS DRIVER, MONOLITHIC SILICON
- DLA MIL-DTL-17813 H VALID NOTICE 1-2013 Expansion Joints, Pipe, Metallic Bellows, General Specification for
- DLA SMD-5962-87704 REV C-1993 MICROCIRCUITS, DIGITAL, CMOS, 9 AND 10-BIT BUS TRANSCEIVER, MONOLITHIC SILICON
- DLA SMD-5962-94712 REV B-1996 MICROCIRCUIT, MEMORY, DIGITAL CMOS, PROGRAMMABLE LOGIC CELL ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-87763 REV A-2004 MICROCIRCUIT, LINEAR, CMOS, DUAL 12-BIT, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
- DLA SMD-5962-95521 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 10,000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-88573 REV C-1992 MICROCIRCUIT, DIGITAL CMOS, HIGH PERFORMANCE PARITY BUS TRANSCEIVERS, MONOLITHIC SILICON
- DLA SMD-5962-88699-1988 MICROCIRCUITS, LINEAR, 16-CHANNEL/DIFFERENTIAL 8-CHANNEL CMOS ANALOG MULTIPLEXER
- DLA SMD-5962-89483 REV D-1996 MICROCIRCUIT, LINEAR, CMOS, QUAD, UNIVERSAL FILTER BUILDING BLOCK, MONOLITHIC SILICON
- DLA SMD-5962-89518 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, 8-BIT, A/D CONVERTER WITH TRACK/HOLD, MONOLITHIC SILICON
- DLA SMD-5962-87519 REV A-1991 MICROCIRCUITS, DIGITAL, NMOS, GENERAL, PURPOSE INTERFACE BUS CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-95722 REV B-2007 MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-95801 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, HEX INVERTER WITH OPEN DRAIN, MONOLITHIC SILICON
- DLA SMD-5962-95824-1996 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 8-BIT MICROPROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-87603 REV B-1992 MICROCIRCUIT, HIGH PERFORMANCE CMOS 9-WIDE AND 10-WIDE BUS INTERFACE LATCHES, MONOLITHIC SILICON
- DLA SMD-5962-89513 REV B-2006 MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL D REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-87640 REV B-2002 MICROCIRCUIT, LINEAR, BIMOS II LATCHED DRIVERS, MONOLITHIC SILICON
- DLA SMD-5962-91692 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, 16-BIT, 20 KHZ, A/D CONVERTER, MONOLITHIC SILICON
- DLA SMD-5962-91762 REV B-1993 MICROCIRCUIT, DIGITAL, CMOS, 4 X 8 BIT MULTILEVEL PIPELINE REGISTER, MONOLITHIC SILICON
- DLA SMD-5962-92124 REV A-2004 MICROCIRCUIT, LINEAR, CMOS, LOW POWER, INVERTING SWITCHING REGULATOR, MONOLITHIC SILICON
- DLA SMD-5962-95525-1995 MICROCIRCUIT, DIGITAL, CMOS, QUAD ELECTRICALLY ERASABLE PROGRAMMABLE POTENTIOMETER, MONOLITHIC SILICON
- DLA SMD-5962-95653 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, DUAL 4-INPUT NAND GATE, MONOLITHIC SILICON
- DLA SMD-5962-95657 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED ADVANCED CMOS, QUAD 2-INPUT AND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95660 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUAD 2-INPUT EXCLUSIVE OR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95679 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, QUAD 2-INPUT NOR GATE, MONOLITHIC SILICON
- DLA SMD-5962-94730 REV D-2002 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-94733-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 12000 GATE CONFIGURABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-90731 REV E-2004 MICROCIRCUIT, LINEAR, CMOS QUAD, SPST ANALOG SWITCH, MONLITHIC SILICON
- DLA SMD-5962-88775 REV A-1991 MICROCIRCUITS, FAST, CMOS, OCTAL TRANSCEIVER/REGISTER, MONOLITHIC SILICON
- DLA SMD-5962-90969 REV B-2007 MICROCIRCUIT, LINEAR, CMOS, QUAD, LOW POWER VOLTAGE COMPARATOR, MONOLITHIC SILICON
