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spectroscopic ellipsometer
spectroscopic ellipsometer, Total:42 items.
In the international standard classification, spectroscopic ellipsometer involves: Machine tools, Metrology and measurement in general, Non-destructive testing, Surface treatment and coating, Biology. Botany. Zoology, Linear and angular measurements, Optical equipment, Textile fibres.
Korean Agency for Technology and Standards (KATS), spectroscopic ellipsometer
British Standards Institution (BSI), spectroscopic ellipsometer
German Institute for Standardization, spectroscopic ellipsometer
- DIN EN ISO 23131:2023-01 Ellipsometry - Principles (ISO 23131:2021); German version EN ISO 23131:2022
- DIN EN ISO 23131:2023 Ellipsometry - Principles (ISO 23131:2021)
- DIN 50989-2:2021-04 Ellipsometry - Part 2: Bulk material model; Text in German and English
- DIN 50989-3:2022-04 Ellipsometry - Part 3: Transparent single layer model; Text in German and English
- DIN 50989-6:2023-03 Ellipsometry - Part 6: Effective Materials model; Text in German and English / Note: Date of issue 2023-01-27
- DIN 50989-4:2022-09 Ellipsometry - Part 4: Semi-transparent single layer model; Text in German and English
- DIN 50989-5:2023-03 Ellipsometry - Part 5: Multiple layers and periodic layers model; Text in German and English / Note: Date of issue 2023-01-27
- DIN 50989-1:2018 Ellipsometry - Part 1: Principles; Text in German and English
- DIN 50989-3:2022 Ellipsometry - Part 3: Transparent single layer model; Text in German and English
- DIN 50989-3:2021 Ellipsometry - Part 3: Transparent single layer model; Text in German and English
- DIN 50989-4:2022 Ellipsometry - Part 4: Semi-transparent single layer model; Text in German and English
- DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
Association Francaise de Normalisation, spectroscopic ellipsometer
National Metrological Technical Specifications of the People's Republic of China, spectroscopic ellipsometer
- JJF 1932-2021 Calibration Specification for Ellipsometers
- JJF 1497-2014 Calibration Specification for Polarimeters
- JJF(纺织) 039-2020 Calibration Specification for Polarization Maturity Testers of Cotton Fiber
- JJF(纺织)039-2020 Calibration Specification for Polarization Maturity Testers of Cotton Fiber
- JJF(纺织) 039-2006 Calibration specification for cotton fiber polarization maturity meter
- JJF 1428-2013 Calibration Specification of Fiber Polarization Mode Dispersion Testers
- JJF 1456-2014 Calibration Specification for Optical Degree of Polarization Meter for Telecommunications
ES-UNE, spectroscopic ellipsometer
Danish Standards Foundation, spectroscopic ellipsometer
- DS/ISO 23131:2021 Ellipsometry – Principles
- DS/ISO 23216:2021 Carbon based films – Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry
Military Standard of the People's Republic of China-General Armament Department, spectroscopic ellipsometer
- GJB 8373-2015 Specification for elliptical stress applying part polarization-maintaining fiber
- GJB 1713-1993 Specifications for Nanolaser Polarization Interferometers
International Organization for Standardization (ISO), spectroscopic ellipsometer
- IEC TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
- IEC/TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
- IEC TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
- ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
United States Navy, spectroscopic ellipsometer
国家市场监督管理总局、中国国家标准化管理委员会, spectroscopic ellipsometer
- GB/T 37908-2019 General analysis regulation of the label-free protein microarray based on imaging ellipsometry
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, spectroscopic ellipsometer
- GB/T 31225-2014 Test method for the thickness of silicon oxide on Si substrate by ellipsometer
- GB/T 6099.2-1992 Test method for maturity of cotton fibres—Polarized apparatus method
Professional Standard - Education, spectroscopic ellipsometer
- JY 141-1982 Light interference, diffraction, polarization demonstrator
National Metrological Verification Regulations of the People's Republic of China, spectroscopic ellipsometer
- JJG(纺织) 049-1991 Cotton Fiber Polarizing Maturity Tester Verification Regulations