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Auger Electron Spectroscopy Depth Analysis
Auger Electron Spectroscopy Depth Analysis, Total:9 items.
In the international standard classification, Auger Electron Spectroscopy Depth Analysis involves: Electronic components in general, Analytical chemistry.
Professional Standard - Electron, Auger Electron Spectroscopy Depth Analysis
- SJ/T 10457-1993 Standard guide for depth profiling auger electron spectroscopy
国家市场监督管理总局、中国国家标准化管理委员会, Auger Electron Spectroscopy Depth Analysis
- GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
British Standards Institution (BSI), Auger Electron Spectroscopy Depth Analysis
- BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
- 21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
International Organization for Standardization (ISO), Auger Electron Spectroscopy Depth Analysis
- ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
American Society for Testing and Materials (ASTM), Auger Electron Spectroscopy Depth Analysis