- DLA SMD-5962-96526 REV C-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, DUAL 4-INPUT NAND GATE, MONOLITHIC SILICON
- DLA SMD-5962-95680 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, QUAD 2-INPUT AND GATE, MONOLITHIC SILICON
- DLA SMD-5962-95682 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, QUAD 2-INPUT NOR GATE, MONOLITHIC SILICON
- DLA SMD-5962-95720 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, TRIPLE 3-INPUT AND GATE, MONOLITHIC SILICON
- DLA SMD-5962-95725 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, HEX INVERTER, MONOLITHIC SILICON
- DLA SMD-5962-95779 REV B-1999 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, DUAL 4-INPUT AND GATE, MONOLITHIC SILICON
- DLA SMD-5962-95780 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, TRIPLE 3-INPUT NOR GATE, MONOLITHIC SILICON
- DLA SMD-5962-95781 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, QUAD 2-INPUT OR GATE, MONOLITHIC SILICON
- DLA SMD-5962-95811 REV A-1998 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, 4-BIT FULL ADDER WITH FAST CARRY, MONOLITHIC SILICON
- DLA QPL-24236-30-2006 SWITCHES, THERMOSTATIC (METALLIC AND BIMETALLIC), GENERAL SPECIFICATION FOR
- DLA MIL-DTL-17813 H SUPP 1-2009 EXPANSION JOINTS, PIPE, METALLIC BELLOWS, GENERAL SPECIFICATION FOR
- DLA MIL-DTL-17813 H-2009 EXPANSION JOINTS, PIPE, METALLIC BELLOWS, GENERAL SPECIFICATION FOR
- DLA MIL-DTL-17813/4 G-2009 EXPANSION JOINTS, PIPE, METALLIC, CORRUGATED BELLOWS, EXTERNALLY PRESSURIZED
Association Francaise de Normalisation, Nodal line semi-metal
- NF E22-521:1984 Plain bearings. Pressed bimetallic half thrust washers. Features and tolerances.
- NF E22-563:1988 Plain bearings. Metallic thin-walled half bearings. Determination of the sigma 0,01 elastic limit.
- NF A55-401:1982 NON FERROUS METALS. COLD ROLLED SEMI-FINISHED PRODUCTS MADE OF LEAD. CHARACTERISTICS.
- NF C66-428:1986 Insulators and fittings for overhead lines. Metal fittings. Semi-horizontal (flat arch) configuration (NV).
- NF C80-204*NF EN 62418:2011 Semiconductor devices - Metallization stress void test
- NF EN 2600:2018 Série aérospatiale - Désignation des demi-produits métalliques - Règles
- NF EN 24503:1993 Métaux-durs - Dosage des éléments métalliques par fluorescence de rayons X - Méthode par fusion.
- NF EN 4000:2002 Série aérospatiale - Matériaux métalliques - Règles pour la rédaction et la présentation des normes dimensionnelles des demi-produits métalliques
- NF L10-003*NF EN 2600:2018 Aerospace series - Designation of metallic semi-finished products - Rules
- NF EN 14917:2021 Compensateurs de dilatation à soufflets métalliques pour appareils à pression
- NF L52-210:1966 Flat metal braid for metallisation.
- NF L52-215:1966 Round metal braid for metallisation.
- NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
- NF L10-015*NF EN 4000:2002 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
- NF A91-115:1995 Metallic and non-metallic coatings. Measurement of thickness. Beta backscatter method.
- NF EN 24883:1993 Métaux-durs - Dosage des éléments métalliques par fluorescence de rayons X - Méthode par solution.
- NF C66-439:1981 Insulators and fittings for overhead lines. Metal fittings. Metal sole-plate (SM).
- NF EN 62418:2011 Dispositifs à semi-conducteurs - Essai sur les cavités dues aux contraintes de la métallisation
- NF EN ISO 3543:2001 Revêtements métalliques et non métalliques - Mesurage de l'épaisseur - Méthode par rétrodiffusion des rayons bêta
- NF P22-470:1989 Steel construction - Welded connections - Details and design of welds.
