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Ellipsometer Classification
Ellipsometer Classification, Total:21 items.
In the international standard classification, Ellipsometer Classification involves: Machine tools, Metrology and measurement in general, Non-destructive testing, Linear and angular measurements.
Korean Agency for Technology and Standards (KATS), Ellipsometer Classification
British Standards Institution (BSI), Ellipsometer Classification
Association Francaise de Normalisation, Ellipsometer Classification
German Institute for Standardization, Ellipsometer Classification
- DIN EN ISO 23131:2023-01 Ellipsometry - Principles (ISO 23131:2021); German version EN ISO 23131:2022
- DIN EN ISO 23131:2023 Ellipsometry - Principles (ISO 23131:2021)
- DIN 50989-3:2022-04 Ellipsometry - Part 3: Transparent single layer model; Text in German and English
- DIN 50989-2:2021-04 Ellipsometry - Part 2: Bulk material model; Text in German and English
- DIN 50989-6:2023-03 Ellipsometry - Part 6: Effective Materials model; Text in German and English / Note: Date of issue 2023-01-27
- DIN 50989-4:2022-09 Ellipsometry - Part 4: Semi-transparent single layer model; Text in German and English
- DIN 50989-5:2023-03 Ellipsometry - Part 5: Multiple layers and periodic layers model; Text in German and English / Note: Date of issue 2023-01-27
- DIN 50989-1:2018 Ellipsometry - Part 1: Principles; Text in German and English
- DIN 50989-3:2022 Ellipsometry - Part 3: Transparent single layer model; Text in German and English
- DIN 50989-3:2021 Ellipsometry - Part 3: Transparent single layer model; Text in German and English
- DIN 50989-4:2022 Ellipsometry - Part 4: Semi-transparent single layer model; Text in German and English
National Metrological Technical Specifications of the People's Republic of China, Ellipsometer Classification
ES-UNE, Ellipsometer Classification
International Organization for Standardization (ISO), Ellipsometer Classification
- IEC TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
- IEC/TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Ellipsometer Classification
- GB/T 31225-2014 Test method for the thickness of silicon oxide on Si substrate by ellipsometer