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magnetic random access memory

magnetic random access memory, Total:177 items.

In the international standard classification, magnetic random access memory involves: Integrated circuits. Microelectronics, Data storage devices, Pumps, Applications of information technology, Materials for aerospace construction, Audio, video and audiovisual engineering, Microprocessor systems, Testing of metals, Components for electrical equipment, Magnetic materials, Interface and interconnection equipment, Mechanical testing, Aerosol containers.


Group Standards of the People's Republic of China, magnetic random access memory

  • T/CIE 126-2021 Magnetic random access memory chip test method
  • T/CIE 092-2020 Test method for spin-transfer torque magnetic random access memory
  • T/CIE 133-2022 Test method for data retention time of magnetic random access memory device
  • T/CIE 134-2022 Test method for data retention time of magnetic random access memory chip

U.S. Air Force, magnetic random access memory

Defense Logistics Agency, magnetic random access memory

German Institute for Standardization, magnetic random access memory

  • DIN 32744-1:2001 Office machines - Magnetic stripes on saving books - Part 1: Mechanical and electromagnetic properties
  • DIN 19242-8:1987 Measurement and control; performance tests on process computer systems; time measurement; function tested: I/O operation on a peripherical storage system (random access)

CZ-CSN, magnetic random access memory

Professional Standard - Electron, magnetic random access memory

  • SJ 50597/38-1995 Semiconductor integrated circuits.Detail specification of type JM2148H NMOS 1024×4 bit static random access memory
  • SJ/T 10739-1996 Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
  • SJ/T 10740-1996 Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories

AENOR, magnetic random access memory

  • UNE 58913:1987 STORAGE AND RETRIEVAL MACHINES. RELIABILITY AND AVAILABILITY
  • UNE 20587:1978 MAGNETIC CORES FOR APPLICATION IN COINCIDENT CURRENT MATRIX STORES HAVING A NOMINAL SELECTION RATIO 2:1 AND LINEAR SELECT MEMORY STORES

Association Francaise de Normalisation, magnetic random access memory

  • NF C86-253:1987 Harmonized system of quality assessment for electronic components. Mos read/write dynamic memories silicon monolithic circuits. Blank detail specification.
  • NF C86-254:1987 Harmonized system of quality assessment for electronic components. Mos read/write static memories silicon monolithic circuits. Blank detail specification.

RU-GOST R, magnetic random access memory

  • GOST R 52005-2003 Non-destructive testing. Method using metal magnetic memory. General requirements
  • GOST 28043-1989 Personal computers. Removable heads hard fixed disk drive interface. General requirements

International Electrotechnical Commission (IEC), magnetic random access memory

  • IEC 60281/AMD1:1975 Magnetic cores for application in coincident current matrix stores having a nominal selection ratio of 2:1 and in linearselect memory stores

IN-BIS, magnetic random access memory

国家市场监督管理总局、中国国家标准化管理委员会, magnetic random access memory

  • GB/T 36474-2018 Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)

American Society for Testing and Materials (ASTM), magnetic random access memory

  • ASTM D6654-05 Standard Test Method for Basic Storage Stability of a Mechanical Pump Dispenser
  • ASTM D6654-05(2010) Standard Test Method for Basic Storage Stability of a Mechanical Pump Dispenser
  • ASTM D6654-01 Standard Test Method for Basic Storage Stability of a Mechanical Pump Dispenser




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