- NF EN 62417:2010 Dispositifs à semiconducteurs - Essais d'ions mobiles pour transistors à semiconducteur à oxyde métallique à effet de champ (MOSFET)
Indonesia Standards, Nodal line semi-metal
Professional Standard - Aviation, Nodal line semi-metal
RO-ASRO, Nodal line semi-metal
American Society for Testing and Materials (ASTM), Nodal line semi-metal
- ASTM F1123-87(2004) Standard Specification for Non-Metallic Expansion Joints
- ASTM B95-39(1979) Method of Linear Expansion of Metals
- ASTM B902-04a(2010) Standard Specification for Compressed Round Stranded Copper Conductors, Hard, Medium-Hard, or Soft Using Single Input Wire Construction
- ASTM B902-13 Standard Specification for Compressed Round Stranded Copper Conductors, Hard, Medium-Hard, or Soft Using Single Input Wire Construction
- ASTM F1123-87(1998) Standard Specification for Non-Metallic Expansion Joints
- ASTM F1123-87(2019) Standard Specification for Non-Metallic Expansion Joints
- ASTM F1123-87(2015) Standard Specification for Non-Metallic Expansion Joints
- ASTM B902-04a Standard Specification for Compressed Round Stranded Copper Conductors, Hard, Medium-Hard, or Soft Using Single Input Wire Construction
- ASTM B902-04 Standard Specification for Compressed Round Stranded Copper Conductors, Hard, Medium-Hard, or Soft Using Single Input Wire Construction
- ASTM F1123-87(2010) Standard Specification for Non-Metallic Expansion Joints
- ASTM F72-06 Standard Specification for Gold Wire for Semiconductor Lead Bonding
- ASTM B902-00 Standard Specification for Compressed Round Stranded Copper Conductors, Hard, Medium-Hard, or Soft Using Single Input Wire Construction
- ASTM A975-97 Standard Specification for Double-Twisted Hexagonal Mesh Gabions and Revet Mattresses (Metallic-Coated Steel Wire or Metallic-Coated Steel Wire With Poly(Vinyl Chloride) (PVC) Coating)
- ASTM A975-97(2003) Standard Specification for Double-Twisted Hexagonal Mesh Gabions and Revet Mattresses (Metallic-Coated Steel Wire or Metallic-Coated Steel Wire With Poly(Vinyl Chloride) (PVC) Coating)
- ASTM F180-94(2010)e1 Standard Test Method for Density of Fine Wire and Ribbon Wire for Electronic Devices
- ASTM F180-94(2015) Standard Test Method for Density of Fine Wire and Ribbon Wire for Electronic Devices
- ASTM F2979-14 Standard Guide for Characterization of Wear from the Articulating Surfaces in Retrieved Metal-on-Metal and other Hard-on-Hard Hip Prostheses
- ASTM F72-17e1 Standard Specification for Gold Wire for Semiconductor Lead Bonding
- ASTM F72-95 Standard Specification for Gold Wire for Semiconductor Lead Bonding
- ASTM F72-17 Standard Specification for Gold Wire for Semiconductor Lead Bonding
- ASTM F72-21 Standard Specification for Gold Wire for Semiconductor Lead Bonding
- ASTM A974-97 Standard Specification for Welded Wire Fabric Gabions and Gabion Mattresses (Metallic Coated or Polyvinyl Chloride (PVC) Coated)
- ASTM A974-97(2003) Standard Specification for Welded Wire Fabric Gabions and Gabion Mattresses (Metallic Coated or Polyvinyl Chloride (PVC) Coated)
- ASTM A974-97(2011) Standard Specification for Welded Wire Fabric Gabions and Gabion Mattresses (Metallic Coated or Polyvinyl Chloride (PVC) Coated)
- ASTM D4388-20 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
Professional Standard-Ships, Nodal line semi-metal
Underwriters Laboratories (UL), Nodal line semi-metal
- UL 2565-2013 UL Standard for Safety Manual and Semiautomatic Metal Sawing Machines (First Edition; Reprint with revisions through and including July 26@ 2017)
- UL 514A-2017 UL Standard for Safety Metallic Outlet Boxes (Eleventh Edition; Reprint with Revisions Through and Including August 11@ 2017)
- UL 62-2002 Fixture wire
- UL 514A-2004 Metallic outlet boxes
- UL 514A-2013 UL Standard for Safety Metallic Outlet Boxes (Eleventh Edition; Reprint with Revisions Through and Including August 11@ 2017)
- UL 514A-1991 Metallic outlet boxes
- UL 514A-1996 Metallic outlet boxes
