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Ellipsometer power
Ellipsometer power, Total:35 items.
In the international standard classification, Ellipsometer power involves: Machine tools, Metrology and measurement in general, Non-destructive testing, Optical equipment, Electricity. Magnetism. Electrical and magnetic measurements, Linear and angular measurements, Special measuring equipment for use in telecommunications, Fibre optic communications, Non-ferrous metals, Domestic, commercial and industrial heating appliances.
Korean Agency for Technology and Standards (KATS), Ellipsometer power
British Standards Institution (BSI), Ellipsometer power
German Institute for Standardization, Ellipsometer power
- DIN EN ISO 23131:2023-01 Ellipsometry - Principles (ISO 23131:2021); German version EN ISO 23131:2022
- DIN EN ISO 23131:2023 Ellipsometry - Principles (ISO 23131:2021)
- DIN 50989-2:2021-04 Ellipsometry - Part 2: Bulk material model; Text in German and English
- DIN 50989-3:2022-04 Ellipsometry - Part 3: Transparent single layer model; Text in German and English
- DIN 50989-6:2023-03 Ellipsometry - Part 6: Effective Materials model; Text in German and English / Note: Date of issue 2023-01-27
- DIN 50989-4:2022-09 Ellipsometry - Part 4: Semi-transparent single layer model; Text in German and English
- DIN 50989-5:2023-03 Ellipsometry - Part 5: Multiple layers and periodic layers model; Text in German and English / Note: Date of issue 2023-01-27
- DIN 50989-1:2018 Ellipsometry - Part 1: Principles; Text in German and English
Association Francaise de Normalisation, Ellipsometer power
National Metrological Technical Specifications of the People's Republic of China, Ellipsometer power
ES-UNE, Ellipsometer power
Group Standards of the People's Republic of China, Ellipsometer power
International Organization for Standardization (ISO), Ellipsometer power
- IEC TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
- IEC/TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
Japanese Industrial Standards Committee (JISC), Ellipsometer power
- JIS C 1283:1979 Watt-hour, var-hour and maximum demand indicators for telemetering
- JIS C 1283-1:2009 Watt-hour, var-hour and maximum demand indicators for telemetering -- Part 1: General measuring instrument
- JIS C 6186:1999 Calibration of fiber optic power meters
- JIS C 6186:2008 Calibration of fiber optic power meters
- JIS C 1283-2:2009 Watt-hour, var-hour and maximum demand indicators for telemetering -- Part 2: Measuring instruments used transaction or certification
- JIS C 1283-2 AMD 1:2014 Watt-hour, var-hour and maximum demand indicators for telemetering -- Part 2: Measuring instruments used in transaction or certification (Amendment 1)
- JIS C 1263-1:2009 Var-hour meters -- Part 1: General measuring instrument
CENELEC - European Committee for Electrotechnical Standardization, Ellipsometer power
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Ellipsometer power
- GB/T 31225-2014 Test method for the thickness of silicon oxide on Si substrate by ellipsometer
- GB/T 7287.8-1987 Measuring method for power deviation rate of infrared heater
Professional Standard - Non-ferrous Metal, Ellipsometer power
- YS/T 839-2012 Test method for measurement of insulator thickness and refractive index on silicon substrates by ellipsometry
European Committee for Electrotechnical Standardization（CENELEC）, Ellipsometer power
Professional Standard - Agriculture, Ellipsometer power
Professional Standard - Electron, Ellipsometer power