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Wafer analysis

Wafer analysis, Total:6 items.

In the international standard classification, Wafer analysis involves: Semiconducting materials, Analytical chemistry, Integrated circuits. Microelectronics.

American Society for Testing and Materials (ASTM), Wafer analysis

• ASTM F1726-97 Standard Guide for Analyis of Crystallographic Perfection of Silicon Wafers

Korean Agency for Technology and Standards (KATS), Wafer analysis

• KS D ISO 14706-2003(2018)

KR-KS, Wafer analysis

• KS D ISO 14706-2003(2023)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Wafer analysis

• GB/T 30701-2014 Surface chemical analysis.Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

International Organization for Standardization (ISO), Wafer analysis

• ISO 17331:2004/Amd 1:2010 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1

German Institute for Standardization, Wafer analysis

• DIN 51456:2013 Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)

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