- UL 514A CRD-2018 UL Standard for Safety Metallic Outlet Boxes - Section / Paragraph Reference: 10.3.3 Subject: Slots in Adjustable Metal Outlet Boxes for Use only With Bar Hanger Assemblies (Edition 11; February 1@ 2013)
- UL 2565 BULLETIN-2007 UL Standard for Safety Manual and Semiautomatic Metal Sawing Machines
- UL 62-1991 Flexible cord and fixture wire
- UL SUBJECT 2565-2007 OUTLINE OF INVESTIGATION FOR Manual and Semiautomatic Metal Sawing Machines (Issue 1)
- UL 514A BULLETIN-2022 UL Standard for Safety Metallic Outlet Boxes
RU-GOST R, Nodal line semi-metal
- GOST 11611-1982 Plain bearings metal half-liners split bearing blocks. Design and dimensions
- GOST 27861-1988 Billets and semiproducts of nonferrous metals and their alloys. Marking
- GOST 2171-1990 Pieces, products, semi-finished products and billets of non-ferrous metals and alloys. Grade designation
- GOST 25501-1982 Stocks and semifinished products of non-ferrous metals and alloys. Terms and definitions
- GOST R 52915-2008 Automatic and semi-automatic metalforming machines. Safety requirements
- GOST 14311-1985 Steel cord. Specifiucations
- GOST 24047-1980 Half-finished products out of non-ferrous metals and their alloys. Sampling for tensile test
- GOST 31542-2012 Automatic and semi-automatic metal forming machines. Safety requirements
- GOST 5221-2008 Tin-zink bronze wire. Specifications
- GOST 5221-1977 Tin-zinc bronze wire. Specifications
- GOST R ISO 10513-2009 Prevailing torque type all-metal hexagon nuts, style 2, with fine pitch thread. Property classes 8, 10 and 12
ES-AENOR, Nodal line semi-metal
CZ-CSN, Nodal line semi-metal
PL-PKN, Nodal line semi-metal
- PN M82162-1960 Studs semi-precise length of the metal end 1d
- PN M82164-1960 Studs semi-precise length of the metal end 2d
- PN H01701-1973 Non-?errous metals Halfproducts and products Marking
- PN M82163-1960 Studs semi-precises lenght of the metal end l,25d
- PN H04420-1988 Metals Metallurgic semiproducts and products Measurement of form deviations
- PN-EN 6099-2021-08 E Aerospace series -- Rod-end, spherical, plain bearing, metal to metal -- Technical specification
Canadian Standards Association (CSA), Nodal line semi-metal
German Institute for Standardization, Nodal line semi-metal
- DIN 9430-2:1984-12 Aerospace; sampling of semi-finished products in light metals; wrought aluminium alloys
- DIN 9430-3:1984-12 Aerospace; sampling of semi-finished products in light metals; titanium and titanium alloys
- DIN 47104:1988 Tinselwire for telecommunication cords
- DIN 47104:1988-06 Tinselwire for telecommunication cords
- DIN EN 14917:2012 Metal bellows expansion joints for pressure applications; German version EN 14917:2009+A1:2012
- DIN EN 62418:2010-12 Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
- DIN 9430-3:1984 Aerospace; sampling of semi-finished products in light metals; titanium and titanium alloys
- DIN 9430-2:1984 Aerospace; sampling of semi-finished products in light metals; wrought aluminium alloys
- DIN 1546:1954-06 Diamond dies for wires of ferrous and non-ferrous metals
- DIN 46218:1966 Stamped metal rings for conductors
- DIN EN 4000:2003-05 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products; German and English version EN 4000:2001
- DIN EN 4000:2003 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products; German and English version EN 4000:2001
- DIN 9430-1:1984-12 Aerospace; sampling of semi-finished products in light metals; wrought aluminium alloys, titanium and titanium alloys; general
- DIN EN 2600:2019-03 Aerospace series - Designation of metallic semi-finished products - Rules; German and English version EN 2600:2018
- DIN EN 2600:2019 Aerospace series - Designation of metallic semi-finished products - Rules; German and English version EN 2600:2018
- DIN EN 2600:2018 Aerospace series - Designation of metallic semi-finished products - Rules; German and English version FprEN 2600:2018
- DIN ISO 7800:2013-09 Metallic Materials - Wire - Simple torsion test (ISO 7800:2012)
- DIN ISO 7802:2014-11 Metallic materials - Wire - Wrapping test (ISO 7802:2013)
- DIN 9430-1:1984 Aerospace; sampling of semi-finished products in light metals; wrought aluminium alloys, titanium and titanium alloys; general
- DIN 1850-3:1998 Plain bearings - Part 3: Sintermetal bushes
- DIN EN 14917:2022 Metal bellows expansion joints for pressure applications
- DIN EN 14917:2022-02 Metal bellows expansion joints for pressure applications; German version EN 14917:2021
- DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
Professional Standard - Machinery, Nodal line semi-metal
International Organization for Standardization (ISO), Nodal line semi-metal
- ISO/R 956:1969 Tensile test for light metal and light metal alloy wires
- ISO 3543:1981 Metallic and non-metallic coatings; Measurement of thickness; Beta backscatter method
- ISO 15348:2002 Pipework - Metal bellows expansion joints - General
- ISO 7802:1983 Metallic materials; Wire; Wrapping test
- ISO 7802:2013 Metallic materials.Wire.Wrapping test
- ISO 3543:2000 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
- ISO 14919:2001 Thermal spraying - Wires, rods and cords for flame and arc spraying - Classification; Technical supply conditions
- ISO 14919:2015 Thermal spraying - Wires, rods and cords for flame and arc spraying - Classification - Technical supply conditions
CH-SNV, Nodal line semi-metal
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Nodal line semi-metal
Military Standards (MIL-STD), Nodal line semi-metal
IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Nodal line semi-metal
Korean Agency for Technology and Standards (KATS), Nodal line semi-metal
(U.S.) Ford Automotive Standards, Nodal line semi-metal
- FORD M5J3-A-1990 GRAY METALLIC OFFICE EQUIPMENT SEMIGLOSS ENAMEL
- FORD WSK-M11P54-A-2013 PERFORMANCE, SEMISTRUCTURAL ADHESIVE, POLYURETHANE, METAL TO METAL, TWO COMPONENT ***TO BE USED WITH FORD WSS-M99P1111-A***
IT-UNI, Nodal line semi-metal
Group Standards of the People's Republic of China, Nodal line semi-metal
European Committee for Electrotechnical Standardization(CENELEC), Nodal line semi-metal
- EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
- EN 62418:2010 Semiconductor devices - Metallization stress void test
Institute of Electrical and Electronics Engineers (IEEE), Nodal line semi-metal
US-VA, Nodal line semi-metal
US-FCR, Nodal line semi-metal
Aerospace Industries Association/ANSI Aerospace Standards, Nodal line semi-metal
Japanese Industrial Standards Committee (JISC), Nodal line semi-metal
American National Standards Institute (ANSI), Nodal line semi-metal
AT-ON, Nodal line semi-metal
YU-JUS, Nodal line semi-metal
Professional Standard - Building Materials, Nodal line semi-metal
- JC/T 2024-2010 Translucent alumina ceramic tube for metal halide lamps
- JC/T 340-1992 Segmental diamond circular saw blades for processing non-metallic hard and brittle materials
Danish Standards Foundation, Nodal line semi-metal
- DS/EN 62418:2010 Semiconductor devices - Metallization stress void test
- DS/EN 6099:2021 Aerospace series – Rod-end, spherical, plain bearing, metal to metal – Technical specification
- DS/EN 4000:2002 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
- DS/EN 14917+A1:2012 Metal bellows expansion joints for pressure applications
- DS/EN 14917:2021 Metal bellows expansion joints for pressure applications
- DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
International Electrotechnical Commission (IEC), Nodal line semi-metal
- IEC 62418:2010 Semiconductor devices - Metallization stress void test
- IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
- IEC 60695-2-1:1991 Fire hazard testing; part 2: test methods; section 1: glow-wire test and guidance
British Standards Institution (BSI), Nodal line semi-metal
- BS EN 62418:2010 Semiconductor devices. Metallization stress void test
- BS 1133-10.2:1991 Packaging code - Metal containers - Metal drums
- BS EN ISO 15841:2014 Dentistry. Wires for use in orthodontics
- BS EN ISO 15841:2006 Dentistry - Wires for use in orthodontics
- BS EN 14917:2009+A1:2012 Metal bellows expansion joints for pressure applications
- BS EN 14917:2009 Metal bellows expansion joints for pressure applications
