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Microelectronics
Microelectronics, Total:80 items.
In the international standard classification, Microelectronics involves: Analytical chemistry, Optical equipment, Optics and optical measurements, Vocabularies, Air quality, Welding, brazing and soldering, Metrology and measurement in general, Education.
International Organization for Standardization (ISO), Microelectronics
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
British Standards Institution (BSI), Microelectronics
- BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- 20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- 21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
- BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Microelectronics
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 23414-2009 Microbeam analysis.Scanning electron microscopy.Vocabulary
- GB/T 21636-2008 Microbeam analysis.Electron probe microanalysis (EPMA).Vocabulary
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB 7667-2003 The dose of X-rays leakage from electron microscope
Korean Agency for Technology and Standards (KATS), Microelectronics
KR-KS, Microelectronics
- KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Microelectronics
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
- GB/T 33838-2017 Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness
Association Francaise de Normalisation, Microelectronics
国家市场监督管理总局、中国国家标准化管理委员会, Microelectronics
- GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
- GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
Professional Standard - Machinery, Microelectronics
American Society for Testing and Materials (ASTM), Microelectronics
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Japanese Industrial Standards Committee (JISC), Microelectronics
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
Association of German Mechanical Engineers, Microelectronics
CN-STDBOOK, Microelectronics
- 图书 a-4565 Practical Methods for Electron Microanalysis
National Metrological Technical Specifications of the People's Republic of China, Microelectronics
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Group Standards of the People's Republic of China, Microelectronics
National Metrological Verification Regulations of the People's Republic of China, Microelectronics
Professional Standard - Education, Microelectronics
- JY/T 011-1996 General Principles of Transmission Electron Microscopy
- JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
RU-GOST R, Microelectronics
- GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols