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measured with an electron microscope
measured with an electron microscope, Total:44 items.
In the international standard classification, measured with an electron microscope involves: Linear and angular measurements, Fluid power systems, Optics and optical measurements, Analytical chemistry, Optical equipment, Air quality, Materials for aerospace construction, Surface treatment and coating, Physics. Chemistry.
American Society for Testing and Materials (ASTM), measured with an electron microscope
- ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
Korean Agency for Technology and Standards (KATS), measured with an electron microscope
- KS I ISO 4407:2012 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
- KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
- KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
- KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
- KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
- KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
International Organization for Standardization (ISO), measured with an electron microscope
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Professional Standard - Machinery, measured with an electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, measured with an electron microscope
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB 7667-2003 The dose of X-rays leakage from electron microscope
Japanese Industrial Standards Committee (JISC), measured with an electron microscope
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
KR-KS, measured with an electron microscope
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
British Standards Institution (BSI), measured with an electron microscope
- BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
German Institute for Standardization, measured with an electron microscope
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
PH-BPS, measured with an electron microscope
- PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
Group Standards of the People's Republic of China, measured with an electron microscope
- T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
SE-SIS, measured with an electron microscope
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
European Committee for Standardization (CEN), measured with an electron microscope
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
Association Francaise de Normalisation, measured with an electron microscope
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
RU-GOST R, measured with an electron microscope
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
Danish Standards Foundation, measured with an electron microscope
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
Institute of Interconnecting and Packaging Electronic Circuits (IPC), measured with an electron microscope