- BS EN 14917:2021 Metal bellows expansion joints for pressure applications
- BS EN 61663-2:2001 Lightning protection. Telecommunication lines. Lines using metallic conductors
- BS EN 4000:2002 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
- BS EN 2600:2018 Aerospace series. Designation of metallic semi-finished products. Rules
- BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
- BS EN ISO 3543:2001 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
- BS ISO 6282:2018 Plain bearings. Metallic thin-walled half bearings. Determination of the $Gs0, 01*-limit
- BS ISO 15348:2002 Pipework - Metal bellows expansion joints - General
- BS ISO 7802:2013 Metallic materials. Wire. Wrapping test
- BS EN 24503:1993 Hardmetals. Determination of contents of metallic elements by X-ray fluorescence. Fusion method
- BS EN 60695-2-11:2001 Fire hazard testing - Test methods - Glowing/hot-wire based test methods - Glow-wire flammability test method for end-products
- BS EN 60695-2-11:2014 Fire hazard testing. Glowing/hot-wire based test methods. Glow-wire flammability test method for end-products (GWEPT)
- BS 1133-6.1:1991 Packaging code - Protection of metal surfaces against corrosion during transport and storage - Cleaning and drying of metal surfaces
ES-UNE, Nodal line semi-metal
- UNE-EN 62418:2010 Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
- UNE-EN 4000:2001 Aerospace series- Metallic materials- Rules for the drafting and presentation of dimensional standards for metallic semi-finished products. (Endorsed by AENOR in February of 2002.)
- UNE-EN 2600:2018 Aerospace series - Designation of metallic semi-finished products - Rules (Endorsed by Asociación Española de Normalización in February of 2019.)
- UNE-EN 14917:2022 Metal bellows expansion joints for pressure applications
Professional Standard - Non-ferrous Metal, Nodal line semi-metal
- YS/T 203-2009 Threads,wires,rods of precious metals and their alloys
Society of Automotive Engineers (SAE), Nodal line semi-metal
- SAE AMS5555C-1992 Nickel Wire and Ribbon 99Ni
- SAE AMS5555D-2006 Nickel Wire and Ribbon 99Ni UNS N02205
- SAE AS23190/2-2009 STRAPS, CLAMPS, PLASTIC AND METAL, AND MOUNTING HARDWARE, PLASTIC FOR CABLE HARNESS TYING AND SUPPORT CLAMP, LOOP, METAL, CUSHIONED, ADJUSTABLE, WIRE SUPPORT, TYPE V, CLASS 1
- SAE AS14184-2004 NONMETALLIC SHAFT-COUPLING DETAILS, ENGINE DRIVEN ACCESSORIES
Professional Standard - Education, Nodal line semi-metal
教育部, Nodal line semi-metal
Professional Standard - Electron, Nodal line semi-metal
- SJ 20025-1992 Generic specification for gas sensors of metal-oxide semiconductor
- SJ 20026-1992 Measuring methods for gas sensors of metal-oxide semiconductor
- SJ 20079-1992 Test mehods for gas sensors of metal-oxide semiconductor
- SJ/T 10176-1991 Detail specification of metal rhomb package for semiconductor integrated circuits
KR-KS, Nodal line semi-metal
ZA-SANS, Nodal line semi-metal
- SANS 462:2005 Welded wire fabric gabions and gabion mattresses (Metallic-coated or polyvinyl chloride (PVC) coated)
- SANS 367:2005 Plain bearings - Metallic thin-walled half bearings - Determination of the sigma 0,01*-limit
Lithuanian Standards Office , Nodal line semi-metal
- LST EN 4000-2002 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
- LST EN 62418-2010 Semiconductor devices - Metallization stress void test (IEC 62418:2010)
- LST EN 14917-2009+A1-2012 Metal bellows expansion joints for pressure applications
- LST EN 14917-2021 Metal bellows expansion joints for pressure applications
IN-BIS, Nodal line semi-metal
European Committee for Standardization (CEN), Nodal line semi-metal
- EN 4000:2001 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
- EN ISO 3543:1994 Metallic and Non-Metallic Coatings - Measurement of Thickness - Beta Backscatter Method (ISO 3543 : 1981)
- prEN 60695-2-1-1992 Fire hazard testing; part 2: test methods; section 1: glow-wire test and guidance (IEC 695-2-1:1991)
- EN 14917:2021 Metal bellows expansion joints for pressure applications
