ZH
RU
ES

Electron Microscopy

Electron Microscopy, Total:39 items.

In the international standard classification, Electron Microscopy involves: Linear and angular measurements, Analytical chemistry, Surface treatment and coating.

PH-BPS, Electron Microscopy

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

Association Francaise de Normalisation, Electron Microscopy

NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

Danish Standards Foundation, Electron Microscopy

DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy

European Committee for Standardization (CEN), Electron Microscopy

EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
prEN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)

British Standards Institution (BSI), Electron Microscopy

BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS EN ISO 21363:2022 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 21363:2020 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
18/30351714 DC BS ISO 21363. Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

International Organization for Standardization (ISO), Electron Microscopy

ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

KR-KS, Electron Microscopy

KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope

American Society for Testing and Materials (ASTM), Electron Microscopy

ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

ES-UNE, Electron Microscopy

UNE-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020) (Endorsed by Asociación Española de Normalización in February of 2022.)
UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Microscopy

GB/T 43196-2023 Nanotechnology Scanning Electron Microscopy to Measure Nanoparticle Size and Shape Distribution

AT-ON, Electron Microscopy

OENORM EN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)

未注明发布机构, Electron Microscopy

DIN EN ISO 21363:2022 Nanotechnologies – measurements of particle size and particle shape distributions using transmission electron microscopy

German Institute for Standardization, Electron Microscopy

DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
DIN EN ISO 21363:2022-03 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020); German version EN ISO 21363:2022

BELST, Electron Microscopy

STB 2210-2011 Nano-sized carbon and non-carbon materials and composites based on them. Method for determining parameters using scan electron microscopy measurements
STB 2209-2011 Nano-sized carbon and non-carbon materials and composites based on them. The technique for determining elemental composition using scan electron microscopy measurements

RU-GOST R, Electron Microscopy

GOST R 8.697-2010 State system for ensuring the uniformity of measurements. Interpenar spacings in crystals. Method for measurement by means of a transmission electron microscope
GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification

Korean Agency for Technology and Standards (KATS), Electron Microscopy

KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method