CEN - European Committee for Standardization, Nodal line semi-metal
- EN 2600:2018 Aerospace series - Designation of metallic semi-finished products - Rules
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Nodal line semi-metal
Military Standard of the People's Republic of China-General Armament Department, Nodal line semi-metal
- GJB 1996A-2018 Specification for metal bellows expansion joints for piping
- GJB 947A-2003 Specifications for wire, wire and rods of precious metals and their alloys
- GJB 947A-2020 Specifications for wire, wire and rods of precious metals and their alloys
- GJB 947-1990 Precious metals and alloy wires for aerospace use
- GJB 1996-1994 General specification for metal bellows expansion joints for piping
Professional Standard - Textile, Nodal line semi-metal
Professional Standard - Surveying and Mapping, Nodal line semi-metal
National Metrological Verification Regulations of the People's Republic of China, Nodal line semi-metal
AIA/NAS - Aerospace Industries Association of America Inc., Nodal line semi-metal
AENOR, Nodal line semi-metal
TH-TISI, Nodal line semi-metal
- TIS 2175-2004 Reverse bend test for metallic wire [iso title: metallic materials.wire.reverse bend test]
- TIS 2176-2004 Torsion test for metallic wire [iso title: metallic materials.wire.simple torsion test]
- TIS 2177-2004 Reverse torsion test for metallic wire [iso title: metallic materials.wire.reverse torsion test]
- TIS 313-1988 Standard for aluminium insect wire screening
VE-FONDONORMA, Nodal line semi-metal
U.S. Military Regulations and Norms, Nodal line semi-metal
- ARMY MIL-M-63530 NOTICE 1-1997 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
- ARMY MIL-M-63530 (1)-1987 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
- ARMY MIL-M-63530-1981 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
- ARMY DOD-L-63983-1982 LINK, CARTRIDGE, METALLIC BELT, 30MM, M29
European Association of Aerospace Industries, Nodal line semi-metal
- AECMA PREN 2600-1987 Aerospace Series Designation of Metallic Semi-Finished Products Rules Edition P1
- AECMA PREN 3848-1994 Aerospace Series Semi-Finished Metallic Products Method of Measuring for from Deviations Edition P1
- AECMA PREN 3848-1996 Aerospace Series Semi-Finished Metallic Products Methods of Measuring from Deviations Edition P2
ASD-STAN - Aerospace and Defence Industries Association of Europe - Standardization, Nodal line semi-metal
- PREN 3848-1994 Aerospace Series Semi-Finished Metallic Products Method of Measuring for from Deviations (Edition P1)
- PREN 3848-1996 Aerospace Series Semi-Finished Metallic Products Methods of Measuring from Deviations (Edition P2)
- PREN 2600-1987 Aerospace Series Designation of Metallic Semi-Finished Products Rules (Edition P1)
- PREN 4000-1997 Aerospace Series Metallic Materials Rules for the Drafting and Presentation of Dimensional Standards for Metallic Semi-Finished Products (Edition P 2)
国家市场监督管理总局、中国国家标准化管理委员会, Nodal line semi-metal
VN-TCVN, Nodal line semi-metal
CL-INN, Nodal line semi-metal
Professional Standard - Construction Industry, Nodal line semi-metal
Professional Standard - Urban Construction, Nodal line semi-metal
CO-ICONTEC, Nodal line semi-metal
National Electrical Manufacturers Association(NEMA), Nodal line semi-metal
- NEMA FB 2.10-2012 Selection and Installation Guidelines Fittings for Use with Non-Flexible Metallic Conduit or Tubing (Rigid Metal Conduit, Intermediate Metal Conduit, and Electrical Metallic Tubing)
- NEMA RN 2-1987 Packaging of Master Bundles for Electrical Rigid Metal Conduit (ERMC) - Steel, Electrical Intermediate Metal Conduit (EIMC) - Steel, and Electrical Metallic Tubing (EMT) - Steel
国家建筑材料工业局, Nodal line semi-metal
- JC 340-1992 Segmented diamond garden saw blades for processing non-metallic hard and brittle materials
United States Navy, Nodal line semi-metal
Professional Standard - Petrochemical Industry, Nodal line semi-metal
- SH/T 3421-2009 General rules for arrangement and selection of metal bellows expansion joint
SAE - SAE International, Nodal line semi-metal